Infineon Technologies CY7C1612KV18-300BZC
- Part No.:
- CY7C1612KV18-300BZC
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1612KV18-300BZC.pdf
- Description:
- IC SRAM 144MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:1,173
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
CY7C1612KV18-300BZC from Infineon Technologies (formerly Cypress) is a 8M × 18, 144-Mbit QDR® II synchronous SRAM with dual independent read/write ports, 300 MHz clock frequency (720 Mbps DDR data rate), 1.8 V core supply, and 1.4–1.8 V I/O supply. It delivers concurrent high-bandwidth memory access for network packet buffering in telecom line cards.
For engineers reviewing the CY7C1612KV18-300BZC datasheet, CY7C1612KV18-300BZC pinout, CY7C1612KV18-300BZC application, or CY7C1612KV18-300BZC equivalent, key selection criteria include its two-word burst architecture, echo clocks (CQ/CQ), DOFF-configurable 1.5-cycle/1-cycle read latency, HSTL-18 I/O compatibility, and 165-ball FBGA (15 × 17 × 1.4 mm) package.
Technical Context
This QDR II SRAM implements fully pipelined, synchronous operation with separate K/K input clocks for address/data capture and C/C output clocks for data launch-enabling precise DDR timing without bus turnaround. Its internal architecture splits the 8M × 18 array into two 4M × 18 sub-arrays to support depth expansion via RPS/WPS control.
The device integrates a PLL for accurate data placement, JTAG 1149.1 boundary scan for testability, and programmable impedance (ZQ) for output driver calibration. Read latency is configurable via DOFF: 1.5 cycles (DOFF = high) or 1 cycle (DOFF = low), directly impacting system timing closure in high-speed switch fabric designs.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 144 Mbit (8M × 18 organization) |
| Max Clock Frequency | 300 MHz - determines maximum sustained bandwidth of 1.08 GB/s (300 MHz × 2 words × 18 bits × 2 edges) |
| Read Latency | Configurable: 1 cycle (DOFF = low) or 1.5 cycles (DOFF = high) - sets minimum pipeline depth for controller design |
| Core Supply Voltage | 1.8 V ± 0.1 V - requires tight-regulated low-noise LDO; not compatible with 1.5 V core rails |
| I/O Supply Range | 1.4 V to 1.8 V - supports HSTL-18 signaling; enables interoperability with 1.5 V or 1.8 V logic families |
| Package | 165-ball FBGA (15 × 17 × 1.4 mm) - standard footprint for high-density routing; 0.8 mm ball pitch |
| Operating Temperature | 0 °C to +70 °C - commercial grade; suitable for controlled-environment networking equipment |
Pinout & Package
Package: 165-ball fine-pitch BGA (15 mm × 17 mm × 1.4 mm, 0.8 mm ball pitch), RoHS-compliant, Pb-free option available.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| D[17:0] | Synchronous write data inputs | Sampled on rising edge of K clock; 18-bit parallel data path for burst writes |
| Q[17:0] | Synchronous read data outputs | Driven on rising edges of C/C clocks; tristated when RPS is deasserted |
| RPS | Read port select (active low) | Enables read access; controls output driver enable and burst initiation |
| WPS | Write port select (active low) | Enables write access; gates D[17:0] and BWS signals into memory array |
| BWS[1:0] | Byte write selects (active low) | BWS0 controls D[8:0]; BWS1 controls D[17:9] - enables partial-word writes without read-modify-write |
| K / K | Positive/negative input clocks | Used for address and data capture on write; only rising edges sampled - no differential receiver required |
| C / C | Positive/negative output clocks | Launch read data; deskew flight time mismatches across multi-device systems |
| CQ / CQ | Echo clocks | Output-coupled copies of C/C; simplify source-synchronous capture at controller side |
| DOFF | Read latency mode select | High = 1.5-cycle latency (QDR II mode); low = 1-cycle latency (QDR I compatibility mode) |
| VREF | Reference voltage input | Supplies mid-supply reference for HSTL input receivers; must be stable at 0.7 V (VDDQ/2) |
| ZQ | Impedance calibration terminal | Connects to external 240 Ω resistor to ground for on-die output driver termination calibration |
Key Features
| Feature | Design Value |
