Texas Instruments BQ294711DSGT

Overview

BQ294711DSGT from Texas Instruments is a dedicated overvoltage protection IC for 2- to 4-series Li-ion battery packs, featuring factory-programmed 4.220 V OVP threshold, ±10 mV accuracy at 25°C, external capacitor-programmed delay timer (1–2 s with 0.1 µF), and CMOS active-high output drive. It operates across –40°C to +85°C and supports notebook and UPS battery backup systems.

For engineers reviewing the BQ294711DSGT datasheet, BQ294711DSGT pinout, BQ294711DSGT application, or BQ294711DSGT equivalent, key selection criteria include per-cell independent voltage monitoring, low 1 µA quiescent current under normal operation, <100 nA input leakage per cell, 8-pin WSON (2 mm × 2 mm) package, and integrated CD pin timeout detection for open/shorted capacitor fault coverage.

Technical Context

The BQ294711DSGT implements independent analog sensing on four differential cell inputs (V1–VSS, V2–V1, V3–V2, V4–V3) with factory-trimmed 4.220 V overvoltage threshold and 300 mV hysteresis. Its delay timer is controlled by external capacitor on CD pin, with built-in timeout detection that forces OUT activation if CD fails to charge or discharge properly.

In overvoltage mode, the device drives OUT high after the programmed delay; in customer test mode (CD shorted to VSS), delay reduces to ≤170 ms. The CMOS active-high output delivers 4.5 mA source current at VDD = 14.4 V and sinks up to 14 mA when pulled low via external resistor.

Key Specifications

Pinout & Package

Package: 8-pin WSON (DSG), 2.00 mm × 2.00 mm, exposed thermal pad (PowerPAD™) recommended to be connected to VSS on PCB.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar overvoltage protection applications.

Compared with BQ294711DSGT, BQ294701DSGT raises the overvoltage threshold by 30 mV for wider safety margin in aging cells, while BQ294702DSGT adds 80 mV headroom-both retain identical delay behavior, leakage, and footprint, enabling drop-in replacement where threshold adjustment suffices.

Availability

BQ294711DSGT is available at Aetrix Electronics and suitable for notebook battery packs, UPS battery backup systems, and industrial portable test equipment requiring stable component supply, long-lifecycle support, and RoHS-compliant packaging.

Supply support for BQ294711DSGT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor company delivering analog and embedded processing solutions, with leadership in power management, signal chain, and high-reliability IC design.

The BQ2947 family is part of TI's battery management portfolio, engineered specifically for second-level overvoltage protection in multi-cell Li-ion packs-prioritizing precision, fault resilience, and minimal board space.

FAQ

What is the exact overvoltage protection threshold for BQ294711DSGT?

The BQ294711DSGT has a factory-programmed overvoltage protection threshold of 4.220 V, with ±10 mV accuracy at 25°C and ±54 mV variation across –40°C to +110°C. This value is fixed and cannot be adjusted externally; it is specified in TI's SLUSB15K datasheet Table 6-5 under "BQ294711, RIN = 1kΩ". The BQ294711DSGT uses this precise threshold to trigger protection without requiring external resistor networks.

Does BQ294711DSGT support 2-cell and 3-cell battery configurations?

Yes, the BQ294711DSGT supports 2-series, 3-series, and 4-series Li-ion configurations. For 2S operation, V3 and V4 pins are shorted to V2; for 3S, V4 is shorted to V3 - both methods are documented in Figure 8-2 and Figure 8-3 of the datasheet. All configurations retain full per-cell monitoring capability on the active inputs, and the BQ294711DSGT maintains its 4.220 V OVP threshold regardless of stack size.

How does the CD pin fault detection work on BQ294711DSGT?

The BQ294711DSGT monitors the CD pin for proper charge/discharge behavior during overvoltage events. If the external capacitor is open-circuited (no voltage rise) or shorted to VSS (no discharge), the internal timeout circuit detects the anomaly within milliseconds and forces the OUT pin active - ensuring protection activates even with faulty timing components. This behavior is explicitly verified in the "CD pin mechanism" section (Figure 7-2) and confirmed in the "Feature Description" of the BQ294711DSGT datasheet.

What is the recommended external capacitor value for the CD pin on BQ294711DSGT?

The typical external capacitor value for the CD pin on BQ294711DSGT is 0.1 µF, yielding a delay time of 1–2 seconds as calculated by t_CD = K × C_CD, where K = 10–20. This value is validated in the "Delay Timer" table (t_CD = 1–2 s) and shown in Figure 8-1 schematic. Capacitor tolerance directly impacts delay range, so X7R or C0G dielectrics are recommended; the BQ294711DSGT datasheet specifies CCD = 0.1 µF as the nominal design point.

Can BQ294711DSGT be used with an open-drain output configuration?

No - the BQ294711DSGT is exclusively configured as CMOS active-high output. The "Device Comparison Table" (Section 4) confirms BQ294711 has "CMOS Active High" output drive, unlike BQ294707 which specifies "NCH Open Drain Active Low". Attempting to use BQ294711DSGT in open-drain mode would result in incorrect logic levels and potential system malfunction; the correct alternative for open-drain functionality is BQ294707DSGT.