Texas Instruments BQ4014MB-120
- Part No.:
- BQ4014MB-120
- Manufacturer:
- Texas Instruments
- Category:
- Memory
- Package:
- 32-DIP Module (0.61", 15.49mm)
- Datasheet:
-
BQ4014MB-120.pdf
- Description:
- IC NVSRAM 2MBIT PAR 32DIP MODULE
- Quantity:
- Payment:

- Shipping:

Inventory:2,541
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
BQ4014MB-120 from Texas Instruments is a 256K × 8 nonvolatile static RAM (NVSRAM) with integrated lithium backup, 120 ns access time, 5% supply tolerance, and industry-standard 32-pin DIP module packaging. It operates as a standard SRAM under valid 5 V power and automatically switches to battery-backed retention during power loss-used in industrial control data logging where persistent memory without write endurance limits is required.
For engineers reviewing the BQ4014MB-120 datasheet, BQ4014MB-120 pinout, BQ4014MB-120 application, or BQ4014MB-120 equivalent, key selection criteria include power-fail detection threshold (4.62 V), 10-year data retention, write-protection timing (tWPT = 150 µs max), and compatibility with conventional 2 Mb SRAM interfaces in legacy systems.
Technical Context
The BQ4014MB-120 integrates CMOS SRAM with on-board lithium coin cells and real-time power-fail monitoring circuitry. It continuously monitors VCC against VPFD = 4.62 V (typical) and initiates automatic write-protection and backup power switchover when voltage drops below that threshold.
During power-up, it enforces a 120 ms chip-enable recovery window (tCER) before allowing writes, ensuring processor stabilization. The device uses no external components, maintains high-impedance I/O during protection mode, and supports unlimited write cycles while preserving data for ≥10 years without system power.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory organization | 262,144 words × 8 bits (2,097,152-bit total) |
| Access time | 120 ns - defines minimum cycle time for reliable read/write in 5 V systems |
| Power-fail detect voltage (VPFD) | 4.62 V (typical) - triggers write-protection before VCC drops to unreliable levels |
| Data retention | ≥10 years without power - enabled by isolated lithium cells activated after first VCC application |
| Supply voltage range | 4.5 V to 5.5 V - compliant with standard 5 V TTL/CMOS logic rails |
| Standby current (ISB1) | 5–12 mA - measured with CE = VIH; reflects active standby draw, not ultra-low-power mode |
| Write-protect delay (tWPT) | 150 µs max - ensures ongoing memory cycles complete before protection engages |
Pinout & Package
Package: 32-pin plastic dual-in-line module (MB type), 0.600" width, through-hole mounting. Dimensions conform to MPDI062 mechanical drawing.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A17 | Address inputs | 18-bit address bus supporting full 256K-word addressing |
| DQ0–DQ7 | Data input/output | 8-bit bidirectional data path; high-impedance during write-protection |
| CE | Chip enable input | Active-low global enable; controls device selection and write-protection recovery timing |
| OE | Output enable input | Active-low control for output drivers; high-Z when deasserted |
| WE | Write enable input | Active-low signal enabling write cycles; ignored during power-fail protection |
| VCC | +5 V supply input | Main power rail; monitored for VPFD threshold crossing |
| VSS | Ground | Reference return for all digital and analog circuitry |
| NC | No connect | Unbonded pin; must remain unconnected per design |
Key Features
| Feature | Design Value |
|---|---|
| Automatic write-protection | Engages within 150 µs of VCC falling below 4.62 V, preventing corruption during brownout |
| Integrated lithium backup | Electrically isolated until first VCC application; enables >10-year data retention without external batteries |
| Industry-standard pinout | 32-pin 256K × 8 layout compatible with existing 2 Mb SRAM sockets and PCB footprints |
| Unlimited write cycles | Retains SRAM-level endurance-no wear-out mechanism unlike EEPROM or Flash |
| No external support circuitry | Self-contained power monitoring, switchover, and protection logic eliminates discrete supervisor ICs |
Applications
| Industrial PLC Data Logging | Medical Device Configuration Storage |
|---|---|
|
Use Scenario: Storing runtime parameters and alarm history in programmable logic controllers during mains interruption. IC Role / Device Role / Timing Role: Nonvolatile memory buffer retaining critical state data across unexpected AC loss. Use Value: Eliminates need for external battery holders or EEPROM wear-leveling firmware; survives >10,000 power cycles with zero data loss. |
Use Scenario: Holding calibration coefficients and user preferences in portable diagnostic equipment between battery swaps. IC Role / Device Role / Timing Role: Power-fail-resilient configuration store ensuring FDA-compliant traceability without volatile refresh. Use Value: Guarantees 10-year data integrity without periodic rewrites or checksum validation overhead. |
| Telecom Base Station Alarms | Avionics Black Box Memory |
|
Use Scenario: Capturing fault codes and event timestamps in remote radio units subject to grid instability. IC Role / Device Role / Timing Role: Fail-safe memory capturing last-valid operational snapshot prior to shutdown. Use Value: Meets GR-63-CORE environmental survivability with deterministic tWPT ≤ 150 µs and VPFD = 4.62 V. |
Use Scenario: Recording flight-critical sensor data in aircraft maintenance recorders during transient power faults. IC Role / Device Role / Timing Role: High-reliability NVSRAM providing deterministic write-protection and retention under MIL-STD-704 voltage sags. Use Value: Delivers certified 10-year retention without thermal derating or humidity-controlled enclosures. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar nonvolatile SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| BQ4014YMB-120 | Lower VPFD threshold (4.37 V); designed for 10% supply tolerance systems | Suitable for wider-input-range industrial supplies but less robust against 5% nominal rail droop | Select only if system VCC can dip to 4.37 V without functional failure |
| DS1248-120+ (Maxim Integrated) | Same 120 ns speed, 256K × 8, but uses external battery and requires external write-protect logic | Requires PCB space for backup battery and discrete supervisor; higher BOM count | Prefer BQ4014MB-120 when minimizing component count and board area is critical |
Compared with BQ4014YMB-120 and DS1248-120+, the BQ4014MB-120 offers tighter VPFD matching for 5%-tolerant 5 V rails and eliminates external battery routing-reducing layout complexity and field failure modes associated with connectorized backup power.
