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Infineon Technologies CY7C1393JV18-300BZXC

Part No.:
CY7C1393JV18-300BZXC
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C1393JV18-300BZXC.pdf
Description:
IC SRAM 18MBIT PARALLEL 165FBGA
Quantity:
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Payment
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Inventory:4,482

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Product details

Overview

CY7C1393JV18-300BZXC from Cypress Semiconductor is a 18 Mbit (1M × 18) synchronous pipelined DDR II SIO SRAM with two-word burst architecture, 300 MHz clock operation, 1.8 V core supply, and HSTL I/O. It delivers 600 Mbps data transfer via double-data-rate interface and supports precise timing using dual input clocks (K/K) and echo clocks (CQ/CQ). Used in high-bandwidth networking buffers and packet-switching ASIC interfaces.

For engineers reviewing the CY7C1393JV18-300BZXC datasheet, CY7C1393JV18-300BZXC pinout, CY7C1393JV18-300BZXC application, or CY7C1393JV18-300BZXC equivalent, key selection criteria include DDR II SIO architecture, 1.5-cycle read latency with DLL enabled, 165-ball FBGA package, HSTL output drive control, and JTAG 1149.1 test access compliance.

Technical Context

This SRAM implements a synchronous pipelined burst architecture with physically separate read and write ports-eliminating data bus turnaround-and uses rising edges of K/K for address/data capture and C/C for output timing. The internal organization comprises two 512K × 18 arrays, enabling concurrent read/write initiation on every K edge.

It supports dual-clock domain operation (K/K for inputs, C/C for outputs) with echo clocks CQ/CQ referenced to C/C for system-level deskew, and includes a programmable Delay Lock Loop (DLL) that enables 1.5-cycle read latency at 300 MHz or reverts to DDR I–compatible 1-cycle latency when DOFF is asserted low.

Key Specifications

Parameter Value and Actual Design Meaning
Density 18 Mbit (1M × 18), enabling 18-bit wide memory mapping without external width expansion
Max Clock Frequency 300 MHz K/K input clock, supporting 600 MT/s effective throughput via DDR
Read Latency 1.5 cycles with DLL enabled; 1 cycle with DOFF = LOW, directly impacting pipeline depth in controller design
I/O Standard HSTL Class I inputs and outputs, with programmable drive strength and VREF-referenced switching thresholds
Supply Voltages 1.8 V core (VDD), 1.8 V I/O (VDDQ), and dedicated VREF input for impedance-matched signal integrity
Package 165-ball FBGA (13 × 15 × 1.4 mm), RoHS-compliant, with defined ball pitch and thermal pad layout
JTAG Support IEEE 1149.1 compliant TAP (TCK/TMS/TDI/TDO), enabling boundary-scan testing in dense PCB assemblies

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body height, 0.8 mm ball pitch, bottom-side thermal pad.

Pin/Terminal Circuit Role Design Meaning
K / K Input clock pair Rising edges latch address, R/W, LD, BWS, and D[17:0]; define all synchronous input timing references
C / C Output clock pair Rising edges gate Q[17:0] output timing; used with CQ/CQ to compensate for board flight-time skew
CQ / CQ Echo clock outputs Free-running clocks synchronized to C/C; enable source-synchronous data capture at controller without per-device delay tuning
D[17:0] Synchronous data inputs 18-bit write data path; sampled on both K and K rising edges for DDR-aligned burst writes
Q[17:0] Synchronous data outputs 18-bit read data path; driven on C/C rising edges with 0.45 ns output-to-clock skew (min)
BWS0 / BWS1 Byte write select inputs Active-low controls D[8:0] and D[17:9] respectively; enables partial-word writes without read-modify-write overhead
LD Load strobe input Defines start of bus cycle; must be low with R/W to initiate valid read/write transaction on next K edge
ZQ Impedance calibration input Connects to external 240 Ω resistor to ground to calibrate output driver impedance to 48 Ω ±10%
DOFF DLL disable input Active-low disables internal DLL; forces DDR I timing mode with 1-cycle latency and ≤167 MHz max frequency

