Infineon Technologies CY7C1321KV18-250BZXC
- Part No.:
- CY7C1321KV18-250BZXC
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1321KV18-250BZXC.pdf
- Description:
- IC SRAM 18MBIT PARALLEL 165FBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
CY7C1321KV18-250BZXC from Cypress Semiconductor is a 18-Mbit synchronous pipelined DDR II SRAM configured as 512K × 36, operating at 250 MHz with 1.8 V core supply and HSTL I/O. It supports four-word burst reads/writes, dual-edge echo clocks (CQ/CQ), and programmable output impedance via ZQ pin. Used in high-bandwidth networking buffers and packet-switching ASIC interfaces where deterministic latency and precise data capture are critical.
For engineers reviewing the CY7C1321KV18-250BZXC datasheet, CY7C1321KV18-250BZXC pinout, CY7C1321KV18-250BZXC application, or CY7C1321KV18-250BZXC equivalent, this page delivers verified timing behavior, burst address mapping, DOFF-controlled read latency modes (1-cycle vs. 1.5-cycle), and FBGA-165 package interface details essential for DDR II memory subsystem design.
Technical Context
The device implements a synchronous pipelined architecture with internal two-bit burst counter driven by A[1:0], delivering four sequential 36-bit words per access. All synchronous inputs (R/W, LD, BWS[3:0], A[18:0]) are registered on rising edges of K/K clocks; all outputs (DQ[35:0], CQ/CQ) are edge-aligned to C/C or K/K in single-clock mode.
It integrates a PLL for accurate data placement, JTAG 1149.1 test access port, and variable-drive HSTL output buffers supporting 1.4 V–VDD output swing. Read latency is configurable: 1 cycle when DOFF = LOW (DDR I mode), 1.5 cycles when DOFF = HIGH (DDR II mode), with self-timed writes and echo-clock–assisted data capture eliminating board-level skew compensation.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Organization | 18 Mbit / 512K × 36 - enables compact 36-bit wide memory interfaces without external width expansion |
| Max Clock Frequency | 250 MHz (K/K input) - defines maximum sustained burst throughput of 1.8 GB/s (36-bit × 250 MHz × 2 transfers/cycle) |
| Read Latency | 1 or 1.5 clock cycles - selectable via DOFF pin; determines minimum time from address load to first valid DQ output |
| I/O Voltage | 1.8 V core / 1.4–1.8 V HSTL I/O - compatible with both 1.5 V and 1.8 V system I/O rails |
| Burst Length | Four-word - reduces external address bus toggling frequency by 4× versus single-word access |
| Package | 165-ball FBGA (13 × 15 × 1.4 mm) - standard footprint for high-pin-count DDR SRAMs with thermal and signal integrity optimization |
| Output Impedance Control | ZQ pin with external resistor - calibrates DQ/CQ driver strength to match PCB trace impedance (typically 50 Ω) |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, RoHS-compliant, Pb-free option available (BZXC suffix).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[35:0] | Synchronous bidirectional data bus | 36-bit DDR data path; inputs sampled on K/K rising edges, outputs aligned to C/C rising edges; tristated automatically when deselected |
| K, K | Primary input clocks | Rising edges latch all synchronous inputs (address, R/W, LD, BWS); define burst initiation and write timing reference |
| C, C | Output data clocks | Deskew-capable complementary clocks driving DQ and CQ/CQ; enable matched flight-time capture across multiple SRAMs |
| CQ, CQ | Echo clocks | Free-running, phase-matched copies of C/C; simplify controller-side data capture without per-device delay tuning |
| DOFF | Read latency mode select | LOW → 1-cycle latency (DDR I compatibility); HIGH → 1.5-cycle latency (DDR II optimized timing) |
| ZQ | Output impedance calibration input | Connects to external resistor to ground; sets DQ/CQ driver strength to 0.2 × RQ; cannot be left floating or tied to GND |
| LD | Load strobe | Active-LOW synchronous signal defining start of burst cycle; must be asserted with valid address and R/W before first K edge |
| BWS[3:0] | Byte write selects | Four active-LOW signals controlling 9-bit byte lanes (D[8:0], D[17:9], D[26:18], D[35:27]); allow partial writes without read-modify-write |
Key Features
| Feature | Design Value |
|---|---|
| Four-word burst architecture | Reduces external address bus frequency by 75% versus single-word access, lowering routing complexity and EMI |
| Configurable read latency (1 or 1.5 cycles) | Enables drop-in replacement in DDR I systems (DOFF = LOW) or performance-optimized DDR II designs (DOFF = HIGH) |
| Programmable output drive via ZQ | Eliminates need for external series termination resistors; adapts to varying PCB trace impedances across production batches |
| Integrated echo clocks (CQ/CQ) | Removes requirement for controller-side deskew logic; enables reliable >500 Mbps per pin operation without per-lane delay tuning |
| JTAG 1149.1 boundary scan | Supports automated manufacturing test and interconnect verification in dense BGA layouts without physical probe access |
Applications
| Telecom Line Card Buffer | High-Speed Packet Switch ASIC Interface |
|---|---|
|
Use Scenario: Storing ingress/egress packet headers and metadata in multi-gigabit Ethernet line cards. IC Role / Device Role / Timing Role: High-throughput, low-latency buffer between SerDes PHY and traffic manager ASIC. Use Value: Four-word burst + echo clocks ensure deterministic 250 MHz read/write timing, eliminating jitter-induced packet loss at 10G+ line rates. |
Use Scenario: Providing scratchpad memory for lookup table acceleration in network processor SoCs. IC Role / Device Role / Timing Role: Synchronous DDR II SRAM interfacing directly to custom memory controller with tight setup/hold margins. Use Value: Configurable DOFF latency allows matching to controller pipeline depth; ZQ calibration maintains signal integrity across temperature and voltage variation. |
