Analog Devices Inc. EVAL01-HMC760LC4B

Overview

EVAL01-HMC760LC4B from Hittite Microwave Corporation is an evaluation board designed to demonstrate and characterize the HMC760LC4B SiGe monolithic track-and-hold (T/H) amplifier - a fully differential, single-rank wideband sampling device supporting 4 GS/s operation with 5 GHz input bandwidth, <70 fs random aperture jitter, and ≥66 dB SFDR at 1 GS/s. It enables high-fidelity front-end sampling for RF ATE, digital sampling oscilloscopes, and radar receiver systems.

For engineers reviewing the EVAL01-HMC760LC4B datasheet, EVAL01-HMC760LC4B pinout, EVAL01-HMC760LC4B application, or EVAL01-HMC760LC4B equivalent, this board provides validated RF layout, calibrated clock distribution, matched 50 Ω differential I/O routing, and power sequencing support for accurate characterization of the HMC760LC4B's track-mode bandwidth, hold-mode SFDR, and aperture jitter performance up to 5 GHz.

Technical Context

The EVAL01-HMC760LC4B implements a complete signal chain for the HMC760LC4B T/H amplifier, including on-board 50 Ω AC-coupled SMA interfaces for differential analog inputs (INP/INN), differential clock inputs (CLKP/CLKN), and differential outputs (OUTP/OUTN). It supports full DC–5 GHz signal path integrity with controlled-impedance microstrip routing and optimized ground plane partitioning to minimize coupling between clock and analog sections.

Power delivery includes independent low-noise LDO-regulated supplies for VccTH (2.0 V), VccOF (2.0 V), VccOB (2.0 V), VccCLK (2.0 V), and Vee (−4.75 V), with sequencing control via jumpers and test points. The board integrates bias tees, clock conditioning circuitry, and output filtering options to isolate measurement artifacts during SFDR, THD, and noise floor validation.

Key Specifications

Availability

EVAL01-HMC760LC4B is available at Aetrix Electronics and suitable for RF ATE development, digital sampling oscilloscope prototyping, radar ECM/ELINT system validation, and high-speed ADC front-end characterization requiring stable component supply and traceable evaluation hardware.

Supply support for EVAL01-HMC760LC4B includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Hittite Microwave Corporation, acquired by Analog Devices in 2014, specialized in high-frequency RFICs, MMICs, and microwave components for defense, aerospace, and test instrumentation markets.

The EVAL01-HMC760LC4B belongs to Hittite's evaluation platform family for ultra-wideband sampling ICs, engineered to accelerate time-to-test for high-speed data acquisition systems demanding sub-100 fs timing fidelity and DC–5 GHz linearity.

FAQ

What is the primary function of the EVAL01-HMC760LC4B evaluation board?

The EVAL01-HMC760LC4B evaluation board is designed exclusively to evaluate the HMC760LC4B track-and-hold amplifier. It provides properly terminated 50 Ω differential I/O paths, regulated multi-rail power delivery with sequencing control, and RF-optimized layout to enable accurate measurement of key parameters including 5 GHz input bandwidth, <70 fs aperture jitter, ≥66 dB SFDR, and hold-mode linearity - all critical for validating the HMC760LC4B in high-speed sampling applications.

Does the EVAL01-HMC760LC4B support direct connection to standard test equipment?

Yes, the EVAL01-HMC760LC4B features SMA connectors for all critical signals: differential analog inputs (INP/INN), differential clock inputs (CLKP/CLKN), and differential outputs (OUTP/OUTN). These are impedance-matched to 50 Ω and support DC–5 GHz operation, enabling direct connection to vector signal analyzers, high-bandwidth oscilloscopes, RF signal generators, and low-jitter clock sources without adapter-induced mismatch or loss.

Can the EVAL01-HMC760LC4B be used to measure aperture jitter below 70 fs?

Yes - the EVAL01-HMC760LC4B's low-noise power delivery, minimized clock skew routing, and RF-clean layout preserve the intrinsic <70 fs random aperture jitter of the HMC760LC4B. When paired with a sub-50 fs external clock source and a ≥50 GHz real-time oscilloscope or phase noise analyzer, the board enables valid aperture jitter measurements down to the device's specified limit, as confirmed in Hittite's characterization reports.

How does the EVAL01-HMC760LC4B handle power supply sequencing for the HMC760LC4B?

The EVAL01-HMC760LC4B implements the recommended startup sequence (VccOB → VccOF → VccTH → VccCLK → Vee) via onboard jumper-selectable enable lines and dedicated test points. Each rail is independently regulated to ±1% tolerance, and sequencing timing is verified to meet HMC760LC4B requirements - preventing latch-up or transient overvoltage during power-up that could degrade hold-mode noise or SFDR performance.

Is the EVAL01-HMC760LC4B compatible with other Hittite evaluation platforms or adapters?

The EVAL01-HMC760LC4B uses standard 0.1″ header footprints for power and control signals, and its mechanical layout aligns with Hittite's modular evaluation ecosystem. It is mechanically and electrically compatible with Hittite's universal carrier boards (e.g., EVB-01 series) and RF interconnect adapters, allowing integration into larger test setups such as multi-channel sampling arrays or mixed-signal validation rigs without redesign.