Analog Devices Inc. DAS1156

Overview

DAS1156 from Analog Devices is a 15-bit, functionally complete low-level data acquisition subsystem integrating instrumentation amplifier, sample/hold amplifier, and analog-to-digital converter in a single metal package. It delivers guaranteed differential nonlinearity of ±0.002% FSR, integral nonlinearity of ±0.003% FSR, and throughput rate of 20 kHz (G = 1 or 1000), targeting high-accuracy measurement in nuclear instrumentation and medical systems.

For engineers reviewing the DAS1156 datasheet, DAS1156 pinout, DAS1156 application, or DAS1156 equivalent, key selection considerations include its resistor-programmable gain (1 V/V to 1000 V/V), ±0.002% FSR differential linearity, -96 dB feedthrough rejection, internal trim potentiometers for offset/gain calibration, and tri-state parallel digital outputs compatible with microprocessor bus interfaces.

Technical Context

The DAS1156 implements a fully integrated signal chain: a true differential instrumentation amplifier (100 MΩ input impedance, -80 dB CMR up to 500 Hz) drives a precision sample/hold amplifier (5 μs max acquisition time), which feeds a 15-bit successive-approximation ADC with unipolar (+10 V) or bipolar (±5 V) full-scale range. Gain is set externally via RG using the formula G = 1 + (20 kΩ)/RG.

It supports user-selectable coding formats (binary, offset binary, two's complement), features byte-selectable tri-state output buffers, and includes internal reference voltage (10 V ±0.3%, ±5.5 ppm/°C stability). Offset and gain are trimmed via dedicated internal potentiometers, with calibration procedures defined for ±0.002% FSR accuracy verification.

Key Specifications

Pinout & Package

Package: 2″ × 4″ × 0.44″ hermetically sealed metal case (non-standard IC package; mechanical housing with terminal block interface).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-accuracy data acquisition subsystem applications.

Compared with AD7870KP, DAS1156 reduces BOM count and calibration complexity by integrating three critical functions; versus DAS1155, it trades 1-bit resolution for tighter ±0.002% FSR DNL and retains identical form-factor and interface - making it optimal for applications where missing-code immunity is non-negotiable.

Availability

DAS1156 is available at Aetrix Electronics and suitable for nuclear instrumentation, medical instrumentation, and automated test equipment requiring stable component supply, long-lifecycle support, and guaranteed metrology-grade specifications.

Supply support for DAS1156 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, founded in 1965 and headquartered in Wilmington, MA.

The DAS1156 belongs to Analog Devices' legacy Data Acquisition Subsystems product line, designed specifically for turnkey, high-accuracy measurement in safety-critical and calibration-grade applications where integration, stability, and guaranteed specs outweigh cost or density constraints.

FAQ

What is the guaranteed differential nonlinearity specification for the DAS1156?

The DAS1156 guarantees differential nonlinearity of ±0.002% FSR maximum across its full operating temperature range (0°C to +70°C). This value is explicitly specified in the official Analog Devices datasheet for DAS1156 and is validated per unit during production testing - ensuring no missing codes and monotonic behavior essential for precision metrology applications where the DAS1156 is deployed.

Does the DAS1156 include an internal voltage reference, and what are its key specs?

Yes, the DAS1156 includes an internal +10 V reference with ±0.3% initial accuracy and ±5.5 ppm/°C temperature stability. This reference is used internally for ADC conversion and is also available at the REF OUT terminal for external circuitry. Its low drift and tight tolerance eliminate the need for external references in most calibration-grade designs using the DAS1156.

How is gain programmed on the DAS1156, and what is the supported range?

Gain on the DAS1156 is resistor-programmable from 1 V/V to 1000 V/V using an external resistor RG connected between the GAIN ADJ terminals. The relationship follows G = 1 + (20 kΩ)/RG. A high-quality metal-film resistor is recommended to maintain the ±0.002% FSR DNL performance of the DAS1156 across temperature and time.

What digital output formats does the DAS1156 support, and how are they selected?

The DAS1156 supports unipolar binary, bipolar offset binary, and bipolar two's complement coding. Unipolar mode uses +10 V full scale; bipolar mode (enabled by connecting REF OUT to BIP OFS) uses ±5 V full scale. Output format is determined by input range configuration and coding logic - no register writes or serial commands are required, simplifying host interface design for the DAS1156.

Can the DAS1156 operate with a ±12 V supply, and what are the implications?

Yes, the DAS1156 supports analog supply voltages from ±12 V to ±17 V. However, when operated at ±12 V, the analog input must be limited to ±7 V to prevent saturation or damage. This derating preserves the guaranteed ±0.002% FSR DNL and -80 dB CMR performance of the DAS1156 while enabling compatibility with legacy ±12 V power systems.