STMicroelectronics HCF4011M013TR

Overview

HCF4011M013TR from STMicroelectronics is a quad 2-input NAND gate IC in SO-14 package, implementing standard CMOS logic with buffered inputs/outputs, 60 ns typical propagation delay at VDD = 10 V, ±100 nA input leakage at 18 V, and operation across 3–20 V supply range - used in digital control logic, power sequencers, and discrete gate-level combinational circuits.

For engineers reviewing the HCF4011M013TR datasheet, HCF4011M013TR pinout, HCF4011M013TR application, or HCF4011M013TR equivalent, key selection criteria include supply voltage flexibility (3–20 V), symmetrical output drive (±1.1 mA @ 10 V), quiescent current tested to 20 V, noise margin scalability with VDD, and JEDEC JESD13B compliance for B-series CMOS reliability.

Technical Context

The HCF4011M013TR implements four independent NAND gates using standard CMOS process technology, with fully buffered inputs and outputs to ensure consistent signal integrity and fan-out capability. Each gate exhibits symmetrical rise/fall times (50 ns typ. at VDD = 10 V) and matched high/low output voltage thresholds (VOH ≥ 9.95 V, VOL ≤ 0.05 V at VDD = 10 V).

It operates over an extended temperature range (−55 °C to +125 °C) and supports three parametric voltage grades (5 V, 10 V, 15 V), with input leakage tightly specified (≤100 nA at VDD = 18 V, TA = 25 °C) and 100% tested quiescent current per unit.

Key Specifications

Pinout & Package

SO-14 surface-mount package (8.55–8.75 mm × 5.8–6.2 mm, 1.27 mm pitch), compliant with JEDEC MS-012, with gull-wing leads and moisture sensitivity level MSL3.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar quad 2-input NAND gate applications.

Compared with CD4011BE and MC14011BDR2G, the HCF4011M013TR uniquely combines SO-14 SMT compatibility, 20 V absolute max rating, 100% tested quiescent current, and JEDEC JESD13B certification - making it the only choice for high-reliability, wide-supply, automated production environments.

Availability

HCF4011M013TR is available at Aetrix Electronics and suitable for power sequencing control, digital state machines, legacy system interface, and industrial sensor signal conditioning requiring stable component supply across extended temperature and voltage ranges.

Supply support for HCF4011M013TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

STMicroelectronics is a global semiconductor leader headquartered in Geneva, designing and manufacturing analog, digital, and mixed-signal ICs for industrial, automotive, and consumer applications.

The HCF4011M013TR belongs to ST's legacy B-series CMOS logic family, engineered for interoperability with older 4000-series designs while meeting modern reliability and test standards like JESD13B.

FAQ

What is the maximum supply voltage the HCF4011M013TR can withstand continuously?

The absolute maximum VDD rating is +22 V, but continuous operation above 20 V is not recommended. The device is fully characterized and 100% tested up to 20 V, with quiescent current validated at that level. Operation beyond 20 V risks accelerated parametric drift and reduced long-term reliability, even if functional short-term.

Does the HCF4011M013TR support mixed-voltage interfacing between 5 V and 15 V logic domains?

Yes - its input voltage range spans 0 to VDD, and output VOH/VOL remain rail-aligned across 5 V, 10 V, and 15 V operation. At VDD = 15 V, VIH = 11 V and VIL = 4 V provide 4 V noise margin, enabling robust interfacing without external level shifters when driving or receiving from other B-series devices.

Is the SO-14 package of HCF4011M013TR compatible with reflow soldering per J-STD-020?

Yes - the SO-14 package meets JEDEC MS-012 and is rated MSL3 (Moisture Sensitivity Level 3), supporting standard lead-free reflow profiles with peak temperature ≤260 °C. Recommended floor life is 168 hours at ≤30 °C/60% RH; baking before reflow is required if exposed beyond that limit.

How does the 100% quiescent current test impact design margin in battery-powered systems?

This test guarantees each unit draws ≤7.5 µA at VDD = 10 V and ≤150 µA at VDD = 20 V, enabling accurate worst-case battery life calculation. Unlike statistical sampling, 100% testing eliminates outliers, critical for systems where sleep-mode current directly determines service interval - e.g., remote sensor nodes expected to operate >5 years on primary Li-SOCl₂ cells.