| Medical Imaging Data Pipeline | Test Equipment Waveform Memory |
|
Use Scenario: Real-time buffering of raw sensor data streams from ultrasound or MRI front-end ADCs. IC Role / Device Role / Timing Role: Burst-access memory staging data between analog acquisition and FPGA-based reconstruction engine. Use Value: 1.8 V HSTL I/O ensures clean signal transitions at 250 MHz; CQ/CQ alignment simplifies FPGA IDELAYCTRL calibration. |
Use Scenario: Storing high-resolution waveform templates in automated test equipment (ATE) pattern generators. IC Role / Device Role / Timing Role: Deterministic latency memory enabling sub-nanosecond trigger-to-output timing consistency. Use Value: 1.5-cycle DDR II mode (DOFF = HIGH) provides tighter timing margin than DDR I for repeatable waveform playback timing. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AS7C331024B-25TIN | 32-Mbit (1M × 32), 25 ns async access, no DDR, no echo clocks, 3.3 V only | Lacks burst, DDR, and timing precision; suited for non-critical control-plane storage, not data-path buffering | Select only if system lacks DDR clock infrastructure and tolerates higher latency and lower bandwidth. |
| IS61WV102432BLL-15BLI | 32-Mbit (1M × 32), 15 ns async, 3.3 V/2.5 V, no burst, no JTAG, no ZQ calibration | No synchronous timing control; requires external address latching and write enable management | Choose only for legacy designs requiring pin-compatible upgrade from older async SRAMs, not DDR II systems. |
Compared with AS7C331024B-25TIN and IS61WV102432BLL-15BLI, CY7C1321KV18-250BZXC delivers 2.5× higher effective bandwidth via DDR and eliminates board-level timing closure challenges through integrated echo clocks and programmable drive strength.
Availability
CY7C1321KV18-250BZXC is available at Aetrix Electronics and suitable for telecom line card buffers, high-speed packet switch ASIC interfaces, medical imaging data pipelines, and test equipment waveform memory requiring stable component supply and long-term industrial availability.
Supply support for CY7C1321KV18-250BZXC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.
CY7C1321KV18 belongs to Cypress's DDR II SRAM product line, engineered specifically for deterministic, high-bandwidth data buffering in networking, test, and medical imaging systems demanding sub-cycle timing control and signal integrity at 250+ MHz.
FAQ
What is the function of the DOFF pin on CY7C1321KV18-250BZXC?
The DOFF (Data Output OFF) pin configures read latency mode: when asserted HIGH, it enables DDR II operation with 1.5-cycle read latency; when LOW, it reverts to DDR I mode with 1-cycle latency. This setting directly affects the timing relationship between LD assertion and first valid DQ output, and must be held stable during power-up and operation.
Can CY7C1321KV18-250BZXC operate without external C and C clocks?
Yes - the device supports single-clock mode where K and K serve as both input and output clocks. In this configuration, C and C pins are unused, CQ/CQ are generated relative to K/K, and timing margins tighten due to lack of deskew capability. Full DDR II performance requires C/C for optimal system-level timing closure.
How does ZQ pin calibration affect signal integrity?
ZQ connects to an external resistor (typically 240 Ω) to ground, enabling on-die calibration of DQ and CQ output driver strength to match PCB trace impedance. This reduces reflection-induced overshoot/undershoot and ensures consistent eye height across voltage and temperature, critical for reliable 250 MHz DDR operation without external termination.
Is CY7C1321KV18-250BZXC pin-compatible with CY7C1319KV18-250BZXC?
No - although both use the same 165-ball FBGA package, pin assignments differ significantly: CY7C1319KV18 has DQ[17:0] and BWS[1:0], while CY7C1321KV18 uses DQ[35:0] and BWS[3:0]. Address bus width (A[19:0] vs. A[18:0]), and byte-select mapping are incompatible; PCB layout and controller firmware must be redesigned for migration.
CY7C1321KV18-250BZXC Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II
- Memory Size:
- 18Mbit
- Memory Organization:
- 512K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 250 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C1321KV18-250BZXC FAQ
1.How can I place an order for CY7C1321KV18-250BZXC through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1321KV18-250BZXC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1321KV18-250BZXC reliable?
The price and inventory of CY7C1321KV18-250BZXC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1321KV18-250BZXC is usually 5 days.
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Note: Certain payment methods may incur a processing fee.
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Once your CY7C1321KV18-250BZXC order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1321KV18-250BZXC?
For technical support, including CY7C1321KV18-250BZXC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1321KV18-250BZXC requirements.
6.How does Aetrix verify that CY7C1321KV18-250BZXC is sourced from the original manufacturer or authorized distributors?
All CY7C1321KV18-250BZXC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1321KV18-250BZXC meets industry standards.
7.What is the process for return or replacement of CY7C1321KV18-250BZXC?
All CY7C1321KV18-250BZXC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1321KV18-250BZXC, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1321KV18-250BZXC part is unused and in its original packaging.
Return procedure for CY7C1321KV18-250BZXC:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY7C1321KV18-250BZXC Tags

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