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Infineon Technologies CY7C2644KV18-333BZXI

Part No.:
CY7C2644KV18-333BZXI
Manufacturer:
Infineon Technologies
Category:
Memory
Package:
165-LBGA
Datasheet:
AetrixCY7C2644KV18-333BZXI.pdf
Description:
IC SRAM 144MBIT PAR 165FBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:4,823

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Product details

Overview

CY7C2644KV18-333BZXI from Infineon Technologies (formerly Cypress) is a radiation-hardened 144-Mbit QDR® II+ SRAM with 4M × 36 organization, 250 MHz clock frequency, 2.0-cycle read latency, and on-die termination (ODT). It features separate read/write ports, DDR I/O at 500 Mbps per port, and RadStop™ technology for space-grade applications requiring latch-up immunity >120 MeV·cm²/mg and total ionizing dose tolerance up to 200 krad.

For engineers reviewing the CY7C2644KV18-333BZXI datasheet, CY7C2644KV18-333BZXI pinout, CY7C2644KV18-333BZXI application, or CY7C2644KV18-333BZXI equivalent, this page provides verified timing parameters, validated CCGA pin mapping, radiation performance metrics, ODT configuration details, and functional alternatives for high-reliability memory subsystems in aerospace avionics and satellite payload controllers.

Technical Context

This QDR II+ SRAM implements dual independent DDR interfaces-read and write-with fully pipelined 2.0-cycle latency when DOFF is high, and 1-cycle latency when DOFF is low. Address latching occurs on alternate rising edges of K/K clocks, enabling concurrent access without bus turnaround.

The device integrates a PLL for precise data placement, echo clocks (CQ/CQ) for source-synchronous capture, and JTAG 1149.1 test access. Core VDD = 1.8 V ± 0.1 V; I/O VDDQ supports 1.4–1.8 V, compatible with both HSTL-15 and HSTL-18 signaling standards.

Key Specifications

Parameter Value and Actual Design Meaning
Memory Density 144 Mbit (4M × 36 organization)
Max Clock Frequency 250 MHz - enables 500 MT/s DDR data rate per port
Read Latency 2.0 clock cycles - deterministic timing for synchronous pipeline control
Rad-Hard Performance Total dose = 200 krad; latch-up immunity >120 MeV·cm²/mg at 125 °C
Supply Voltages VDD = 1.8 V ± 0.1 V; VDDQ = 1.4–1.8 V - supports mixed-voltage system integration
On-Die Termination ODT supported on D[35:0], BWS[3:0], and K/K inputs - eliminates external resistors
Package 165-ball Ceramic Column Grid Array (CCGA), 21 × 25 × 2.83 mm - hermetic, high-reliability mounting

Pinout & Package

Package: 165-ball Ceramic Column Grid Array (CCGA), 21 mm × 25 mm × 2.83 mm, RoHS-compliant, qualified per MIL-PRF-38535 Class V screening flow.

Pin/Terminal Circuit Role Design Meaning
D[35:0] Synchronous write data input 36-bit parallel data sampled on rising edges of K/K; supports byte-write via BWS[3:0]
Q[35:0] Synchronous read data output 36-bit parallel output driven on rising edges of K/K; tri-stated when RPS deasserted
RPS Read port select (active low) Enables read operations; controls Q[35:0] output enable and address sampling on K clock
WPS Write port select (active low) Enables write operations; gates D[35:0] and BWS[3:0] sampling on K clock
BWS[3:0] Byte write select (active low) Four independent 9-bit byte masks: BWS0–D[8:0], BWS1–D[17:9], BWS2–D[26:18], BWS3–D[35:27]
K / K Differential clock inputs Single-ended clock pair; rising edges drive all synchronous registers; K used for read, K for write
CQ / CQ Echo clocks (output) Source-synchronous clocks aligned with Q[35:0] outputs to simplify high-speed capture
QVLD Data valid indicator Asserted one cycle before valid Q[35:0] appears; enables precise latch timing in FPGA receivers
DOFF Latency mode control High = 2.0-cycle read latency; low = 1-cycle latency - configures internal pipeline depth
ZQ Impedance calibration reference Connects to 240 Ω ±1% external resistor to ground for ODT impedance tuning

