Renesas HI5767EVAL1

Overview

The HI5767EVAL1 evaluation board from Intersil enables engineers to characterize the HI5767 monolithic 10-bit, 20/40/60MSPS analog-to-digital converter under real-world signal conditions. It integrates a single-ended-to-differential analog front-end using two HFA1109 op-amps, an adjustable external reference voltage generator (1.2V bandgap + HA5127 amplifier), AC-coupled 50Ω SMA inputs for clock and analog signals, and a digital output header supporting D0–D9 and complementary CLK/CLK timing.

For engineers reviewing the HI5767EVAL1 datasheet, HI5767EVAL1 pinout, HI5767EVAL1 application, or HI5767EVAL1 equivalent, this board supports dynamic performance validation-including SINAD, SNR, THD, SFDR, and IMD-using coherent sampling test setups with HP8662A signal generators, logic analyzers, and FFT-based PC analysis tools.

Technical Context

The HI5767EVAL1 implements a fully differential pipeline ADC evaluation architecture centered on the HI5767's 7-cycle data latency, dual-supply analog/digital partitioning (+5VA/−5VA/+5VD/+3VD), and internal +2.5V reference (VREFOUT → VREFIN). Its sample clock path uses an AC-coupled SMA input (J2), bias tee, and CD74HC04 inverter comparator to convert sine-wave inputs into TTL-level clocks with user-adjustable duty cycle via VR2.

Analog signal conditioning includes an HFA1109-based unity-gain non-inverting stage (U3) and inverting-gain −1 stage (U4), delivering balanced differential drive to VIN+/VIN− while supporting optional gain modification. The board provides dedicated AGND/DGND planes tied at a single point, 0.1µF/4.7µF decoupling per supply rail, and configurable reference selection (P3 jumper between internal VREFOUT or external variable reference).

Key Specifications

Availability

HI5767EVAL1 is available at Aetrix Electronics and suitable for high-speed data acquisition, communications receiver testing, and video digitization applications requiring stable component supply, traceable sourcing, and long-term evaluation platform continuity.

Supply support for HI5767EVAL1 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Intersil Corporation was a U.S.-based semiconductor company specializing in high-performance analog and mixed-signal ICs, later acquired by Renesas Electronics in 2017. Its products emphasized precision, speed, and low-noise operation for demanding signal-chain applications.

The HI5767EVAL1 belongs to Intersil's high-speed ADC evaluation platform family, designed specifically to accelerate validation of pipeline ADCs in RF, instrumentation, and digital video systems where dynamic performance metrics (SINAD, SFDR, IMD) are critical.

FAQ

What is the primary function of the HI5767EVAL1 evaluation board?

The HI5767EVAL1 evaluation board is a dedicated hardware platform for characterizing the Intersil HI5767 10-bit, 20/40/60MSPS pipeline ADC. It provides calibrated analog signal conditioning, flexible clock generation, reference voltage options, and accessible digital outputs to enable accurate measurement of dynamic parameters including SINAD, SNR, THD, SFDR, and IMD. The HI5767EVAL1 does not operate as a standalone system but serves strictly as a test interface for the HI5767 IC under controlled lab conditions.

How does the HI5767EVAL1 handle analog input signal conditioning?

The HI5767EVAL1 uses two Intersil HFA1109 current-feedback op-amps (U3 and U4) to convert a single-ended 50Ω laboratory signal into a fully differential drive for the HI5767's VIN+/VIN− inputs. U3 operates at unity gain (AV = +1), U4 at inverting gain (AV = −1), ensuring balanced amplitude and phase. The input is AC-coupled via SMA connector J1 and includes provisions for a differential RC lowpass filter. Gain adjustment is possible by populating R3 and matching the inverting path, though default configuration is unity gain. The HI5767EVAL1 also supplies a stable 3.0V DC bias (VDC) to center the common-mode voltage within the HI5767's 0.25V–4.75V range.

Can the HI5767EVAL1 operate with an external reference voltage?

Yes - the HI5767EVAL1 supports both internal and external reference configurations. By default, the HI5767 uses its internal +2.5V reference (VREFOUT → VREFIN). To use the on-board external reference, the P3 jumper is placed across pins P3-1 and P3-2, enabling the ICL8069 (1.2V bandgap) + HA5127 amplifier circuit whose output is adjustable from ~1.2V to ~3.0V via potentiometer VR1. When using either reference, a 0.1µF capacitor must be connected from VREFOUT to AGND to ensure stability. The HI5767EVAL1's design allows direct observation of reference voltage impact on ADC performance metrics like gain error and full-scale accuracy.

What clock signal requirements does the HI5767EVAL1 impose for optimal HI5767 operation?

The HI5767EVAL1 accepts a sine-wave clock input (≤±1.5V) via SMA connector J2, which is AC-coupled, 50Ω terminated, and converted to TTL-level square wave by a CD74HC04 inverter acting as a comparator. A bias tee and potentiometer VR2 allow precise adjustment of the resulting clock's duty cycle to maintain the HI5767's required 50% ±5% specification. The trigger level is ~1.5V at the HI5767's CLK pin, so duty cycle must be measured there. The board delivers aligned CLK and CLK outputs at P2, with CLK rising edges synchronized to data transitions and CLK rising edges mid-bit - preserving timing integrity for downstream capture equipment. The HI5767EVAL1 does not generate clock signals autonomously; it conditions externally supplied ones.

How is digital output data accessed and controlled on the HI5767EVAL1?

Digital output data (D0–D9) and complementary clock signals (CLK/CLK) are available at the P2 2×12 header and optionally through the P1 96-pin Eurocard receptacle. No line drivers are included - the HI5767 drives CMOS loads directly, with strict limits: total load capacitance ≤10pF and drive strength compliant with standard CMOS specifications. The OE (output enable) pin is controlled by shunt JP1: installed for normal operation (OE = low), removed to place D0–D9 in high-impedance state for multi-converter debugging. Data format (offset binary or two's complement) is selected via the DFS pin. All digital signals are routed to low-inductance paths with local 0.1µF/4.7µF decoupling, and the HI5767EVAL1 provides test points (TP1–TP4) for probing key nodes without loading.