Texas Instruments CD54HCT273F
- Part No.:
- CD54HCT273F
- Manufacturer:
- Texas Instruments
- Category:
- Flip Flops
- Package:
- 20-CDIP (0.300", 7.62mm)
- Datasheet:
-
CD54HCT273F.pdf
- Description:
- HIGH SPEED CMOS LOGIC OCTAL D-TY
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
CD54HCT273F from Texas Instruments is a high-speed CMOS octal D-type flip-flop with asynchronous active-low reset, designed for synchronous data latching in 8-bit bus systems. It operates at 4.5V–5.5V, features positive-edge clock triggering, supports –55°C to +125°C operation, and delivers 30 ns typical propagation delay (CL = 50 pF) with TTL-compatible inputs (VIH ≥ 2 V, VIL ≤ 0.8 V).
For engineers reviewing the CD54HCT273F datasheet, CD54HCT273F pinout, CD54HCT273F application, or CD54HCT273F equivalent, this device serves as a radiation-tolerant, military-grade register for data synchronization, bus isolation, and temporary 8-bit storage in avionics, test equipment, and ruggedized control systems where wide temperature range and LSTTL interoperability are critical.
Technical Context
The CD54HCT273F integrates eight identical D-type flip-flops sharing one common clock (CLK) and one active-low asynchronous clear (CLR), enabling simultaneous latching or resetting of all eight Q outputs. Its HCT logic family ensures direct compatibility with legacy LSTTL drivers while maintaining CMOS power efficiency.
Each flip-flop captures D-input data on the rising edge of CLK; CLR overrides clocking and forces all Q outputs low regardless of CLK state. Input leakage is ≤1 μA at VCC = 5.5 V, and output drive capability meets 4 mA sink/source under TTL loads - verified across –55°C to +125°C.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Logic Family | HCT - enables direct interface with LSTTL without level shifters |
| Supply Voltage | 4.5 V to 5.5 V - matches standard 5 V TTL systems with ±10% tolerance |
| Operating Temperature | –55°C to +125°C - qualified for military, aerospace, and industrial environments |
| Propagation Delay | 30 ns (typ), 45 ns (max) at VCC = 4.5 V, CL = 50 pF - supports ≤25 MHz clock rates |
| Input Thresholds | VIH(min) = 2.0 V, VIL(max) = 0.8 V - ensures reliable recognition of LSTTL logic levels |
| Output Drive | ±4 mA at VOH/VOL - sufficient to drive 10 LSTTL loads per output |
| Quiescent Current | ICC ≤ 160 μA at –55°C to +125°C - enables low-power operation in standby |
Pinout & Package
J-lead Ceramic Dual In-line Package (CDIP), 20-pin, 26.92 mm × 6.92 mm body size with hermetic seal - suitable for high-reliability, high-temperature, and radiation-prone applications.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1 | CLR | Asynchronous active-low reset - forces all Q outputs low independent of CLK |
| 2 | 1Q | Output for channel 1 - latched value of 1D on previous CLK rising edge |
| 3 | 1D | Data input for channel 1 - sampled on CLK rising edge if CLR is high |
| 4 | 2D | Data input for channel 2 - same timing behavior as 1D |
| 5 | 2Q | Output for channel 2 - complements 2D after CLK edge when CLR = high |
| 6 | 3Q | Output for channel 3 - synchronized to same CLK/CLR signals |
| 7 | 3D | Data input for channel 3 - part of shared 8-bit parallel data path |
| 8 | 4D | Data input for channel 4 - enables full byte-wide registration |
| 9 | 4Q | Output for channel 4 - maintains registered state until next CLK or CLR |
| 10 | GND | Ground reference - must be low-impedance return for all I/O and supply currents |
| 11 | CLK | Global clock input - rising-edge sensitive; triggers simultaneous update of all Q outputs |
| 12 | 5Q | Output for channel 5 - electrically isolated but functionally identical to other Q pins |
| 13 | 5D | Data input for channel 5 - no internal fanout limitation between D inputs |
| 14 | 6D | Data input for channel 6 - supports independent data per channel |
| 15 | 6Q | Output for channel 6 - retains state during CLK low or high phases |
| 16 | 7Q | Output for channel 7 - shares same timing margins as all Q outputs |
| 17 | 7D | Data input for channel 7 - routed with matched trace length for skew control |
| 18 | 8D | Data input for channel 8 - completes 8-bit parallel load capability |
| 19 | 8Q | Output for channel 8 - final bit of registered byte; used in bus hold or latch-back |
| 20 | VCC | Positive supply - requires local 0.1 μF ceramic bypass capacitor to GND |
