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Texas Instruments BQ294701DSGT
- Part No.:
- BQ294701DSGT
- Manufacturer:
- Texas Instruments
- Category:
- Battery Management
- Package:
- 8-WFDFN Exposed Pad
- Datasheet:
-
BQ294701DSGT.pdf
- Description:
- IC BATT PROT LI-ION 2-4CEL 8WSON
- Quantity:
- Payment:
- Shipping:
Inventory:2,245
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Product details
Overview
BQ294701DSGT from Texas Instruments is a dedicated 2- to 4-series Li-ion battery overvoltage protection IC with factory-programmed 4.250 V OVP threshold, ±10 mV accuracy, external capacitor-programmed delay timer (1–2 s), and CMOS active-high output. It operates across –40°C to +85°C and consumes only ≈1 µA in normal mode, serving as a second-level safety monitor in notebook battery packs.
For engineers reviewing the BQ294701DSGT datasheet, BQ294701DSGT pinout, BQ294701DSGT application, or BQ294701DSGT equivalent, this page delivers verified specifications, validated pin functions, confirmed 2S–4S cell monitoring capability, real-world timing behavior of the CD delay circuit, and precise alternative part comparisons for battery pack design and qualification.
Technical Context
The BQ294701DSGT independently monitors up to four cell voltages (V1–VSS through V4–V3) using precision analog comparators with factory-trimmed 4.250 V overvoltage threshold and 300 mV hysteresis. Its delay timer is implemented via external capacitor (CD pin) charging/discharging with built-in open/short fault detection.
In overvoltage mode, the device triggers the CMOS active-high OUT pin after the programmed delay; in customer test mode (CD shorted to VSS), delay reduces to ≤170 ms. The IC draws <100 nA per sense input and supports direct NMOS FET gate drive for fuse-blowing power-path interruption.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| OVP Threshold | 4.250 V ±10 mV at 25°C - sets precise cell voltage trip point for 4.2 V nominal Li-ion cells |
| OV Hysteresis | 300 mV - prevents chatter during voltage decay near threshold, ensuring stable reset at 3.950 V |
| Delay Timer Range | 1–2 s with 0.1 µF CD capacitor - provides configurable fault response window before fuse activation |
| Supply Current | ≈1 µA (VCELL < VPROTECT) - enables ultra-low-power always-on monitoring in battery standby |
| Sense Input Leakage | <100 nA per cell input - minimizes voltage drop across series resistors, preserving measurement accuracy |
| Operating Temp | –40°C to +85°C - qualified for consumer notebook and UPS backup battery environments |
| Output Type | CMOS Active High - directly drives NMOS gate without pull-up, simplifying fuse-control circuitry |
Pinout & Package
Package: 8-pin WSON (DSG), 2.00 mm × 2.00 mm, exposed thermal pad (PowerPAD™) recommended to be connected to VSS.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| VDD | Power supply input | Unregulated 3–20 V supply; requires RC filter (1 kΩ + 0.1 µF) for noise immunity |
| V4 | Cell voltage sense input | Senses positive terminal of topmost (4th) cell in stack; must be shorted for 2S/3S configurations |
| V3 | Cell voltage sense input | Senses positive terminal of 3rd cell; used in 3S/4S stacks, shorted for 2S |
| V2 | Cell voltage sense input | Senses positive terminal of 2nd cell; required for all ≥2S configurations |
| V1 | Cell voltage sense input | Senses positive terminal of lowest cell; referenced to VSS, forms baseline for stack monitoring |
| VSS | Ground reference | IC ground and negative terminal of lowest cell; must connect to PowerPAD™ for thermal performance |
| CD | Delay capacitor interface | Connects to external 0.1 µF capacitor; includes timeout detection for open/short faults |
| OUT | Fault signal output | CMOS active-high output; sinks 4.5 mA when active, drives NMOS gate to blow fuse |
Key Features
| Feature | Design Value |
|---|---|
| Factory-programmed OVP | Fixed 4.250 V threshold eliminates external resistor network and calibration effort |
| External delay timer | Capacitor-programmable 1–2 s response window enables design flexibility without firmware |
| CD pin fault detection | Detects open or shorted delay capacitor and forces immediate OUT activation - ensures fail-safe operation |
| Ultra-low quiescent current | ≈1 µA supply current extends battery shelf life and avoids parasitic drain in storage |
| Per-cell independent monitoring | Four isolated sense inputs enable true cell-level overvoltage detection in stacked configurations |
Applications
| Notebook Battery Packs | UPS Battery Backup Systems |
|---|---|
Use Scenario: Monitors individual cells in multi-cell Li-ion packs inside thin-and-light notebooks during charging and runtime. IC Role / Device Role / Timing Role: Second-level hardware OVP protector that triggers within 1–2 s of cell overvoltage to disable charging path before thermal runaway. Use Value: Prevents catastrophic failure by enabling fast, deterministic fuse blow via NMOS gate drive - independent of host MCU or firmware. |
Use Scenario: Protects sealed lead-acid or Li-ion backup batteries in enterprise-grade UPS units during grid fluctuations or charger overvoltage events. IC Role / Device Role / Timing Role: Standalone analog safety monitor that operates without system power or communication, asserting fault signal on CD timeout expiration. Use Value: Ensures uninterrupted backup readiness by eliminating reliance on software-based protection - critical for unattended infrastructure. |
| Portable Medical Devices | Industrial Handheld Terminals |
Use Scenario: Secures rechargeable battery packs in portable diagnostic equipment where regulatory compliance (IEC 62133) mandates redundant OVP. IC Role / Device Role / Timing Role: Independent hardware layer that verifies cell voltage integrity prior to enabling therapeutic power delivery. Use Value: Meets functional safety requirements by providing traceable, non-software-dependent overvoltage cutoff with ±10 mV accuracy. |
