NXP Semiconductors HEF4511BT,652

Overview

HEF4511BT,652 from NXP Semiconductors is a BCD-to-7-segment latch/decoder/driver IC with active-HIGH NPN transistor outputs (Qa–Qg), active-HIGH latch enable (LE), active-LOW lamp test (LT), and active-LOW ripple blanking (BL). It operates from 3 V to 15 V over −40 °C to +125 °C and drives common-cathode LED, incandescent, fluorescent, gas discharge, and LCD displays. Its static operation and JEDEC JESD13-B compliance support industrial panel meters and legacy instrumentation.

For engineers reviewing the HEF4511BT,652 datasheet, HEF4511BT,652 pinout, HEF4511BT,652 application, or HEF4511BT,652 equivalent, this page delivers verified functional behavior, SO16 package details, latch timing constraints (e.g., LE pulse width ≥35 ns at 15 V), output drive capability (up to −4.2 mA HIGH-level sink at 15 V), and real-world display interface guidance - all grounded in NXP's Rev. 7 product data sheet.

Technical Context

The HEF4511BT,652 integrates four D-type latches, a BCD-to-7-segment decoder, and seven NPN bipolar output drivers in a single monolithic CMOS structure. Latch operation is edge-triggered on LE rising edge, while LT and BL override segment outputs independently of latch state.

Its output stage uses open-collector NPN transistors capable of sinking up to 4.2 mA per segment at 15 V supply, with VOL ≤ 0.05 V at 1 μA load. Propagation delays range from 12 ns (LT→Qn at 15 V) to 320 ns (LE→Qn at 5 V), scaling linearly with load capacitance per published extrapolation formulas.

Key Specifications

Pinout & Package

HEF4511BT,652 is housed in an SO16 plastic small outline package (SOT109-1), 16-pin, 3.9 mm body width, with standard 1.27 mm pitch and gull-wing leads.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar BCD-to-7-segment latch/decoder applications.

Compared with CD4511BE and 74HC4511, the HEF4511BT,652 uniquely combines 3–15 V operation, −40 °C to +125 °C qualification, JEDEC JESD13-B compliance, and proven reliability in legacy industrial displays - making it the sole choice for drop-in replacement in fielded 4000-series systems.

Availability

HEF4511BT,652 is available at Aetrix Electronics and suitable for industrial panel meters, legacy instrumentation displays, gas discharge tube interfaces, and incandescent digit panels requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for HEF4511BT,652 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor company headquartered in Eindhoven, Netherlands, specializing in secure connectivity solutions for automotive, industrial, and IoT applications.

The HEF4511BT,652 belongs to NXP's legacy HEF4000B logic family, designed specifically for robust, wide-supply-range digital interface functions in industrial control, test equipment, and human-machine interface applications.

FAQ

What is the maximum supply voltage for the HEF4511BT,652?

The absolute maximum supply voltage (VDD) for the HEF4511BT,652 is +18 V, but the recommended operating range is 3 V to 15 V per NXP's datasheet Rev. 7. Operation above 15 V risks exceeding limiting values and may cause permanent damage. The HEF4511BT,652 is rated for parametric performance at 5 V, 10 V, and 15 V - confirming stable functionality across that full span.

Does the HEF4511BT,652 support common-anode displays?

No, the HEF4511BT,652 features active-HIGH NPN transistor outputs (Qa–Qg) designed to sink current into common-cathode displays. To drive common-anode displays, external PNP transistors or inverters are required. The HEF4511BT,652 datasheet explicitly shows connection diagrams only for common-cathode LED, incandescent, fluorescent, gas discharge, and LCD configurations - confirming its native common-cathode orientation.

How does the lamp test (LT) function interact with the latch enable (LE) in the HEF4511BT,652?

In the HEF4511BT,652, the lamp test (LT) input operates independently of the latch enable (LE): when LT is LOW, all segment outputs (Qa–Qg) go HIGH regardless of LE state or D0–D3 data. This means LT can force full-digit illumination even while LE is LOW (transparent mode) or HIGH (latched mode), enabling real-time visual diagnostics without disrupting stored BCD values.

What is the minimum pulse width required on the LE input of the HEF4511BT,652 at 15 V supply?

At VDD = 15 V, the minimum pulse width (tW) for the LE input of the HEF4511BT,652 is 35 ns, as specified in Table 8 of the NXP datasheet Rev. 7. This ensures reliable capture of D0–D3 data on the rising edge of LE. Using shorter pulses risks metastability or incomplete latching, especially under worst-case temperature and process corners.

Can the HEF4511BT,652 drive LCD segments directly?

No, the HEF4511BT,652 is not intended for direct DC drive of LCD segments. As stated in Section 12 of the NXP datasheet, "Direct DC drive of LCDs not recommended for life of LCD readouts." Instead, the HEF4511BT,652 should interface with AC-excited LCD drivers (e.g., using a square-wave excitation signal referenced to VSS–VDD), preserving display longevity and contrast consistency.