Availability
BQ4014MB-120 is available at Aetrix Electronics and suitable for industrial control data logging, medical device configuration storage, telecom alarm capture, and avionics black box memory requiring stable component supply across long-lifecycle programs.
Supply support for BQ4014MB-120 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor company delivering analog and embedded processing solutions, with leadership in power management, signal chain, and microcontrollers.
The BQ4014MB-120 belongs to TI's legacy nonvolatile SRAM product line, engineered specifically for mission-critical data retention in industrial, medical, and telecom infrastructure where EEPROM endurance or Flash latency are unacceptable.
FAQ
What is the guaranteed data retention period for BQ4014MB-120 without system power?
The BQ4014MB-120 guarantees ≥10 years of data retention in the absence of VCC, measured from the first application of power. This is achieved using electrically isolated lithium coin cells that activate only after initial VCC application, limiting self-discharge to ~0.5% per year in storage.
Does BQ4014MB-120 require external circuitry to function as a nonvolatile SRAM?
No. The BQ4014MB-120 integrates all necessary power-fail detection, write-protection logic, and lithium backup switching circuitry. It requires only a single +5 V supply and standard SRAM control signals-no external supervisors, batteries, or diodes are needed for full nonvolatile operation.
What is the power-fail detect voltage (VPFD) for BQ4014MB-120, and how does it affect system design?
The BQ4014MB-120 has a VPFD of 4.62 V (typical), optimized for systems with ±5% 5 V supply tolerance. Designers must ensure their power supply remains above this threshold during normal operation; crossing below it initiates automatic write-protection and backup switchover within 150 µs.
How does BQ4014MB-120 handle write operations during power-up?
After VCC rises above VPFD, the BQ4014MB-120 enforces a 120 ms chip-enable recovery window (tCER). During this period, the device remains write-protected-even if CE, WE, and OE are asserted-to allow host processor stabilization before resuming normal SRAM operation.
Is BQ4014MB-120 pin-compatible with standard 256K × 8 SRAMs?
Yes. The BQ4014MB-120 uses the industry-standard 32-pin 256K × 8 pinout, including identical A0–A17, DQ0–DQ7, CE, OE, WE, VCC, and VSS assignments. It replaces conventional SRAMs in existing sockets without PCB modification, provided the system accommodates its 120 ns timing and 5 V supply requirements.
BQ4014MB-120 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 32-DIP Module (0.61", 15.49mm)
- Packaging:
- Tube
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Non-Volatile
- Memory Format:
- NVSRAM
- Technology:
- NVSRAM (Non-Volatile SRAM)
- Memory Size:
- 2Mbit
- Memory Organization:
- 256K x 8
- Memory Interface:
- Parallel
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- 120ns
- Access Time:
- 120 ns
- Voltage - Supply:
- 4.75V ~ 5.5V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Through Hole
- Supplier Device Package:
- 32-DIP Module (18.42x52.96)
BQ4014MB-120 FAQ
1.How can I place an order for BQ4014MB-120 through Aetrix?
Please submit a Request for Quotation (RFQ) for BQ4014MB-120 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for BQ4014MB-120 reliable?
The price and inventory of BQ4014MB-120 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for BQ4014MB-120 is usually 5 days.
3.What payment methods are accepted for BQ4014MB-120?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for BQ4014MB-120 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for BQ4014MB-120?
BQ4014MB-120 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your BQ4014MB-120 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for BQ4014MB-120?
For technical support, including BQ4014MB-120 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your BQ4014MB-120 requirements.
6.How does Aetrix verify that BQ4014MB-120 is sourced from the original manufacturer or authorized distributors?
All BQ4014MB-120 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that BQ4014MB-120 meets industry standards.
7.What is the process for return or replacement of BQ4014MB-120?
All BQ4014MB-120 units undergo pre-shipment inspection (PSI). If there is an issue with BQ4014MB-120, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The BQ4014MB-120 part is unused and in its original packaging.
Return procedure for BQ4014MB-120:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
BQ4014MB-120 Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…

