Analog Devices Inc. EV-ADL5335SD1Z

Overview

EV-ADL5335SD1Z from Analog Devices is a fully populated, 4-layer FR4 evaluation board designed to verify the operation of the ADL5335 digital variable gain amplifier (DGA) across 700 MHz–4.2 GHz. It supports differential and single-ended RF input configurations, provides PC-based USB control via EVAL-SDP-CS1Z, and integrates the ADL5910 RF threshold detector for fast attack functionality.

For engineers reviewing the EV-ADL5335SD1Z datasheet, EV-ADL5335SD1Z pinout, EV-ADL5335SD1Z application, or EV-ADL5335SD1Z equivalent, this page delivers verified hardware interface details, test setup guidance, software control workflow, RF performance validation procedures, and integration requirements with SDP-S platform and external test equipment.

Technical Context

The EV-ADL5335SD1Z implements full functional verification of the ADL5335 DGA using a 5 V single-supply power interface, SMA-connected RF paths (RFINSE, RFIN+, RFIN−, RFOUT, PA_PRO), and configurable fast attack feedback via ADL5910 Q-output routing through R42/R5. It includes on-board biasing, impedance matching (TCMI-63AX+ balun, 37.5 Ω/82.5 Ω resistor networks), and ac-coupling (100 pF at C1/C2).

Hardware reconfiguration enables dual RF input modes: default single-ended 50 Ω input via RFINSE and TCMI-63AX+, or differential 100 Ω input via RFIN+/RFIN− with discrete termination. Fast attack activation is controlled by S2 switch or EN5910 test point, while threshold level is set via R8 potentiometer or VINEXT/VIN− inputs.

Key Specifications

Availability

EV-ADL5335SD1Z is available at Aetrix Electronics and suitable for RF test bench development, DGA characterization, high-frequency receiver front-end validation, and fast attack loop prototyping requiring stable component supply and documented evaluation infrastructure.

Supply support for EV-ADL5335SD1Z includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, headquartered in Norwood, MA.

The EV-ADL5335SD1Z belongs to Analog Devices' evaluation board product line, engineered specifically to accelerate RF system design and validation for digitally controlled gain amplifiers used in communications infrastructure, test instrumentation, and radar subsystems.

FAQ

What is the primary function of the EV-ADL5335SD1Z?

The EV-ADL5335SD1Z is an evaluation board purpose-built to verify the operation and performance of the ADL5335 digital variable gain amplifier. It provides complete hardware and software infrastructure-including RF interfaces, power conditioning, ADL5910 threshold detection, and PC-based GUI control-to validate gain accuracy, fast attack response, and RF signal integrity across 700 MHz–4.2 GHz. The EV-ADL5335SD1Z itself is not a semiconductor device but a test platform.

Does the EV-ADL5335SD1Z require additional hardware to operate?

Yes. The EV-ADL5335SD1Z requires the EVAL-SDP-CS1Z (SDP-S) system development platform for USB communication and PC control. It also needs an external 5 V power supply (≥200 mA), RF signal generator, spectrum analyzer, and optionally an external coupler for ADL5910 sensing. These are explicitly listed in the UG-1206 test equipment section and are mandatory for full functionality of the EV-ADL5335SD1Z.

Can the EV-ADL5335SD1Z be used for differential RF input signals?

Yes. By default, the EV-ADL5335SD1Z is configured for single-ended RF input via RFINSE and TCMI-63AX+. However, it can be reconfigured for differential 100 Ω input by removing R32 and R43 and populating R44, R45, R46, and R47 with 37.5 Ω resistors - as specified in the UG-1206 Hardware section. This modification directly enables differential drive of the ADL5335's RFIN+ and RFIN− pins on the EV-ADL5335SD1Z.

How is fast attack functionality implemented on the EV-ADL5335SD1Z?

Fast attack on the EV-ADL5335SD1Z is implemented by routing the Q output of the onboard ADL5910 threshold detector to the FA input of the ADL5335 via R42 and R5. When RF output power exceeds the ADL5910 threshold (set by R8, VINEXT, or VIN−), the Q output goes high, triggering gain reduction. R42 can be removed to disable this path, and S2 or EN5910 test point enables ADL5910 independently - all confirmed in UG-1206 Section 3.4.

Is the EV-ADL5335SD1Z RoHS compliant and ESD-safe?

Yes. The EV-ADL5335SD1Z is manufactured to comply with RoHS Directive requirements, as stated in the Legal Terms and Conditions section of UG-1206. It is also labeled ESD-sensitive, with explicit handling cautions due to integrated ADL5335ACPZ and ADL5910ACPZN-R7 ICs. Proper ESD precautions - including grounded workstations and anti-static packaging - are required during handling and operation of the EV-ADL5335SD1Z.