Infineon Technologies CY7C1312KV18-300BZXCT
- Part No.:
- CY7C1312KV18-300BZXCT
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1312KV18-300BZXCT.pdf
- Description:
- IC SRAM 18MBIT PARALLEL 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:1,045
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Product details
Overview
CY7C1312KV18-300BZXCT from Cypress Semiconductor is a 1M × 18, 18-Mbit QDR® II SRAM with separate read/write ports, 300 MHz clock operation (600 Mbps DDR per port), 1.5-cycle read latency (DOFF = HIGH), and 1.8 V core / 1.4–1.8 V I/O supply. It delivers concurrent burst transfers of two 18-bit words per access for high-bandwidth packet buffering in network line cards.
For engineers reviewing the CY7C1312KV18-300BZXCT datasheet, CY7C1312KV18-300BZXCT pinout, CY7C1312KV18-300BZXCT application, or CY7C1312KV18-300BZXCT equivalent, key selection criteria include dual-clock DDR timing, echo clock (CQ/CQ) support for source-synchronous capture, HSTL-compatible variable-drive outputs, JTAG 1149.1 testability, and FBGA-165 package compatibility with high-density routing.
Technical Context
The device implements a synchronous pipelined architecture with independent read and write data paths, eliminating bus turnaround overhead. It uses rising edges of K/K clocks for address/data latching and C/C clocks for output timing, enabling true concurrent read-write operations at 300 MHz.
Internal self-timed writes and programmable DOFF pin select between 1.5-cycle (QDR II mode) or 1-cycle (QDR I mode) read latency. Echo clocks CQ/CQ are phase-aligned to C/C and provide deterministic timing references for high-speed data capture in multi-device systems.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 1M × 18 (18 Mbit total); supports depth expansion via RPS/WPS |
| Max Clock Frequency | 300 MHz K/K input clock → 600 Mbps DDR bandwidth per port |
| Read Latency | 1.5 cycles (DOFF = HIGH) or 1 cycle (DOFF = LOW); determines pipeline depth in controller design |
| Supply Voltages | VDD = 1.8 V ±0.1 V (core); VDDQ = 1.4–1.8 V (I/O); enables mixed-voltage system integration |
| Output Interface | HSTL Class I compatible with programmable drive strength; ZQ pin enables impedance tuning to 0.2×RQ |
| Timing Reference | Dedicated echo clocks CQ/CQ synchronized to C/C; eliminates board-level skew compensation effort |
| JTAG Support | IEEE 1149.1 compliant TAP controller with boundary scan for production test and debug |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm, RoHS-compliant, Pb-free.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| D[17:0] | Synchronous write data inputs | Latched on rising edge of K clock; 18-bit parallel input path for burst writes |
| Q[17:0] | Synchronous read data outputs | Driven on rising edge of C/C clocks; 18-bit DDR output path with echo-clock alignment |
| RPS, WPS | Active-low port select controls | Enable independent read/write port activation; essential for depth expansion and transaction arbitration |
| BWS[1:0] | Byte write select inputs | Control 9-bit byte groups (D[8:0], D[17:9]); enable partial-word writes without read-modify-write |
| K, K | Positive/negative input clocks | Capture all synchronous inputs (address, data, control); define system timing reference |
| C, C | Positive/negative output clocks | Source-synchronous timing for Q[17:0]; used with CQ/CQ for deskewed capture at controller |
| CQ, CQ | Echo clocks referenced to C/C | Free-running, phase-aligned copies of C/C; simplify high-speed PCB layout and timing closure |
| ZQ | Impedance calibration input | Connects to external resistor to ground; tunes Q[17:0] and CQ/CQ output impedance to match trace Z₀ |
| DOFF | Read latency mode control | High = QDR II mode (1.5-cycle latency); Low = QDR I mode (1-cycle latency); sets controller pipeline configuration |
Key Features
| Feature | Design Value |
|---|---|
| Separate read/write data ports | Eliminates bus turnaround delay and contention; enables full-duplex memory access in networking ASIC interfaces |
| Two-word burst architecture | Delivers 36 bits per 300 MHz clock cycle (18-bit × 2) - doubles effective throughput vs. single-word devices |
| Programmable output drive impedance | ZQ-controlled HSTL outputs reduce signal integrity margin loss on long traces; avoids external termination resistors |
| Integrated PLL and echo clocks | Enables precise data placement at 600 Mbps DDR; removes need for external clock forwarding ICs in high-speed designs |
| JTAG 1149.1 boundary scan | Supports automated test pattern generation and interconnect verification in dense BGA layouts |
Applications
| Network Packet Buffering | Telecom Line Card Memory |
|---|---|
|
Use Scenario: Storing ingress/egress packet headers and payloads in 10G/40G Ethernet switch fabric ASICs. IC Role / Device Role / Timing Role: High-throughput, low-latency shared memory buffer interfacing directly to SerDes MAC controllers via DDR HSTL buses. Use Value: Concurrent read/write capability eliminates arbitration stalls; 300 MHz operation sustains >10 Gbps aggregate bandwidth per device. |
Use Scenario: Frame buffering in OC-192/STM-64 SONET/SDH add-drop multiplexers. IC Role / Device Role / Timing Role: Dual-port SRAM acting as elastic store between asynchronous tributary streams and synchronous backplane clock domains. Use Value: 1.5-cycle latency mode (DOFF = HIGH) aligns with SONET jitter tolerance; echo clocks ensure deterministic capture across temperature. |
| Baseband Processing Memory | Test Equipment Data Capture |
|
