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Infineon Technologies CY7C1321KV18-250BZXC

Part No.:
CY7C1321KV18-250BZXC
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C1321KV18-250BZXC.pdf
Description:
IC SRAM 18MBIT PARALLEL 165FBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:3,118

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Product details

Overview

CY7C1321KV18-250BZXC from Cypress Semiconductor is a 18-Mbit synchronous pipelined DDR II SRAM configured as 512K × 36, operating at 250 MHz with 1.8 V core supply and HSTL I/O. It supports four-word burst reads/writes, dual-edge echo clocks (CQ/CQ), and programmable output impedance via ZQ pin. Used in high-bandwidth networking buffers and packet-switching ASIC interfaces where deterministic latency and precise data capture are critical.

For engineers reviewing the CY7C1321KV18-250BZXC datasheet, CY7C1321KV18-250BZXC pinout, CY7C1321KV18-250BZXC application, or CY7C1321KV18-250BZXC equivalent, this page delivers verified timing behavior, burst address mapping, DOFF-controlled read latency modes (1-cycle vs. 1.5-cycle), and FBGA-165 package interface details essential for DDR II memory subsystem design.

Technical Context

The device implements a synchronous pipelined architecture with internal two-bit burst counter driven by A[1:0], delivering four sequential 36-bit words per access. All synchronous inputs (R/W, LD, BWS[3:0], A[18:0]) are registered on rising edges of K/K clocks; all outputs (DQ[35:0], CQ/CQ) are edge-aligned to C/C or K/K in single-clock mode.

It integrates a PLL for accurate data placement, JTAG 1149.1 test access port, and variable-drive HSTL output buffers supporting 1.4 V–VDD output swing. Read latency is configurable: 1 cycle when DOFF = LOW (DDR I mode), 1.5 cycles when DOFF = HIGH (DDR II mode), with self-timed writes and echo-clock–assisted data capture eliminating board-level skew compensation.

Key Specifications

Parameter Value and Actual Design Meaning
Density & Organization 18 Mbit / 512K × 36 - enables compact 36-bit wide memory interfaces without external width expansion
Max Clock Frequency 250 MHz (K/K input) - defines maximum sustained burst throughput of 1.8 GB/s (36-bit × 250 MHz × 2 transfers/cycle)
Read Latency 1 or 1.5 clock cycles - selectable via DOFF pin; determines minimum time from address load to first valid DQ output
I/O Voltage 1.8 V core / 1.4–1.8 V HSTL I/O - compatible with both 1.5 V and 1.8 V system I/O rails
Burst Length Four-word - reduces external address bus toggling frequency by 4× versus single-word access
Package 165-ball FBGA (13 × 15 × 1.4 mm) - standard footprint for high-pin-count DDR SRAMs with thermal and signal integrity optimization
Output Impedance Control ZQ pin with external resistor - calibrates DQ/CQ driver strength to match PCB trace impedance (typically 50 Ω)

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, RoHS-compliant, Pb-free option available (BZXC suffix).

Pin/Terminal Circuit Role Design Meaning
DQ[35:0] Synchronous bidirectional data bus 36-bit DDR data path; inputs sampled on K/K rising edges, outputs aligned to C/C rising edges; tristated automatically when deselected
K, K Primary input clocks Rising edges latch all synchronous inputs (address, R/W, LD, BWS); define burst initiation and write timing reference
C, C Output data clocks Deskew-capable complementary clocks driving DQ and CQ/CQ; enable matched flight-time capture across multiple SRAMs
CQ, CQ Echo clocks Free-running, phase-matched copies of C/C; simplify controller-side data capture without per-device delay tuning
DOFF Read latency mode select LOW → 1-cycle latency (DDR I compatibility); HIGH → 1.5-cycle latency (DDR II optimized timing)
ZQ Output impedance calibration input Connects to external resistor to ground; sets DQ/CQ driver strength to 0.2 × RQ; cannot be left floating or tied to GND
LD Load strobe Active-LOW synchronous signal defining start of burst cycle; must be asserted with valid address and R/W before first K edge
BWS[3:0] Byte write selects Four active-LOW signals controlling 9-bit byte lanes (D[8:0], D[17:9], D[26:18], D[35:27]); allow partial writes without read-modify-write

Key Features

Feature Design Value
Four-word burst architecture Reduces external address bus frequency by 75% versus single-word access, lowering routing complexity and EMI
Configurable read latency (1 or 1.5 cycles) Enables drop-in replacement in DDR I systems (DOFF = LOW) or performance-optimized DDR II designs (DOFF = HIGH)
Programmable output drive via ZQ Eliminates need for external series termination resistors; adapts to varying PCB trace impedances across production batches
Integrated echo clocks (CQ/CQ) Removes requirement for controller-side deskew logic; enables reliable >500 Mbps per pin operation without per-lane delay tuning
JTAG 1149.1 boundary scan Supports automated manufacturing test and interconnect verification in dense BGA layouts without physical probe access

Applications

Telecom Line Card Buffer High-Speed Packet Switch ASIC Interface

Use Scenario: Storing ingress/egress packet headers and metadata in multi-gigabit Ethernet line cards.

IC Role / Device Role / Timing Role: High-throughput, low-latency buffer between SerDes PHY and traffic manager ASIC.

Use Value: Four-word burst + echo clocks ensure deterministic 250 MHz read/write timing, eliminating jitter-induced packet loss at 10G+ line rates.

Use Scenario: Providing scratchpad memory for lookup table acceleration in network processor SoCs.