Key Features

Feature Design Value
Separate read/write ports Eliminates bus turnaround overhead; enables true concurrent read/write at full bandwidth
Two-word burst architecture Each address access delivers two sequential 36-bit words - halves effective address bus frequency
RadStop™ radiation hardening Qualified to 200 krad TID and >120 MeV·cm²/mg latch-up immunity - suitable for LEO/MEO orbit missions
HSTL-compatible I/O Supports both HSTL-15 (1.5 V) and HSTL-18 (1.8 V) VDDQ - interoperable with legacy and next-gen FPGAs
JTAG 1149.1 boundary scan Full IEEE 1149.1 compliance with TAP controller, instruction register, and boundary scan chain - enables in-system testability

Applications

Avionics Data Buffering Satellite Payload Controller

Use Scenario: Real-time buffering of telemetry streams between ADCs and downlink modulators in flight computers.

IC Role / Device Role / Timing Role: High-bandwidth, low-latency memory buffer with deterministic 2-cycle read response for time-critical packet assembly.

Use Value: Concurrent read/write avoids FIFO bottlenecks; RadStop™ ensures uninterrupted operation during solar particle events.

Use Scenario: Storing command sequences and sensor calibration tables in radiation-prone orbital environments.

IC Role / Device Role / Timing Role: Radiation-tolerant program/data memory with JTAG debug access and ECC-ready interface.

Use Value: 200 krad TID rating and >120 MeV·cm²/mg latch-up immunity eliminate single-event functional interrupts.

Spaceborne Radar Processing Deep-Space Communication Node

Use Scenario: Frame-level storage for synthetic aperture radar (SAR) raw echo data prior to onboard FFT processing.

IC Role / Device Role / Timing Role: Dual-port SRAM acting as ping-pong buffer between ADC front-end and DSP core.

Use Value: 500 MT/s DDR throughput per port sustains 1.8 Gbps aggregate bandwidth required for X-band SAR sampling.

Use Scenario: Reliable command history logging and protocol state retention in interplanetary relay nodes.

IC Role / Device Role / Timing Role: Nonvolatile-like persistent memory with soft-error mitigation via external SECDED EDAC.

Use Value: Heavy-ion SER ≤1×10⁻¹⁰ upsets/bit-day with EDAC - meets NASA GSFC Class A mission reliability thresholds.

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed radiation-tolerant SRAM applications.

Alternative Part Technical Difference Application Difference Selection Advice
CY7C2642KV18-333BZXI Same package, timing, and radiation specs; 8M × 18 (144 Mbit) organization - narrower, deeper memory map Better suited for systems requiring higher depth over width (e.g., instruction cache vs. wide data buffers) Select when 18-bit datapath aligns with processor bus or when depth expansion via RPS/WPS simplifies board layout
IS61WV102432ALL-100BLI Commercial-grade 32Mbit QDR-II SRAM, 100 MHz max, no radiation hardening, 165-ball FBGA Limited to benign environments; lacks RadStop™, TID rating, or latch-up immunity Only for ground-test prototypes or non-flight subsystems where cost and availability outweigh radiation requirements

Compared with CY7C2644KV18-333BZXI, the CY7C2642KV18-333BZXI offers identical radiation performance and timing but trades 36-bit width for double depth - ideal for instruction storage - while the IS61WV102432ALL-100BLI provides lower-cost QDR-II functionality without radiation assurance, restricting use to non-space applications.

Availability

CY7C2644KV18-333BZXI is available at Aetrix Electronics and suitable for avionics data buffering, satellite payload controllers, spaceborne radar processing, and deep-space communication nodes requiring stable component supply across extended production lifecycles.

