Infineon Technologies CY7C1315BV18-200BZI
- Part No.:
- CY7C1315BV18-200BZI
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1315BV18-200BZI.pdf
- Description:
- IC SRAM 18MBIT PARALLEL 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:1,464
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
CY7C1315BV18 from Cypress Semiconductor is a 512K × 36-bit (18-Mbit), 1.8V synchronous QDR-II SRAM with independent read/write ports, 200 MHz K-clock operation, DDR interfaces delivering 400 MT/s effective data rate, and echo clocks (CQ/CQ) for precise high-speed data capture in networking packet buffers and switch fabric memory subsystems.
For engineers reviewing the CY7C1315BV18 datasheet, CY7C1315BV18 pinout, CY7C1315BV18 application, or CY7C1315BV18 equivalent, key selection considerations include its 165-ball FBGA package, 36-bit wide x 4-word burst architecture, dual-clock domain timing (K/K and C/C), HSTL-18 I/O compatibility, and support for depth expansion via four byte write selects (BWS[3:0]).
Technical Context
The device implements a true dual-port QDR-II architecture: separate dedicated D[35:0] inputs and Q[35:0] outputs eliminate bus turnaround, enabling concurrent read and write operations on the same clock cycle. Address latching occurs on alternating rising edges of K and K clocks, supporting pipelined access with 1.5-cycle latency.
It uses internal DLL for accurate data placement, supports single- or dual-clock modes, and features programmable output drive strength via ZQ impedance calibration. Core VDD = 1.8 V ±0.1 V and I/O VDDQ = 1.4–1.8 V ensure compatibility with HSTL-18 signaling standards and low-power operation at 200 MHz.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 512K × 36-bit (18-Mbit total); enables 144-bit wide data transfers per burst |
| Maximum Clock Frequency | 200 MHz K-clock; defines maximum sustained address rate and pipeline throughput |
| Data Rate | 400 MT/s (DDR on both ports); delivers 14.4 GB/s bandwidth with 36-bit bus |
| Voltage Supply | Core VDD = 1.8 V ±0.1 V; I/O VDDQ = 1.4–1.8 V; ensures HSTL-18 compliance and signal integrity |
| Burst Length | 4-word fixed burst; reduces address bus toggling frequency by 75% vs. single-word access |
| Write Select Granularity | Four active-low BWS[3:0] signals; allows independent 9-bit byte masking during writes |
| Package | 165-ball FBGA (13 × 15 × 1.4 mm); supports high-density PCB layout with controlled impedance routing |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, 0.8 mm ball pitch, RoHS-compliant lead-free option available.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| D[35:0] | Synchronous write data input | 36-bit parallel data sampled on rising edge of K/K; supports full-width or byte-masked writes |
| Q[35:0] | Synchronous read data output | 36-bit parallel data driven on rising edges of C/C; tri-stated when RPS inactive |
| A[16:0] | Multiplexed address input | 17-bit address latched on K clock rising edge; shared by read and write ports |
| RPS | Read port select (active LOW) | Enables read burst; deassertion auto-tri-states Q[35:0] after final C edge |
| WPS | Write port select (active LOW) | Initiates write burst; deassertion ignores D[35:0] and BWS[3:0] |
| BWS[3:0] | Byte write select (active LOW) | Four independent 9-bit masks; each controls one 9-bit segment of D[35:0] |
| K, K | Positive/negative input clocks | Rising edges latch all synchronous inputs (address, control, data); define core timing domain |
| C, C | Positive/negative output clocks | Rising edges clock Q[35:0] and CQ/CQ; enable board-level flight-time deskew |
| CQ, CQ | Echo clocks | Free-running copies of C/C synchronized to output domain; simplify receiver capture timing |
| ZQ | Impedance calibration input | Connects to external resistor to ground; tunes output driver impedance to match 50 Ω data bus |
Key Features
| Feature | Design Value |
|---|---|
| Independent Read/Write Ports | Eliminates data bus turnaround delay and contention; enables true concurrent access in full-duplex systems |
| 4-Word Burst Architecture | Reduces required address transitions by 75%, lowering routing complexity and EMI in high-speed designs |
| Double Data Rate Interfaces | Delivers 400 MT/s on both ports using 200 MHz clocks; doubles bandwidth without increasing clock frequency |
| Echo Clocks (CQ/CQ) | Provide source-synchronous timing references aligned to Q[35:0]; reduce setup/hold margin requirements at receiver |
| HSTL-18 Compatible I/O | Supports 1.4–1.8 V VDDQ; ensures interoperability with FPGA transceivers and ASIC memory controllers |
| JTAG 1149.1 Test Access | Enables boundary-scan testing and in-system diagnostics without additional test fixtures |
Applications
| High-Speed Network Switching | Telecom Line Card Buffering |
|---|---|
Use Scenario: Storing and forwarding variable-length packet headers and metadata in Layer 2/3 switching ASICs. IC Role / Device Role / Timing Role: Dedicated packet buffer SRAM with zero-wait-state concurrent read/write for ingress/egress pipelines. Use Value: 400 MT/s bandwidth and 4-word burst minimize latency spikes during bursty traffic; echo clocks align data capture with FPGA logic. |
Use Scenario: Holding time-division multiplexed (TDM) voice frames and control messages in carrier-grade line cards. IC Role / Device Role / Timing Role: Synchronous frame buffer interfacing directly with TDM controller's HSTL-18 interface. Use Value: Independent ports allow simultaneous frame write (from framer) and read (to backplane), eliminating arbitration overhead. |
| Optical Transport Network (OTN) Framer Memory | High-Performance Test Equipment FIFO |
Use Scenario: Buffering OTU1/OTU2 overhead and payload alignment words in DWDM framer ICs. IC Role / Device Role / Timing Role: Low-latency, deterministic-access memory for real-time OTN frame assembly/disassembly. Use Value: 200 MHz K-clock and DLL-controlled timing guarantee sub-5 ns jitter tolerance required for OTN bit error rate compliance. |
Use Scenario: Capturing high-speed digital stimulus/response patterns in automated test equipment (ATE) pattern generators. IC Role / Device Role / Timing Role: High-bandwidth FIFO between pattern sequencer and DUT interface drivers. Use Value: Byte-write select (BWS[3:0]) enables partial-word updates without read-modify-write cycles, preserving test vector integrity. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-bandwidth synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1315BV18-250BZI | 250 MHz K-clock rating; higher current draw (500 mA typical); identical pinout and functionality | Required where system clock exceeds 200 MHz but ≤250 MHz; same PCB layout | Select when bandwidth >18 GB/s is needed and power budget allows +100 mA |
| AS7C3256B-20JC | 256K × 32-bit, 3.3 V, async SRAM; no DDR, no echo clocks, no burst mode; SOJ-44 package | Only suitable for non-concurrent, lower-speed buffering where timing margins are relaxed | Use only if QDR-II features are unnecessary and voltage/interface compatibility permits |
Compared with CY7C1315BV18-250BZI, the -200BZI variant trades 50 MHz bandwidth for lower power and thermal footprint; versus AS7C3256B-20JC, it provides 4× higher effective bandwidth, deterministic latency, and concurrent port operation - essential for modern packet processing.