Key Features

Feature Design Value
DDR II Separate IO Architecture Physically isolated read (Q[17:0]) and write (D[17:0]) data paths eliminate bus turnaround delay and enable true concurrent access
Two-Word Burst Access Each address fetches two sequential 18-bit words in one clock period, halving required address bus transitions vs. single-word SRAMs
Programmable DLL Timing DLL enables 1.5-cycle read latency at full 300 MHz; DOFF pin allows fallback to 1-cycle DDR I mode for timing margin or legacy compatibility
HSTL Output Drive Control Variable-strength HSTL drivers with ZQ calibration ensure consistent 48 Ω output impedance across voltage/temperature for clean 600 Mbps signaling
JTAG Boundary Scan Fully compliant IEEE 1149.1 TAP enables automated PCB test coverage for high-density routing and BGA solder joint validation

Applications

Networking Line Card Buffer High-Speed Packet Switch ASIC Interface

Use Scenario: Storing ingress/egress packet headers and metadata in 10G/25G Ethernet line cards with strict latency budgets.

IC Role / Device Role / Timing Role: Low-latency, burst-mode SRAM acting as first-level buffering between SERDES PHY and traffic manager ASIC.

Use Value: Two-word burst + DDR II SIO reduces address bus toggling by 50% and eliminates turnaround gaps, sustaining >90% bus utilization at 300 MHz.

Use Scenario: Providing temporary storage for flow-control tokens and queue state in multi-port switch fabric controllers.

IC Role / Device Role / Timing Role: Synchronous pipelined memory with deterministic 1.5-cycle read latency, synchronized to ASIC's DDR clock domain.

Use Value: Echo clocks CQ/CQ align data capture at the ASIC receiver, removing per-SRAM trace-length matching requirements and simplifying PCB layout.

Telecom Baseband Processing Test Equipment Pattern Memory

Use Scenario: Holding interleaved channel coefficients and FFT window data in 4G/5G baseband processors requiring burst-access predictability.

IC Role / Device Role / Timing Role: High-bandwidth SRAM interfacing directly to FPGA-based DSP engines using HSTL I/O and dual-clock domain timing.

Use Value: 1.8 V HSTL I/O with ZQ calibration ensures signal integrity across 15+ cm traces at 600 Mbps, reducing jitter-induced bit errors.

Use Scenario: Storing stimulus/response vectors in automated test equipment (ATE) where deterministic access timing and repeatability are critical.

IC Role / Device Role / Timing Role: Pin-accurate, cycle-exact memory with JTAG scan support for in-system verification and fault injection testing.

Use Value: JTAG 1149.1 TAP enables real-time visibility into internal registers and memory state during pattern execution, accelerating debug cycles.

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed synchronous SRAM applications.

Alternative Part Technical Difference Application Difference Selection Advice
ISSI IS61WV102418BLL-15BLI 18 Mbit (1M × 18), 165 MHz max frequency, single-data-rate (SDR), 3.3 V core/I/O, no DLL or echo clocks Limited to ≤165 MHz systems; lacks DDR II SIO, burst architecture, and source-synchronous timing features Select only for cost-sensitive, lower-bandwidth designs where 300 MHz DDR II timing and echo clock deskew are unnecessary
Micron MT45W16MW16BG-300A 18 Mbit (1M × 18), 300 MHz DDR2 SDRAM, 1.8 V, but requires refresh, command decoding, and has higher latency (CAS=3) Not pin-compatible; requires DRAM controller, suffers from refresh overhead and variable latency under bank conflicts Choose only if system already uses DDR2 SDRAM infrastructure and can tolerate non-deterministic latency and refresh management overhead

Compared with IS61WV102418BLL-15BLI and MT45W16MW16BG-300A, CY7C1393JV18-300BZXC provides deterministic 1.5-cycle latency, zero-refresh operation, and echo-clock–assisted deskew-critical for ASIC/FPGA co-designs demanding cycle-accurate timing and maximum bandwidth efficiency.

