Infineon Technologies CY62167G30-55ZXE
- Part No.:
- CY62167G30-55ZXE
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 48-TFSOP (0.724", 18.40mm Width)
- Datasheet:
-
CY62167G30-55ZXE.pdf
- Description:
- IC SRAM 16MBIT PARALLEL 48TSOP I
- Quantity:
- Payment:

- Shipping:

Inventory:4,770
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
CY62167G30-55ZXE from Cypress Semiconductor is an AEC-Q100 qualified automotive-grade 16-Mbit (1M × 16-bit) static RAM with embedded single-bit error-correcting code (ECC), operating at 55 ns access time, 2.2–3.6 V supply, and -40 °C to +125 °C temperature range. It delivers ultra-low standby current (5.5 µA typ), supports dual chip-enable architecture, and features byte power-down for dynamic power management in engine control units and ADAS modules.
For engineers reviewing the CY62167G30-55ZXE datasheet, CY62167G30-55ZXE pinout, CY62167G30-55ZXE application, or CY62167G30-55ZXE equivalent, key selection criteria include ECC-enabled data integrity, automotive temperature compliance, TSOP I / VFBGA package compatibility, and dual CE timing behavior under low-voltage retention (1.0 V).
Technical Context
The CY62167G30-55ZXE implements a CMOS MoBL SRAM core with dedicated ECC encode/decode logic that detects and corrects single-bit errors in real time without automatic write-back. Its dual chip-enable interface (CE1 LOW + CE2 HIGH) enables selective bank activation in multi-SRAM systems.
It supports two memory configurations: native 1M × 16-bit mode (BYTE tied to VCC) and reconfigurable 2M × 8-bit mode (BYTE tied to VSS) in the 48-pin TSOP I package. The Byte Power Down feature triggers standby when both BHE and BLE are deasserted - independent of CE state - enabling fine-grained power gating.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 16 Mbit (1,048,576 words × 16 bits); enables compact storage for firmware boot images and real-time sensor buffers. |
| Access Time | 55 ns max (Automotive-E grade); ensures deterministic timing for safety-critical read cycles in ECU applications. |
| Supply Voltage | 2.2 V to 3.6 V; compatible with modern automotive 3.3 V domains and brown-out tolerant down to 2.2 V. |
| Standby Current | 5.5 µA typical / 75 µA max at +125 °C; reduces quiescent power in always-on vehicle subsystems. |
| ECC Function | Single-bit error correction per 16-bit word; improves functional safety compliance without external logic overhead. |
| Data Retention | 1.0 V minimum VCC; maintains memory contents during deep sleep or battery brownout events. |
| Temperature Range | -40 °C to +125 °C (Automotive-E grade); validated for under-hood deployment per AEC-Q100 Rev G. |
Pinout & Package
Package: 48-ball Very Thin Fine-Pitch Ball Grid Array (VFBGA), 6 mm × 8 mm, 0.5 mm pitch, Pb-free, RoHS-compliant.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A19 | Address Inputs | 20-bit address bus supporting full 1M-word addressing; A16–A19 unused in 2M×8 mode. |
| I/O0–I/O15 | Bidirectional Data Bus | 16-bit parallel interface; I/O0–I/O7 controlled by BLE, I/O8–I/O15 by BHE for byte-select writes/reads. |
| CE1, CE2 | Dual Chip Enable | Active-Low CE1 and Active-High CE2 must both be asserted for device selection; enables hierarchical memory decoding. |
| WE | Write Enable | Active-Low signal initiating write cycle; timing synchronized with CE and byte enables per tSCE/tPWE specs. |
| OE | Output Enable | Active-Low control for output buffer enable; tDOE = 25 ns max ensures fast read response in interrupt-driven firmware. |
| BHE, BLE | Byte High/Low Enable | Independent 8-bit write masking; simultaneous deassertion forces automatic standby regardless of CE state. |
| VCC, VSS | Power Supply | Single 2.2–3.6 V supply; no separate I/O voltage required - simplifies PCB routing and power sequencing. |
Key Features
| Feature | Design Value |
|---|---|
| Embedded ECC | On-die single-bit error correction per 16-bit word eliminates need for external ECC logic or software overhead. |