Use Scenario: Real-time FFT coefficient storage and channel estimation buffers in LTE/5G massive MIMO baseband processors. IC Role / Device Role / Timing Role: Burst-access scratchpad memory co-located with DSP cores; synchronized to baseband clock domain via K/K and C/C. Use Value: Two-word burst matches typical FFT bin-pair processing; variable VDDQ supports 1.5 V I/O for legacy FPGA interface compatibility. |
Use Scenario: High-speed waveform acquisition in digital sampling oscilloscopes and bit error rate testers. IC Role / Device Role / Timing Role: Deep memory buffer capturing serial data streams at >600 Msps using time-interleaved ADCs and parallel write paths. Use Value: Independent WPS/BWS control enables selective write masking per sample group; JTAG enables in-system memory test during calibration. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar QDR II SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| IDT72T36120L10BG | 1M × 18, 10 ns access, LVDS I/O, 2.5 V core; no echo clocks or ZQ calibration | Requires external clock forwarding and termination; suited for lower-frequency (<200 MHz) systems with LVDS signaling | Select when LVDS interface and simpler timing model outweigh need for echo-clock deskew and impedance tuning |
| ISSI IS61WV102418B | 1M × 18, 165 MHz max, SSTL-2 I/O, 3.3 V core; single-port, asynchronous burst mode | Lacks concurrent read/write; requires external arbitration logic; limited to ≤165 MHz bandwidth | Choose only for cost-sensitive, non-concurrent applications where QDR II features are unnecessary |
Compared with IDT72T36120L10BG and IS61WV102418B, CY7C1312KV18-300BZXCT uniquely delivers 300 MHz DDR concurrency, echo-clock–assisted timing closure, and on-die impedance matching-critical for next-generation packet-processing systems requiring deterministic sub-nanosecond timing margins.
Availability
CY7C1312KV18-300BZXCT is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, baseband processing memory, and test equipment data capture requiring stable component supply and long-term industrial availability.
Supply support for CY7C1312KV18-300BZXCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.
This device belongs to Cypress's QDR® II SRAM product line, engineered specifically for ultra-low-latency, high-bandwidth memory subsystems in networking and telecom infrastructure where deterministic timing and concurrent access are mandatory.
FAQ
What is the function of the DOFF pin on CY7C1312KV18-300BZXCT?
The DOFF (Data Output OFF) pin selects read latency mode: when asserted HIGH, it enables QDR II mode with 1.5-cycle read latency; when LOW, it reverts to QDR I mode with 1-cycle latency. This pin directly configures internal pipeline staging and must be set before initialization and held static during operation.
Can CY7C1312KV18-300BZXCT operate with only one clock (K) instead of differential K/K?
Yes - the device supports single-clock mode where K serves as both positive and negative clock input. In this mode, C and C must also be tied together, and CQ/CQ derive from K. However, performance is limited to ≤250 MHz due to reduced timing margin, and echo-clock deskew benefits are lost.
How is output impedance calibrated using the ZQ pin?
ZQ connects to an external precision resistor (typically 240 Ω) to ground; the device measures this resistance and adjusts driver strength so that Q[17:0] and CQ/CQ output impedances equal 0.2 × RQ (e.g., 48 Ω). Direct connection to VDDQ enables minimum impedance mode (~25 Ω), but grounding or leaving ZQ floating is prohibited.
Is JTAG boundary scan supported on CY7C1312KV18-300BZXCT, and what pins are required?
Yes - IEEE 1149.1 JTAG is fully implemented. Required pins are TDI, TDO, TCK, TMS, and TRST (optional). These are dedicated balls in the FBGA-165 package (pins R12, R11, R10, R9, and P10 respectively) and require no additional configuration beyond standard JTAG voltage levels (VDDQ).
CY7C1312KV18-300BZXCT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, QDR II
- Memory Size:
- 18Mbit
- Memory Organization:
- 1M x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- 300 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C1312KV18-300BZXCT FAQ
1.How can I place an order for CY7C1312KV18-300BZXCT through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1312KV18-300BZXCT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1312KV18-300BZXCT reliable?
The price and inventory of CY7C1312KV18-300BZXCT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1312KV18-300BZXCT is usually 5 days.
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We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1312KV18-300BZXCT transactions.
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4.How is shipping managed for CY7C1312KV18-300BZXCT?
CY7C1312KV18-300BZXCT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY7C1312KV18-300BZXCT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1312KV18-300BZXCT?
For technical support, including CY7C1312KV18-300BZXCT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1312KV18-300BZXCT requirements.
6.How does Aetrix verify that CY7C1312KV18-300BZXCT is sourced from the original manufacturer or authorized distributors?
All CY7C1312KV18-300BZXCT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1312KV18-300BZXCT meets industry standards.
7.What is the process for return or replacement of CY7C1312KV18-300BZXCT?
All CY7C1312KV18-300BZXCT units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1312KV18-300BZXCT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1312KV18-300BZXCT part is unused and in its original packaging.
Return procedure for CY7C1312KV18-300BZXCT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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