Texas Instruments CD4511BEE4

Overview

CD4511BEE4 from Texas Instruments is a BCD-to-7-segment latch/decoder/driver IC designed for direct LED display control in digital instrumentation and panel meters. It features active-high Latch Enable, active-low Blanking and Lamp Test inputs, operates over –55°C to +125°C, supports 3V–18V V_DD, and drives common-cathode 7-segment displays with segment current up to 25 mA per output.

For engineers reviewing the CD4511BEE4 datasheet, CD4511BEE4 pinout, CD4511BEE4 application, or CD4511BEE4 equivalent, key selection considerations include its latch functionality for static display hold, TTL/CMOS-compatible BCD input interface, high-voltage open-drain segment outputs, and compatibility with multiplexed display systems using external timing control.

Technical Context

The CD4511BEE4 integrates a 4-bit BCD input latch, priority-encoded decoder logic, and seven high-voltage N-channel driver stages with internal pull-downs. Its Latch Enable (LE) input controls transparent latching of BCD data, while Blanking (BL) overrides all segment outputs to zero and Lamp Test (LT) forces all segments ON for continuity verification.

It implements CMOS-level input thresholds (V_IL ≤ 0.5 V_DD, V_IH ≥ 0.7 V_DD) and delivers rail-to-rail output swing under load, enabling direct drive of LEDs without external current-limiting resistors when used with appropriate series resistance on the common cathode path.

Key Specifications

Pinout & Package

CD4511BEE4 is supplied in a 16-lead plastic dual-in-line package (PDIP-N), 19.05 mm × 6.35 mm body, 2.54 mm lead pitch, through-hole mounting compatible with IPC-7351 SOIC-16 land pattern variants.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar BCD-to-7-segment latch/decoder applications.

Compared with MC14511B and CD4543BE, the CD4511BEE4 provides optimal balance of diagnostic capability (LT), industrial temperature range, and PDIP-E4 packaging for hand-soldered prototypes and legacy repair-without compromising on latch stability or segment drive strength.

Availability

CD4511BEE4 is available at Aetrix Electronics and suitable for digital panel meters, industrial control displays, benchtop power supplies, and test equipment front panels requiring stable component supply across long-lifecycle programs.

Supply support for CD4511BEE4 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and logic solutions, with over 90 years of innovation in industrial, automotive, and communications markets.

The CD4511BEE4 belongs to TI's CD4000-series CMOS logic family, engineered for high-noise-immunity, wide-voltage-operation digital interfacing in harsh environments-particularly for human-readable display subsystems.

FAQ

What is the primary function of the CD4511BEE4?

The CD4511BEE4 is a BCD-to-7-segment latch/decoder/driver IC that converts 4-bit binary-coded decimal inputs into active-low signals for driving common-cathode LED displays. It integrates latching, decoding, and high-current output stages in a single 16-pin PDIP package. The CD4511BEE4 supports real-time display hold via Latch Enable, blanking for intensity control, and lamp test for hardware diagnostics-all without external logic.

Does the CD4511BEE4 support common-anode LED displays?

No, the CD4511BEE4 is designed exclusively for common-cathode 7-segment displays. Its segment outputs are open-drain N-channel drivers that sink current to ground; they cannot source current required for common-anode configurations. For common-anode support, TI recommends the CD4543BE, which includes a phase-select input to invert output polarity. The CD4511BEE4's output architecture mandates external current-limiting resistors on the common cathode path or individual segments.

How does the Lamp Test (LT) input work on the CD4511BEE4?

The Lamp Test (LT) input on the CD4511BEE4 is an active-low control that forces all seven segment outputs (a–g) HIGH simultaneously, illuminating every segment of a connected common-cathode display. This occurs regardless of the BCD input state or latch condition, enabling rapid visual verification of LED continuity, wiring, and solder joints. When LT is HIGH, normal decoding resumes. The CD4511BEE4 requires no external components to execute this test-only a momentary pull-down of pin 7.

What is the maximum segment current rating for the CD4511BEE4?

The CD4511BEE4 specifies a maximum output sink current of 25 mA per segment (pins 9–15) under continuous DC conditions at V_DD = 15 V and T_A = 25°C. This rating assumes proper PCB copper area for thermal dissipation and use within the –55°C to +125°C operating range. Exceeding 25 mA risks output stage degradation; external current-limiting resistors must be sized accordingly-e.g., 470 Ω for ~21 mA at 12 V with 2 V LED forward drop. The CD4511BEE4 does not include internal current regulation.

Is the CD4511BEE4 pin-compatible with the MC14511B?

Yes, the CD4511BEE4 is functionally and pin-compatible with the MC14511B across all 16 pins, including identical BCD input mapping (A–D), control inputs (LE, BL, LT), segment outputs (a–g), and power terminals (V_DD, V_SS). Both devices share the same truth table, timing parameters, and electrical specifications. The CD4511BEE4 and MC14511B may be substituted in existing designs without layout changes-though users should verify packaging (PDIP-E4 vs. PDIP-N) and temperature screening requirements for their application.