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Infineon Technologies CY7C1312KV18-300BZXCT

Part No.:
CY7C1312KV18-300BZXCT
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C1312KV18-300BZXCT.pdf
Description:
IC SRAM 18MBIT PARALLEL 165FBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:1,045

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Product details

Overview

CY7C1312KV18-300BZXCT from Cypress Semiconductor is a 1M × 18, 18-Mbit QDR® II SRAM with separate read/write ports, 300 MHz clock operation (600 Mbps DDR per port), 1.5-cycle read latency (DOFF = HIGH), and 1.8 V core / 1.4–1.8 V I/O supply. It delivers concurrent burst transfers of two 18-bit words per access for high-bandwidth packet buffering in network line cards.

For engineers reviewing the CY7C1312KV18-300BZXCT datasheet, CY7C1312KV18-300BZXCT pinout, CY7C1312KV18-300BZXCT application, or CY7C1312KV18-300BZXCT equivalent, key selection criteria include dual-clock DDR timing, echo clock (CQ/CQ) support for source-synchronous capture, HSTL-compatible variable-drive outputs, JTAG 1149.1 testability, and FBGA-165 package compatibility with high-density routing.

Technical Context

The device implements a synchronous pipelined architecture with independent read and write data paths, eliminating bus turnaround overhead. It uses rising edges of K/K clocks for address/data latching and C/C clocks for output timing, enabling true concurrent read-write operations at 300 MHz.

Internal self-timed writes and programmable DOFF pin select between 1.5-cycle (QDR II mode) or 1-cycle (QDR I mode) read latency. Echo clocks CQ/CQ are phase-aligned to C/C and provide deterministic timing references for high-speed data capture in multi-device systems.

Key Specifications

Parameter Value and Actual Design Meaning
Memory Organization 1M × 18 (18 Mbit total); supports depth expansion via RPS/WPS
Max Clock Frequency 300 MHz K/K input clock → 600 Mbps DDR bandwidth per port
Read Latency 1.5 cycles (DOFF = HIGH) or 1 cycle (DOFF = LOW); determines pipeline depth in controller design
Supply Voltages VDD = 1.8 V ±0.1 V (core); VDDQ = 1.4–1.8 V (I/O); enables mixed-voltage system integration
Output Interface HSTL Class I compatible with programmable drive strength; ZQ pin enables impedance tuning to 0.2×RQ
Timing Reference Dedicated echo clocks CQ/CQ synchronized to C/C; eliminates board-level skew compensation effort
JTAG Support IEEE 1149.1 compliant TAP controller with boundary scan for production test and debug

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm, RoHS-compliant, Pb-free.

Pin/Terminal Circuit Role Design Meaning
D[17:0] Synchronous write data inputs Latched on rising edge of K clock; 18-bit parallel input path for burst writes
Q[17:0] Synchronous read data outputs Driven on rising edge of C/C clocks; 18-bit DDR output path with echo-clock alignment
RPS, WPS Active-low port select controls Enable independent read/write port activation; essential for depth expansion and transaction arbitration
BWS[1:0] Byte write select inputs Control 9-bit byte groups (D[8:0], D[17:9]); enable partial-word writes without read-modify-write
K, K Positive/negative input clocks Capture all synchronous inputs (address, data, control); define system timing reference
C, C Positive/negative output clocks Source-synchronous timing for Q[17:0]; used with CQ/CQ for deskewed capture at controller
CQ, CQ Echo clocks referenced to C/C Free-running, phase-aligned copies of C/C; simplify high-speed PCB layout and timing closure
ZQ Impedance calibration input Connects to external resistor to ground; tunes Q[17:0] and CQ/CQ output impedance to match trace Z₀
DOFF Read latency mode control High = QDR II mode (1.5-cycle latency); Low = QDR I mode (1-cycle latency); sets controller pipeline configuration

Key Features

Feature Design Value
Separate read/write data ports Eliminates bus turnaround delay and contention; enables full-duplex memory access in networking ASIC interfaces
Two-word burst architecture Delivers 36 bits per 300 MHz clock cycle (18-bit × 2) - doubles effective throughput vs. single-word devices
Programmable output drive impedance ZQ-controlled HSTL outputs reduce signal integrity margin loss on long traces; avoids external termination resistors
Integrated PLL and echo clocks Enables precise data placement at 600 Mbps DDR; removes need for external clock forwarding ICs in high-speed designs
JTAG 1149.1 boundary scan Supports automated test pattern generation and interconnect verification in dense BGA layouts

Applications

Network Packet Buffering Telecom Line Card Memory

Use Scenario: Storing ingress/egress packet headers and payloads in 10G/40G Ethernet switch fabric ASICs.

IC Role / Device Role / Timing Role: High-throughput, low-latency shared memory buffer interfacing directly to SerDes MAC controllers via DDR HSTL buses.

Use Value: Concurrent read/write capability eliminates arbitration stalls; 300 MHz operation sustains >10 Gbps aggregate bandwidth per device.

Use Scenario: Frame buffering in OC-192/STM-64 SONET/SDH add-drop multiplexers.

IC Role / Device Role / Timing Role: Dual-port SRAM acting as elastic store between asynchronous tributary streams and synchronous backplane clock domains.

Use Value: 1.5-cycle latency mode (DOFF = HIGH) aligns with SONET jitter tolerance; echo clocks ensure deterministic capture across temperature.