Key Features
| Feature | Design Value |
|---|---|
| Asynchronous active-low reset | Enables immediate, clock-independent clearing of all eight registers - critical for system initialization and fault recovery |
| Positive-edge clock triggering | Ensures deterministic sampling of D inputs only at defined voltage threshold crossing - eliminates metastability risk from slow edges |
| TTL-compatible input thresholds | VIH(min) = 2.0 V and VIL(max) = 0.8 V guarantee interoperability with 74LS, 74ALS, and other bipolar TTL families without external biasing |
| Wide temperature operation | –55°C to +125°C rating validated per MIL-PRF-38535 - supports deployment in engine compartments, space payloads, and downhole tools |
| Low quiescent current | ICC ≤ 160 μA over full temperature range - reduces thermal load and extends battery life in always-on monitoring circuits |
Applications
| Avionics Data Acquisition | Industrial PLC I/O Module |
|---|---|
|
Use Scenario: Capturing analog-to-digital converter (ADC) output words in flight control sensor interfaces where timing jitter must be minimized and reset must occur instantly upon fault detection. IC Role / Device Role / Timing Role: Synchronizes 8-bit parallel ADC data to a centralized system clock while providing hard reset for safe state recovery. Use Value: Eliminates race conditions between sampling and processing; CLR allows deterministic zeroing of all channels before re-synchronization. |
Use Scenario: Isolating field-side digital inputs (e.g., limit switches, proximity sensors) from backplane logic in programmable logic controller racks operating in harsh factory environments. IC Role / Device Role / Timing Role: Acts as an input latch stage - holds sensor states stable during scan cycle execution and prevents spurious reads during bus arbitration. Use Value: Prevents misreads caused by signal bounce or noise transients; wide temperature range ensures reliability near motors and welders. |
| Test Equipment Pattern Generator | Ruggedized Communication Interface |
|
Use Scenario: Generating precise, repeatable 8-bit stimulus patterns for IC functional testing, requiring glitch-free transitions and deterministic reset between test vectors. IC Role / Device Role / Timing Role: Stores and outputs preloaded test data bits on each CLK edge; CLR resets pattern counter and clears outputs before new vector load. Use Value: Enables sub-45 ns timing resolution and eliminates setup/hold violations due to balanced propagation delays across all eight channels. |
Use Scenario: Buffering UART or SPI data lines in military radios exposed to extreme thermal cycling and ESD events. IC Role / Device Role / Timing Role: Provides level-shifted, noise-immune data staging between microcontroller peripherals and external transceivers. Use Value: TTL-compatible inputs tolerate noisy RS-232/RS-485 receiver outputs; ceramic package resists moisture ingress and thermal shock. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar octal D-type flip-flop applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CD74HCT273M | SOIC-20 plastic package; rated for –55°C to +125°C but not MIL-qualified; lower cost, non-hermetic | Suitable for commercial/industrial designs where radiation hardness and hermeticity are not required | Select CD74HCT273M for cost-sensitive, non-military applications with standard PCB assembly processes |
| SN74HCT273N | PDIP-20 package; commercial temperature range only (0°C to +70°C); identical logic and AC specs | Limited to benign-environment lab equipment or consumer prototypes; not rated for extended temperature or reliability testing | Choose SN74HCT273N only for bench validation or low-risk development - not for production in demanding environments |
Compared with CD74HCT273M and SN74HCT273N, the CD54HCT273F provides guaranteed operation across –55°C to +125°C, hermetic J-package construction, and compliance with MIL-PRF-38535 screening - making it the sole option for flight-critical, downhole, or long-life embedded systems where reliability cannot be compromised.
Availability
CD54HCT273F is available at Aetrix Electronics and suitable for avionics data acquisition, industrial PLC I/O modules, test equipment pattern generators, and ruggedized communication interfaces requiring stable component supply across extended temperature ranges and long product lifecycles.