|---|---|
| Independent read/write ports | Eliminates bus turnaround overhead - enables true concurrent read+write at full bandwidth |
| Two-word burst architecture | Every access transfers two sequential words - reduces address strobe overhead by 50% vs single-word devices |
| Echo clocks (CQ/CQ) | Enable reliable source-synchronous data capture at 720 Mbps without complex PCB trace length matching |
| DOFF-configurable latency | Allows migration from legacy QDR I systems (1-cycle) or optimization for new QDR II timing budgets (1.5-cycle) |
| JTAG 1149.1 boundary scan | Supports automated PCB test and interconnect validation - critical for high-pin-count BGA routing verification |
Applications
| Network Packet Buffering | Switch Fabric Memory |
|---|---|
|
Use Scenario: Storing ingress/egress packet headers and metadata in Layer 2/L3 switches before forwarding decisions. IC Role / Device Role / Timing Role: High-throughput, low-latency shared memory buffer interfaced to multiple ASIC ports via dedicated read/write buses. Use Value: Concurrent read/write eliminates arbitration stalls; 300 MHz clock sustains >1 Gbps throughput per port under real traffic loads. |
Use Scenario: Interfacing between ingress and egress scheduler blocks in modular chassis-based routers. IC Role / Device Role / Timing Role: Dual-port SRAM acting as crossbar staging memory with deterministic 1.5-cycle read latency for scheduling pipeline alignment. Use Value: Echo clocks (CQ/CQ) reduce setup/hold margin requirements by 120 ps versus non-echoed clocking schemes. |
| Telecom Line Card Buffering | High-Speed Test Equipment Memory |
|
Use Scenario: Temporary storage of SONET/OTN frame payloads during protocol conversion in optical transport terminals. IC Role / Device Role / Timing Role: Burst-mode memory supporting 2-word-aligned payload bursts synchronized to line-rate clocks. Use Value: Byte write selects (BWS[1:0]) allow selective overwrite of header fields without disturbing payload integrity. |
Use Scenario: Pattern generation and capture memory in automated test equipment (ATE) for high-speed SerDes validation. IC Role / Device Role / Timing Role: Deterministic-latency memory enabling precise stimulus-response timing correlation at 300 MHz. Use Value: JTAG boundary scan validates all 165 BGA connections pre-deployment - eliminating intermittent open/short faults. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar QDR II SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1612KV18-250BZC | Lower max clock: 250 MHz (vs. 300 MHz); reduced power draw (800 mA vs. 910 mA @ VDDQ = 1.5 V) | Acceptable for cost-sensitive, lower-bandwidth systems where 750 MB/s suffices | Select when thermal budget or board-level power delivery limits prevent 300 MHz operation |
| AS7C3256B-300BIN | Asynchronous SRAM (not QDR II); single-port; no echo clocks or DOFF latency control | Limited to non-concurrent, lower-bandwidth applications requiring simpler timing models | Only consider if system architecture lacks dual-clock infrastructure or requires pin-compatible drop-in replacement without redesign |
Compared with CY7C1612KV18-250BZC, the -300BZC delivers 20% higher bandwidth and tighter timing margins; compared with AS7C3256B-300BIN, it provides true concurrent access, echo-clock timing simplification, and QDR-specific features essential for high-end networking silicon interfaces.
Availability
CY7C1612KV18-300BZC is available at Aetrix Electronics and suitable for network packet buffering, switch fabric memory, and telecom line card buffering requiring stable component supply, long-term lifecycle assurance, and guaranteed traceable sourcing.
Supply support for CY7C1612KV18-300BZC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Infineon Technologies acquired Cypress Semiconductor in 2020 and maintains its high-performance memory portfolio, including QDR SRAMs, for demanding infrastructure applications.
CY7C1612KV18 belongs to the QDR® II SRAM product line, engineered specifically for deterministic, high-bandwidth memory interfacing in networking ASICs, FPGA-based switch fabrics, and telecom baseband processors.
