Texas Instruments BQ294712DSGT

Overview

BQ294712DSGT from Texas Instruments is a dedicated 4-series Li-ion battery overvoltage protection IC with factory-programmed 4.125 V OVP threshold, ±10 mV accuracy, external capacitor-programmable delay timer (1–2 s), and CMOS active-high output drive. It monitors each cell independently and triggers fault response upon any cell exceeding threshold-used in notebook battery packs and UPS backup systems.

For engineers reviewing the BQ294712DSGT datasheet, BQ294712DSGT pinout, BQ294712DSGT application, or BQ294712DSGT equivalent, key selection considerations include its 4.125 V fixed OVP point, 8-pin WSON package, 1 µA quiescent current, <100 nA per-cell leakage, and support for 2S–4S configurations with independent cell sensing and open-circuit/short-circuit detection on the CD pin.

Technical Context

The BQ294712DSGT implements second-level overvoltage protection using independent analog comparators per cell input (V1–VSS to V4–V3), with factory-trimmed 4.125 V threshold and 300 mV hysteresis. Its delay timer relies on external capacitor discharge via a precision current source on the CD pin, enabling configurable 1–2 s fault response while detecting CD pin faults (open/short).

It operates across –40°C to +85°C, accepts 3–20 V unregulated VDD supply, and delivers CMOS active-high output capable of sourcing 4.5 mA during overvoltage. Input leakage remains below 100 nA per sense pin, and total supply current stays ≈1 µA when all cells are below threshold.

Key Specifications

Pinout & Package

Package: 8-pin WSON (DSG), 2.00 mm × 2.00 mm, exposed thermal pad (PowerPAD™) recommended to be connected to VSS.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar overvoltage protection applications.

Compared with BQ294712DSGT, BQ294701DSGT raises the OVP threshold by 125 mV for broader compatibility with conventional Li-ion, while BQ294708DSGT increases it by 375 mV to accommodate high-voltage cathodes-both retain identical timing, leakage, and thermal performance but require revalidation of fault response timing against pack-specific fuse characteristics.

Availability

BQ294712DSGT is available at Aetrix Electronics and suitable for notebook battery packs, UPS backup modules, and portable medical devices requiring stable component supply, long-term lifecycle assurance, and RoHS-compliant WSON packaging.

Supply support for BQ294712DSGT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader delivering analog and embedded processing solutions, with deep expertise in power management and battery protection ICs.

The BQ2947 family was designed specifically for second-level overvoltage protection in multi-cell Li-ion battery packs-emphasizing accuracy, low power, fault resilience, and seamless integration into safety-critical portable energy systems.

FAQ

What is the exact overvoltage protection threshold of the BQ294712DSGT?

The BQ294712DSGT has a factory-programmed overvoltage protection threshold of 4.125 V, with ±10 mV accuracy at 25°C and ±54 mV maximum drift across –40°C to +110°C. This value is laser-trimmed during manufacturing and cannot be adjusted externally-ensuring consistent trip behavior across production lots and temperature ranges for the BQ294712DSGT.

Does the BQ294712DSGT support 2-cell or 3-cell battery configurations?

Yes, the BQ294712DSGT supports 2S, 3S, and 4S Li-ion configurations. For 2S operation, V3 and V4 pins are shorted to V2; for 3S, V4 is shorted to V3. The device monitors only the connected differential voltages (e.g., V1–VSS, V2–V1, etc.) and ignores unused upper sense inputs-making the BQ294712DSGT flexible across multiple pack architectures without redesign.

How does the CD pin fault detection work on the BQ294712DSGT?

The BQ294712DSGT continuously monitors the CD pin for valid charging/discharging behavior during overvoltage events. If the external capacitor is open-circuited (no voltage rise) or shorted to VSS (no discharge phase), the internal timeout circuit detects the anomaly within milliseconds and forces the OUT pin active-ensuring fail-safe response even with defective timing components. This behavior is intrinsic to the BQ294712DSGT and requires no external logic.

What is the purpose of the customer test mode in the BQ294712DSGT?

The customer test mode in the BQ294712DSGT reduces the overvoltage delay time from 1–2 s to ≤170 ms by grounding the CD pin, enabling rapid functional verification during production testing. This mode maintains full electrical accuracy and fault coverage while cutting test cycle time-critical for high-volume battery pack manufacturing where the BQ294712DSGT serves as a final safety gate.

Can the BQ294712DSGT be used with an open-drain output configuration?

No-the BQ294712DSGT is specified exclusively with CMOS active-high output drive. Open-drain active-low variants exist in the BQ2947 family (e.g., BQ294707DSGT), but the BQ294712DSGT part number denotes the active-high version. Attempting to configure it as open-drain would violate its electrical specifications and compromise fault signaling integrity in safety-critical applications.