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Infineon Technologies CY7C1393BV18-167BZC

Part No.:
CY7C1393BV18-167BZC
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C1393BV18-167BZC.pdf
Description:
IC SRAM 18MBIT PAR 165FBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:2,343

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Product details

Overview

CY7C1393BV18-167BZC from Cypress Semiconductor is a 1M × 18 (18-Mbit), 1.8V synchronous pipelined SRAM with DDR-II Separate I/O architecture, supporting 167 MHz maximum operating frequency, 2-word burst read/write, and dual-clock DDR timing using K/K and C/C pairs. It delivers 600 MT/s effective data rate in high-bandwidth networking buffers and packet memory applications.

For engineers reviewing the CY7C1393BV18-167BZC datasheet, CY7C1393BV18-167BZC pinout, CY7C1393BV18-167BZC application, or CY7C1393BV18-167BZC equivalent, key selection criteria include DDR-II SIO timing margin, HSTL-18 I/O compatibility, DLL-enabled data placement accuracy, and 165-ball FBGA mechanical fit for dense PCB layouts.

Technical Context

This SRAM implements a synchronous, pipelined burst architecture with physically separate read and write data paths-eliminating bus turnaround overhead. Internal organization is two 512K × 18 arrays, accessed via multiplexed address inputs (A[18:0]) latched on alternating rising edges of K and K clocks.

Read data is registered and driven synchronously on both C and C rising edges, while echo clocks CQ/CQ are phase-aligned to C/C for precise system-level capture. The integrated Delay Lock Loop (DLL) aligns internal timing to minimize skew between Q[17:0] and CQ/CQ, enabling reliable operation at 167 MHz with 3.0 ns clock-to-output delay.

Key Specifications

ParameterValue and Actual Design Meaning
Density18 Mbit (1M × 18 configuration)
Max Clock Frequency167 MHz - defines maximum sustained burst throughput of 334 million words/sec
Data Rate600 MT/s - double-data-rate transfer enabled by C/C clock pair
I/O StandardHSTL Class I - ensures impedance-matched 1.4–1.8 V signaling compatible with FPGA/ASIC memory controllers
Core Voltage1.8 V ± 0.1 V - powers internal logic and DLL; requires low-noise regulation
Package165-ball FBGA (13 × 15 × 1.4 mm) - supports fine-pitch routing and thermal dissipation up to 500 mW
Write SelectBWS[1:0] - enables independent 9-bit byte writes per 18-bit word, preserving unselected bytes

Pinout & Package

165-ball Fine-Pitch Ball Grid Array (FBGA) package, 13 mm × 15 mm × 1.4 mm body, RoHS-compliant, with 0.8 mm ball pitch and edge-aligned signal ball layout optimized for controlled-impedance DDR routing.

Pin/TerminalCircuit RoleDesign Meaning
A[18:0]Address Input19-bit multiplexed address bus shared by read/write ports; latched on K/K rising edges
D[17:0]Data Input18-bit synchronous write data path; sampled on both K and K rising edges
Q[17:0]Data Output18-bit synchronous read data path; driven on C/C rising edges with echo-clock alignment
K, KInput ClockDifferential input clock pair for address/control/data capture; defines all synchronous timing references
C, COutput ClockDifferential output clock pair for read data strobing; enables deskew across multiple devices
CQ, CQEcho ClockFree-running output clocks phase-aligned to C/C; simplify latch timing at controller side
BWS[1:0]Byte Write SelectActive-low controls for 9-bit sub-word writes; preserves non-selected bytes during partial writes
R/WDirection ControlSynchronous read/write indicator; sampled with LD to define transaction type
LDLoad StrobeActivates address and R/W sampling cycle; initiates burst access on next K edge
ZQImpedance CalibrationConnects to external 240 Ω resistor to ground to calibrate HSTL output drive strength
DOFFDLL DisableActive-low pin to bypass Delay Lock Loop; used only for debug or legacy timing modes
VDD, VDDQ, VSSPower/GroundSeparate 1.8 V core (VDD) and I/O (VDDQ) supplies; dedicated ground planes required for noise isolation

Key Features

FeatureDesign Value
DDR-II Separate I/O ArchitectureEliminates bidirectional bus turnaround delay, enabling continuous 2-word burst reads/writes without dead cycles
Integrated Delay Lock Loop (DLL)Aligns Q[17:0] output edges to CQ/CQ within ±50 ps, removing board-level trace length matching requirements
Variable Drive HSTL OutputsOutput impedance programmable via ZQ calibration to match 50 Ω transmission lines, reducing signal reflections
2-Word Burst TimingFixed burst length reduces address bus toggling by 50% versus single-word access, lowering EMI and controller overhead
JTAG 1149.1 Test Access PortEnables boundary-scan testing of interconnects and in-system programming of configuration registers

Applications

Packet Buffer MemoryNetwork Switch ASIC Interface

Use Scenario: Temporary storage of variable-length Ethernet frames in Layer 2/L3 switching pipelines.

IC Role / Device Role / Timing Role: High-throughput, low-latency SRAM buffer interfacing directly with switch fabric controller via DDR-II SIO.

Use Value: 2-word burst + DDR-II SIO sustains 600 MT/s line-rate buffering without bus contention, reducing frame drop under 10 Gbps traffic loads.

Use Scenario: Shared memory resource for multi-port packet classification and forwarding engines.

IC Role / Device Role / Timing Role: Synchronous burst-access memory mapped into ASIC's memory space using K/K and C/C clock domains.