| Byte Power Down | Automatic transition to standby when BHE and BLE are both inactive - reduces leakage without CPU intervention. |
| Dual Chip Enable | CE1/CE2 logic allows precise memory mapping in multi-chip systems and avoids partial decode glitches. |
| 1.0-V Data Retention | Maintains stored values during ultra-low-power states (e.g., ignition-off monitoring), extending battery life. |
| AEC-Q100 Qualified | Validated for Automotive-E grade (-40 °C to +125 °C), including HTOL, TC, and ESD testing per Rev G requirements. |
Applications
| Engine Control Unit (ECU) | Advanced Driver Assistance Systems (ADAS) |
|---|---|
|
Use Scenario: Storing real-time sensor fusion data and calibration tables during active engine operation and transient load conditions. IC Role / Device Role / Timing Role: Primary volatile working memory with ECC-protected storage for critical control variables and fault logs. Use Value: Prevents silent data corruption in combustion timing calculations, ensuring ASIL-B compliance without redundant memory checks. |
Use Scenario: Buffering high-speed camera frame metadata and radar pre-processing outputs in lane-departure warning modules. IC Role / Device Role / Timing Role: Low-latency scratchpad memory interfacing directly with MCU DMA engines via 16-bit bus. Use Value: 55 ns access time enables sub-millisecond response to object detection interrupts while maintaining data integrity across thermal cycling. |
| Infotainment Head Unit | Electric Vehicle Battery Management System (BMS) |
|
Use Scenario: Caching navigation map tiles and voice recognition grammar models during GPS signal loss or UI rendering bursts. IC Role / Device Role / Timing Role: High-bandwidth SRAM supplementing internal MCU RAM for deterministic UI responsiveness. Use Value: 2.2–3.6 V operation matches infotainment SoC I/O rails; 75 µA max ISB2 minimizes standby drain on 12 V auxiliary supply. |
Use Scenario: Holding cell voltage sampling history and state-of-charge (SoC) estimation coefficients during active balancing cycles. IC Role / Device Role / Timing Role: Fault-tolerant data buffer storing time-stamped measurements prior to CAN transmission. Use Value: ECC protection prevents corrupted SoC drift due to alpha particle strikes in high-voltage battery enclosures. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar automotive SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| IS61WV102416BLL-10MLI | No embedded ECC; 10 ns faster (10 ns access), but higher standby current (200 µA typ at +125 °C). | Lacks hardware-level error correction - requires software ECC or external logic for ASIL-B systems. | Select only if speed outweighs functional safety requirements and system-level ECC is already implemented. |
| MT28EW128ABA1HPC-0SIT | Quad SPI NOR Flash with ECC; non-volatile, slower random access (100+ ns effective), 1.7–2.0 V supply. | Used for code storage, not volatile working memory; unsuitable as direct SRAM replacement due to interface and latency mismatch. | Consider only for firmware storage consolidation - not for SRAM function replacement in real-time data paths. |
Compared with IS61WV102416BLL-10MLI and MT28EW128ABA1HPC-0SIT, the CY62167G30-55ZXE uniquely combines automotive-grade ECC, ultra-low standby power, and true SRAM timing - making it the sole choice for safety-critical volatile memory where bit-flip resilience and deterministic latency are mandatory.
Availability
CY62167G30-55ZXE is available at Aetrix Electronics and suitable for engine control units, ADAS domain controllers, and electric vehicle battery management systems requiring stable component supply across extended automotive temperature ranges and long production lifecycles.
Supply support for CY62167G30-55ZXE includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) designs high-reliability semiconductor solutions for automotive, industrial, and IoT applications, with expertise in memory, microcontrollers, and connectivity.
