Infineon Technologies CY7C1321KV18-250BZCT
- Part No.:
- CY7C1321KV18-250BZCT
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1321KV18-250BZCT.pdf
- Description:
- IC SRAM 18MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
CY7C1321KV18-250BZCT from Cypress Semiconductor is a 18-Mbit synchronous pipelined DDR II SRAM configured as 512K × 36, operating at 250 MHz with 1.8 V core supply and HSTL I/O. It supports four-word burst reads/writes, dual-edge DDR data transfer (500 Mbps per pin), and uses echo clocks (CQ/CQ) for precise high-speed data capture in networking and telecom buffer applications.
For engineers reviewing the CY7C1321KV18-250BZCT datasheet, CY7C1321KV18-250BZCT pinout, CY7C1321KV18-250BZCT application, or CY7C1321KV18-250BZCT equivalent, key selection criteria include its 250 MHz K/K clock frequency, DOFF-configurable read latency (1 or 1.5 cycles), 165-ball FBGA package, 36-bit DDR interface, and JTAG 1149.1 test access support.
Technical Context
This SRAM implements a synchronous pipelined architecture with internal burst counter driven by A[1:0], delivering four sequential 36-bit words per access. All address, control, and data inputs are registered on rising edges of complementary K/K clocks, enabling precise timing alignment in high-speed systems.
The device supports dual-clock domain operation: K/K for address/control/data input registration and C/C for output data strobing, with echo clocks CQ/CQ synchronized to C/C to eliminate board-level skew. Its PLL ensures accurate data placement, and ZQ pin enables programmable output impedance matching to system bus termination.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Organization | 18 Mbit / 512K × 36 - provides 36-bit wide data path for high-throughput packet buffering |
| Max Clock Frequency (K/K) | 250 MHz - defines maximum sustained burst transaction rate of 250 million cycles/sec |
| Data Rate (DDR) | 500 Mbps per DQ pin - achieved via double-data-rate transfers on both edges of C/C clocks |
| Read Latency | 1 cycle (DOFF = LOW) or 1.5 cycles (DOFF = HIGH) - selectable timing mode for system-level synchronization trade-offs |
| Supply Voltages | 1.8 V core (VDD), 1.4–1.8 V I/O (VDDQ) - supports mixed-voltage system integration with HSTL compatibility |
| Package | 165-ball FBGA (13 × 15 × 1.4 mm) - surface-mount footprint optimized for dense routing in telecom line cards |
| JTAG Support | IEEE 1149.1 compliant TAP - enables boundary-scan testing and in-system debug without additional test fixtures |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, RoHS-compliant, Pb-free option available.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[35:0] | Synchronous bidirectional data bus | 36-bit DDR I/O shared between read output and write input; driven on rising edges of C/C (or K/K in single-clock mode) |
| K / K | Complementary input clocks | Rising edges latch all synchronous inputs (address, R/W, LD, BWS); define burst initiation and write sampling timing |
| C / C | Complementary output data clocks | Strobe read data outputs; used with CQ/CQ to deskew flight time across multiple SRAMs on same bus |
| CQ / CQ | Echo clocks referenced to C/C | Free-running, phase-aligned copies of C/C; simplify controller data capture without per-device delay tuning |
| DOFF | Read latency configuration input | Active-HIGH selects 1.5-cycle latency (DDR II mode); LOW enables 1-cycle latency (DDR I compatibility) |
| ZQ | Output impedance calibration reference | Connect to external resistor to ground to tune DQ/CQ drive strength to match 50 Ω or 60 Ω trace impedance |
| LD | Load enable for burst address | Sampled on K edge to capture A[18:0] and R/W; initiates four-word burst sequence starting at loaded address |
| BWS[3:0] | Byte write select (active LOW) | Four independent 9-bit byte masks; allows partial 36-bit writes without read-modify-write overhead |
Key Features
| Feature | Design Value |
|---|---|
| Four-word burst architecture | Reduces external address bus toggling by 75% versus single-word access - lowers EMI and simplifies controller logic |
| Programmable output drive strength (ZQ) | Enables dynamic impedance matching to PCB trace characteristics - improves signal integrity without external resistors |
| Dual-clock domain (K/K + C/C) | Decouples input capture timing from output strobe timing - eliminates setup/hold violations in multi-SRAM topologies |
| Configurable read latency (DOFF) | Allows migration from legacy DDR I designs (1-cycle) to higher-performance DDR II (1.5-cycle) without hardware change |
| Integrated PLL | Minimizes jitter on CQ/CQ outputs - ensures < ±50 ps skew between echo clocks and data valid windows |
Applications
| Telecom Line Card Buffering | Network Packet Switching |
|---|---|
|
Use Scenario: Storing ingress/egress packet headers and payload fragments in 10G/40G Ethernet switch fabric ASIC interfaces. IC Role / Device Role / Timing Role: High-bandwidth, low-latency shared memory buffer interfacing directly with SerDes MAC controllers via HSTL buses. Use Value: 512K × 36 organization matches typical packet descriptor size; 250 MHz DDR timing meets sub-20 ns access requirements for cut-through switching. |
Use Scenario: Acting as frame buffer in multi-port Layer 2/L3 forwarding engines handling IPv4/IPv6 lookup tables and ACL entries. IC Role / Device Role / Timing Role: Synchronous burst-access memory supporting parallel TCAM-assisted table lookups with deterministic latency. Use Value: Four-word burst reduces controller address generation overhead; DOFF pin enables latency tuning to match pipeline stages. |
| Baseband Processing in Wireless Infrastructure | Industrial Real-Time Data Acquisition |
|
Use Scenario: Temporary storage of OFDM symbol samples between FFT processing blocks in LTE/5G remote radio head baseband units. IC Role / Device Role / Timing Role: DDR II SRAM providing glitch-free, jitter-controlled data handoff between FPGA-based DSP pipelines. Use Value: CQ/CQ echo clocks align sampled data edges precisely with FPGA IDELAYCTRL inputs - eliminates manual delay calibration. |
