Infineon Technologies CY7C1415BV18-250BZC

Overview

CY7C1415BV18 from Cypress Semiconductor is a 1M × 36-bit, 36-Mbit QDR-II SRAM with separate read/write ports, 250 MHz operation (400 ps clock period), DDR interfaces on both ports enabling 600 MHz data transfer, and 1.8 V core / 1.4 V I/O supply. It delivers concurrent high-bandwidth memory access for network packet buffering in telecom line cards.

For engineers reviewing the CY7C1415BV18 datasheet, CY7C1415BV18 pinout, CY7C1415BV18 application, or CY7C1415BV18 equivalent, key selection criteria include burst depth (4-word), DLL-enabled 1.5-cycle read latency, x36 bus width, 165-ball FBGA package, and HSTL-18 I/O compatibility with precise echo-clock timing.

Technical Context

This QDR-II SRAM implements fully independent synchronous read and write pipelines, each with dedicated address latching on alternating edges of K/K clocks and data transfer synchronized to C/C output clocks. Its architecture eliminates bus turnaround by separating D[35:0] inputs and Q[35:0] outputs.

The device supports dual-clock domain operation with echo clocks CQ/CQ referenced to C/C for deskewed data capture, and includes a programmable Delay Lock Loop (DLL) that enables 1.5-cycle read latency at 250 MHz or reverts to QDR-I 1-cycle latency when disabled via DOFF.

Key Specifications

Pinout & Package

165-ball Fine-Pitch Ball Grid Array (FBGA) package, 15 mm × 17 mm footprint, 1.4 mm height, 0.8 mm ball pitch, RoHS-compliant Pb-free option available.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-bandwidth dual-port SRAM applications.

Compared with CY7C1415BV18-250BZC, the BZI variant extends thermal range without electrical or mechanical change, while AS7C33618B demands full system-level requalification due to core voltage and I/O standard mismatch.

Availability

CY7C1415BV18-250BZC is available at Aetrix Electronics and suitable for telecom infrastructure, high-speed switch fabric, network processor co-processing, and automated test equipment requiring stable component supply and long-term obsolescence management.

Supply support for CY7C1415BV18-250BZC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and mixed-signal ICs for communications, industrial, and automotive applications, with emphasis on signal integrity and timing precision.

This device belongs to the QDR-II SRAM product line, engineered specifically for deterministic, low-latency, concurrent memory access in packet-switched networking systems operating above 10 Gbps.

FAQ

What is the minimum supported clock frequency for CY7C1415BV18-250BZC?

The device has no specified minimum clock frequency; it operates down to DC for static timing analysis. Functional operation requires stable K/K and C/C clocks with valid setup/hold margins per AC specifications. At very low frequencies (<10 MHz), DLL lock time may dominate initialization, but the SRAM remains fully functional once locked or when DLL is disabled via DOFF.

Can CY7C1415BV18-250BZC be used in single-clock mode?

Yes. When C and C are tied together and driven by K and K respectively, the device operates in single-clock mode. In this configuration, Q[35:0] is clocked by K/K instead of C/C, and CQ/CQ are generated relative to K/K. All timing parameters shift accordingly, and DLL remains active unless explicitly disabled via DOFF.

How does ZQ calibration affect signal integrity?

ZQ calibration adjusts the output driver impedance of Q[35:0], CQ, and CQ to match the PCB trace impedance (typically 50 Ω). With a 240 Ω resistor to ground, drivers are tuned to 48 Ω (0.2 × 240 Ω), minimizing reflections and improving eye diagram margin. Leaving ZQ unconnected or tied to GND violates specification and causes undefined output drive strength.

Is JTAG boundary scan supported on CY7C1415BV18-250BZC?

Yes. The device implements IEEE 1149.1 JTAG TAP controller with TDI, TDO, TCK, and TMS pins. Boundary scan supports interconnect testing and in-system programming of configuration registers. JTAG functionality remains active regardless of DLL or clock mode settings, and does not interfere with normal memory operation.