FAQ
What is the function of the DOFF pin on CY7C1612KV18-300BZC?
The DOFF (Data Output OFFset) pin configures read latency mode: when asserted high, it enables QDR II mode with 1.5-cycle latency for optimized timing closure in high-frequency systems; when low, it reverts to QDR I–compatible 1-cycle latency. This setting is sampled synchronously on the K clock edge at power-up or reset and remains latched until next reset.
Can CY7C1612KV18-300BZC operate with 1.5 V I/O supply?
Yes - the device supports I/O supply (VDDQ) from 1.4 V to 1.8 V, making it fully compatible with 1.5 V HSTL-18 signaling. Core VDD must remain at 1.8 V ± 0.1 V. Using 1.5 V VDDQ reduces switching power by ~22% versus 1.8 V while maintaining signal integrity per HSTL-18 specifications.
How does the ZQ pin function during system operation?
ZQ connects to an external 240 Ω resistor to ground and enables on-die impedance calibration of output drivers. Calibration occurs automatically at power-up and can be triggered manually via JTAG instruction. It ensures consistent HSTL output drive strength across voltage/temperature variations, critical for signal integrity at 720 Mbps DDR rates.
Is the 165-ball FBGA package of CY7C1612KV18-300BZC compatible with standard reflow profiles?
Yes - the package complies with IPC/JEDEC J-STD-020 moisture sensitivity level 3 and supports standard lead-free reflow profiles (peak temperature ≤ 260 °C). Board layout must observe 0.8 mm ball pitch routing rules and include thermal vias under the die pad for thermal dissipation, especially under sustained 300 MHz operation.
CY7C1612KV18-300BZC Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, QDR II
- Memory Size:
- 144Mbit
- Memory Organization:
- 8M x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- 300 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (15x17)
CY7C1612KV18-300BZC FAQ
1.How can I place an order for CY7C1612KV18-300BZC through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1612KV18-300BZC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1612KV18-300BZC reliable?
The price and inventory of CY7C1612KV18-300BZC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1612KV18-300BZC is usually 5 days.
3.What payment methods are accepted for CY7C1612KV18-300BZC?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1612KV18-300BZC transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY7C1612KV18-300BZC?
CY7C1612KV18-300BZC orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY7C1612KV18-300BZC order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1612KV18-300BZC?
For technical support, including CY7C1612KV18-300BZC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1612KV18-300BZC requirements.
6.How does Aetrix verify that CY7C1612KV18-300BZC is sourced from the original manufacturer or authorized distributors?
All CY7C1612KV18-300BZC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1612KV18-300BZC meets industry standards.
7.What is the process for return or replacement of CY7C1612KV18-300BZC?
All CY7C1612KV18-300BZC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1612KV18-300BZC, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1612KV18-300BZC part is unused and in its original packaging.
Return procedure for CY7C1612KV18-300BZC:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY7C1612KV18-300BZC Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
LDO regulator guide covering low dropout voltage, power dissipation, thermal design, PSRR, output noise, capacitor stability, adjustable LDO circuits, LDO vs buck converter and datasheet selection chec…
Conditional Access Module guide covering CAM meaning, CI/CI+ interface, smart card authorization, DVB security workflow, TV and set-top box compatibility, internal electronics, ESD protection, connecto…
Guide to electronic component obsolescence covering EOL risk, PCN/PDN notices, last-time buy planning, replacement options, form-fit-function validation, counterfeit risk and BOM lifecycle management.
18650 battery guide covering lithium-ion cell basics, 3.6V/3.7V voltage, 4.2V charging, mAh and Wh capacity, protected cells, chargers, BMS, series-parallel packs, holders, welding and sourcing checks.…
Hall effect sensor guide covering working principle, linear and digital sensors, Arduino circuits, current sensing, speed detection, automotive applications, A3144 examples, signal filtering and datash…
Product Change Notification guide for electronic components, covering PCN meaning, PCN vs PDN/EOL, common change types, risk levels, form-fit-function review, engineering validation, BOM control, LTB/L…

