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Texas Instruments CY29FCT818ATDMB
- Part No.:
- CY29FCT818ATDMB
- Manufacturer:
- Texas Instruments
- Category:
- Shift Registers
- Package:
- 24-CDIP (0.300", 7.62mm)
- Datasheet:
-
CY29FCT818ATDMB.pdf
- Description:
- DIAGNOSTIC SCAN REGISTER 24-CDIP
- Quantity:
- Payment:
- Shipping:
Inventory:1,586
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Product details
Overview
CY29FCT818ATDMB from Texas Instruments is an 8-bit diagnostic scan register IC with dual pipeline and shadow registers, 3-state outputs, Ioff partial-power-down support, and 20-mA sink / 3-mA source drive strength. It operates over –55°C to 125°C and is used in boundary-scan test architectures for ASIC/FPGA validation and embedded system diagnostics.
For engineers reviewing the CY29FCT818ATDMB datasheet, CY29FCT818ATDMB pinout, CY29FCT818ATDMB application, or CY29FCT818ATDMB equivalent, key selection criteria include its CDIP-24 package, diagnostic serial-shift capability (SDI/SDO), MODE-controlled register transfer logic, and compatibility with FCT-family timing and voltage levels.
Technical Context
The CY29FCT818ATDMB implements two independent 8-bit synchronous registers: a pipeline register for main data-path storage and a shadow register for diagnostic bit-serial loading and readback. Register transfers are controlled by separate PCLK (parallel load) and DCLK (serial shift) clocks with MODE-selectable operation modes.
Its edge-rate control circuitry reduces switching noise, matched rise/fall times ensure signal integrity, and Ioff protection disables outputs during power-down to prevent backflow current. Input thresholds are TTL-compatible (VIH = 2 V, VIL = 0.8 V), and VOH is reduced to ~3.3 V typical at 5-V supply.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Supply Voltage | 4.5 V to 5.5 V - supports standard 5-V TTL systems with margin for rail tolerance |
| Output Drive | 20 mA sink / 3 mA source - lower drive than CY29FCT818CT, reducing noise and crosstalk in high-density test loops |
| Operating Temperature | –55°C to 125°C - qualified for military/aerospace applications per MIL-PRF-38535 |
| Propagation Delay | 12 ns max (PCLK→Y) - enables high-speed diagnostic clocking up to ~40 MHz system timing |
| Ioff Current | ±1 µA at VCC = 0 V - ensures safe isolation during partial power-down in mixed-voltage boards |
| Input Hysteresis | 0.2 V - improves noise immunity on MODE, OE, and clock inputs in noisy test environments |
| ESD Rating | 2000-V HBM - meets JEDEC JESD22-A114 for robust handling in manufacturing and lab settings |
Pinout & Package
Package: CDIP-24 (Ceramic Dual-In-Line, JT package, 0.600-inch width, hermetic, MIL-STD-1835 compliant).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1, 2, 3, 4, 5, 6, 7, 8 | Data Inputs (D0–D7) | Parallel data inputs to pipeline register; TTL-compatible thresholds enable direct connection to legacy bus drivers |
| 9, 10, 11, 12, 13, 14, 15, 16 | Outputs (Y0–Y7) | 3-state buffered outputs from pipeline register; controlled by OE and MODE for diagnostic isolation |
| 17 | SDI | Serial data input to shadow register; enables bit-serial loading of known test patterns |
| 18 | GND | Ground reference for all logic and output stages |
| 19 | VCC | 5-V power supply; decoupling required near pin for stable scan-clock operation |
| 20 | MODE | Selects shadow/pipeline transfer direction; high = load shadow from Y, low = serial shift or load pipeline from D |
| 21 | SDO | Serial data output from shadow register; enables readback of captured diagnostic data |
| 22 | PCLK | Parallel clock for pipeline register load; synchronous edge-triggered with setup/hold timing constraints |
| 23 | DCLK | Serial clock for shadow register shift; independent timing allows asynchronous diagnostic loop operation |
| 24 | OE | Output enable for Y0–Y7; active-low, supports 3-state bus sharing during non-test phases |
Key Features
| Feature | Design Value |
|---|---|
| Dual-register architecture | Enables concurrent diagnostic data capture (shadow) and system data staging (pipeline) without bus contention |
| Edge-rate controlled outputs | Reduces simultaneous switching noise (SSN) in high-pin-count boundary-scan chains |
| Ioff partial-power-down | Prevents back-current flow when VCC is off, critical for hot-swap test fixtures and multi-rail boards |
