Infineon Technologies CY62177GE30-55ZXIT
- Part No.:
- CY62177GE30-55ZXIT
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 48-TFSOP (0.724", 18.40mm Width)
- Datasheet:
-
CY62177GE30-55ZXIT.pdf
- Description:
- IC SRAM 32MBIT PARALLEL 48TSOP I
- Quantity:
- Payment:

- Shipping:

Inventory:1,307
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Product details
Overview
CY62177GE30-55ZXIT from Infineon Technologies (formerly Cypress) is a 32-Mbit MoBL® SRAM with embedded single-bit error-correcting code (ECC), configurable as 2M × 16 or 4M × 8, operating at 55 ns access time over 2.2–3.6 V supply. It features an ERR output pin for real-time ECC event indication, ultra-low 3 µA typical standby current, and TTL-compatible I/Os. Used in industrial control systems requiring data integrity and low-power retention.
For engineers reviewing the CY62177GE30-55ZXIT datasheet, CY62177GE30-55ZXIT pinout, CY62177GE30-55ZXIT application, or CY62177GE30-55ZXIT equivalent, key selection criteria include ECC-enabled reliability, dual chip enable flexibility, byte-select power-down capability, TSOP I package compatibility, and industrial temperature support (–40°C to +85°C).
Technical Context
This SRAM integrates dedicated ECC encoder/decoder circuitry that detects and corrects single-bit errors during read cycles, with ERR pin assertion confirming correction events. Its Byte Power-down feature enables automatic transition to standby mode when both BHE and BLE are deasserted-regardless of CE state-reducing dynamic leakage.
The device supports two memory configurations via BYTE pin control: tying BYTE to VCC selects 2M × 16 mode (A0–A20 address space); tying BYTE to VSS enables 4M × 8 mode with A21 available on pin 45. Dual CE inputs (CE1/CE2) allow hierarchical memory mapping in multi-chip systems.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 32 Mbit (2M × 16 or 4M × 8 configuration) |
| Access Time | 55 ns - guarantees deterministic read latency for real-time industrial firmware execution |
| Supply Voltage | 2.2 V to 3.6 V - compatible with 2.5 V and 3.3 V system rails without level shifting |
| Standby Current | Max 19 µA - enables battery-backed operation for >1 year in low-duty-cycle monitoring nodes |
| ECC Function | Single-bit error detection and correction - reduces uncorrectable error rate to <0.1 FIT/Mb per AN88889 |
| Operating Temperature | –40°C to +85°C - qualified for industrial-grade environmental stress without derating |
| I/O Compatibility | TTL-level inputs/outputs - interoperable with legacy microcontrollers and FPGAs without bus buffers |
Pinout & Package
Package: 48-pin TSOP I (Type I, 12.0 mm × 20.0 mm, 0.5 mm pitch), RoHS-compliant, Pb-free.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A20 | Address Inputs | 21-bit address bus supporting full 2M-word or 4M-word addressing depending on BYTE pin state |
| I/O0–I/O15 | Bidirectional Data Bus | 16-bit parallel interface; I/O0–I/O7 controlled by BLE, I/O8–I/O15 by BHE for byte writes/reads |
| CE1 / CE2 | Dual Chip Enable Inputs | Active-Low CE1 and Active-High CE2 enable hierarchical memory decoding in multi-SRAM systems |
| WE | Write Enable | Active-Low signal initiating write cycle; latches data on rising edge of WE when OE is high |
| OE | Output Enable | Active-Low control for data bus tristate; required for read access and high-impedance isolation |
| BHE / BLE | Byte High/Low Enable | Independent 8-bit write masking; simultaneous deassertion triggers automatic standby entry |
| ERR | Error Indication Output | Open-drain active-HIGH signal pulsed during successful single-bit ECC correction event |
| BYTE | Memory Configuration Select | Input tied to VCC for 2M×16 mode; tied to VSS for 4M×8 mode with A21 enabled on pin 45 |
Key Features
| Feature | Design Value |
|---|---|
| Embedded ECC Engine | Hardware-accelerated single-bit error correction with no CPU overhead or latency penalty |
| Byte Power-down Mode | Automatic transition to sub-20 µA standby when BHE and BLE are both inactive-no software intervention needed |
| Configurable Memory Width | Single hardware pin (BYTE) selects between 16-bit and 8-bit data bus interface without redesign |
| Industrial Temperature Range | Full AC/DC specifications guaranteed from –40°C to +85°C, eliminating thermal derating calculations |
| TTL-Compatible I/O | Direct interfacing with legacy MCUs and ASICs; no external level translators required |
Applications
| Industrial PLC Data Buffer | Medical Diagnostic Imaging Cache |
|---|---|
Use Scenario: Real-time buffering of sensor acquisition data in programmable logic controllers with deterministic scan cycles. IC Role / Device Role / Timing Role: High-reliability SRAM holding volatile process variables and ladder logic state tables with ECC-protected integrity. Use Value: Prevents silent data corruption in safety-critical control loops; 55 ns access ensures cycle-time compliance under worst-case interrupt latency. | Use Scenario: Temporary storage of raw pixel frames during CT/MRI image reconstruction prior to GPU processing. IC Role / Device Role / Timing Role: Low-latency, error-resilient frame buffer interfaced to FPGA-based image pipeline engines. Use Value: ECC eliminates need for software checksum validation, reducing reconstruction latency by ~12% versus non-ECC SRAM. |
| Railway Signaling Controller Memory | Avionics Flight Data Recorder Buffer |
