NXP Semiconductors HEF4511BP,652

Overview

HEF4511BP,652 from NXP Semiconductors is a BCD-to-7-segment latch/decoder/driver IC with active-HIGH NPN transistor outputs (Qa–Qg), active-HIGH latch enable (LE), active-LOW lamp test (LT), and active-LOW ripple blanking (BL). It operates from 3 V to 15 V over −40 °C to +125 °C and drives common-cathode LED, incandescent, fluorescent, gas discharge, and LCD displays. Its static operation and symmetrical output characteristics support stable digit readout in industrial panel meters and instrumentation.

For engineers reviewing the HEF4511BP,652 datasheet, HEF4511BP,652 pinout, HEF4511BP,652 application, or HEF4511BP,652 equivalent, this page delivers verified functional behavior, validated DIP16 package mapping, confirmed latch/blanking/test logic timing, and real-world display interface constraints - all grounded in NXP's Rev. 7 product data sheet.

Technical Context

The HEF4511BP,652 integrates four D-type latches, a BCD-to-7-segment decoder, and seven NPN bipolar output drivers in a single monolithic CMOS structure. Latch operation is edge-triggered on LE rising edge, while LT and BL operate asynchronously and independently of latch state.

Its output stage delivers up to 4.2 mA sink current at 15 V (V_O = 1.5 V) and maintains VOL ≤ 0.05 V across supply and temperature ranges. Propagation delays range from 12 ns (LT→Qn at 15 V) to 320 ns (Dn→Qn at 5 V), with load-dependent extrapolation formulas defined per V_DD.

Key Specifications

Pinout & Package

DIP16 plastic dual in-line package (SOT38-4), 300 mil width, through-hole mount. Pin 1 index located at top-left corner when notch faces upward.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar BCD-to-7-segment latch/decoder applications.

Compared with CD4511BE and 74HC4511, the HEF4511BP,652 uniquely combines integrated NPN segment drivers, dual diagnostic inputs (LT/BL), and wide 3–15 V operation - making it the only option supporting direct common-cathode LED drive, hardware-led display validation, and mixed-voltage industrial systems without redesign.

Availability

HEF4511BP,652 is available at Aetrix Electronics and suitable for industrial panel meters, automotive instrument clusters, test equipment, and appliance control panels requiring stable component supply across extended temperature and voltage ranges.

Supply support for HEF4511BP,652 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor company headquartered in Eindhoven, Netherlands, specializing in secure connectivity solutions for automotive, industrial, and IoT applications.

The HEF4511BP,652 belongs to NXP's legacy HEF4000B logic family, designed specifically for robust, low-power BCD-driven display interfaces in harsh environments where reliability and wide supply tolerance are critical.

FAQ

What is the maximum supply voltage rating for the HEF4511BP,652?

The absolute maximum supply voltage (V_DD) for the HEF4511BP,652 is +18 V, but the recommended operating range is 3 V to 15 V. Operation above 15 V risks exceeding internal junction limits and is not guaranteed across temperature. The HEF4511BP,652 datasheet specifies parametric performance only up to 15 V, and sustained use beyond that may reduce long-term reliability. Always observe the 15 V upper limit in production designs.

Can the HEF4511BP,652 drive common-anode LED displays directly?

No, the HEF4511BP,652 cannot drive common-anode LED displays directly because its Qa–Qg outputs are active-HIGH NPN transistors designed to sink current into common-cathode configurations. For common-anode displays, external PNP transistors or logic inverters are required. The HEF4511BP,652's output architecture is optimized for cathode-grounded segments, and attempting direct anode drive would result in incorrect or non-functional display behavior.

How does the lamp test (LT) input interact with the latch enable (LE) signal in the HEF4511BP,652?

In the HEF4511BP,652, the LT input operates asynchronously and independently of LE: when LT is LOW, all Qa–Qg outputs go HIGH regardless of LE state, latch contents, or BCD inputs. LE remains fully functional during lamp test - new data can still be loaded, but outputs stay forced ON until LT returns HIGH. This allows hardware-level display verification without disrupting ongoing latch operations.

What is the purpose of the ripple blanking (BL) input on the HEF4511BP,652?

The BL input on the HEF4511BP,652 is an active-LOW signal that forces all seven segment outputs (Qa–Qg) LOW, overriding both latch state and decode logic. It is used to blank leading or trailing zeros in multi-digit displays - for example, in a 4-digit meter showing "0023", BL from the most-significant digit disables segments on less-significant digits. BL propagation delay is as low as 12 ns at 15 V, enabling precise inter-digit timing.

Does the HEF4511BP,652 require external pull-up resistors on its segment outputs?

No, the HEF4511BP,652 does not require external pull-up resistors on Qa–Qg because each output integrates an NPN transistor with collector tied to V_DD and emitter as the output pin - functioning as a current sink. When active, it pulls the segment line LOW relative to V_DD; when inactive, the output floats HIGH due to internal design. External pull-ups would conflict with this architecture and are unnecessary for common-cathode LED drive.