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Infineon Technologies CY7C1318KV18-250BZCT

Part No.:
CY7C1318KV18-250BZCT
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C1318KV18-250BZCT.pdf
Description:
IC SRAM 18MBIT PAR 165FBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:1,671

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Product details

Overview

CY7C1318KV18-250BZCT from Cypress Semiconductor is a 18-Mbit (1M × 18) DDR II synchronous SRAM with two-word burst architecture, 250 MHz maximum clock frequency, 1.8 V core supply, and HSTL I/O compatible with 1.5 V/1.8 V VDDQ. It delivers 900 MB/s peak bandwidth via double-data-rate transfers at 500 Mbps per pin and supports precise timing using dual input clocks (K/K) and echo clocks (CQ/CQ). Used in high-speed networking line cards for packet buffering.

For engineers reviewing the CY7C1318KV18-250BZCT datasheet, CY7C1318KV18-250BZCT pinout, CY7C1318KV18-250BZCT application, or CY7C1318KV18-250BZCT equivalent, key selection criteria include DDR-II burst latency mode (DOFF-controlled), 165-ball FBGA package mechanical compatibility, HSTL output drive programmability, and JTAG 1149.1 test access support.

Technical Context

The device implements a synchronous pipelined architecture with internal burst counter driven by A0, latching addresses on alternate rising edges of K and K. Read data is registered and driven on rising edges of C and C (or K and K in single-clock mode), enabling deterministic 1.5-cycle read latency when DOFF = HIGH or 1-cycle latency when DOFF = LOW.

It integrates a PLL for accurate data placement, echo clocks (CQ/CQ) synchronized to C/C for simplified system-level data capture, and ZQ-calibrated output impedance matching. All synchronous inputs pass through edge-triggered registers; writes use on-chip self-timed control logic with byte-write select (BWS0/BWS1) for partial-word updates.

Key Specifications

Parameter Value and Actual Design Meaning
Density 18 Mbit (1M × 18 configuration)
Max Clock Frequency 250 MHz - sets maximum sustained burst throughput and system timing margin
Data Rate 500 Mbps per DQ pin - enables 900 MB/s aggregate bandwidth with 18-bit bus
Read Latency 1.5 cycles (DOFF = HIGH) or 1 cycle (DOFF = LOW) - determines pipeline depth in controller design
Supply Voltages 1.8 V core (VDD), 1.4–1.8 V I/O (VDDQ) - supports mixed-voltage board interfaces
Package 165-ball FBGA (13 × 15 × 1.4 mm) - standard footprint for high-pin-count DDR memory placement
JTAG Support IEEE 1149.1 compliant TAP - enables boundary-scan testing without external probes

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, 0.8 mm ball pitch, RoHS-compliant.

Pin/Terminal Circuit Role Design Meaning
DQ[17:0] Synchronous bidirectional data I/O 18-bit DDR data bus; inputs sampled on K/K rising edges, outputs driven on C/C rising edges
K / K Positive/negative input clocks Edge-paired clocks for address/control/data capture; define all synchronous timing references
C / C Positive/negative output data clocks Deskew-capable clocks for read data; enable flight-time compensation across multi-device systems
CQ / CQ Echo clocks referenced to C/C Free-running, phase-aligned copies of C/C; simplify controller data capture without routing delays
DOFF DDR latency mode control Active-HIGH selects 1.5-cycle DDR-II latency; LOW enables 1-cycle DDR-I compatibility mode
ZQ Output impedance calibration reference Connects to external resistor to ground; tunes DQ/CQ output drive strength to match PCB trace impedance
BWS0 / BWS1 Byte write select (active low) Enable partial-word writes: BWS0 controls DQ[8:0], BWS1 controls DQ[17:9]
LD Load strobe Asserted LOW to latch address and R/W state on next K edge; initiates all burst transactions

Key Features

Feature Design Value
Two-word burst architecture Reduces external address bus toggling by 50% versus single-word SRAMs, lowering EMI and routing complexity
Programmable output drive (HSTL) Adjusts DQ/CQ slew rate and strength via ZQ calibration, improving signal integrity on long traces
Dual clock domains (K/K + C/C) Enables independent optimization of input setup/hold and output timing margins in high-speed controllers
On-chip PLL Stabilizes internal timing alignment between core and I/O paths, reducing jitter-induced setup violations
JTAG 1149.1 test port Supports production-level boundary scan for interconnect verification without physical probe access

Applications

Telecom Line Card Buffering High-Speed Test Equipment Memory

Use Scenario: Storing incoming/outgoing packet headers and metadata in 10G/25G Ethernet line cards.

IC Role / Device Role / Timing Role: Low-latency, burst-mode SRAM acting as first-level packet buffer between SERDES and traffic manager ASIC.

Use Value: 1.5-cycle DDR-II latency and echo clocks ensure deterministic read timing under variable packet load, minimizing jitter-induced FIFO overflow.

Use Scenario: Capturing high-fidelity waveform samples in automated test equipment with >200 MS/s sampling rates.

IC Role / Device Role / Timing Role: Synchronous burst memory staging acquired samples before compression or offload to host processor.

Use Value: Two-word burst reduces address bus activity by half, allowing stable 250 MHz operation on dense PCB layouts with minimal crosstalk.

Industrial PLC Data Logging Avionics Sensor Fusion Buffer

Use Scenario: Temporarily storing sensor readings and control loop outputs during deterministic real-time execution cycles.

