Infineon Technologies CY7C25682KV18-500BZC
- Part No.:
- CY7C25682KV18-500BZC
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C25682KV18-500BZC.pdf
- Description:
- IC SRAM 72MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
CY7C25682KV18 from Cypress Semiconductor is a 72-Mbit (4M × 18) synchronous pipelined DDR II+ SRAM with two-word burst architecture, 2.5-cycle read latency (when DOFF = HIGH), 550 MHz clock operation, and on-die termination (ODT) for D[x:0], BWS[x:0], and K/K inputs. It delivers 1100 MT/s data throughput via double-data-rate I/O and is used in high-bandwidth networking line cards requiring deterministic low-latency memory access.
For engineers reviewing the CY7C25682KV18 datasheet, CY7C25682KV18 pinout, CY7C25682KV18 application, or CY7C25682KV18 equivalent, key selection criteria include DDR II+ timing compliance, echo clock (CQ/CQ) synchronization for source-synchronous data capture, ODT configuration via ZQ/ODT pins, and compatibility with 1.8 V core / 1.4–1.8 V I/O supply rails.
Technical Context
This device implements a synchronous pipelined SRAM core with dual-edge DDR interface logic, where all address, control, and data signals are registered on rising edges of complementary clocks K and K. Read data is driven on both K and K edges with precise alignment to echo clocks CQ/CQ, enabling reliable source-synchronous capture without board-level timing margining.
The internal architecture includes two 2M × 18 arrays, byte-write select (BWS0/BWS1) for 9-bit granularity writes, QVLD for cycle-accurate data validity indication, and a PLL for accurate data placement. DOFF pin selects between DDR II+ mode (2.5-cycle latency) and DDR I mode (1-cycle latency), allowing runtime latency tuning.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Organization | 72 Mbit (4M × 18); dual 2M × 18 arrays enable depth expansion without external logic |
| Max Clock Frequency | 550 MHz; supports 1100 MT/s effective data rate with DDR I/O |
| Read Latency | 2.5 cycles (DOFF = HIGH); enables tighter system timing budgets than standard DDR I |
| VDD / VDDQ | Core VDD = 1.8 V ± 0.1 V; I/O VDDQ = 1.4 V to 1.8 V; supports mixed-voltage system integration |
| On-Die Termination | Configurable ODT for D[17:0], BWS[1:0], K/K; eliminates 12+ external 33–50 Ω resistors per device |
| Output Timing Reference | QVLD synchronized to CQ/CQ edges; provides unambiguous data-valid window for FPGA/ASIC capture |
| Package | 165-ball FBGA (13 × 15 × 1.4 mm); RoHS-compliant, 0.8 mm ball pitch, thermal pad compatible |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, 0.8 mm ball pitch, bottom thermal pad.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[17:0] | Synchronous bidirectional data bus | DDR I/O pins; sampled on K/K rising edges during write; driven on K/K rising edges during read; tri-stated automatically on deselect |
| K / K | Complementary input clocks | Rising edges latch all synchronous inputs (A, R/W, LD, BWS); drive output data and QVLD; define all timing windows |
| CQ / CQ | Output echo clocks | Free-running, K-synchronized clocks aligned to Q[17:0] valid windows; eliminate need for separate strobes in multi-SRAM systems |
| QVLD | Data validity indicator | Asserted edge-aligned with CQ/CQ; signals exact cycle when DQ[17:0] contains valid read data - no additional timing calculation required |
| ODT | On-die termination select | Configures ODT resistance range (RQ/3.33 or RQ/1.66) at power-up; floating defaults to high-range mode |
| ZQ | Impedance calibration reference | Connects to precision 240 Ω resistor to ground; calibrates internal ODT drivers to match PCB trace impedance |
| LD | Load command strobe | Latched on K rising edge; initiates address capture and defines start of burst transaction; must be stable before K edge |
| BWS0 / BWS1 | Byte write select | Active-low controls 9-bit write granularity: BWS0 → DQ[8:0], BWS1 → DQ[17:9]; enables partial writes without read-modify-write |
Key Features
| Feature | Design Value |
|---|---|
| Two-word burst architecture | Reduces address bus frequency by 2× vs. single-word SRAMs; cuts address trace count and routing complexity in high-pin-count designs |
| Programmable 2.5-cycle or 1-cycle read latency | DOFF pin selects latency mode at power-up; allows same hardware to support latency-sensitive (e.g., packet buffering) or bandwidth-optimized (e.g., frame storage) use cases |
| HSTL-compatible I/O with variable drive strength | Meets JEDEC HSTL Class I specs; drive strength configurable via mode register; ensures signal integrity across 10+ inch FR4 traces at 550 MHz |
| JTAG 1149.1 test access port | Enables boundary scan testing of SRAM interconnects without dedicated test fixtures; supports production ICT and board-level debug |
| Internal self-timed write circuitry | Eliminates external write pulse generation; guarantees correct write completion independent of clock jitter or skew between K/K |
Applications
| Network Packet Buffering | Telecom Line Card Cache |
|---|---|
|
Use Scenario: Storing ingress/egress packet headers and metadata in 10G/25G Ethernet switch ASICs. IC Role / Device Role / Timing Role: Low-latency, burst-access SRAM serving as first-level packet buffer with deterministic 2.5-cycle read response. Use Value: Enables zero-wait-state packet forwarding at line rate; QVLD + CQ alignment removes setup/hold uncertainty in FPGA-based header parsing logic. |
Use Scenario: Holding real-time voice channel samples and protocol state in carrier-grade TDM-to-packet gateways. IC Role / Device Role / Timing Role: Synchronous burst SRAM interfacing directly to DSP or network processor with DDR-capable memory controller. Use Value: 1100 MT/s bandwidth sustains 48-channel G.711 voice processing; ODT eliminates 24 external termination resistors per device, reducing BOM cost and layout area. |
| High-Speed Test Equipment Memory | Industrial Real-Time Controller Buffer |
