Analog Devices Inc. EVAL-CN0211-EB1Z

Overview

EVAL-CN0211-EB1Z from Analog Devices is an evaluation board for the ADG904 wideband 4:1 RF multiplexer, designed to validate high-isolation, low-loss switching performance up to 2.5 GHz in absorptive SP4T configuration. It supports CMOS/LVTTL control (1.65 V–2.75 V), delivers 37 dB off-isolation at 1 GHz and 1.1 dB insertion loss at 1 GHz, and enables rapid characterization of antenna diversity, filter selection, and Tx/Rx front-end switching in wireless transceivers.

For engineers reviewing the EVAL-CN0211-EB1Z datasheet, EVAL-CN0211-EB1Z pinout, EVAL-CN0211-EB1Z application, or EVAL-CN0211-EB1Z equivalent, this board provides a ready-to-use platform with calibrated 50 Ω SMA interfaces (J4–J8), on-board TSSOP/LFCSP socket compatibility, and documented test setup guidance for RF S-parameter measurement, timing validation, and power-handling verification under real-world bias and temperature conditions.

Technical Context

The EVAL-CN0211-EB1Z implements the ADG904's absorptive 4:1 mux architecture using controlled-impedance coplanar waveguide routing on a 4-layer FR4 PCB (ε_r = 4.3, thickness = 0.062″), with dedicated ground planes and trace geometry optimized for minimal discontinuity (0.024″ width, 0.008″ clearance). It replicates the ADG904's RFC/RF1–RF4 signal path topology and includes EN/A0/A1 logic interface headers compatible with standard digital pattern generators.

It integrates a through-line reference path (J9–J10) for de-embedding PCB loss, supports single-supply operation (1.65 V–2.75 V), and maintains RF port return loss >15 dB up to 1 GHz-enabling accurate isolation, insertion loss, crosstalk, and IP3 measurements per ADG904 Rev. D test circuits (Figures 21–26).

Key Specifications

Availability

EVAL-CN0211-EB1Z is available at Aetrix Electronics and suitable for RF front-end validation, wireless transceiver prototyping, and high-frequency switch characterization requiring stable component supply, traceable sourcing, and documented test methodology.

Supply support for EVAL-CN0211-EB1Z includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and RF ICs, serving precision instrumentation, communications, and industrial markets since 1965.

EVAL-CN0211-EB1Z belongs to Analog Devices' evaluation board product line, engineered specifically to accelerate design-in and performance verification of their wideband RF switches-including the ADG904 family-for ISM-band and wireless infrastructure applications.

FAQ

What is the primary function of the EVAL-CN0211-EB1Z evaluation board?

The EVAL-CN0211-EB1Z evaluation board is a dedicated platform for characterizing the ADG904 absorptive 4:1 RF multiplexer. It enables direct measurement of key RF parameters-including off-isolation (37 dB @ 1 GHz), insertion loss (1.1 dB @ 1 GHz), crosstalk, and IP3-using standard network and spectrum analyzers. The board's calibrated 50 Ω layout and reference through-path ensure repeatable, datasheet-aligned results for EVAL-CN0211-EB1Z users validating RF switch behavior in real signal paths.

Which ADG904 package variants does the EVAL-CN0211-EB1Z support?

EVAL-CN0211-EB1Z supports both the 20-lead TSSOP (RU-20) and 20-lead 4 mm × 4 mm LFCSP (CP-20-6) packages of the ADG904, as confirmed by its dual-footprint landing pattern and mechanical compatibility per ADG904 Rev. D Outline Dimensions (Figures 31–32). The board accommodates either variant without adapter or rework, maintaining signal integrity across both封装 types for consistent EVAL-CN0211-EB1Z testing.

Does the EVAL-CN0211-EB1Z include power supply regulation or level-shifting circuitry?

No, the EVAL-CN0211-EB1Z does not include voltage regulation or level shifting. It requires an external 1.65 V–2.75 V DC supply applied directly to the VDD header, matching the ADG904's native supply range. Decoupling is provided by a single 10 µF capacitor per the ADG904 test circuit (Figure 19), ensuring clean biasing without added noise or delay-critical for accurate EVAL-CN0211-EB1Z timing and distortion measurements.

How is RF calibration performed on the EVAL-CN0211-EB1Z?

Calibration on EVAL-CN0211-EB1Z uses the integrated J9–J10 through-line-a 50 Ω transmission path with identical construction to the RFC/RFx signal paths. By measuring S21 of J9–J10 under the same environmental conditions, users quantify and subtract PCB insertion loss from device-under-test measurements. This de-embedding method aligns with ADG904 Rev. D test procedures (Figure 20) and ensures EVAL-CN0211-EB1Z delivers true device-level RF performance data.

Can the EVAL-CN0211-EB1Z be used to evaluate the ADG904-R reflective variant?

Yes, the EVAL-CN0211-EB1Z is explicitly designed for both ADG904 (absorptive) and ADG904-R (reflective) variants, as stated in the "Evaluation Board" section (Page 12) of the ADG904 Rev. D datasheet. Its 50 Ω routing, SMA interface, and logic header are agnostic to termination type-allowing full characterization of isolation, insertion loss, and switching timing for either variant using the same EVAL-CN0211-EB1Z hardware.