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Infineon Technologies CY7C1168KV18-400BZXC

Part No.:
CY7C1168KV18-400BZXC
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C1168KV18-400BZXC.pdf
Description:
IC SRAM 18MBIT PARALLEL 165FBGA
Quantity:
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Payment
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Inventory:781

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Product details

Overview

CY7C1168KV18 from Cypress Semiconductor is a 18-Mbit (1M × 18) synchronous pipelined DDR II+ SRAM with two-word burst architecture, 2.5-cycle read latency at 400 MHz, HSTL I/O interface, and 165-ball FBGA package. It operates with core VDD = 1.8 V ± 0.1 V and I/O VDDQ = 1.4 V to 1.8 V, and integrates echo clocks (CQ/CQ) and QVLD for precise high-speed data capture in networking packet buffers and baseband memory subsystems.

For engineers reviewing the CY7C1168KV18 datasheet, CY7C1168KV18 pinout, CY7C1168KV18 application, or CY7C1168KV18 equivalent, key selection criteria include DDR II+ timing compliance, 2.5-cycle vs. 1-cycle latency mode via DOFF control, HSTL drive strength matching, echo clock alignment tolerance, and JTAG 1149.1 test access capability for production validation.

Technical Context

This SRAM implements a synchronous, pipelined DDR II+ interface with dual input clocks (K/K) - all synchronous inputs latched on K rising edges, write data registered on both K and K rising edges, and read data driven on both K and K rising edges. The device uses internal self-timed write circuitry and supports depth expansion without wait states via automatic output tri-state after K edge upon deselect.

The integrated PLL enables accurate data placement at 400 MHz operation; when DOFF is HIGH, it operates in DDR II+ mode (2.5-cycle latency); when DOFF is LOW, it reverts to DDR I mode (1-cycle latency, ≤167 MHz). Echo clocks CQ/CQ are free-running and synchronized to K, eliminating per-device data capture skew in multi-SRAM systems.

Key Specifications

ParameterValue and Actual Design Meaning
Density18 Mbit (1M × 18 configuration)
Max Clock Frequency400 MHz - defines maximum sustained burst throughput of 1.44 GB/s (2 × 18-bit × 400 MHz)
Read Latency2.5 cycles (DOFF = HIGH) - determines minimum read-to-read turnaround and pipeline depth in controller design
I/O VoltageVDDQ = 1.4 V to 1.8 V - supports interoperability with 1.5 V and 1.8 V memory controllers and bus termination schemes
Core VoltageVDD = 1.8 V ± 0.1 V - constrains power supply regulation tolerance and noise margin for stable SRAM core operation
Package165-ball FBGA (13 × 15 × 1.4 mm) - defines PCB layout footprint, thermal dissipation path, and signal integrity constraints for high-speed routing
Interface StandardHSTL Class I inputs / variable-drive HSTL outputs - specifies termination requirements and drive strength calibration via ZQ pin

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body height, RoHS-compliant Pb-free option available.

Pin/TerminalCircuit RoleDesign Meaning
DQ[17:0]Synchronous bidirectional data busShares physical pins for read output and write input; data valid aligned to CQ/CQ edges; tristated automatically on deselect
K / KDifferential input clocksK rising edge initiates all accesses; both K and K rising edges register write data and drive read data; only rising edges used
CQ / CQSynchronous echo clocksFree-running, K-synchronized outputs; used by external logic to capture DQ data without per-device skew compensation
QVLDValid data indicatorAsserted edge-aligned with CQ/CQ; signals that DQ[17:0] contains valid read data - eliminates need for fixed delay-based sampling
DOFFPLL enable/disable controlActive-LOW; when HIGH → DDR II+ mode (2.5-cycle latency @ 400 MHz); when LOW → DDR I mode (1-cycle latency, ≤167 MHz)
ZQOutput impedance calibration referenceConnects to external resistor to ground; sets CQ/CQ/DQ output impedance to 0.2 × RQ; cannot be left floating or tied to GND
LDLoad strobeSynchronous address latch enable; sampled on K rising edge; defines start of bus cycle including address and R/W direction
BWS0/BWS1Byte write selectActive-LOW; BWS0 controls DQ[8:0], BWS1 controls DQ[17:9]; enables partial-word writes without read-modify-write overhead

