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Infineon Technologies CY7C11651KV18-400BZC

Part No.:
CY7C11651KV18-400BZC
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C11651KV18-400BZC.pdf
Description:
IC SRAM 18MBIT PARALLEL 165FBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:1,185

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Product details

Overview

CY7C11651KV18 from Cypress Semiconductor is a 18-Mbit QDR® II+ SRAM with 512K × 36 organization, 4-word burst architecture, and 2.5-cycle read latency at 400 MHz. It features separate read/write ports, DDR interfaces on both ports (800 Mbps effective data rate), HSTL I/O, and operates with core VDD = 1.8 V ± 0.1 V and I/O VDDQ = 1.4–1.8 V. It is used in high-bandwidth packet buffering for network line cards and switch fabric controllers.

For engineers reviewing the CY7C11651KV18 datasheet, CY7C11651KV18 pinout, CY7C11651KV18 application, or CY7C11651KV18 equivalent, key selection criteria include burst depth, read latency mode (DOFF-controlled), byte write select granularity (BWS[3:0]), echo clock timing (CQ/CQ), and 165-ball FBGA package compatibility with high-speed PCB layout constraints.

Technical Context

This SRAM implements synchronous pipelined QDR II+ architecture with independent read and write ports sharing a multiplexed address bus. Address latching occurs on alternating rising edges of K and K clocks, enabling concurrent access without bus turnaround.

It integrates a PLL for precise DDR data placement, supports programmable impedance via ZQ pin, and uses echo clocks (CQ/CQ) with QVLD to simplify high-speed data capture. DOFF pin selects between 2.5-cycle (HIGH) and 1-cycle (LOW) read latency modes, maintaining functional alignment with legacy QDR I systems.

Key Specifications

Parameter Value and Actual Design Meaning
Memory Density 18 Mbit (512K × 36 configuration)
Max Clock Frequency 400 MHz - sets maximum sustained bandwidth of 28.8 Gbps (36-bit × 2 × 400 MHz)
Read Latency 2.5 cycles (DOFF = HIGH) - enables deterministic timing for pipeline-synchronized systems
I/O Voltage Range VDDQ = 1.4 V to 1.8 V - supports interoperability with both 1.5 V and 1.8 V logic families
Package 165-ball FBGA (13 × 15 × 1.4 mm) - optimized for signal integrity in >500 Mbps DDR routing
Interface Standard HSTL Class I inputs / variable-drive HSTL outputs - ensures clean edge rates and termination control
Power Supply Core VDD = 1.8 V ± 0.1 V - defines strict voltage tolerance for stable 400 MHz operation

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, 0.8 mm ball pitch, RoHS-compliant.

Pin/Terminal Circuit Role Design Meaning
D[35:0] Synchronous write data input 36-bit parallel data sampled on rising edge of K/K; supports full or partial writes via BWS[3:0]
Q[35:0] Synchronous read data output 36-bit DDR output registered to K/K; valid indicated by QVLD and timed to CQ/CQ
A[16:0] Multiplexed address input 17-bit address latched on alternating K/K edges for 128K-depth addressing per internal array
BWS[3:0] Byte write select (active LOW) Four independent controls for D[8:0], D[17:9], D[26:18], D[35:27]; enables granular 8-bit updates
CQ / CQ Echo clocks (DDR) Output-synchronous clocks aligned to Q[35:0] edges; eliminate setup/hold uncertainty in FPGA capture
DOFF Read latency mode select HIGH → 2.5-cycle latency (QDR II+); LOW → 1-cycle latency (QDR I compatibility)
QVLD Data validity indicator Asserted HIGH during valid read data windows; synchronously aligned to CQ/CQ for safe sampling
ZQ Impedance calibration reference Connects to 240 Ω ± 1% external resistor to ground for HSTL output drive strength tuning

Key Features

Feature Design Value
Separate read/write data paths Eliminates bus turnaround delay - enables true concurrent read+write at full bandwidth
4-word burst transfer Reduces address bus toggling frequency by 4× versus single-word access - lowers EMI and routing complexity
Programmable 2.5/1-cycle read latency DOFF pin allows runtime switching between QDR II+ and QDR I timing models - simplifies system migration
HSTL I/O with ZQ calibration Ensures consistent signal integrity across voltage/temperature - critical for 800 Mbps DDR eye compliance
JTAG 1149.1 test access port Enables boundary scan verification of high-density FBGA solder joints without physical probe access

Applications

Network Packet Buffering Switch Fabric Controller Memory

Use Scenario: Storing ingress/egress packet headers and metadata in 10G/40G Ethernet line cards.

IC Role / Device Role / Timing Role: High-throughput, low-latency shared memory buffer interfacing directly with MAC and traffic manager ASICs.

Use Value: 400 MHz DDR interface delivers 28.8 Gbps bandwidth - sufficient for full-duplex 40G line-rate buffering with zero wait states.

Use Scenario: Holding forwarding tables and queue state in modular chassis-based switches.

IC Role / Device Role / Timing Role: Synchronous dual-port SRAM acting as lookaside cache for TCAM-assisted longest-prefix match engines.

Use Value: Independent read/write ports enable simultaneous table lookup and update - eliminates arbitration stalls in real-time scheduling.

