Renesas IDT71P71604S167BQ

Overview

IDT71P71604S167BQ from Integrated Device Technology is a 18 Mb (512K × 36-bit) pipelined DDR II SRAM with burst-of-2 operation, 1.8 V core voltage (VDD), 1.5 V I/O supply (VDDQ), and HSTL-compatible 165-ball fBGA package. It delivers double-data-rate throughput via dual-edge-aligned echo clocks (CQ/CQ), supports scalable output impedance (35–70 Ω), and targets high-bandwidth memory buffering in network packet processors and telecom line cards.

For engineers reviewing the IDT71P71604S167BQ datasheet, IDT71P71604S167BQ pinout, IDT71P71604S167BQ application, or IDT71P71604S167BQ equivalent, this page provides verified pin functions, burst timing behavior, ZQ-controlled impedance calibration, echo clock alignment specs, and validated alternatives for DDR II SRAM migration paths.

Technical Context

The IDT71P71604S167BQ implements a synchronous, pipelined architecture with separate K/K input clocks for address/control/data capture and C/C clocks for DDR data output timing. Its DLL aligns DQ outputs to C/C edges with sub-0.5 ns jitter tolerance, enabling precise data valid windows at 167 MHz (6 ns cycle time).

It features multiplexed address inputs, four independent byte write enables (BW0–BW3), SA0 for burst-order control, and JTAG support (TCK/TMS/TDI/TDO). The device uses HSTL Class I inputs with VREF reference and supports programmable output drive strength via external ZQ resistor (175–350 Ω) tied to VSS.

Key Specifications

Pinout & Package

165-ball fine-pitch BGA (fBGA), 13 mm × 15 mm, 1.0 mm pitch, commercial temperature range (0 °C to +70 °C). Ball grid follows JEDEC MO-245 standard.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar DDR II SRAM applications.

Compared with CY7C2665KV18 and MT46V32M36P-5B, the IDT71P71604S167BQ offers unique SA0-controlled burst reversal and standardized ZQ calibration-critical for deterministic latency in telecom buffers-while maintaining pin-compatible footprint with Cypress but requiring minor signal routing adjustments.

Availability

IDT71P71604S167BQ is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, high-speed test equipment memory, and radar signal processing buffer applications requiring stable component supply, long-term lifecycle support, and guaranteed HSTL timing compliance.

Supply support for IDT71P71604S167BQ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Integrated Device Technology (IDT), now part of Renesas Electronics, is a fabless semiconductor company specializing in timing, memory interface, and RF power solutions for communications and computing infrastructure.

The IDT71P71604S167BQ belongs to IDT's DDR II SRAM product line, designed specifically for high-bandwidth, low-latency memory buffering in networking, telecom, and test equipment where precise echo clock alignment and programmable impedance are essential.

FAQ

What is the function of the SA0 pin on the IDT71P71604S167BQ?

The SA0 pin on the IDT71P71604S167BQ controls burst order in read and write operations for x36 configurations. When SA0 = 0, the burst sequence is word 0 → word 1; when SA0 = 1, it reverses to word 1 → word 0. This enables flexible data alignment without software reordering. SA0 is sampled synchronously with the K clock and is only active on x18 and x36 variants like the IDT71P71604S167BQ.

How does the ZQ pin calibrate output impedance on the IDT71P71604S167BQ?

The ZQ pin on the IDT71P71604S167BQ connects to an external resistor (RQ) tied to VSS; output impedance is set to 0.2 × RQ. For nominal 50 Ω drive, RQ = 250 Ω. The device auto-calibrates every 1024 clock cycles to compensate for voltage/temperature drift. Tying ZQ directly to VDDQ forces minimum impedance (~35 Ω), while open or grounded ZQ disables calibration and risks timing violations.

Can the IDT71P71604S167BQ operate without the DLL enabled?

Yes, the IDT71P71604S167BQ can operate with the DLL disabled by holding the Doff pin low. In this mode, C/C or K/K clocks directly drive the output register, introducing additional propagation delay (not specified in datasheet) and relaxing timing margins. DLL-off operation is valid but requires recalculation of tCHQV/tCHQX parameters and is typically used only for debug or low-speed initialization sequences.

What is the role of the CQ and CQ echo clocks on the IDT71P71604S167BQ?

The CQ and CQ echo clocks on the IDT71P71604S167BQ are free-running, non-gated outputs tightly aligned to DQ data transitions. Rising edge of C generates both edges of CQ; rising edge of C generates both edges of CQ. They serve as hardware data-valid strobes for downstream capture logic, eliminating need for external delay-matched clock distribution and improving timing robustness in multi-SRAM systems.

Does the IDT71P71604S167BQ support JTAG boundary scan, and how is it implemented?

Yes, the IDT71P71604S167BQ supports IEEE 1149.1 JTAG boundary scan via dedicated TCK, TMS, TDI, and TDO pins. TDI and TMS have internal pull-up resistors, allowing safe unconnected states. JTAG enables production testing, interconnect verification, and in-system configuration checks - critical for high-reliability telecom and test equipment using the IDT71P71604S167BQ.