Key Features

FeatureDesign Value
Two-word burst architectureReduces address bus frequency by 2× versus single-word SRAMs - lowers controller pin count and routing complexity
Programmable 2.5/1-cycle latency modeDOFF pin selects between high-bandwidth DDR II+ (400 MHz) or legacy-compatible DDR I (≤167 MHz) timing - simplifies migration and test
Integrated echo clocks (CQ/CQ)Eliminates board-level clock forwarding and deskew circuitry - reduces jitter-sensitive trace length mismatch in multi-chip memory stacks
QVLD-valid data indicatorRemoves fixed setup/hold timing assumptions - enables robust data capture across voltage/temperature/process corners
JTAG 1149.1 boundary scanSupports automated PCB test, interconnect verification, and in-system programming - critical for high-reliability telecom and industrial designs

Applications

Packet Buffer MemoryBaseband Processor Cache

Use Scenario: High-throughput line cards in 10G/25G Ethernet switches requiring low-latency, burst-access memory for frame queuing and header processing.

IC Role / Device Role / Timing Role: Primary packet buffer SRAM interfacing directly to MAC-layer traffic manager with DDR II+ timing and echo-clock–synchronized data capture.

Use Value: 2.5-cycle latency and 400 MHz clock enable ≥1.4 GB/s sustained bandwidth - meets full-duplex 25G line rate with zero packet loss under burst load.

Use Scenario: Real-time digital signal processing in LTE/5G baseband units where deterministic memory access minimizes FFT/FFT pipeline stalls.

IC Role / Device Role / Timing Role: Low-jitter, pipelined cache for channel estimation and equalization engines, synchronized to FPGA fabric clocks via K/K and CQ/CQ.

Use Value: QVLD-driven data capture and HSTL I/O ensure <±50 ps timing margin across -40°C to +105°C - guarantees bit-accurate processing in RF-intensive environments.

Depth-Expanded Memory SubsystemTest Equipment Pattern Memory

Use Scenario: Multi-bank memory systems in protocol analyzers requiring seamless bank-to-bank transitions without wait-state insertion.

IC Role / Device Role / Timing Role: One of multiple CY7C1168KV18 devices in parallel depth-expansion configuration, using automatic tri-state on K edge to avoid bus contention.

Use Value: Synchronous internal tri-state control eliminates external bus transceivers and arbitration logic - reduces BOM cost and PCB layer count by 20%.

Use Scenario: High-speed ATE systems generating stimulus patterns at >800 Mbps with sub-nanosecond timing precision.

IC Role / Device Role / Timing Role: Deterministic pattern storage element synchronized to tester master clock via PLL-derived K/K and echo-clocked DQ sampling.

Use Value: PLL-based data placement and DOFF-selectable latency allow exact alignment of pattern edges to DUT clock domains - improves test coverage by 12% over asynchronous SRAMs.

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed burst SRAM applications.

Alternative PartTechnical DifferenceApplication DifferenceSelection Advice
CY7C1167KV18Same 1M × 18 density but DDR II (not DDR II+) with fixed 2-cycle latency; no DOFF pin; max 333 MHzLacks programmable latency mode and echo clocks - requires external capture logic and limits max system clock to 333 MHzSelect only if legacy DDR II compatibility is required and 400 MHz bandwidth is unnecessary
AS7C3256B-15JINAsynchronous 256K × 18 SRAM; 15 ns access time; no DDR interface, no PLL, no echo clocksCannot support burst or DDR timing; suitable only for low-frequency control-plane memory, not data-path bufferingChoose only for non-pipelined, low-power management MCU interfaces where timing predictability outweighs bandwidth needs

Compared with CY7C1167KV18 and AS7C3256B-15JIN, the CY7C1168KV18 uniquely delivers 400 MHz DDR II+ operation with programmable latency, echo clocks, and QVLD - enabling higher bandwidth, lower system-level timing uncertainty, and simplified PCB layout in real-time data-path applications.

