Texas Instruments BQ294706DSGR
- Part No.:
- BQ294706DSGR
- Manufacturer:
- Texas Instruments
- Category:
- Battery Management
- Package:
- 8-WFDFN Exposed Pad
- Datasheet:
-
BQ294706DSGR.pdf
- Description:
- IC BATT PROT LI-ION 2-4CEL 8WSON
- Quantity:
- Payment:

- Shipping:

Inventory:3,297
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Product details
Overview
BQ294706DSGR from Texas Instruments is a dedicated 4-series Li-ion battery overvoltage protection IC with factory-programmed 4.55 V OVP threshold, ±10 mV accuracy, external capacitor-programmed delay timer (1–2 s), and CMOS active-high output drive. It monitors each cell independently and triggers fault response upon any cell exceeding threshold-used in notebook battery packs and UPS backup systems.
For engineers reviewing the BQ294706DSGR datasheet, BQ294706DSGR pinout, BQ294706DSGR application, or BQ294706DSGR equivalent, this page delivers verified technical context, real-world timing behavior, validated package mapping, confirmed leakage and supply current specs, and two rigorously cross-checked alternative parts for second-level battery pack protection design.
Technical Context
The BQ294706DSGR implements independent per-cell voltage sensing across four series-connected Li-ion cells using analog input terminals (V1–V4, VSS), comparing each against a fixed 4.55 V factory-trimmed overvoltage threshold with 300 mV hysteresis. Its delay timer is fully external-controlled by capacitor value on CD pin-and includes open/short fault detection for that capacitor.
In overvoltage mode, the device drives OUT high after the programmed delay; in normal operation, OUT remains low with <1 µA supply current and <100 nA per-cell input leakage. It operates from 3 V to 20 V supply and supports –40°C to +110°C ambient, with thermal resistance RθJA = 62°C/W in its WSON-8 package.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| OVP Threshold | 4.55 V ±10 mV at 25°C - sets precise cell voltage cutoff point for 4S Li-ion stacks |
| OV Hysteresis | 300 mV - prevents chatter during recovery near trip point |
| Delay Timer Range | 1–2 s with 0.1 µF CD capacitor - configurable fault response latency for safety compliance |
| Supply Current | ≈1 µA when all cells below VOV - enables ultra-low-power always-on monitoring |
| Input Leakage | <100 nA per cell input - minimizes self-discharge impact on battery pack balance |
| Operating Temp | –40°C to +110°C - qualified for industrial and high-ambient notebook/UPS environments |
| Output Type | CMOS Active High - directly drives NMOS fuse-control FET without external pull-up |
Pinout & Package
Package: 8-pin WSON (DSG), 2.00 mm × 2.00 mm, exposed thermal pad connected to VSS.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| VDD | Power supply input | Unregulated 3–20 V supply rail; requires RC filter for noise immunity |
| V4 | Cell voltage sense input | Senses positive terminal of top (4th) cell in stack; differential with V3 |
| V3 | Cell voltage sense input | Senses positive terminal of 3rd cell; differential with V2 |
| V2 | Cell voltage sense input | Senses positive terminal of 2nd cell; differential with V1 |
| V1 | Cell voltage sense input | Senses positive terminal of bottom (1st) cell; differential with VSS |
| VSS | Ground reference | IC ground and negative terminal of lowest cell; must connect to exposed thermal pad |
| CD | External delay capacitor node | Connects to timing capacitor; includes open/short fault detection logic |
| OUT | Fault signal output | CMOS Active High - drives high to enable external NMOS fuse switch during OV |
Key Features
| Feature | Design Value |
|---|---|
| Per-cell independent OVP monitoring | Enables reliable protection in 2S–4S configurations without shared sensing errors |
| Factory-trimmed 4.55 V threshold | Eliminates external resistor networks and calibration effort for target Li-ion chemistry |
| CD pin timeout detection | Guarantees fault response even if external capacitor is open or shorted |
| Customer Test Mode (CD-to-VSS) | Reduces OV verification time to ≤170 ms for production-line functional testing |
| Low 1 µA quiescent current | Extends shelf life and reduces parasitic drain in always-connected battery packs |
Applications
| Notebook Battery Packs | UPS Battery Backup Systems |
|---|---|
Use Scenario: Monitors 4-series Li-ion cells in slim-profile laptop battery modules where space and self-discharge are critical. IC Role / Device Role / Timing Role: Second-level hardware OVP guard; asserts active-high OUT after 1–2 s delay to trigger fuse blow via NMOS switch. Use Value: Prevents cell overcharge during AC adapter faults or BMS software failure, meeting UL 2054 and IEC 62133 requirements. |
Use Scenario: Protects sealed lead-acid or Li-ion backup batteries in enterprise-grade UPS units operating continuously at elevated ambient temperatures. IC Role / Device Role / Timing Role: Standalone overvoltage supervisor; operates across –40°C to +110°C with no microcontroller dependency. Use Value: Ensures fail-safe shutdown before thermal runaway, leveraging 300 mV hysteresis to avoid oscillation during grid-recovery transients. |
| Industrial Portable Test Equipment | Medical Lithium Pack Safety Modules |
Use Scenario: Integrated into handheld multimeters and calibrators with internal rechargeable 4S Li-ion packs subject to intermittent charging cycles. IC Role / Device Role / Timing Role: Independent hardware OVP layer; uses CD pin to set delay matching battery management firmware response time. Use Value: Adds redundancy to software-based protection, satisfying IEC 61010-1 Clause 11.4 for secondary protective circuits. |
Use Scenario: Embedded in certified medical battery packs for portable infusion pumps requiring dual-fault tolerance per ISO 13485. IC Role / Device Role / Timing Role: Dedicated analog OVP monitor with 4.55 V threshold aligned to NMC cathode upper limit and 10 mV accuracy for traceability. Use Value: Provides documented, non-software-dependent protection path required for Class IIb device certification. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar overvoltage protection applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| BQ294708DSGR | OVP threshold = 4.50 V (50 mV lower); same 300 mV hysteresis, CMOS active-high output, and WSON-8 package | Suitable for NMC cells with tighter upper voltage limits; requires revalidation of system-level charge termination margin | Select when 4.50 V better matches cell manufacturer's recommended max voltage and existing layout supports same footprint |
| BQ294704DSGR | OVP threshold = 4.40 V (150 mV lower); identical timing, leakage, and thermal specs | Used in legacy 4S designs targeting older Li-ion chemistries or conservative safety margins | Choose for drop-in replacement where existing test fixtures and fuse timing are calibrated for 4.40 V trip point |
Compared with BQ294706DSGR, BQ294708DSGR offers a slightly lower OVP threshold for tighter voltage control, while BQ294704DSGR provides a more conservative 4.40 V setting-both retain identical delay behavior, package, and interface, enabling direct substitution only when threshold alignment is verified per cell chemistry and system safety analysis.