Availability

CY7C1393JV18-300BZXC is available at Aetrix Electronics and suitable for high-speed networking line cards, telecom baseband processing units, and automated test equipment requiring stable component supply, long-term lifecycle support, and guaranteed RoHS-compliant sourcing.

Supply support for CY7C1393JV18-300BZXC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for industrial, automotive, and communications markets, with emphasis on signal integrity and timing precision.

CY7C1393JV18 belongs to Cypress's DDR II SIO SRAM product line, engineered specifically for deterministic, high-bandwidth buffering in ASIC/FPGA-based systems where DDR2 SDRAM latency and complexity are unacceptable.

FAQ

What is the function of the DOFF pin, and how does it affect timing?

The DOFF pin is an active-low DLL disable input. When tied HIGH (via 10 kΩ pull-up), the internal Delay Lock Loop operates, enabling 1.5-cycle read latency at 300 MHz. When pulled LOW, the DLL is disabled and the device reverts to DDR I–compatible timing with 1-cycle latency and a maximum frequency of 167 MHz. This provides a hardware-selectable trade-off between peak bandwidth and timing margin.

How do CQ and CQ echo clocks improve system-level timing closure?

CQ and CQ are free-running output clocks synchronized to C and C, respectively. They replicate the phase relationship between output data (Q[17:0]) and the output clocks at the SRAM die, allowing the receiving controller to use them as local capture clocks. This eliminates the need to match individual trace lengths from each SRAM to the controller, significantly easing PCB layout and improving timing margin in multi-device DDR II SIO systems.

Can CY7C1393JV18-300BZXC operate in single-clock mode, and how is it configured?

Yes. Single-clock mode is enabled by strapping C and C HIGH at power-on. In this mode, K/K serve as both input and output timing references, eliminating the need for separate C/C generation. All timing parameters remain identical to dual-clock mode, and the device behaves as if C/C have zero skew relative to K/K. This configuration is fixed at power-up and cannot be changed dynamically.

What is the role of the ZQ pin, and what external component is required?

ZQ is an impedance calibration input that sets the output driver impedance for Q[17:0], CQ, and CQ. It must be connected to a 240 Ω resistor tied to ground to calibrate outputs to 48 Ω ±10%. Alternatively, connecting ZQ directly to VDDQ enables minimum-impedance mode (~30 Ω). Leaving ZQ floating or tying it to VSS is prohibited and will cause undefined output behavior.

CY7C1393JV18-300BZXC Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tray
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, DDR II
Memory Size:
18Mbit
Memory Organization:
1M x 18
Memory Interface:
Parallel
Clock Frequency:
300 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (13x15)

CY7C1393JV18-300BZXC FAQ

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Please submit a Request for Quotation (RFQ) for CY7C1393JV18-300BZXC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

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The price and inventory of CY7C1393JV18-300BZXC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1393JV18-300BZXC is usually 5 days.

3.What payment methods are accepted for CY7C1393JV18-300BZXC?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1393JV18-300BZXC transactions.

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4.How is shipping managed for CY7C1393JV18-300BZXC?

CY7C1393JV18-300BZXC orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your CY7C1393JV18-300BZXC order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for CY7C1393JV18-300BZXC?

For technical support, including CY7C1393JV18-300BZXC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1393JV18-300BZXC requirements.

6.How does Aetrix verify that CY7C1393JV18-300BZXC is sourced from the original manufacturer or authorized distributors?

All CY7C1393JV18-300BZXC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1393JV18-300BZXC meets industry standards.

7.What is the process for return or replacement of CY7C1393JV18-300BZXC?

All CY7C1393JV18-300BZXC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1393JV18-300BZXC, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C1393JV18-300BZXC part is unused and in its original packaging.

Return procedure for CY7C1393JV18-300BZXC:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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