Infineon Technologies CY7C1440AV33-250AXCT

Overview

CY7C1440AV33-250AXCT from Cypress Semiconductor is a 36-Mbit (1M × 36) pipelined synchronous SRAM with 250 MHz bus operation, 2.6 ns clock-to-output delay, 3.3 V core supply, 2.5/3.3 V I/O support, and IEEE 1149.1 JTAG boundary scan-designed for high-speed secondary cache in Pentium-class processor systems.

For engineers reviewing the CY7C1440AV33-250AXCT datasheet, CY7C1440AV33-250AXCT pinout, CY7C1440AV33-250AXCT application, or CY7C1440AV33-250AXCT equivalent, key selection criteria include burst mode configuration (linear vs. interleaved), byte-write granularity control via BWx/BWE/GW, synchronous self-timed write timing, and dual-voltage I/O compatibility in TQFP/FBGA packages.

Technical Context

The device implements a two-bit synchronous wraparound burst counter controlled by ADV, ADSP, and ADSC inputs, enabling Intel Pentium–compatible interleaved or user-selectable linear burst sequences. All address, data, and control inputs (except OE and ZZ) are registered on the rising edge of CLK.

It supports synchronous self-timed writes with programmable byte-width (1–4 bytes) via BWA–BWD and BWE, plus global write override via GW. Output enable (OE) is asynchronous, and ZZ provides non-time-critical sleep mode with internal pull-down.

Key Specifications

Pinout & Package

The CY7C1440AV33-250AXCT is packaged in a Pb-free 100-pin TQFP (14 × 20 × 1.4 mm) with exposed thermal pad. Pin functions are fully synchronous except OE (asynchronous output enable) and ZZ (asynchronous sleep).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar synchronous SRAM applications.

Compared with IDT72V2115L15PF and IS61WV102436BLL-250BLI, the CY7C1440AV33-250AXCT uniquely combines 250 MHz operation, 36-bit native width, and integrated JTAG-making it optimal for high-performance, testable cache subsystems where pin count and debug access are constrained.

Availability

CY7C1440AV33-250AXCT is available at Aetrix Electronics and suitable for industrial motion controllers, network packet buffers, processor cache interfaces, and automated test equipment requiring stable component supply and long-term lifecycle support.

Supply support for CY7C1440AV33-250AXCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for automotive, industrial, and communications systems.

The CY7C1440AV33 belongs to Cypress's high-speed synchronous SRAM product line, engineered specifically for low-latency, burst-mode cache and buffer applications in x86-compatible and custom processor subsystems.

FAQ

What is the function of the MODE pin on CY7C1440AV33-250AXCT?

The MODE pin selects burst address sequence behavior: logic LOW configures Intel Pentium–compatible interleaved burst order, while logic HIGH selects linear burst order. It is sampled synchronously on the rising edge of CLK during the first cycle of a burst access and determines how the internal 2-bit counter increments addresses via ADV.

Can CY7C1440AV33-250AXCT operate with only 2.5 V I/O supply and 3.3 V core?

Yes. The device supports independent VDDQ (2.5 V or 3.3 V) and VDD (3.3 V) supplies. When VDDQ = 2.5 V, all I/O pins comply with JEDEC JESD8-5 2.5 V logic levels, while the core remains powered at 3.3 V. This allows seamless interfacing with 2.5 V ASICs or FPGAs without level-shifting circuitry.

How does the ZZ sleep mode affect data retention and wake-up timing?

In ZZ mode (pin HIGH), the device enters a low-power sleep state with data integrity preserved. Core and I/O circuitry are gated, reducing standby current to ≤120 mA. Wake-up is asynchronous: data becomes valid within one CLK cycle after ZZ returns LOW, with no additional setup or stabilization delay required before the next access.

Is JTAG boundary scan functional when the device is in ZZ sleep mode?

No. JTAG operation is disabled in ZZ sleep mode. The TAP controller and scan chain are powered down along with other synchronous logic. To perform boundary scan testing, ZZ must be held LOW (or floating, due to internal pull-down), and the device must be in active operation with CLK running and VDD/VDDQ powered.