The CY62167G product line targets functional-safety-critical automotive electronics, delivering radiation-tolerant SRAMs with integrated ECC to meet ISO 26262 ASIL-B requirements without external circuitry.
FAQ
Does CY62167G30-55ZXE support automatic error correction during read operations?
Yes - the device performs real-time single-bit error correction on every read access using on-die ECC logic. Detected errors are corrected before data reaches the I/O pins, and no external intervention or software handling is required. However, it does not perform automatic write-back of corrected data to memory cells, as noted in the datasheet footnote.
Can CY62167G30-55ZXE operate in 2M × 8-bit configuration?
Yes - in the 48-pin TSOP I package only, tying the BYTE pin to VSS configures the device as a 2M × 8-bit SRAM. In this mode, A20 appears on pin 45, and BHE, BLE, and I/O8–I/O14 are unused. The 48-ball VFBGA package supports 1M × 16-bit mode only.
What is the significance of the "dual chip-enable" interface?
The dual CE interface (CE1 active-low + CE2 active-high) provides stricter decode control than single CE, reducing risk of partial activation during address bus glitches. It enables hierarchical memory mapping in multi-SRAM systems and supports synchronous deselection with precise timing margins defined in tHZCE and tLZCE parameters.
How does the Byte Power Down feature reduce system power consumption?
When both BHE and BLE are deasserted, the device enters standby mode regardless of CE1/CE2 state - allowing power gating even while other memory chips remain selected. This enables per-byte subsystem power control in multi-processor architectures, cutting leakage current to 5.5 µA typical without requiring CPU coordination.
CY62167G30-55ZXE Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- MOBL™
- Package/Case:
- 48-TFSOP (0.724", 18.40mm Width)
- Packaging:
- Tray
- Product Status:
- Last Time Buy
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Asynchronous
- Memory Size:
- 16Mbit
- Memory Organization:
- 2M x 8, 1M x 16
- Memory Interface:
- Parallel
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- 55ns
- Access Time:
- 55 ns
- Voltage - Supply:
- 2.2V ~ 3.6V
- Operating Temperature:
- -40°C ~ 125°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 48-TSOP I
CY62167G30-55ZXE FAQ
1.How can I place an order for CY62167G30-55ZXE through Aetrix?
Please submit a Request for Quotation (RFQ) for CY62167G30-55ZXE on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY62167G30-55ZXE reliable?
The price and inventory of CY62167G30-55ZXE are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY62167G30-55ZXE is usually 5 days.
3.What payment methods are accepted for CY62167G30-55ZXE?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY62167G30-55ZXE transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY62167G30-55ZXE?
CY62167G30-55ZXE orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY62167G30-55ZXE order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY62167G30-55ZXE?
For technical support, including CY62167G30-55ZXE datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY62167G30-55ZXE requirements.
6.How does Aetrix verify that CY62167G30-55ZXE is sourced from the original manufacturer or authorized distributors?
All CY62167G30-55ZXE products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY62167G30-55ZXE meets industry standards.
7.What is the process for return or replacement of CY62167G30-55ZXE?
All CY62167G30-55ZXE units undergo pre-shipment inspection (PSI). If there is an issue with CY62167G30-55ZXE, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY62167G30-55ZXE part is unused and in its original packaging.
Return procedure for CY62167G30-55ZXE:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY62167G30-55ZXE Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
LDO regulator guide covering low dropout voltage, power dissipation, thermal design, PSRR, output noise, capacitor stability, adjustable LDO circuits, LDO vs buck converter and datasheet selection chec…
Conditional Access Module guide covering CAM meaning, CI/CI+ interface, smart card authorization, DVB security workflow, TV and set-top box compatibility, internal electronics, ESD protection, connecto…
Guide to electronic component obsolescence covering EOL risk, PCN/PDN notices, last-time buy planning, replacement options, form-fit-function validation, counterfeit risk and BOM lifecycle management.