Use Scenario: Capturing synchronized analog channel data from high-speed ADCs in precision test equipment and power quality analyzers. IC Role / Device Role / Timing Role: Burst-mode memory buffer accepting time-stamped sample streams at >200 MSPS aggregate rate. Use Value: 1.8 V HSTL I/O ensures noise immunity in mixed-signal environments; ZQ calibration maintains signal fidelity across temperature drift. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AS7C331024B-250BIN | 32-Mbit (1M × 32), 250 MHz, single-ended SSTL-18 I/O, no echo clocks or ZQ calibration | Lacks DDR timing flexibility and skew compensation - requires tighter PCB layout control and external termination | Select when cost-sensitive designs prioritize density over timing margin and do not require echo-clock–based capture simplification |
| IS61WV102436BLL-250BLI | 36-Mbit (1M × 36), 250 MHz, asynchronous interface, no DDR, no burst, no JTAG | No burst or DDR capability - limits bandwidth scalability; lacks built-in test infrastructure for production test coverage | Select only for legacy systems requiring pin-compatible drop-in replacement where DDR features are unused and test access is handled externally |
Compared with AS7C331024B-250BIN and IS61WV102436BLL-250BLI, CY7C1321KV18-250BZCT uniquely delivers DDR II timing control, echo-clock–assisted data capture, and on-die impedance tuning - critical for maintaining signal integrity above 400 Mbps per pin in dense, multi-device memory subsystems.
Availability
CY7C1321KV18-250BZCT is available at Aetrix Electronics and suitable for telecom line card buffering, network packet switching, baseband processing in wireless infrastructure, and industrial real-time data acquisition requiring stable component supply across extended product lifecycles.
Supply support for CY7C1321KV18-250BZCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.
CY7C1321KV18 belongs to Cypress's DDR II SRAM product line, designed specifically for high-bandwidth, low-latency buffering in packet-switched networks and real-time signal processing systems demanding deterministic timing and robust signal integrity.
FAQ
What is the function of the DOFF pin on CY7C1321KV18-250BZCT?
The DOFF (Data Output OFF) pin configures read latency mode: when asserted HIGH, it enables DDR II operation with 1.5-cycle latency for improved timing margin; when LOW, it reverts to DDR I behavior with 1-cycle latency for backward compatibility. This pin is sampled synchronously on the rising edge of K and remains latched until the next LD assertion.
Can CY7C1321KV18-250BZCT operate without external C and C clocks?
Yes - the device supports single-clock mode using only K and K for both input capture and output strobing. In this mode, CQ and CQ are generated relative to K/K instead of C/C, and data output timing references the K/K edges. However, echo-clock–assisted deskewing is lost, requiring tighter board-level timing closure.
How does ZQ calibration affect system-level signal integrity?
ZQ calibration adjusts the output driver impedance of DQ, CQ, and CQ pins to match the system's characteristic trace impedance (typically 50 Ω). By connecting an external resistor (e.g., 240 Ω) between ZQ and GND, the device tunes its drive strength to minimize reflections and improve eye diagram margins - especially critical at 500 Mbps per pin.
Is CY7C1321KV18-250BZCT pin-compatible with CY7C1319KV18-250BZI?
No - although both share the same 165-ball FBGA package, their pinouts differ significantly: CY7C1319KV18-250BZI (1M × 18) uses DQ[17:0] and two BWS pins, while CY7C1321KV18-250BZCT (512K × 36) uses DQ[35:0] and four BWS pins. Signal assignments for BWS, DQ, and array-specific control lines are not interchangeable.
CY7C1321KV18-250BZCT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II
- Memory Size:
- 18Mbit
- Memory Organization:
- 512K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 250 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C1321KV18-250BZCT FAQ
1.How can I place an order for CY7C1321KV18-250BZCT through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1321KV18-250BZCT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1321KV18-250BZCT reliable?
The price and inventory of CY7C1321KV18-250BZCT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1321KV18-250BZCT is usually 5 days.
3.What payment methods are accepted for CY7C1321KV18-250BZCT?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1321KV18-250BZCT transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY7C1321KV18-250BZCT?
CY7C1321KV18-250BZCT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY7C1321KV18-250BZCT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1321KV18-250BZCT?
For technical support, including CY7C1321KV18-250BZCT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1321KV18-250BZCT requirements.
6.How does Aetrix verify that CY7C1321KV18-250BZCT is sourced from the original manufacturer or authorized distributors?
All CY7C1321KV18-250BZCT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1321KV18-250BZCT meets industry standards.
7.What is the process for return or replacement of CY7C1321KV18-250BZCT?
All CY7C1321KV18-250BZCT units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1321KV18-250BZCT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1321KV18-250BZCT part is unused and in its original packaging.
Return procedure for CY7C1321KV18-250BZCT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY7C1321KV18-250BZCT Tags

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M24C02-WMN6TP
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AT24C02C-XHM-T
Microchip Technology

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AT21CS01-STUM10-T
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M24C02-FMC6TG
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AT24CS02-SSHM-T
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93LC46BT-I/OT
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AT24C04C-SSHM-T
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24LC01BT-I/SN
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24AA02UIDT-I/OT
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AT24C08C-STUM-T
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