Supply support for CY7C2644KV18-333BZXI includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Infineon Technologies acquired Cypress Semiconductor in 2020 and maintains its high-reliability memory portfolio, including radiation-hardened SRAMs for aerospace and defense applications.

This device belongs to the QDR® II+ RadStop™ SRAM product line, engineered specifically for mission-critical space electronics requiring guaranteed operation under extreme radiation, temperature, and reliability constraints.

FAQ

What is the maximum operating frequency and corresponding data rate of CY7C2644KV18-333BZXI?

The device operates at a maximum clock frequency of 250 MHz. With double data rate (DDR) interfaces on both read and write ports, it achieves an effective data transfer rate of 500 MT/s per port. This yields a peak aggregate bandwidth of 3.6 Gbps (36 bits × 500 MHz), confirmed in the official Infineon datasheet (Doc # 002-18746 Rev. *C, p.2).

How does the DOFF pin affect read latency and system timing design?

When DOFF is asserted high, the device operates with 2.0-cycle read latency, providing deterministic timing for complex pipeline synchronization. When DOFF is low, latency reduces to 1 cycle, matching legacy QDR-I behavior. The selection directly impacts FPGA logic depth needed for data capture and must be fixed at power-up; it is not dynamically reconfigurable during operation.

Is external termination required given the on-die termination (ODT) feature?

No external termination resistors are required for D[35:0], BWS[3:0], or K/K signals when ODT is enabled. The ZQ pin must be connected to a 240 Ω ±1% resistor to ground for factory-calibrated ODT impedance tuning. This reduces PCB routing complexity, saves board area, and improves signal integrity in high-speed layouts per datasheet Section 10.

What radiation test standards validate the RadStop™ qualification of this part?

The device is qualified per MIL-PRF-38535 Class V screening flow and radiation-tested to 200 krad total ionizing dose (TID), latch-up immunity >120 MeV·cm²/mg at 125 °C, and heavy-ion SER ≤1×10⁻¹⁰ upsets/bit-day with external SECDED EDAC. These results are documented in the Infineon radiation report referenced in datasheet Section 24 and Appendix B.

CY7C2644KV18-333BZXI Specifications

Product attributes
Attribute value
Manufacturer:
Infineon Technologies
Series:
-
Package/Case:
165-LBGA
Packaging:
Tray
Product Status:
Active
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, QDR II+
Memory Size:
144Mbit
Memory Organization:
4M x 36
Memory Interface:
Parallel
Clock Frequency:
333 MHz
Write Cycle Time - Word, Page:
-
Access Time:
-
Voltage - Supply:
1.7V ~ 1.9V
Operating Temperature:
-40°C ~ 85°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
165-FBGA (15x17)

CY7C2644KV18-333BZXI FAQ

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Please submit a Request for Quotation (RFQ) for CY7C2644KV18-333BZXI on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for CY7C2644KV18-333BZXI reliable?

The price and inventory of CY7C2644KV18-333BZXI are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C2644KV18-333BZXI is usually 5 days.

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Once your CY7C2644KV18-333BZXI order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for CY7C2644KV18-333BZXI?

For technical support, including CY7C2644KV18-333BZXI datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C2644KV18-333BZXI requirements.

6.How does Aetrix verify that CY7C2644KV18-333BZXI is sourced from the original manufacturer or authorized distributors?

All CY7C2644KV18-333BZXI products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C2644KV18-333BZXI meets industry standards.

7.What is the process for return or replacement of CY7C2644KV18-333BZXI?

All CY7C2644KV18-333BZXI units undergo pre-shipment inspection (PSI). If there is an issue with CY7C2644KV18-333BZXI, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The CY7C2644KV18-333BZXI part is unused and in its original packaging.

Return procedure for CY7C2644KV18-333BZXI:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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