Availability

CY7C1168KV18 is available at Aetrix Electronics and suitable for packet buffer memory, baseband processor cache, and depth-expanded memory subsystems requiring stable component supply, long-term lifecycle support, and guaranteed Pb-free sourcing.

Supply support for CY7C1168KV18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.

The CY7C1168KV18 belongs to Cypress's QDR II+/DDR II+ SRAM product line, designed specifically for deterministic, high-bandwidth data-path buffering in networking infrastructure, wireless base stations, and test equipment where burst access, low latency, and timing repeatability are critical.

FAQ

What is the function of the DOFF pin, and how does it affect timing?

The DOFF pin is an active-LOW PLL disable control. When asserted HIGH, the internal PLL enables DDR II+ mode with 2.5-cycle read latency at up to 400 MHz. When pulled LOW, the device operates in DDR I mode with 1-cycle latency and a maximum frequency of 167 MHz. This dual-mode capability allows hardware reuse across generations and simplifies validation against legacy timing specifications.

How do CQ and CQ echo clocks improve system-level timing margin?

CQ and CQ are free-running, K-synchronized output clocks that track the same phase relationship as the internal K/K clocks driving DQ outputs. By using CQ/CQ instead of K/K to sample DQ, external logic avoids skew between clock distribution and data paths. This eliminates board-level deskew components and increases timing margin by up to 120 ps across temperature and voltage variations in multi-SRAM configurations.

Can CY7C1168KV18 operate with VDDQ = 1.5 V while VDD = 1.8 V?

Yes. The datasheet explicitly supports VDDQ = 1.4 V to VDD (1.8 V), making 1.5 V operation fully compliant. This allows direct interfacing with 1.5 V memory controllers while maintaining 1.8 V core stability. The ZQ pin must be connected to a resistor to ground (not VDDQ) to calibrate output drive strength correctly for 1.5 V signaling.

Is JTAG boundary scan supported, and what standards does it comply with?

Yes, CY7C1168KV18 includes a fully compliant IEEE 1149.1 JTAG test access port. It supports TAP reset, instruction register loading, boundary scan register access, and identification register readback. All scan cells and instruction decoding meet the IEEE 1149.1-2013 standard, enabling production ICT, solder joint verification, and in-system programming without additional test fixtures.

CY7C1168KV18-400BZXC Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tray
Product Status:
Last Time Buy
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, DDR II+
Memory Size:
18Mbit
Memory Organization:
1M x 18
Memory Interface:
Parallel
Clock Frequency:
400 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (13x15)

CY7C1168KV18-400BZXC FAQ

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Please submit a Request for Quotation (RFQ) for CY7C1168KV18-400BZXC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for CY7C1168KV18-400BZXC reliable?

The price and inventory of CY7C1168KV18-400BZXC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1168KV18-400BZXC is usually 5 days.

3.What payment methods are accepted for CY7C1168KV18-400BZXC?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1168KV18-400BZXC transactions.

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4.How is shipping managed for CY7C1168KV18-400BZXC?

CY7C1168KV18-400BZXC orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your CY7C1168KV18-400BZXC order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for CY7C1168KV18-400BZXC?

For technical support, including CY7C1168KV18-400BZXC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1168KV18-400BZXC requirements.

6.How does Aetrix verify that CY7C1168KV18-400BZXC is sourced from the original manufacturer or authorized distributors?

All CY7C1168KV18-400BZXC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1168KV18-400BZXC meets industry standards.

7.What is the process for return or replacement of CY7C1168KV18-400BZXC?

All CY7C1168KV18-400BZXC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1168KV18-400BZXC, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C1168KV18-400BZXC part is unused and in its original packaging.

Return procedure for CY7C1168KV18-400BZXC:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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