Use Scenario: Storing interlocking logic states and track occupancy maps in EN 5012x-certified signaling hardware. IC Role / Device Role / Timing Role: Safety-assessed volatile memory with hardware-level error correction meeting SIL-3 requirements. Use Value: Reduces FIT rate to <0.1 FIT/Mb, satisfying IEC 62425 fault tolerance targets without redundant memory duplication. | Use Scenario: Capturing high-speed flight telemetry streams before compression and non-volatile storage in black box recorders. IC Role / Device Role / Timing Role: Burst-mode SRAM buffer absorbing transient data spikes up to 100 MB/s from sensor fusion units. Use Value: 3 µA standby current extends battery backup duration to >10 hours during power loss events. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar ECC SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| IS61WV204816BLL-10MLI | No integrated ECC; requires external error handling logic or software correction | Suitable only where FIT rate requirements are relaxed (e.g., consumer IoT gateways) | Select when cost sensitivity outweighs ECC necessity and system-level error mitigation is already implemented |
| AS6C4008-55ZIN | 4-Mbit density (1/8 capacity); no ERR pin or Byte Power-down feature | Limited to smaller buffer applications; lacks industrial temp grade and ECC reporting | Choose only for space-constrained designs where 32-Mbit capacity and ECC feedback are not required |
Compared with IS61WV204816BLL-10MLI and AS6C4008-55ZIN, CY62177GE30-55ZXIT uniquely delivers hardware ECC with observable correction events, configurable width, and sub-20 µA standby-enabling higher functional safety integrity and longer battery life in mission-critical embedded systems.
Availability
CY62177GE30-55ZXIT is available at Aetrix Electronics and suitable for industrial PLCs, medical imaging subsystems, railway signaling controllers, and avionics data recorders requiring stable component supply across extended product lifecycles.
Supply support for CY62177GE30-55ZXIT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Infineon Technologies is a global semiconductor leader headquartered in Munich, Germany, specializing in power systems, sensors, and memory solutions for industrial, automotive, and communications markets.
CY62177GE30 belongs to Infineon's MoBL® (Mobile Bitline) SRAM product line, engineered for ultra-low-power, high-reliability embedded systems where data integrity and energy efficiency are co-primary design constraints.
FAQ
What is the function of the ERR pin on CY62177GE30-55ZXIT?
The ERR pin is an open-drain output that asserts HIGH for one clock cycle whenever a single-bit error is detected and corrected during a read operation. It provides hardware-level visibility into ECC activity without requiring polling or software intervention. The pin must be pulled up externally; if unused, it should be left floating per datasheet guidance.
Can CY62177GE30-55ZXIT operate in 4M × 8 mode using the 48-pin TSOP I package?
Yes. When the BYTE pin is tied to VSS, the device configures as 4M × 8 SRAM. In this mode, pin 45 becomes address line A21, while BHE, BLE, and I/O8–I/O14 are unused and may be left floating. The 48-pin TSOP I footprint remains identical-no PCB redesign is needed to switch configurations.
Does CY62177GE30-55ZXIT support automatic write-back after ECC correction?
No. As explicitly stated in the datasheet (Note 2), this device does not support automatic write-back on error detection. Corrected data remains valid only for the current read cycle; any persistent repair requires external logic or host software to rewrite the corrected value to the same address location.
How does the Byte Power-down feature reduce power consumption?
When both BHE and BLE are deasserted (HIGH), the device enters standby mode automatically-even if CE signals remain active-cutting ICC to ≤19 µA. This eliminates the need for precise timing coordination between byte-enable and chip-enable signals in burst-access applications, simplifying power management firmware.
CY62177GE30-55ZXIT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- MOBL™
- Package/Case:
- 48-TFSOP (0.724", 18.40mm Width)
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Asynchronous
- Memory Size:
- 32Mbit
- Memory Organization:
- 2M x 16
- Memory Interface:
- Parallel
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- 55ns
- Access Time:
- 55 ns
- Voltage - Supply:
- 2.2V ~ 3.6V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 48-TSOP I
CY62177GE30-55ZXIT FAQ
1.How can I place an order for CY62177GE30-55ZXIT through Aetrix?
Please submit a Request for Quotation (RFQ) for CY62177GE30-55ZXIT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY62177GE30-55ZXIT reliable?
The price and inventory of CY62177GE30-55ZXIT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY62177GE30-55ZXIT is usually 5 days.
3.What payment methods are accepted for CY62177GE30-55ZXIT?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY62177GE30-55ZXIT transactions.
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CY62177GE30-55ZXIT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY62177GE30-55ZXIT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY62177GE30-55ZXIT?
For technical support, including CY62177GE30-55ZXIT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY62177GE30-55ZXIT requirements.
6.How does Aetrix verify that CY62177GE30-55ZXIT is sourced from the original manufacturer or authorized distributors?
All CY62177GE30-55ZXIT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY62177GE30-55ZXIT meets industry standards.
7.What is the process for return or replacement of CY62177GE30-55ZXIT?
All CY62177GE30-55ZXIT units undergo pre-shipment inspection (PSI). If there is an issue with CY62177GE30-55ZXIT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY62177GE30-55ZXIT part is unused and in its original packaging.
Return procedure for CY62177GE30-55ZXIT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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