STMicroelectronics EVAL638X-KIT

Overview

EVAL638X-KIT from STMicroelectronics is an evaluation kit designed to support rapid prototyping and functional validation of the L6384E, L6385E, L6386E, L6387E, and L6388E high-voltage gate drivers. It provides complete reference schematics, PCB layouts, and component placement for half-bridge, full-bridge, and asymmetrical converter topologies - enabling engineers to verify bootstrap driver operation, dead-time configuration, UVLO thresholds (e.g., V_CCTH1 = 9.6 V for L6385E), interlocking logic, and cycle-by-cycle current sensing (L6386E). The kit is used in motor control, resonant lighting ballasts, and SMPS design.

For engineers reviewing the EVAL638X-KIT datasheet, EVAL638X-KIT pinout, EVAL638X-KIT application, or EVAL638X-KIT equivalent, this kit supports hands-on validation of high-side floating drive, internal bootstrap diode replacement, 400 mA/650 mA gate drive capability, and shutdown/diagnostic interface behavior across five L638xE variants - critical for power stage reliability and layout optimization.

Technical Context

The EVAL638X-KIT implements standardized test circuits for all five L638xE devices using identical PCB footprints and modular component placement. Each variant's evaluation circuit includes dedicated C_BOOT networks, gate resistor options, UVLO monitoring points, and diagnostic signal access (e.g., DIAG and CIN on L6386E).

It enables comparative analysis of key functional differences: externally adjustable dead time (L6384E), independent HIN/LIN control with interlock (L6385E/L6387E/L6388E), 3.3-V logic compatibility (L6388E), and integrated current-sense comparator with open-drain diagnostic output (L6386E).

Key Specifications

Availability

EVAL638X-KIT is available at Aetrix Electronics and suitable for motor control development, LED lamp ballast design, and SMPS prototyping requiring stable component supply and consistent reference implementation across multiple gate driver variants.

Supply support for EVAL638X-KIT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

STMicroelectronics is a global semiconductor leader specializing in power management, analog, and microcontroller technologies - serving automotive, industrial, and consumer markets with high-reliability silicon solutions.

The L638xE evaluation kit belongs to ST's high-voltage gate driver product line, engineered specifically for robust, layout-efficient implementation of half-bridge and full-bridge power stages in offline converters and motor drives.

FAQ

Can EVAL638X-KIT be used with all five L638xE devices without hardware modification?

Yes - the kit uses a unified PCB layout with jumper-selectable configurations and footprint-compatible placements for SO-8 (L6384E/L6385E/L6387E/L6388E) and SO-14 (L6386E) packages. Figures 2, 5, 8, and associated application note schematics confirm shared evaluation circuit architecture across variants.

Does EVAL638X-KIT include components for testing the internal bootstrap driver feature?

Yes - each evaluation circuit includes C_BOOT, V_OUT/V_BOOT test points, and LVG-controlled charging path layout per Figure 13. The kit enables direct measurement of bootstrap capacitor voltage drop, DMOS conduction loss, and comparison against external diode alternatives as described in Section 6 of AN994.

How does EVAL638X-KIT support dead-time evaluation for L6384E and L6388E?

For L6384E, the kit provides a resistor-to-ground connection point at DT/SD (Pin 3) to set dead time from 0.5 µs to 2.7 µs; for L6388E, it validates fixed 320 ns interlocked dead time via oscilloscope-accessible HVG/LVG waveforms and truth table timing (Table 5), with no external adjustment required.

Is the L6386E current sense comparator (CIN/DIAG) fully operational on the EVAL638X-KIT board?

Yes - the kit includes a precision shunt resistor network and configurable gain stage feeding the CIN pin, with DIAG output routed to a test header. Application Note AN994 Figure 8 and Table 3 confirm the diagnostic path is implemented per L6386E's 0.5-V threshold specification and open-drain output drive capability.