Availability
CY7C1315BV18-200BZI is available at Aetrix Electronics and suitable for high-speed network switching, telecom line card buffering, optical transport framer memory, and ATE FIFO applications requiring stable component supply across multi-year production cycles.
Supply support for CY7C1315BV18-200BZI includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) is a U.S.-based semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.
This device belongs to Cypress's QDR-II SRAM product line, engineered specifically for deterministic, low-latency, concurrent-access memory subsystems in packet-switched infrastructure and real-time signal processing.
FAQ
What is the minimum supported VDDQ voltage for CY7C1315BV18-200BZI?
The device supports VDDQ from 1.4 V to 1.8 V. Operation below 1.4 V is not guaranteed and may cause output driver malfunction or timing violations. At 1.4 V, HSTL-18-compatible receivers must be used, and ZQ calibration should be performed with RQ = 50 Ω to maintain 25 Ω output impedance.
Can CY7C1315BV18-200BZI operate in single-clock mode?
Yes - it supports single-clock mode where K and C are tied together, and K and C are tied together. In this configuration, all timing references derive from the K/K pair, and echo clocks CQ/CQ track K/K instead of C/C. The AC timing parameters shift accordingly, with tKQ and tKQ replacing tCQ and tCQ.
How does the ZQ pin affect signal integrity?
ZQ connects to an external precision resistor (typically 50 Ω to ground) to calibrate internal output driver impedance to 25 Ω (0.2 × RQ). This matches standard 50 Ω PCB traces, minimizing reflections and ensuring clean eye diagrams at 400 MT/s. Leaving ZQ floating or shorting it to VDDQ disables calibration and forces minimum drive strength.
Is JTAG boundary-scan supported in functional operation mode?
Yes - the IEEE 1149.1 TAP controller operates independently of memory function. TDI, TDO, TCK, and TMS pins remain fully accessible during normal read/write operation. Boundary-scan instructions can be executed without halting memory access, enabling in-system test while maintaining system uptime.
CY7C1315BV18-200BZI Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, QDR II
- Memory Size:
- 18Mbit
- Memory Organization:
- 512K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 200 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C1315BV18-200BZI FAQ
1.How can I place an order for CY7C1315BV18-200BZI through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1315BV18-200BZI on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1315BV18-200BZI reliable?
The price and inventory of CY7C1315BV18-200BZI are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1315BV18-200BZI is usually 5 days.
3.What payment methods are accepted for CY7C1315BV18-200BZI?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1315BV18-200BZI transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY7C1315BV18-200BZI?
CY7C1315BV18-200BZI orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY7C1315BV18-200BZI order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1315BV18-200BZI?
For technical support, including CY7C1315BV18-200BZI datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1315BV18-200BZI requirements.
6.How does Aetrix verify that CY7C1315BV18-200BZI is sourced from the original manufacturer or authorized distributors?
All CY7C1315BV18-200BZI products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1315BV18-200BZI meets industry standards.
7.What is the process for return or replacement of CY7C1315BV18-200BZI?
All CY7C1315BV18-200BZI units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1315BV18-200BZI, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1315BV18-200BZI part is unused and in its original packaging.
Return procedure for CY7C1315BV18-200BZI:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY7C1315BV18-200BZI Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
LDO regulator guide covering low dropout voltage, power dissipation, thermal design, PSRR, output noise, capacitor stability, adjustable LDO circuits, LDO vs buck converter and datasheet selection chec…
Conditional Access Module guide covering CAM meaning, CI/CI+ interface, smart card authorization, DVB security workflow, TV and set-top box compatibility, internal electronics, ESD protection, connecto…
Guide to electronic component obsolescence covering EOL risk, PCN/PDN notices, last-time buy planning, replacement options, form-fit-function validation, counterfeit risk and BOM lifecycle management.
18650 battery guide covering lithium-ion cell basics, 3.6V/3.7V voltage, 4.2V charging, mAh and Wh capacity, protected cells, chargers, BMS, series-parallel packs, holders, welding and sourcing checks.…
Hall effect sensor guide covering working principle, linear and digital sensors, Arduino circuits, current sensing, speed detection, automotive applications, A3144 examples, signal filtering and datash…

