Infineon Technologies CY7C1318KV18-250BZCT
- Part No.:
- CY7C1318KV18-250BZCT
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1318KV18-250BZCT.pdf
- Description:
- IC SRAM 18MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:1,671
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
CY7C1318KV18-250BZCT from Cypress Semiconductor is a 18-Mbit (1M × 18) DDR II synchronous SRAM with two-word burst architecture, 250 MHz maximum clock frequency, 1.8 V core supply, and HSTL I/O compatible with 1.5 V/1.8 V VDDQ. It delivers 900 MB/s peak bandwidth via double-data-rate transfers at 500 Mbps per pin and supports precise timing using dual input clocks (K/K) and echo clocks (CQ/CQ). Used in high-speed networking line cards for packet buffering.
For engineers reviewing the CY7C1318KV18-250BZCT datasheet, CY7C1318KV18-250BZCT pinout, CY7C1318KV18-250BZCT application, or CY7C1318KV18-250BZCT equivalent, key selection criteria include DDR-II burst latency mode (DOFF-controlled), 165-ball FBGA package mechanical compatibility, HSTL output drive programmability, and JTAG 1149.1 test access support.
Technical Context
The device implements a synchronous pipelined architecture with internal burst counter driven by A0, latching addresses on alternate rising edges of K and K. Read data is registered and driven on rising edges of C and C (or K and K in single-clock mode), enabling deterministic 1.5-cycle read latency when DOFF = HIGH or 1-cycle latency when DOFF = LOW.
It integrates a PLL for accurate data placement, echo clocks (CQ/CQ) synchronized to C/C for simplified system-level data capture, and ZQ-calibrated output impedance matching. All synchronous inputs pass through edge-triggered registers; writes use on-chip self-timed control logic with byte-write select (BWS0/BWS1) for partial-word updates.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density | 18 Mbit (1M × 18 configuration) |
| Max Clock Frequency | 250 MHz - sets maximum sustained burst throughput and system timing margin |
| Data Rate | 500 Mbps per DQ pin - enables 900 MB/s aggregate bandwidth with 18-bit bus |
| Read Latency | 1.5 cycles (DOFF = HIGH) or 1 cycle (DOFF = LOW) - determines pipeline depth in controller design |
| Supply Voltages | 1.8 V core (VDD), 1.4–1.8 V I/O (VDDQ) - supports mixed-voltage board interfaces |
| Package | 165-ball FBGA (13 × 15 × 1.4 mm) - standard footprint for high-pin-count DDR memory placement |
| JTAG Support | IEEE 1149.1 compliant TAP - enables boundary-scan testing without external probes |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, 0.8 mm ball pitch, RoHS-compliant.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[17:0] | Synchronous bidirectional data I/O | 18-bit DDR data bus; inputs sampled on K/K rising edges, outputs driven on C/C rising edges |
| K / K | Positive/negative input clocks | Edge-paired clocks for address/control/data capture; define all synchronous timing references |
| C / C | Positive/negative output data clocks | Deskew-capable clocks for read data; enable flight-time compensation across multi-device systems |
| CQ / CQ | Echo clocks referenced to C/C | Free-running, phase-aligned copies of C/C; simplify controller data capture without routing delays |
| DOFF | DDR latency mode control | Active-HIGH selects 1.5-cycle DDR-II latency; LOW enables 1-cycle DDR-I compatibility mode |
| ZQ | Output impedance calibration reference | Connects to external resistor to ground; tunes DQ/CQ output drive strength to match PCB trace impedance |
| BWS0 / BWS1 | Byte write select (active low) | Enable partial-word writes: BWS0 controls DQ[8:0], BWS1 controls DQ[17:9] |
| LD | Load strobe | Asserted LOW to latch address and R/W state on next K edge; initiates all burst transactions |
Key Features
| Feature | Design Value |
|---|---|
| Two-word burst architecture | Reduces external address bus toggling by 50% versus single-word SRAMs, lowering EMI and routing complexity |
| Programmable output drive (HSTL) | Adjusts DQ/CQ slew rate and strength via ZQ calibration, improving signal integrity on long traces |
| Dual clock domains (K/K + C/C) | Enables independent optimization of input setup/hold and output timing margins in high-speed controllers |
| On-chip PLL | Stabilizes internal timing alignment between core and I/O paths, reducing jitter-induced setup violations |
| JTAG 1149.1 test port | Supports production-level boundary scan for interconnect verification without physical probe access |
Applications
| Telecom Line Card Buffering | High-Speed Test Equipment Memory |
|---|---|
|
Use Scenario: Storing incoming/outgoing packet headers and metadata in 10G/25G Ethernet line cards. IC Role / Device Role / Timing Role: Low-latency, burst-mode SRAM acting as first-level packet buffer between SERDES and traffic manager ASIC. Use Value: 1.5-cycle DDR-II latency and echo clocks ensure deterministic read timing under variable packet load, minimizing jitter-induced FIFO overflow. |
Use Scenario: Capturing high-fidelity waveform samples in automated test equipment with >200 MS/s sampling rates. IC Role / Device Role / Timing Role: Synchronous burst memory staging acquired samples before compression or offload to host processor. Use Value: Two-word burst reduces address bus activity by half, allowing stable 250 MHz operation on dense PCB layouts with minimal crosstalk. |
| Industrial PLC Data Logging | Avionics Sensor Fusion Buffer |
|
Use Scenario: Temporarily storing sensor readings and control loop outputs during deterministic real-time execution cycles. IC Role / Device Role / Timing Role: Deterministic-access SRAM providing guaranteed sub-20 ns read/write turnaround for safety-critical control loops. Use Value: DOFF-selectable 1-cycle DDR-I mode ensures worst-case latency predictability required for IEC 61508 SIL-3 compliance. |
Use Scenario: Aggregating time-stamped inertial measurement unit (IMU) and GPS data streams in flight control units. IC Role / Device Role / Timing Role: Burst-capable memory synchronizing multi-source sensor data with precise timestamp alignment. Use Value: CQ/CQ echo clocks eliminate skew between data and capture clock across multiple SRAMs, preserving nanosecond-level timestamp coherence. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar DDR II SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AS7C3318A-250BIN | Single-ended clock interface (no K/K or C/C pairs); 1-cycle fixed latency; no ZQ calibration | Lacks echo clocks and differential timing control - unsuitable for >200 MHz multi-device synchronization | Select only for cost-sensitive, lower-speed designs where board-level deskew is handled externally |
| IS45S18180J-25BLI | SDR interface (not DDR); 166 MHz max clock; 3.3 V I/O; no burst counter or echo clocks | Requires full address bus per access; incompatible with DDR-II controller timing requirements | Use only as drop-in replacement in legacy SDR-based systems - not functionally equivalent |
Compared with AS7C3318A-250BIN and IS45S18180J-25BLI, CY7C1318KV18-250BZCT uniquely provides true DDR-II timing with echo clocks, programmable impedance, and selectable latency - essential for new designs targeting >200 MHz burst throughput and multi-SRAM synchronization.