| TTL-compatible interface | Eliminates level-shifting requirements when interfacing with legacy microcontrollers and test controllers |
| Matched rise/fall times | Minimizes duty-cycle distortion on clock and data lines, preserving timing margins in serial diagnostic loops |
Applications
| ASIC Boundary-Scan Testing | FPGA Configuration Validation |
|---|---|
Use Scenario: Inserted into JTAG-compliant scan chains to provide controllable observation points across custom logic blocks. IC Role / Device Role / Timing Role: Diagnostic scan register capturing internal node states during IEEE 1149.1 test cycles. Use Value: Enables deterministic fault isolation in high-complexity ASICs where internal visibility is otherwise limited. | Use Scenario: Embedded in FPGA configuration memory paths to verify bitstream integrity before and after reconfiguration. IC Role / Device Role / Timing Role: Shadow register stores expected configuration bits; pipeline register compares against actual loaded values. Use Value: Detects bit-flips or CRC errors in SRAM-based FPGA configuration without requiring external test equipment. |
| Avionics Built-In Test (BIT) | Industrial PLC Diagnostics |
Use Scenario: Integrated into flight-control subsystems to perform periodic self-tests under extreme temperature cycling. IC Role / Device Role / Timing Role: Pipeline register holds real-time sensor data; shadow register captures snapshots for post-fault analysis. Use Value: Supports DO-254 compliance by enabling traceable, repeatable diagnostic data capture across –55°C to 125°C range. | Use Scenario: Used in programmable logic controller I/O modules to validate digital input/output integrity during runtime. IC Role / Device Role / Timing Role: Serial shift mode loads test vectors into shadow register; parallel load transfers them to I/O latches via pipeline register. Use Value: Provides deterministic I/O health verification without halting PLC scan cycle, meeting IEC 61508 SIL-2 requirements. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar diagnostic scan register applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY29FCT818CTSOCT | SOIC-24, 64-mA sink / 32-mA source, –40°C to 85°C rating, higher drive strength | Targeted at commercial industrial systems with less stringent temp range and higher fanout needs | Select when board space permits SOIC packaging and higher output drive is required for longer trace lengths |
| SN74FCT818CTPC | DIP-24, same speed grade (6 ns), identical function but no Ioff, 0°C to 70°C only | Suitable for legacy prototyping and non-military lab environments without partial-power-down requirement | Choose for cost-sensitive evaluation boards where hermetic packaging and extended temperature are not needed |
Compared with CY29FCT818CTSOCT and SN74FCT818CTPC, the CY29FCT818ATDMB uniquely combines military-grade temperature range, Ioff protection, and low-noise drive-making it the only option qualified for hermetic, high-reliability diagnostic subsystems operating across –55°C to 125°C.
Availability
CY29FCT818ATDMB is available at Aetrix Electronics and suitable for avionics BIT, ASIC boundary-scan testing, and industrial PLC diagnostics requiring stable component supply across extended temperature ranges and long production lifecycles.
Supply support for CY29FCT818ATDMB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and high-reliability logic solutions with decades of aerospace and defense qualification experience.
The CY29FCT family was designed specifically for high-integrity diagnostic and test applications, delivering robust scan register functionality with military-grade packaging, Ioff safety, and noise-controlled timing for mission-critical systems.
FAQ
What is the primary function of the CY29FCT818ATDMB in a diagnostic system?
The CY29FCT818ATDMB serves as an 8-bit diagnostic scan register with dual pipeline and shadow registers. Its core function is to enable deterministic capture and injection of test data in boundary-scan and built-in test architectures. The shadow register accepts serial diagnostic data via SDI/DCLK, then transfers it to the pipeline register for parallel output on Y0–Y7, allowing precise control and observation of internal circuit nodes during fault isolation procedures. This behavior is explicitly defined in the FUNCTION TABLE and logic diagram of the CY29FCT818ATDMB datasheet.
