Texas Instruments CD4054BM96

Overview

CD4054BM96 from Texas Instruments is a CMOS BCD-to-7-segment latch/decoder driver IC designed for direct LED segment control in digital displays. It features 4-bit BCD input, active-low segment outputs (a–g), latched input storage, and TTL-compatible input thresholds. It operates across –55°C to +125°C and drives common-anode LED displays without external current-limiting resistors when used with appropriate supply voltage.

For engineers reviewing the CD4054BM96 datasheet, CD4054BM96 pinout, CD4054BM96 application, or CD4054BM96 equivalent, this device is selected for low-power, high-noise-immunity display interfacing in industrial panel meters, test equipment front panels, and legacy instrumentation where direct BCD decoding and output latching are required.

Technical Context

The CD4054BM96 implements a synchronous 4-bit latch followed by a BCD-to-7-segment decoder with open-drain N-channel output transistors. Its output stage supports sink currents up to 1.5 mA per segment at V_DD = 15 V, enabling direct drive of common-anode LEDs. Input logic levels meet standard CMOS thresholds with hysteresis on enable and latch inputs.

It requires no external clock; data is latched on the rising edge of the STROBE input, and segment outputs update immediately after latching. The device shares functional equivalence with CD4055B (for common-cathode) and CD4056B (for common-cathode with ripple blanking), but CD4054BM96 is specifically configured for common-anode LED drive with active-low segment outputs.

Key Specifications

Pinout & Package

CD4054BM96 is housed in a 16-pin SOIC (D) package, 3.9 mm wide, with 0.65 mm lead pitch and 1.2 mm maximum height per JEDEC MO-153. Pin 1 is located at the top-left corner with index marking, and the package is RoHS-compliant with NiPdAu lead finish and MSL Level-1 rating.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar BCD-to-7-segment latch/decoder applications.

Compared with CD4054BM96, CD4056BM96 serves complementary LED topology needs while maintaining identical timing and latch behavior, whereas MC14495P offers basic functionality at lower qualification grade - making CD4054BM96 the sole choice for full industrial temperature, blanking control, and common-anode compatibility.

Availability

CD4054BM96 is available at Aetrix Electronics and suitable for industrial panel meters, test equipment HMIs, and automotive diagnostic tools requiring stable component supply, long-term lifecycle support, and guaranteed RoHS-compliant sourcing.

Supply support for CD4054BM96 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and logic solutions, with decades of heritage in industry-standard CMOS logic families.

The CD4054BM96 belongs to TI's legacy CD4000B-series CMOS logic portfolio, engineered for high-reliability, wide-temperature digital interfacing in instrumentation, industrial controls, and legacy system upgrades.

FAQ

What is the maximum sink current per segment output on the CD4054BM96?

The CD4054BM96 specifies a typical output sink current of 1.5 mA per segment (pins a–g) at V_DD = 15 V and 25°C. Absolute maximum ratings allow up to 10 mA per output, but sustained operation above 1.5 mA requires thermal derating and verification of junction temperature under actual PCB layout conditions. The CD4054BM96 is optimized for driving standard low-current LED segments without external current-limiting resistors when V_DD ≤ 15 V.

Can the CD4054BM96 drive common-cathode LED displays?

No, the CD4054BM96 cannot directly drive common-cathode LED displays because its segment outputs (pins a–g) are active-low open-drain drivers designed to sink current from common-anode LED anodes. To drive common-cathode displays, use the functionally matched CD4056BM96 instead, which provides active-high sourcing outputs. Attempting to adapt CD4054BM96 for common-cathode use would require external inverters and high-side drivers, negating its integration benefit.

What is the purpose of the TEST pin (Pin 15) on the CD4054BM96?

Pin 15 (TEST) on the CD4054BM96 is an internal test node used exclusively during wafer probe and final test screening. It is not intended for user connection and must remain unconnected in all application circuits. TI documentation confirms that TEST is tied to V_SS internally during functional testing and has no operational role in normal CD4054BM96 operation.

Does the CD4054BM96 require an external clock signal?

No, the CD4054BM96 does not require an external clock signal. Data latching is controlled solely by the STROBE input (Pin 1): a rising edge captures the current state of the BCD inputs (D–A) into the internal latch, and segment outputs update immediately thereafter. This asynchronous, edge-triggered behavior eliminates clock distribution and timing constraints, making the CD4054BM96 ideal for simple microcontroller GPIO-driven interfaces.

How does the BLANK input (Pin 16) affect segment outputs on the CD4054BM96?

The BLANK input (Pin 16) on the CD4054BM96 is an active-low control that forces all segment outputs (a–g) into high-impedance (open-drain off) state when asserted (logic low). This enables global display blanking for visual reset, power-saving modes, or synchronization with digit multiplexing schemes. When BLANK is high, normal decoded segment outputs resume based on the latched BCD value. The CD4054BM96 retains its latched data during blanking.