Infineon Technologies CY7C1512V18-200BZXC

Overview

CY7C1512V18 from Cypress Semiconductor is a 4M × 18-bit (72-Mbit), 1.8V QDR-II SRAM with separate read/write ports, 250 MHz clock support, DDR interfaces on both ports (500 MHz data rate), and 165-ball FBGA (15 × 17 × 1.4 mm) packaging. It delivers concurrent high-bandwidth memory access for network packet buffering in telecom line cards.

For engineers reviewing the CY7C1512V18 datasheet, CY7C1512V18 pinout, CY7C1512V18 application, or CY7C1512V18 equivalent, key selection criteria include its dual-clock DDR timing architecture, HSTL I/O compatibility, DLL-based data alignment, 18-bit burst width, and synchronous self-timed write capability.

Technical Context

The CY7C1512V18 implements QDR-II architecture with fully independent read and write ports sharing a multiplexed 21-bit address bus. Address latching occurs on alternate rising edges of K/K clocks, enabling pipelined 2-word bursts per access cycle.

It uses two input clock pairs-K/K for address/control/data capture and C/C for output data synchronization-with echo clocks CQ/CQ to compensate for board flight-time skew. The integrated Delay Lock Loop (DLL) aligns output data to C/C edges with sub-cycle precision.

Key Specifications

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 15 mm × 17 mm × 1.4 mm body, 0.8 mm ball pitch, JEDEC MO-270AC compliant.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-bandwidth dual-port SRAM applications.

Compared with IDT72T3615L10BG and IS61WV102418B, CY7C1512V18 uniquely delivers 500 MT/s DDR concurrency, DLL-based timing closure, and HSTL-18 compatibility-making it the only option for 10G+ packet-processing pipelines requiring deterministic sub-cycle latency.

Availability

CY7C1512V18 is available at Aetrix Electronics and suitable for high-speed network packet buffering, telecom line card memory, baseband processing in wireless infrastructure, and high-performance test equipment requiring stable component supply across extended product lifecycles.

Supply support for CY7C1512V18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for networking, automotive, and industrial applications.

CY7C1512V18 belongs to the QDR-II SRAM product line, engineered specifically for deterministic, low-latency, concurrent memory access in multi-gigabit packet-forwarding and signal-processing systems.

FAQ

What is the minimum supported clock frequency for CY7C1512V18?

The device operates down to DC for functional operation, but AC timing specifications-including DLL lock range and output valid windows-are guaranteed only from 100 MHz to 250 MHz. Below 100 MHz, DLL may lose lock, requiring DOFF assertion and manual timing margin validation per application note AN91504.

Can CY7C1512V18 operate in single-clock mode?

Yes. When C and C are tied to K and K respectively, the device enters single-clock mode. In this configuration, Q[17:0] is clocked by K/K instead of C/C, and CQ/CQ become replicas of K/K. All timing parameters shift-refer to Table 12 in datasheet Rev. *F for revised setup/hold values.

How does ZQ pin calibration affect signal integrity?

ZQ connects to an external 240 Ω resistor to set output driver impedance to 48 Ω ±15%, matching standard PCB trace impedances. Incorrect ZQ termination causes reflection-induced eye closure-measured eye height drops >15% at 500 MT/s if ZQ is left floating or shorted to VDDQ without resistor.

Is JTAG boundary-scan supported during normal operation?

Yes. TCK/TMS/TDI/TDO operate independently of memory function. Boundary-scan testing can be performed while RPS/WPS remain inactive, enabling in-system verification without halting data path operation-validated per IEEE 1149.1 test patterns in datasheet Section 5.3.