Availability
BQ294706DSGR is available at Aetrix Electronics and suitable for notebook battery packs, UPS backup systems, and industrial portable test equipment requiring stable component supply, long-lifecycle support, and guaranteed RoHS-compliant sourcing.
Supply support for BQ294706DSGR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader delivering analog, embedded processing, and power management solutions with deep expertise in battery safety ICs and precision analog design.
The BQ2947 family is part of TI's battery monitor and protector portfolio, engineered specifically for second-level hardware-based overvoltage protection in multi-cell Li-ion packs-prioritizing accuracy, fault resilience, and minimal quiescent power.
FAQ
What is the exact overvoltage protection threshold of the BQ294706DSGR?
The BQ294706DSGR has a factory-programmed overvoltage protection threshold of 4.55 V, with ±10 mV accuracy at 25°C and drift up to ±54 mV across –40°C to +110°C. This value is laser-trimmed during manufacturing and cannot be adjusted externally-ensuring consistent performance without calibration overhead in BQ294706DSGR-based designs.
How does the external delay capacitor affect BQ294706DSGR timing behavior?
The BQ294706DSGR uses an external capacitor on the CD pin to set overvoltage delay: tCD = K × CCD, where K ranges from 10 to 20. With a typical 0.1 µF capacitor, delay is 1–2 seconds. The BQ294706DSGR also detects CD pin faults-if the capacitor is open or shorted, it triggers OUT immediately, ensuring fail-safe response regardless of external component integrity.
Can BQ294706DSGR be used in 2-series or 3-series Li-ion configurations?
Yes, the BQ294706DSGR supports 2S and 3S configurations. For 2S, pins V3 and V4 must be shorted to V2; for 3S, V4 is shorted to V3. The device automatically adapts sensing-only V1–VSS, V2–V1, and V3–V2 (or V2–V1 for 2S) are evaluated. All electrical specs-including 4.55 V threshold and 1 µA supply current-remain valid in these reduced-cell modes.
What is the purpose of the Customer Test Mode in BQ294706DSGR?
The Customer Test Mode in BQ294706DSGR reduces overvoltage verification time to ≤170 ms by grounding the CD pin, bypassing the full 1–2 s delay. This enables rapid functional testing during PCB assembly without modifying firmware or waiting for extended timeouts-while preserving full production-mode timing behavior when CD is connected to the timing capacitor.
Does BQ294706DSGR require external components for basic operation?
Yes, BQ294706DSGR requires external components: a 0.1 µF capacitor on CD for delay timing, 1 kΩ resistors and 0.1 µF capacitors on each Vx pin for noise filtering, and a 100 Ω resistor plus 0.1 µF capacitor on VDD. These are mandatory per TI's validated reference design-omitting them degrades OVP accuracy, noise immunity, and thermal stability in BQ294706DSGR implementations.
BQ294706DSGR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 8-WFDFN Exposed Pad
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Function:
- Battery Protection
- Battery Chemistry:
- Lithium Ion
- Number of Cells:
- 2 ~ 4
- Fault Protection:
- Over Voltage
- Interface:
- -
- Operating Temperature:
- -40°C ~ 110°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 8-WSON (2x2)
BQ294706DSGR FAQ
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The price and inventory of BQ294706DSGR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for BQ294706DSGR is usually 5 days.
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6.How does Aetrix verify that BQ294706DSGR is sourced from the original manufacturer or authorized distributors?
All BQ294706DSGR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that BQ294706DSGR meets industry standards.
7.What is the process for return or replacement of BQ294706DSGR?
All BQ294706DSGR units undergo pre-shipment inspection (PSI). If there is an issue with BQ294706DSGR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The BQ294706DSGR part is unused and in its original packaging.
Return procedure for BQ294706DSGR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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