|
Use Scenario: Capturing high-resolution waveform data from 1 GS/s ADCs in automated test equipment (ATE). IC Role / Device Role / Timing Role: Burst-mode SRAM acting as acquisition FIFO with precise echo-clock–synchronized data capture. Use Value: CQ/CQ outputs align exactly with DQ[17:0] valid windows, enabling direct connection to FPGA fabric without delay-locked loops or manual deskew. |
Use Scenario: Storing motion control trajectory points and sensor fusion buffers in CNC machine controllers. IC Role / Device Role / Timing Role: Deterministic-latency SRAM providing jitter-free access to position interpolation tables for servo loop execution. Use Value: 2.5-cycle latency mode ensures sub-2 ns timing variation across temperature; VDDQ range (1.4–1.8 V) simplifies integration with mixed-voltage industrial SoCs. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed burst SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C25682KV18-450BZC | Same die, lower max clock (450 MHz); reduced IDD (650 mA vs. 760 mA) | Lower bandwidth requirement (900 MT/s); suitable for cost-sensitive 10G PHY interfaces | Select when system clock budget permits relaxed timing margins and power reduction is prioritized over peak throughput |
| AS7C3256B-15JCIN | Asynchronous 256K × 16 SRAM; no DDR, no ODT, no echo clocks; 15 ns access time | Legacy control plane buffering; no burst or source-synchronous timing support | Only for non-critical, low-bandwidth subsystems where DDR complexity is unnecessary and latency tolerance >10 ns |
Compared with CY7C25682KV18-450BZC, the -500BZC offers 100 MHz higher bandwidth and 110 mA higher current headroom for sustained bursts; versus AS7C3256B-15JCIN, it delivers 72× more density, 73× higher throughput, and deterministic source-synchronous timing essential for modern packet-processing pipelines.
Availability
CY7C25682KV18 is available at Aetrix Electronics and suitable for high-bandwidth networking infrastructure, telecom line card design, and industrial real-time control systems requiring stable component supply and long-term lifecycle assurance.
Supply support for CY7C25682KV18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for networking, automotive, and industrial applications, with emphasis on signal integrity and system-level timing robustness.
CY7C25682KV18 belongs to the QDR II+ SRAM product line, engineered specifically for deterministic, low-jitter, high-throughput memory interfacing in packet-forwarding engines, baseband processors, and test instrumentation.
FAQ
What is the function of the DOFF pin, and how does it affect timing?
The DOFF (Double-Off) pin configures read latency mode: when asserted HIGH, the device operates in DDR II+ mode with 2.5-cycle read latency; when LOW, it reverts to DDR I mode with 1-cycle latency. This is a static configuration set at power-up and affects internal pipeline staging - no dynamic switching is supported during operation. Latency mode determines minimum clock-to-output delay and burst alignment.
How is on-die termination (ODT) calibrated and controlled?
ODT is calibrated using the ZQ pin connected to a 240 Ω resistor to ground, which sets the reference impedance. The ODT pin selects resistance range: LOW selects RQ/3.33 (~72 Ω for 240 Ω ZQ), HIGH selects RQ/1.66 (~144 Ω). Calibration occurs automatically during power-up initialization and remains fixed until next reset; no software register access is required.
Can CY7C25682KV18 interface directly with Xilinx Ultrascale+ FPGAs?
Yes - its HSTL Class I I/O, 550 MHz DDR timing, echo clocks (CQ/CQ), and QVLD signal are fully compatible with Xilinx Ultrascale+ memory interfaces. The device meets all AC timing requirements for MIG-generated DDR controllers targeting QDR II+ protocols, including tDS, tDH, and tQVLD specifications in the 001-66483 datasheet.
What is the role of the LD (Load) signal in burst transaction sequencing?
LD is the command strobe that initiates each burst transaction. Sampled on the rising edge of K, it latches the current address and R/W state to begin a two-word read or write. LD must meet strict setup/hold times relative to K; it is not a continuous enable but a per-burst trigger - one LD assertion yields exactly two data words transferred, regardless of subsequent K edges.
CY7C25682KV18-500BZC Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II+
- Memory Size:
- 72Mbit
- Memory Organization:
- 4M x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- 500 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C25682KV18-500BZC FAQ
1.How can I place an order for CY7C25682KV18-500BZC through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C25682KV18-500BZC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
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The price and inventory of CY7C25682KV18-500BZC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C25682KV18-500BZC is usually 5 days.
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Once your CY7C25682KV18-500BZC order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C25682KV18-500BZC?
For technical support, including CY7C25682KV18-500BZC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C25682KV18-500BZC requirements.
6.How does Aetrix verify that CY7C25682KV18-500BZC is sourced from the original manufacturer or authorized distributors?
All CY7C25682KV18-500BZC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C25682KV18-500BZC meets industry standards.
7.What is the process for return or replacement of CY7C25682KV18-500BZC?
All CY7C25682KV18-500BZC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C25682KV18-500BZC, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C25682KV18-500BZC part is unused and in its original packaging.
Return procedure for CY7C25682KV18-500BZC:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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