Texas Instruments CD74HC4511PWR

Overview

CD74HC4511PWR from Texas Instruments is a BCD-to-7-segment latch/decoder/driver IC in 16-pin TSSOP package, operating from 2 V to 6 V. It features input latching, lamp-test and blanking control, high-output sourcing (10 mA at 6 V), and balanced propagation delays. It drives common-cathode 7-segment displays in digital instrumentation and industrial panel meters.

For engineers reviewing the CD74HC4511PWR datasheet, CD74HC4511PWR pinout, CD74HC4511PWR application, or CD74HC4511PWR equivalent, key selection considerations include its 2–6 V supply range, latch-enable timing (17 ns min pulse width at 6 V), output sourcing capability, TTL-compatible input thresholds, and TSSOP-16 thermal performance (R_θJA = 108 °C/W).

Technical Context

The CD74HC4511PWR implements a synchronous latch/decoder architecture with four BCD inputs (D0–D3), active-low blanking (BL), lamp-test (LT), and latch-enable (LE). When LE is high, BCD data is latched; when low, outputs follow inputs transparently. Its CMOS design ensures high noise immunity (NIL = 30% of V_CC at 5 V) and low static current (8 μA typical).

It delivers segment outputs with VOH ≥ 5.48 V (IOH = −5.2 mA, VCC = 6 V) and VOL ≤ 0.33 V (IOL = 5.2 mA), supporting direct drive of LEDs without external transistors in low-current applications. Propagation delay is 51 ns (max) from Dn to segment output at 6 V with 15 pF load.

Key Specifications

Pinout & Package

TSSOP-16 package (PW), body size 5.00 mm × 4.40 mm, 1.2 mm max height, moisture sensitivity level 1 (260 °C peak reflow), RoHS-compliant NiPdAu lead finish.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar BCD-to-7-segment driver applications.

Compared with CD74HCT4511E and SN74LS47N, the CD74HC4511PWR offers wider supply flexibility (2–6 V), lower quiescent current, higher output drive, and active-high segment outputs ideal for modern common-cathode LED displays - making it optimal for new designs prioritizing efficiency, integration, and supply scalability.

Availability

CD74HC4511PWR is available at Aetrix Electronics and suitable for digital instrumentation, industrial HMI panels, and embedded test equipment requiring stable component supply across extended temperature ranges (–55°C to +125°C) and long production lifecycles.

Supply support for CD74HC4511PWR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader delivering analog, embedded processing, and logic solutions for industrial, automotive, and communications markets.

The CD74HC4511PWR belongs to TI's HC logic family, designed specifically for low-power, high-noise-immunity BCD decoding and display driving in space-constrained, thermally demanding applications.

FAQ

What is the maximum output current per segment on the CD74HC4511PWR?

The CD74HC4511PWR can source up to 10 mA per segment output at V_CC = 6 V while maintaining VOH ≥ 5.48 V. At 4.5 V, it delivers 7.5 mA with VOH ≥ 3.98 V. These values are specified under DC conditions and assume proper PCB layout with adequate thermal dissipation. The CD74HC4511PWR must not exceed ±25 mA per pin or ±50 mA total device current as defined in absolute maximum ratings.

Does the CD74HC4511PWR support common-anode displays?

No, the CD74HC4511PWR is designed exclusively for common-cathode 7-segment displays. Its segment outputs (a–g) are active-high and source current. To drive common-anode displays, an external inverter or N-channel MOSFET stage would be required - which negates the integrated simplicity of the CD74HC4511PWR. For common-anode applications, consider the SN74LS47 or CD74HCT4543 instead.

How does the lamp-test (LT) function interact with blanking (BL) on the CD74HC4511PWR?

On the CD74HC4511PWR, lamp-test (LT) has priority over blanking (BL): when LT is low, all seven segments (a–g) are forced high regardless of BL state or BCD input. This allows full-display verification even when BL is asserted. BL only takes effect when LT is high, enabling independent control of diagnostic and operational blanking modes.

What is the minimum latch-enable (LE) pulse width required for reliable operation of the CD74HC4511PWR at 5 V?

At V_CC = 5 V, the CD74HC4511PWR requires a minimum LE high pulse width of 15 ns (typical) and 20 ns (max across –40°C to +85°C), per timing specifications. For robust design across temperature and voltage extremes, a 25 ns minimum pulse width is recommended. This ensures reliable capture of BCD inputs without metastability or partial latching.

Can unused inputs on the CD74HC4511PWR be left floating?

No - all unused inputs on the CD74HC4511PWR must be tied to either V_CC or GND. Floating CMOS inputs cause increased supply current, unpredictable logic states, and potential device malfunction due to intermediate voltage levels triggering both NMOS and PMOS transistors. TI explicitly recommends hard-wiring unused inputs to valid logic levels per application report SCBA004.