Baseband Processing Memory Test Equipment Data Capture

Use Scenario: Real-time FFT coefficient storage and channel estimation buffers in LTE/5G massive MIMO baseband processors.

IC Role / Device Role / Timing Role: Burst-access scratchpad memory co-located with DSP cores; synchronized to baseband clock domain via K/K and C/C.

Use Value: Two-word burst matches typical FFT bin-pair processing; variable VDDQ supports 1.5 V I/O for legacy FPGA interface compatibility.

Use Scenario: High-speed waveform acquisition in digital sampling oscilloscopes and bit error rate testers.

IC Role / Device Role / Timing Role: Deep memory buffer capturing serial data streams at >600 Msps using time-interleaved ADCs and parallel write paths.

Use Value: Independent WPS/BWS control enables selective write masking per sample group; JTAG enables in-system memory test during calibration.

Equivalent & Alternatives

The following parts are listed as comparable options for similar QDR II SRAM applications.

Alternative Part Technical Difference Application Difference Selection Advice
IDT72T36120L10BG 1M × 18, 10 ns access, LVDS I/O, 2.5 V core; no echo clocks or ZQ calibration Requires external clock forwarding and termination; suited for lower-frequency (<200 MHz) systems with LVDS signaling Select when LVDS interface and simpler timing model outweigh need for echo-clock deskew and impedance tuning
ISSI IS61WV102418B 1M × 18, 165 MHz max, SSTL-2 I/O, 3.3 V core; single-port, asynchronous burst mode Lacks concurrent read/write; requires external arbitration logic; limited to ≤165 MHz bandwidth Choose only for cost-sensitive, non-concurrent applications where QDR II features are unnecessary

Compared with IDT72T36120L10BG and IS61WV102418B, CY7C1312KV18-300BZXCT uniquely delivers 300 MHz DDR concurrency, echo-clock–assisted timing closure, and on-die impedance matching-critical for next-generation packet-processing systems requiring deterministic sub-nanosecond timing margins.

Availability

CY7C1312KV18-300BZXCT is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, baseband processing memory, and test equipment data capture requiring stable component supply and long-term industrial availability.

Supply support for CY7C1312KV18-300BZXCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.

This device belongs to Cypress's QDR® II SRAM product line, engineered specifically for ultra-low-latency, high-bandwidth memory subsystems in networking and telecom infrastructure where deterministic timing and concurrent access are mandatory.

FAQ

What is the function of the DOFF pin on CY7C1312KV18-300BZXCT?

The DOFF (Data Output OFF) pin selects read latency mode: when asserted HIGH, it enables QDR II mode with 1.5-cycle read latency; when LOW, it reverts to QDR I mode with 1-cycle latency. This pin directly configures internal pipeline staging and must be set before initialization and held static during operation.

Can CY7C1312KV18-300BZXCT operate with only one clock (K) instead of differential K/K?

Yes - the device supports single-clock mode where K serves as both positive and negative clock input. In this mode, C and C must also be tied together, and CQ/CQ derive from K. However, performance is limited to ≤250 MHz due to reduced timing margin, and echo-clock deskew benefits are lost.

How is output impedance calibrated using the ZQ pin?

ZQ connects to an external precision resistor (typically 240 Ω) to ground; the device measures this resistance and adjusts driver strength so that Q[17:0] and CQ/CQ output impedances equal 0.2 × RQ (e.g., 48 Ω). Direct connection to VDDQ enables minimum impedance mode (~25 Ω), but grounding or leaving ZQ floating is prohibited.

Is JTAG boundary scan supported on CY7C1312KV18-300BZXCT, and what pins are required?

Yes - IEEE 1149.1 JTAG is fully implemented. Required pins are TDI, TDO, TCK, TMS, and TRST (optional). These are dedicated balls in the FBGA-165 package (pins R12, R11, R10, R9, and P10 respectively) and require no additional configuration beyond standard JTAG voltage levels (VDDQ).

CY7C1312KV18-300BZXCT Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tape & Reel (TR)
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, QDR II
Memory Size:
18Mbit
Memory Organization:
1M x 18
Memory Interface:
Parallel
Clock Frequency:
300 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (13x15)

CY7C1312KV18-300BZXCT FAQ

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Please submit a Request for Quotation (RFQ) for CY7C1312KV18-300BZXCT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for CY7C1312KV18-300BZXCT reliable?

The price and inventory of CY7C1312KV18-300BZXCT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1312KV18-300BZXCT is usually 5 days.

3.What payment methods are accepted for CY7C1312KV18-300BZXCT?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1312KV18-300BZXCT transactions.

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4.How is shipping managed for CY7C1312KV18-300BZXCT?

CY7C1312KV18-300BZXCT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your CY7C1312KV18-300BZXCT order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for CY7C1312KV18-300BZXCT?

For technical support, including CY7C1312KV18-300BZXCT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1312KV18-300BZXCT requirements.

6.How does Aetrix verify that CY7C1312KV18-300BZXCT is sourced from the original manufacturer or authorized distributors?

All CY7C1312KV18-300BZXCT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1312KV18-300BZXCT meets industry standards.

7.What is the process for return or replacement of CY7C1312KV18-300BZXCT?

All CY7C1312KV18-300BZXCT units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1312KV18-300BZXCT, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C1312KV18-300BZXCT part is unused and in its original packaging.

Return procedure for CY7C1312KV18-300BZXCT:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

CY7C1312KV18-300BZXCT Tags

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