Infineon Technologies CY7C1370DV25-167AXCT

Overview

CY7C1370DV25-167AXCT from Cypress Semiconductor is a 18-Mbit (512K × 36) synchronous pipelined SRAM with NoBL™ architecture, designed for high-throughput memory subsystems in networking and telecom line cards. It operates at 167 MHz with 3.4 ns clock-to-output time, supports zero-wait-state burst reads/writes, and uses dual power supplies (2.5 V core VDD, 2.5 V I/O VDDQ).

For engineers reviewing the CY7C1370DV25-167AXCT datasheet, CY7C1370DV25-167AXCT pinout, CY7C1370DV25-167AXCT application, or CY7C1370DV25-167AXCT equivalent, key selection criteria include pipelined read/write coherency, byte-write select control (BWa–BWd), synchronous self-timed write timing, and JEDEC-standard 100-pin TQFP packaging with ZZ sleep mode support.

Technical Context

The device implements fully registered synchronous interfaces: all address, control, and data inputs are latched on the rising edge of CLK, and all outputs pass through output registers synchronized to CLK. Its NoBL™ logic eliminates bus latency by enabling true back-to-back read/write operations without wait states.

Burst operation supports both linear and interleaved orders via the MODE strap pin; write cycles use on-chip self-timed circuitry with byte-level granularity controlled by four independent BW signals and WE. Three chip enables (CE1/CE2/CE3) and asynchronous OE provide flexible bank selection and output three-state control.

Key Specifications

Pinout & Package

Package: 100-pin TQFP (14 mm × 20 mm × 1.4 mm), lead-free, RoHS-compliant, JEDEC MO-145AC standard.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar pipelined SRAM applications.

Compared with IDT72V2115L16PF and IS61WV102436BLL-167TQLI, CY7C1370DV25-167AXCT uniquely combines 2.5 V dual-supply operation, hardware-configurable burst order, parity I/O, and integrated ZZ sleep - making it optimal for upgrade paths from ZBT™-based telecom infrastructure.

Availability

CY7C1370DV25-167AXCT is available at Aetrix Electronics and suitable for telecom line card design, network switch buffer implementation, and radar signal processor development requiring stable component supply and long-term obsolescence management.

Supply support for CY7C1370DV25-167AXCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for communications, industrial, and automotive markets.

This device belongs to Cypress's NoBL™ SRAM product line, engineered specifically for zero-latency, high-bandwidth memory subsystems in packet-switched infrastructure where deterministic timing and burst coherency are mandatory.

FAQ

What is the function of the MODE pin on CY7C1370DV25-167AXCT?

The MODE pin is a strap input that selects burst address order: pulled HIGH (or left floating) enables interleaved burst mode; pulled LOW enables linear burst mode. It must be held static during operation and is sampled at power-up/reset. This allows hardware-level compatibility with either ZBT™-legacy (interleaved) or cache-optimized (linear) system architectures without firmware changes.

How does the ZZ pin operate, and what is the errata requirement?

The ZZ pin places the device into ultra-low-power sleep mode when asserted LOW. Per documented errata (page 30), Pin 64 (ZZ) must be externally tied to ground - it is not internally terminated and will not function correctly if left floating or pulled high. This external connection is mandatory for reliable sleep entry/exit behavior.

Can CY7C1370DV25-167AXCT operate with only VDD powered and VDDQ unpowered?

No. Both VDD (2.5 V core) and VDDQ (2.5 V I/O) must be powered within specification before applying CLK or any input signals. The device lacks I/O isolation circuitry between VDDQ and internal logic; unpowered VDDQ risks latch-up or undefined I/O states, violating Absolute Maximum Ratings in Section 21 of the datasheet.

Is JTAG boundary scan functional on this device?

JTAG (IEEE 1149.1) is physically implemented but not guaranteed for production testing. Per errata (page 30), JTAG must be used only in BYPASS mode - TAP functionality is not characterized or validated. For debug or test, rely on functional I/O verification rather than scan-chain diagnostics.