Availability
CY7C1318KV18-250BZCT is available at Aetrix Electronics and suitable for telecom infrastructure, automated test equipment, industrial PLCs, and avionics subsystems requiring stable component supply and long-term manufacturing continuity.
Supply support for CY7C1318KV18-250BZCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.
CY7C1318KV18 belongs to Cypress's DDR II SRAM product line, engineered specifically for deterministic, low-latency burst buffering in high-speed serial data systems where timing precision and signal integrity are critical.
FAQ
What is the function of the DOFF pin on CY7C1318KV18-250BZCT?
The DOFF (DDR Off) pin configures read latency mode: when asserted HIGH, it enables DDR-II operation with 1.5-cycle latency; when LOW, it reverts to DDR-I mode with 1-cycle latency. This allows backward compatibility with existing DDR-I controllers while supporting higher bandwidth in optimized systems. DOFF is sampled synchronously on the rising edge of K.
Can CY7C1318KV18-250BZCT operate with only one clock signal (K) instead of K/K pair?
Yes - the device supports single-clock mode where K serves as both positive and negative clock reference. In this mode, C and C must be tied together and driven by K, and CQ/CQ derive from K. However, dual-clock operation is required to achieve full DDR-II timing benefits including deskew and minimized flight-time mismatch across multi-device systems.
How does ZQ calibration affect signal integrity in high-speed designs?
ZQ calibration adjusts the output driver impedance of DQ and CQ pins to match the characteristic impedance of the PCB trace (typically 50 Ω). By connecting an external 240 Ω resistor from ZQ to ground, the device sets output strength to 0.2 × RQ = 48 Ω, minimizing reflections and improving eye diagram margins at 500 Mbps per pin.
Is CY7C1318KV18-250BZCT pin-compatible with other devices in the CY7C13xxKV18 family?
No - CY7C1318KV18-250BZCT (1M × 18) uses a distinct 165-ball FBGA pinout optimized for its 18-bit data width and BWS0/BWS1 byte-select mapping. CY7C1320KV18 (512K × 36) has different address count, BWS[3:0] signals, and DQ[35:0] layout, making them mechanically and electrically incompatible despite shared architecture.
CY7C1318KV18-250BZCT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II
- Memory Size:
- 18Mbit
- Memory Organization:
- 1M x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- 250 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C1318KV18-250BZCT FAQ
1.How can I place an order for CY7C1318KV18-250BZCT through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1318KV18-250BZCT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1318KV18-250BZCT reliable?
The price and inventory of CY7C1318KV18-250BZCT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1318KV18-250BZCT is usually 5 days.
3.What payment methods are accepted for CY7C1318KV18-250BZCT?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1318KV18-250BZCT transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY7C1318KV18-250BZCT?
CY7C1318KV18-250BZCT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY7C1318KV18-250BZCT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1318KV18-250BZCT?
For technical support, including CY7C1318KV18-250BZCT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1318KV18-250BZCT requirements.
6.How does Aetrix verify that CY7C1318KV18-250BZCT is sourced from the original manufacturer or authorized distributors?
All CY7C1318KV18-250BZCT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1318KV18-250BZCT meets industry standards.
7.What is the process for return or replacement of CY7C1318KV18-250BZCT?
All CY7C1318KV18-250BZCT units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1318KV18-250BZCT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1318KV18-250BZCT part is unused and in its original packaging.
Return procedure for CY7C1318KV18-250BZCT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY7C1318KV18-250BZCT Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
LDO regulator guide covering low dropout voltage, power dissipation, thermal design, PSRR, output noise, capacitor stability, adjustable LDO circuits, LDO vs buck converter and datasheet selection chec…
Conditional Access Module guide covering CAM meaning, CI/CI+ interface, smart card authorization, DVB security workflow, TV and set-top box compatibility, internal electronics, ESD protection, connecto…
Guide to electronic component obsolescence covering EOL risk, PCN/PDN notices, last-time buy planning, replacement options, form-fit-function validation, counterfeit risk and BOM lifecycle management.
18650 battery guide covering lithium-ion cell basics, 3.6V/3.7V voltage, 4.2V charging, mAh and Wh capacity, protected cells, chargers, BMS, series-parallel packs, holders, welding and sourcing checks.…