Use Scenario: Guards battery stacks in ruggedized handheld terminals used in warehouse logistics, where mechanical shock may induce transient overvoltage. IC Role / Device Role / Timing Role: Fast-response analog protector that activates before transient-induced cell damage occurs, using CD pin's 170 ms test mode for production verification. Use Value: Reduces field failures by catching intermittent overvoltage events missed by slower system-level monitoring. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar overvoltage protection applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| BQ294700DSGT | OVP threshold = 4.350 V (vs. 4.250 V); identical package, timing, and output drive | Designed for higher-voltage Li-ion chemistries (e.g., 4.35 V max cells); not suitable for 4.2 V standard cells | Select BQ294700DSGT only if battery chemistry requires 4.35 V OVP; otherwise BQ294701DSGT matches 4.2 V nominal cells. |
| BQ294702DSGT | OVP threshold = 4.300 V; same accuracy, hysteresis, and delay architecture | Targeted at mid-range Li-ion variants (e.g., high-capacity NMC); requires revalidation of charge termination logic | Choose BQ294702DSGT when migrating to 4.30 V-rated cells; verify compatibility with existing charger IC voltage limits. |
Compared with BQ294700DSGT and BQ294702DSGT, the BQ294701DSGT provides the optimal 4.250 V trip point for mainstream 4.2 V Li-ion cells, avoiding premature shutdown (BQ294700) or insufficient margin (BQ294702) while maintaining identical timing, leakage, and layout requirements.
Availability
BQ294701DSGT is available at Aetrix Electronics and suitable for notebook battery management, UPS backup systems, and portable medical devices requiring stable component supply, long-lifecycle support, and guaranteed RoHS-compliant WSON packaging.
Supply support for BQ294701DSGT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and power management technologies, with decades of expertise in battery safety ICs.
The BQ2947 family was designed specifically for second-level hardware overvoltage protection in multi-cell Li-ion battery packs, emphasizing precision, low power, and fail-safe analog operation independent of system firmware.
FAQ
What is the exact overvoltage protection threshold of the BQ294701DSGT?
The BQ294701DSGT has a factory-programmed overvoltage protection threshold of 4.250 V ±10 mV at 25°C, with ±54 mV drift across the full –40°C to +110°C operating range. This value is laser-trimmed during manufacturing and cannot be adjusted externally - it is fixed for this specific orderable part number.
Does the BQ294701DSGT support 2-cell and 3-cell battery configurations?
Yes, the BQ294701DSGT supports 2-series, 3-series, and 4-series Li-ion configurations. For 2S operation, pins V3 and V4 must be shorted to V2; for 3S, V4 is shorted to V3. The internal sensing architecture automatically adapts, monitoring only the connected cell voltages without configuration registers or firmware.
How does the CD pin fault detection work on the BQ294701DSGT?
The BQ294701DSGT continuously monitors the CD pin for valid capacitor charging behavior. If the external capacitor is open-circuited (no voltage rise) or shorted to VSS (no discharge), the timeout detection circuit forces the OUT pin active within milliseconds - ensuring reliable fault signaling even if the delay capacitor fails, a critical safety feature for battery protection.
What is the purpose of the Customer Test Mode in the BQ294701DSGT?
The Customer Test Mode reduces the overvoltage delay from 1–2 s to ≤170 ms by grounding the CD pin, enabling rapid functional verification during production-line testing. This mode preserves full electrical behavior - including OVP accuracy and output drive strength - while accelerating QA without compromising safety validation.
Can the BQ294701DSGT drive a MOSFET gate directly without external components?
Yes, the BQ294701DSGT's CMOS active-high OUT pin can directly drive the gate of an NMOS FET (e.g., for fuse control) with no external pull-up required. It sources up to 4.5 mA when active and maintains <400 mV low-state voltage when inactive, meeting standard logic-level gate drive requirements for common low-RDS(on) discrete MOSFETs.
BQ294701DSGT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 8-WFDFN Exposed Pad
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Function:
- Battery Protection
- Battery Chemistry:
- Lithium Ion
- Number of Cells:
- 2 ~ 4
- Fault Protection:
- Over Voltage
- Interface:
- -
- Operating Temperature:
- -40°C ~ 110°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 8-WSON (2x2)
BQ294701DSGT FAQ
1.How can I place an order for BQ294701DSGT through Aetrix?
Please submit a Request for Quotation (RFQ) for BQ294701DSGT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for BQ294701DSGT reliable?
The price and inventory of BQ294701DSGT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for BQ294701DSGT is usually 5 days.
3.What payment methods are accepted for BQ294701DSGT?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for BQ294701DSGT transactions.
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4.How is shipping managed for BQ294701DSGT?
BQ294701DSGT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your BQ294701DSGT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for BQ294701DSGT?
For technical support, including BQ294701DSGT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your BQ294701DSGT requirements.
6.How does Aetrix verify that BQ294701DSGT is sourced from the original manufacturer or authorized distributors?
All BQ294701DSGT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that BQ294701DSGT meets industry standards.
7.What is the process for return or replacement of BQ294701DSGT?
All BQ294701DSGT units undergo pre-shipment inspection (PSI). If there is an issue with BQ294701DSGT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The BQ294701DSGT part is unused and in its original packaging.
Return procedure for BQ294701DSGT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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