Supply support for CD54HCT273F includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and high-reliability logic solutions, with decades of heritage in military and aerospace component design.
The CD54HCT273F belongs to TI's CD54HCT logic family - engineered specifically for high-reliability applications demanding extended temperature operation, radiation tolerance, and MIL-qualified packaging.
FAQ
What is the maximum clock frequency supported by the CD54HCT273F?
The CD54HCT273F supports a maximum clock frequency of 25 MHz at 25°C, derating to 20 MHz over –40°C to +85°C and 16 MHz across its full –55°C to +125°C operating range. This is determined by the 45 ns maximum propagation delay (tPLH/tPHL) and minimum pulse width requirements for both CLK and CLR signals as specified in the official TI datasheet SCHS174D.
Does the CD54HCT273F require external pull-up or pull-down resistors on unused inputs?
Yes - all unused inputs on the CD54HCT273F, including D, CLK, and CLR, must be terminated to either VCC or GND to prevent floating states that cause excessive current draw, oscillation, or undefined output behavior. A 10 kΩ resistor is recommended for pull-up/pull-down; direct connection is acceptable if the input remains permanently inactive.
Can the CD54HCT273F drive standard LSTTL loads directly?
Yes - the CD54HCT273F is explicitly designed for direct LSTTL compatibility. Its VIH(min) = 2.0 V and VIL(max) = 0.8 V match LSTTL input thresholds, and its outputs deliver ±4 mA drive strength into TTL loads - sufficient to drive up to 10 LSTTL inputs per output without external buffers.
What package type does the CD54HCT273F use, and why is it significant?
The CD54HCT273F uses a 20-pin J-lead Ceramic Dual In-line Package (CDIP). This hermetically sealed ceramic package provides superior moisture resistance, thermal stability, and radiation hardness - essential for aerospace, defense, and downhole applications where plastic packages would fail under thermal cycling or ionizing radiation exposure.
How does the asynchronous CLR function interact with the clock signal in the CD54HCT273F?
The CLR input on the CD54HCT273F is asynchronous and active-low: when pulled low, it forces all eight Q outputs immediately to logic 0 - regardless of CLK state, edge, or timing. This override behavior occurs independently of clock edges and takes priority over data capture, enabling instantaneous system reset without waiting for the next clock cycle.
CD54HCT273F Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- 54HCT
- Package/Case:
- 20-CDIP (0.300", 7.62mm)
- Packaging:
- Tube
- Product Status:
- Active
- Function:
- Master Reset
- Type:
- D-Type
- Output Type:
- Non-Inverted
- Number of Elements:
- 1
- Number of Bits per Element:
- 8
- Clock Frequency:
- 50 MHz
- Max Propagation Delay @ V, Max CL:
- 30ns @ 4.5V, 50pF
- Trigger Type:
- Positive Edge
- Current - Output High, Low:
- 4mA, 4mA
- Voltage - Supply:
- 4.5V ~ 5.5V
- Current - Quiescent (Iq):
- 8 µA
- Input Capacitance:
- 10 pF
- Operating Temperature:
- -55°C ~ 125°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Through Hole
- Supplier Device Package:
- 20-CDIP
CD54HCT273F FAQ
1.How can I place an order for CD54HCT273F through Aetrix?
Please submit a Request for Quotation (RFQ) for CD54HCT273F on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CD54HCT273F reliable?
The price and inventory of CD54HCT273F are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CD54HCT273F is usually 5 days.
3.What payment methods are accepted for CD54HCT273F?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CD54HCT273F transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CD54HCT273F?
CD54HCT273F orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CD54HCT273F order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CD54HCT273F?
For technical support, including CD54HCT273F datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CD54HCT273F requirements.
6.How does Aetrix verify that CD54HCT273F is sourced from the original manufacturer or authorized distributors?
All CD54HCT273F products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CD54HCT273F meets industry standards.
7.What is the process for return or replacement of CD54HCT273F?
All CD54HCT273F units undergo pre-shipment inspection (PSI). If there is an issue with CD54HCT273F, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CD54HCT273F part is unused and in its original packaging.
Return procedure for CD54HCT273F:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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