IC Role / Device Role / Timing Role: Deterministic-access SRAM providing guaranteed sub-20 ns read/write turnaround for safety-critical control loops.

Use Value: DOFF-selectable 1-cycle DDR-I mode ensures worst-case latency predictability required for IEC 61508 SIL-3 compliance.

Use Scenario: Aggregating time-stamped inertial measurement unit (IMU) and GPS data streams in flight control units.

IC Role / Device Role / Timing Role: Burst-capable memory synchronizing multi-source sensor data with precise timestamp alignment.

Use Value: CQ/CQ echo clocks eliminate skew between data and capture clock across multiple SRAMs, preserving nanosecond-level timestamp coherence.

Equivalent & Alternatives

The following parts are listed as comparable options for similar DDR II SRAM applications.

Alternative Part Technical Difference Application Difference Selection Advice
AS7C3318A-250BIN Single-ended clock interface (no K/K or C/C pairs); 1-cycle fixed latency; no ZQ calibration Lacks echo clocks and differential timing control - unsuitable for >200 MHz multi-device synchronization Select only for cost-sensitive, lower-speed designs where board-level deskew is handled externally
IS45S18180J-25BLI SDR interface (not DDR); 166 MHz max clock; 3.3 V I/O; no burst counter or echo clocks Requires full address bus per access; incompatible with DDR-II controller timing requirements Use only as drop-in replacement in legacy SDR-based systems - not functionally equivalent

Compared with AS7C3318A-250BIN and IS45S18180J-25BLI, CY7C1318KV18-250BZCT uniquely provides true DDR-II timing with echo clocks, programmable impedance, and selectable latency - essential for new designs targeting >200 MHz burst throughput and multi-SRAM synchronization.

Availability

CY7C1318KV18-250BZCT is available at Aetrix Electronics and suitable for telecom infrastructure, automated test equipment, industrial PLCs, and avionics subsystems requiring stable component supply and long-term manufacturing continuity.

Supply support for CY7C1318KV18-250BZCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.

CY7C1318KV18 belongs to Cypress's DDR II SRAM product line, engineered specifically for deterministic, low-latency burst buffering in high-speed serial data systems where timing precision and signal integrity are critical.

FAQ

What is the function of the DOFF pin on CY7C1318KV18-250BZCT?

The DOFF (DDR Off) pin configures read latency mode: when asserted HIGH, it enables DDR-II operation with 1.5-cycle latency; when LOW, it reverts to DDR-I mode with 1-cycle latency. This allows backward compatibility with existing DDR-I controllers while supporting higher bandwidth in optimized systems. DOFF is sampled synchronously on the rising edge of K.

Can CY7C1318KV18-250BZCT operate with only one clock signal (K) instead of K/K pair?

Yes - the device supports single-clock mode where K serves as both positive and negative clock reference. In this mode, C and C must be tied together and driven by K, and CQ/CQ derive from K. However, dual-clock operation is required to achieve full DDR-II timing benefits including deskew and minimized flight-time mismatch across multi-device systems.

How does ZQ calibration affect signal integrity in high-speed designs?

ZQ calibration adjusts the output driver impedance of DQ and CQ pins to match the characteristic impedance of the PCB trace (typically 50 Ω). By connecting an external 240 Ω resistor from ZQ to ground, the device sets output strength to 0.2 × RQ = 48 Ω, minimizing reflections and improving eye diagram margins at 500 Mbps per pin.

Is CY7C1318KV18-250BZCT pin-compatible with other devices in the CY7C13xxKV18 family?

No - CY7C1318KV18-250BZCT (1M × 18) uses a distinct 165-ball FBGA pinout optimized for its 18-bit data width and BWS0/BWS1 byte-select mapping. CY7C1320KV18 (512K × 36) has different address count, BWS[3:0] signals, and DQ[35:0] layout, making them mechanically and electrically incompatible despite shared architecture.

CY7C1318KV18-250BZCT Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tape & Reel (TR)
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, DDR II
Memory Size:
18Mbit
Memory Organization:
1M x 18
Memory Interface:
Parallel
Clock Frequency:
250 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (13x15)

CY7C1318KV18-250BZCT FAQ

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Please submit a Request for Quotation (RFQ) for CY7C1318KV18-250BZCT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for CY7C1318KV18-250BZCT reliable?

The price and inventory of CY7C1318KV18-250BZCT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1318KV18-250BZCT is usually 5 days.

3.What payment methods are accepted for CY7C1318KV18-250BZCT?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1318KV18-250BZCT transactions.

Note: Certain payment methods may incur a processing fee.

4.How is shipping managed for CY7C1318KV18-250BZCT?

CY7C1318KV18-250BZCT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your CY7C1318KV18-250BZCT order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for CY7C1318KV18-250BZCT?

For technical support, including CY7C1318KV18-250BZCT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1318KV18-250BZCT requirements.

6.How does Aetrix verify that CY7C1318KV18-250BZCT is sourced from the original manufacturer or authorized distributors?

All CY7C1318KV18-250BZCT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1318KV18-250BZCT meets industry standards.

7.What is the process for return or replacement of CY7C1318KV18-250BZCT?

All CY7C1318KV18-250BZCT units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1318KV18-250BZCT, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C1318KV18-250BZCT part is unused and in its original packaging.

Return procedure for CY7C1318KV18-250BZCT:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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