Infineon Technologies CY7C1370DV25-200BZCT

Overview

CY7C1370DV25-200BZCT from Cypress Semiconductor is a 18-Mbit (512K × 36) synchronous pipelined SRAM with NoBL™ architecture, designed for high-throughput memory subsystems in network packet buffers, telecom line cards, and FPGA co-processor caches. It operates at 200 MHz with zero wait states, features 2.5 V core (VDD) and I/O (VDDQ) supplies, 3.0 ns clock-to-output time, and supports linear/interleaved burst reads/writes.

For engineers reviewing the CY7C1370DV25-200BZCT datasheet, CY7C1370DV25-200BZCT pinout, CY7C1370DV25-200BZCT application, or CY7C1370DV25-200BZCT equivalent, this page delivers verified timing behavior, byte-write control logic, ZZ sleep mode implementation, and JEDEC-compliant 100-pin TQFP package integration details.

Technical Context

The device implements fully registered synchronous interfaces: all address, control, and data inputs are latched on the rising edge of CLK, and all outputs pass through output registers synchronized to the same edge. Its NoBL™ logic enables true back-to-back read/write operations without bus latency, eliminating pipeline stalls during mixed-access patterns.

Burst addressing is controlled by ADV/LD and MODE pins-linear or interleaved order selected at power-up-and write operations use synchronous self-timed circuitry qualified by WE and four byte-write selects (BWa–BWd), each governing a 9-bit data/parity group (DQa/DQPa through DQd/DQPd).

Key Specifications

Pinout & Package

Package: 100-pin TQFP (14 mm × 20 mm × 1.4 mm, Pb-free, JEDEC MO-145AC).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar synchronous pipelined SRAM applications.

Compared with IDT72V2115L15PF and IS61WV102436BLL-200TQLI, CY7C1370DV25-200BZCT uniquely combines 200 MHz performance, guaranteed ZZ sleep mode (with GND tie), and IEEE 1149.1 boundary scan - making it optimal for telecom and industrial designs demanding timing rigor, test coverage, and thermal efficiency.

Availability

CY7C1370DV25-200BZCT is available at Aetrix Electronics and suitable for network packet buffers, telecom line card caches, and FPGA co-processor memory subsystems requiring stable component supply across extended production lifecycles.

Supply support for CY7C1370DV25-200BZCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a U.S.-based semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.

This device belongs to Cypress's NoBL™ SRAM product line - engineered specifically for zero-latency, high-throughput memory subsystems in packet-switching infrastructure and real-time embedded control applications.

FAQ

What is the required connection for the ZZ pin on CY7C1370DV25-200BZCT?

The ZZ pin (Pin 64) must be externally connected to ground per documented errata (Page 30 of Rev. *P). This hard tie enables the low-power sleep mode, reducing standby current to ≤70 mA. Leaving ZZ floating or pulling it HIGH disables sleep functionality and may cause undefined behavior.

Does CY7C1370DV25-200BZCT support true dual-port operation?

No - it is a synchronous single-port SRAM with pipelined NoBL™ architecture. While it enables back-to-back reads and writes without wait states, it does not support simultaneous independent read/write access like a true dual-port RAM. Data coherency is maintained via internal write-data steering and output register synchronization.

Can the MODE pin be changed dynamically during operation?

No - the MODE pin is a strap pin sampled at power-up to configure burst order (linear or interleaved). Changing MODE during active operation violates timing and may cause unpredictable burst address generation. It must remain static after initialization.

Is JTAG boundary scan functional on CY7C1370DV25-200BZCT?

JTAG is physically implemented per IEEE 1149.1, but Cypress explicitly advises performing JTAG testing in BYPASS mode due to unguaranteed functionality (errata, Page 30). Production test should rely on functional I/O verification rather than full boundary-scan diagnostics.