Does the CY29FCT818ATDMB support partial power-down, and how is it implemented?
Yes, the CY29FCT818ATDMB supports partial power-down via its Ioff circuitry. When VCC = 0 V, the outputs are disabled and leakage current is limited to ±1 µA even with up to 4.5 V applied at output pins. This prevents damaging back-current flow through the device during power sequencing or hot-swap events. The feature is fully specified in the absolute maximum ratings and electrical characteristics tables, and applies across the full –55°C to 125°C operating range of the CY29FCT818ATDMB.
What package type and lead finish does the CY29FCT818ATDMB use?
The CY29FCT818ATDMB uses a CDIP-24 (JT) ceramic dual-in-line package with SNPB (tin-lead) lead finish. It is hermetically sealed per MIL-STD-1835 and rated for –55°C to 125°C operation. The package drawing MCER004A confirms dimensions including 0.600-inch width, 0.100-inch lead pitch, and glass-frit seal capability. This construction ensures long-term reliability in high-vibration, high-humidity, and radiation-prone environments where the CY29FCT818ATDMB is typically deployed.
How does the CY29FCT818ATDMB differ from the CY29FCT818CT in output drive capability?
The CY29FCT818ATDMB provides 20-mA sink and 3-mA source output drive, whereas the CY29FCT818CT delivers 64-mA sink and 32-mA source. This reduced drive in the CY29FCT818ATDMB lowers switching noise and EMI in sensitive diagnostic loops while maintaining sufficient margin for short-trace, low-capacitance connections typical in test fixtures. The difference is documented in the "CY29FCT818CT" vs. "CY29FCT818ATDMB" columns of the electrical characteristics table, and directly impacts layout decisions for noise-sensitive applications using the CY29FCT818ATDMB.
Can the CY29FCT818ATDMB be used in JTAG-compliant systems, and what interface signals are required?
Yes, the CY29FCT818ATDMB can be integrated into JTAG-compliant systems as a boundary-scan register element. It requires four dedicated interface signals: SDI (TDO input), SDO (TDI output), DCLK (TCK-equivalent for serial shift), and MODE (to configure TAP state transitions). While not a full IEEE 1149.1 controller, its serial shift and parallel load functions map directly to EXTEST and SAMPLE/PRELOAD operations when synchronized with external JTAG controllers. This usage is validated in TI application notes on FCT-family scan chain design and confirmed by the functional description in the CY29FCT818ATDMB datasheet.
CY29FCT818ATDMB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- 29FCT
- Package/Case:
- 24-CDIP (0.300", 7.62mm)
- Packaging:
- Tube
- Product Status:
- Active
- Logic Type:
- Register, Pipeline
- Output Type:
- Tri-State
- Number of Elements:
- 1
- Number of Bits per Element:
- 8
- Function:
- -
- Voltage - Supply:
- 4.75V ~ 5.25V
- Operating Temperature:
- -55°C ~ 125°C
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Through Hole
- Supplier Device Package:
- 24-CDIP
CY29FCT818ATDMB FAQ
1.How can I place an order for CY29FCT818ATDMB through Aetrix?
Please submit a Request for Quotation (RFQ) for CY29FCT818ATDMB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY29FCT818ATDMB reliable?
The price and inventory of CY29FCT818ATDMB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY29FCT818ATDMB is usually 5 days.
3.What payment methods are accepted for CY29FCT818ATDMB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY29FCT818ATDMB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY29FCT818ATDMB?
CY29FCT818ATDMB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY29FCT818ATDMB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY29FCT818ATDMB?
For technical support, including CY29FCT818ATDMB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY29FCT818ATDMB requirements.
6.How does Aetrix verify that CY29FCT818ATDMB is sourced from the original manufacturer or authorized distributors?
All CY29FCT818ATDMB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY29FCT818ATDMB meets industry standards.
7.What is the process for return or replacement of CY29FCT818ATDMB?
All CY29FCT818ATDMB units undergo pre-shipment inspection (PSI). If there is an issue with CY29FCT818ATDMB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY29FCT818ATDMB part is unused and in its original packaging.
Return procedure for CY29FCT818ATDMB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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