IC Role / Device Role / Timing Role: Synchronous DDR II SRAM interfacing directly to custom memory controller with tight setup/hold margins.

Use Value: Configurable DOFF latency allows matching to controller pipeline depth; ZQ calibration maintains signal integrity across temperature and voltage variation.

Medical Imaging Data Pipeline Test Equipment Waveform Memory

Use Scenario: Real-time buffering of raw sensor data streams from ultrasound or MRI front-end ADCs.

IC Role / Device Role / Timing Role: Burst-access memory staging data between analog acquisition and FPGA-based reconstruction engine.

Use Value: 1.8 V HSTL I/O ensures clean signal transitions at 250 MHz; CQ/CQ alignment simplifies FPGA IDELAYCTRL calibration.

Use Scenario: Storing high-resolution waveform templates in automated test equipment (ATE) pattern generators.

IC Role / Device Role / Timing Role: Deterministic latency memory enabling sub-nanosecond trigger-to-output timing consistency.

Use Value: 1.5-cycle DDR II mode (DOFF = HIGH) provides tighter timing margin than DDR I for repeatable waveform playback timing.

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed synchronous SRAM applications.

Alternative Part Technical Difference Application Difference Selection Advice
AS7C331024B-25TIN 32-Mbit (1M × 32), 25 ns async access, no DDR, no echo clocks, 3.3 V only Lacks burst, DDR, and timing precision; suited for non-critical control-plane storage, not data-path buffering Select only if system lacks DDR clock infrastructure and tolerates higher latency and lower bandwidth.
IS61WV102432BLL-15BLI 32-Mbit (1M × 32), 15 ns async, 3.3 V/2.5 V, no burst, no JTAG, no ZQ calibration No synchronous timing control; requires external address latching and write enable management Choose only for legacy designs requiring pin-compatible upgrade from older async SRAMs, not DDR II systems.

Compared with AS7C331024B-25TIN and IS61WV102432BLL-15BLI, CY7C1321KV18-250BZXC delivers 2.5× higher effective bandwidth via DDR and eliminates board-level timing closure challenges through integrated echo clocks and programmable drive strength.

Availability

CY7C1321KV18-250BZXC is available at Aetrix Electronics and suitable for telecom line card buffers, high-speed packet switch ASIC interfaces, medical imaging data pipelines, and test equipment waveform memory requiring stable component supply and long-term industrial availability.

Supply support for CY7C1321KV18-250BZXC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.

CY7C1321KV18 belongs to Cypress's DDR II SRAM product line, engineered specifically for deterministic, high-bandwidth data buffering in networking, test, and medical imaging systems demanding sub-cycle timing control and signal integrity at 250+ MHz.

FAQ

What is the function of the DOFF pin on CY7C1321KV18-250BZXC?

The DOFF (Data Output OFF) pin configures read latency mode: when asserted HIGH, it enables DDR II operation with 1.5-cycle read latency; when LOW, it reverts to DDR I mode with 1-cycle latency. This setting directly affects the timing relationship between LD assertion and first valid DQ output, and must be held stable during power-up and operation.

Can CY7C1321KV18-250BZXC operate without external C and C clocks?

Yes - the device supports single-clock mode where K and K serve as both input and output clocks. In this configuration, C and C pins are unused, CQ/CQ are generated relative to K/K, and timing margins tighten due to lack of deskew capability. Full DDR II performance requires C/C for optimal system-level timing closure.

How does ZQ pin calibration affect signal integrity?

ZQ connects to an external resistor (typically 240 Ω) to ground, enabling on-die calibration of DQ and CQ output driver strength to match PCB trace impedance. This reduces reflection-induced overshoot/undershoot and ensures consistent eye height across voltage and temperature, critical for reliable 250 MHz DDR operation without external termination.

Is CY7C1321KV18-250BZXC pin-compatible with CY7C1319KV18-250BZXC?

No - although both use the same 165-ball FBGA package, pin assignments differ significantly: CY7C1319KV18 has DQ[17:0] and BWS[1:0], while CY7C1321KV18 uses DQ[35:0] and BWS[3:0]. Address bus width (A[19:0] vs. A[18:0]), and byte-select mapping are incompatible; PCB layout and controller firmware must be redesigned for migration.

CY7C1321KV18-250BZXC Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tray
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, DDR II
Memory Size:
18Mbit
Memory Organization:
512K x 36
Memory Interface:
Parallel
Clock Frequency:
250 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (13x15)

CY7C1321KV18-250BZXC FAQ

1.How can I place an order for CY7C1321KV18-250BZXC through Aetrix?

Please submit a Request for Quotation (RFQ) for CY7C1321KV18-250BZXC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for CY7C1321KV18-250BZXC reliable?

The price and inventory of CY7C1321KV18-250BZXC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1321KV18-250BZXC is usually 5 days.

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We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1321KV18-250BZXC transactions.

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CY7C1321KV18-250BZXC orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your CY7C1321KV18-250BZXC order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for CY7C1321KV18-250BZXC?

For technical support, including CY7C1321KV18-250BZXC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1321KV18-250BZXC requirements.

6.How does Aetrix verify that CY7C1321KV18-250BZXC is sourced from the original manufacturer or authorized distributors?

All CY7C1321KV18-250BZXC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1321KV18-250BZXC meets industry standards.

7.What is the process for return or replacement of CY7C1321KV18-250BZXC?

All CY7C1321KV18-250BZXC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1321KV18-250BZXC, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C1321KV18-250BZXC part is unused and in its original packaging.

Return procedure for CY7C1321KV18-250BZXC:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

CY7C1321KV18-250BZXC Tags

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