Baseband Processing Buffer High-Speed Test Equipment Memory

Use Scenario: Temporary storage of OFDM symbol samples between FFT and channel estimation blocks in LTE eNodeB radios.

IC Role / Device Role / Timing Role: Burst-mode data scratchpad synchronized to baseband clock domain using K/K and CQ/CQ timing.

Use Value: 2.5-cycle latency + echo clocks ensure deterministic 4-sample burst delivery - matches OFDM symbol timing constraints.

Use Scenario: Capturing high-fidelity waveform data streams in automated test equipment (ATE) pattern generators.

IC Role / Device Role / Timing Role: Deep memory buffer capturing parallel digital stimulus at 400 MHz with precise timestamp alignment.

Use Value: QVLD-stamped output and BWS-granular writes allow selective overwriting of invalid capture segments without full memory reload.

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-bandwidth synchronous SRAM applications.

Alternative Part Technical Difference Application Difference Selection Advice
CY7C11651KV18-450BZC 450 MHz max clock (vs. 400 MHz); higher IDD (1100 mA vs. 1000 mA at VDDQ = 1.5 V) Requires tighter power delivery and thermal management; suitable only where 12.5% bandwidth gain justifies cost/power increase Select when system clock domain mandates ≥425 MHz operation and board layout supports enhanced cooling.
AS7C331024P-15JIN Asynchronous 32M × 36 SRAM; no DDR, no echo clocks, no DOFF latency control; 15 ns access time Lacks concurrent read/write capability and burst efficiency - limits throughput to ~133 MHz effective rate Choose only for cost-sensitive, non-pipelined systems where deterministic sub-15 ns latency outweighs bandwidth needs.

Compared with CY7C11651KV18-450BZC, this 400 MHz variant offers lower power (1000 mA vs. 1100 mA) and relaxed timing margins, while AS7C331024P-15JIN trades all QDR II+ advantages for simplicity and legacy compatibility - making CY7C11651KV18 optimal for new high-speed packet-processing designs.

Availability

CY7C11651KV18 is available at Aetrix Electronics and suitable for network infrastructure, telecom baseband processing, and automated test equipment requiring stable component supply across multi-year production cycles.

Supply support for CY7C11651KV18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for demanding embedded and communications systems.

This device belongs to the QDR® II+ SRAM product line, engineered specifically for deterministic, high-bandwidth buffering in packet-switched networks and real-time signal processing architectures.

FAQ

What is the function of the DOFF pin on CY7C11651KV18?

The DOFF (Data-Off) pin configures read latency mode: when asserted HIGH, it enables 2.5-cycle latency for QDR II+ operation; when LOW, it reverts to 1-cycle latency compatible with QDR I timing. This pin is sampled synchronously on the K clock rising edge at power-up and remains latched until reset. It does not support dynamic switching during active operation.

How many address bits are required for CY7C11651KV18's 512K × 36 organization?

CY7C11651KV18 requires 17 address bits (A[16:0]) because its internal memory array is organized as four 128K × 36 banks. The 17-bit address space accesses 131,072 locations per bank, and bank selection is implicit via port control (RPS/WPS) and burst sequencing-not decoded address lines.

Can CY7C11651KV18 operate with VDDQ = 1.5 V while VDD = 1.8 V?

Yes - the datasheet explicitly permits VDDQ = 1.4 V to 1.8 V independently of core VDD = 1.8 V ± 0.1 V. At VDDQ = 1.5 V, HSTL output drive strength is reduced but remains compliant with Class I specifications, and input thresholds adapt accordingly. System-level timing margins must be verified per AC characteristics table at that VDDQ.

What is the purpose of the ZQ pin, and how must it be connected?

ZQ is a dedicated reference pin for on-die impedance calibration of HSTL output drivers. It must be connected to a single 240 Ω ± 1% resistor tied to ground, placed within 5 mm of the FBGA pad. No capacitors or series resistors are allowed. Calibration occurs automatically at power-up and can be retriggered via JTAG instruction, ensuring consistent output impedance across voltage and temperature.

CY7C11651KV18-400BZC Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tray
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, QDR II+
Memory Size:
18Mbit
Memory Organization:
512K x 36
Memory Interface:
Parallel
Clock Frequency:
400 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (13x15)

CY7C11651KV18-400BZC FAQ

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Please submit a Request for Quotation (RFQ) for CY7C11651KV18-400BZC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

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The price and inventory of CY7C11651KV18-400BZC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C11651KV18-400BZC is usually 5 days.

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5.How can I obtain technical support or documentation for CY7C11651KV18-400BZC?

For technical support, including CY7C11651KV18-400BZC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C11651KV18-400BZC requirements.

6.How does Aetrix verify that CY7C11651KV18-400BZC is sourced from the original manufacturer or authorized distributors?

All CY7C11651KV18-400BZC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C11651KV18-400BZC meets industry standards.

7.What is the process for return or replacement of CY7C11651KV18-400BZC?

All CY7C11651KV18-400BZC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C11651KV18-400BZC, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C11651KV18-400BZC part is unused and in its original packaging.

Return procedure for CY7C11651KV18-400BZC:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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