Use Value: DLL-aligned CQ/CQ outputs enable deterministic 167 MHz read capture at FPGA-based classifier logic, eliminating setup/hold violations.

Telecom Line Card BufferHigh-Speed Test Equipment Memory

Use Scenario: Real-time buffering of TDM-over-IP payloads in carrier-grade optical transport modules.

IC Role / Device Role / Timing Role: Dual-clock DDR-II SRAM providing jitter-tolerant, burst-aligned storage between framer and processor interfaces.

Use Value: HSTL-18 I/O and 1.8 V core reduce power per bit by 35% vs. 3.3 V QDR SRAM, critical for thermally constrained line cards.

Use Scenario: Pattern memory for automated test equipment generating high-speed digital stimulus waveforms.

IC Role / Device Role / Timing Role: Deterministic burst-read memory supplying 18-bit parallel vectors synchronized to tester clock domain via C/C and CQ/CQ.

Use Value: BWS[1:0]-enabled partial writes allow dynamic pattern updates without full memory reload, cutting test program changeover time by >40%.

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed burst SRAM applications.

Alternative PartTechnical DifferenceApplication DifferenceSelection Advice
CY7C1393BV18-200BZC200 MHz max frequency; higher current draw (600 mA @ 1.8 V); identical pinout and DDR-II SIO architectureSupports higher bandwidth systems requiring >167 MHz sustained burst rateSelect when system clock budget allows tighter timing margins and thermal design accommodates +15% power
AS7C31026B-167JCIN1M × 18, 3.3 V CMOS SRAM; single-data-rate; no DLL or echo clocks; SOJ-44 packageLimited to ≤100 MHz operation; requires external clock management and bus turnaround logicChoose only for cost-sensitive, lower-speed legacy upgrades where DDR-II timing complexity must be avoided

Compared with CY7C1393BV18-200BZC, this -167BZC variant trades 33 MHz peak bandwidth for reduced power and relaxed timing closure; versus AS7C31026B-167JCIN, it delivers 2× effective throughput and eliminates bus turnaround latency at the cost of tighter layout constraints.

Availability

CY7C1393BV18-167BZC is available at Aetrix Electronics and suitable for packet buffering, network switch ASIC interfacing, telecom line card design, and high-speed test equipment requiring stable component supply and long-term obsolescence planning.

Supply support for CY7C1393BV18-167BZC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for communications, industrial, and automotive systems, emphasizing signal integrity and timing precision.

CY7C1393BV18 belongs to the DDR-II SIO SRAM product line, engineered specifically for deterministic, low-latency burst memory applications in high-speed digital infrastructure where DDR timing control and echo-clock synchronization are critical.

FAQ

What is the function of the DOFF pin on CY7C1393BV18-167BZC?

The DOFF (DLL Turn Off) pin is an active-low control that disables the internal Delay Lock Loop. When pulled LOW, the DLL is bypassed and output timing reverts to basic clock-to-output delay without phase alignment to CQ/CQ. This mode increases clock-to-output variation to ±1.2 ns and is intended only for debug, characterization, or compatibility with legacy timing models-not for production operation.

Can CY7C1393BV18-167BZC operate with only a single clock source?

Yes-it supports single-clock mode using only K and K for both input capture and output driving. In this mode, C and C are not required, and read data is driven on the rising edges of K and K instead of C/C. However, echo clocks CQ/CQ remain functional and aligned to K/K, preserving deskew capability. Setup/hold timing margins tighten by ~15% compared to dual-clock mode.

How does ZQ calibration affect HSTL output drive strength?

ZQ connects to an external 240 Ω resistor to ground, enabling on-die calibration of output driver impedance to match 50 Ω transmission lines. This sets Q[17:0], CQ, and CQ output impedance to 0.2 × RQ = 48 Ω, minimizing signal reflections and improving eye diagram integrity. Leaving ZQ floating or tying it to GND causes undefined drive strength and violates HSTL Class I specifications.

What is the purpose of BWS[1:0] in the 1M × 18 configuration?

BWS[1:0] are active-low byte write select signals that enable independent 9-bit writes within each 18-bit word. BWS0 controls D[8:0], BWS1 controls D[17:9]. When one BWS is deasserted, its corresponding 9-bit segment retains prior data during the write cycle. This allows partial updates without read-modify-write sequences-critical for efficient packet header modification in networking applications.

CY7C1393BV18-167BZC Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tray
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, DDR II
Memory Size:
18Mbit
Memory Organization:
1M x 18
Memory Interface:
Parallel
Clock Frequency:
167 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (13x15)

CY7C1393BV18-167BZC FAQ

1.How can I place an order for CY7C1393BV18-167BZC through Aetrix?

Please submit a Request for Quotation (RFQ) for CY7C1393BV18-167BZC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for CY7C1393BV18-167BZC reliable?

The price and inventory of CY7C1393BV18-167BZC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1393BV18-167BZC is usually 5 days.

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CY7C1393BV18-167BZC orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your CY7C1393BV18-167BZC order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for CY7C1393BV18-167BZC?

For technical support, including CY7C1393BV18-167BZC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1393BV18-167BZC requirements.

6.How does Aetrix verify that CY7C1393BV18-167BZC is sourced from the original manufacturer or authorized distributors?

All CY7C1393BV18-167BZC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1393BV18-167BZC meets industry standards.

7.What is the process for return or replacement of CY7C1393BV18-167BZC?

All CY7C1393BV18-167BZC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1393BV18-167BZC, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C1393BV18-167BZC part is unused and in its original packaging.

Return procedure for CY7C1393BV18-167BZC:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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