Renesas IDT71P71604S200BQG
- Part No.:
- IDT71P71604S200BQG
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 165-TBGA
- Datasheet:
-
IDT71P71604S200BQG.pdf
- Description:
- IC SRAM 18MBIT PAR 165CABGA
- Quantity:
- Payment:

- Shipping:

Inventory:4,769
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
IDT71P71604S200BQG from Integrated Device Technology is a 18 Mb (512K × 36-bit) pipelined DDR II SRAM with double-data-rate burst-of-2 operation, 1.8 V core voltage (VDD), 1.5 V I/O supply (VDDQ), and HSTL-compatible interfaces. It delivers 333 MHz clock frequency support, scalable 35–70 Ω output impedance via ZQ calibration, and dual echo clocks (CQ/CQ) for precise data capture in high-speed networking and packet buffering applications.
For engineers reviewing the IDT71P71604S200BQG datasheet, IDT71P71604S200BQG pinout, IDT71P71604S200BQG application, or IDT71P71604S200BQG equivalent, this device requires attention to its 165-ball fBGA package, dual-clock (K/K and C/C) timing architecture, burst-order control via SA0, byte-write enable mapping (BW0–BW3), and JTAG debug interface - all critical for DDR memory subsystem validation and signal integrity planning.
Technical Context
The IDT71P71604S200BQG implements a synchronous, pipelined DDR architecture where each K-clock cycle initiates one read or write access, and each access delivers two data words on the 36-bit DQ[35:0] bus using both rising and falling edges of C/C clocks. Its DLL aligns output data to echo clocks within ±0.25 ns, enabling tight setup/hold margins at 333 MHz.
It features separate VDD (1.8 V) and VDDQ (1.4–1.9 V) supplies, programmable output impedance calibrated via external ZQ resistor (175–350 Ω), and HSTL-compliant inputs referenced to VREF = VDDQ/2. The SA0 pin enables burst-order reversal and individual-word addressing in x36 mode, while BW0–BW3 provide per-byte write control across all 36 bits.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Organization | 18 Mb / 512K × 36-bit - supports high-bandwidth packet buffer storage with wide data path for parallel processing. |
| Max Clock Frequency | 333 MHz (tKHKH = 3.00 ns) - enables 666 MT/s effective data rate on DQ bus with burst-of-2 DDR operation. |
| Core & I/O Voltage | VDD = 1.7–1.9 V; VDDQ = 1.4–1.9 V - allows interoperability with 1.5 V HSTL, 1.8 V TTL, or scaled logic systems. |
| Output Impedance Range | 35–70 Ω (via ZQ pin + external 175–350 Ω resistor) - enables PCB trace impedance matching to reduce reflections and EMI. |
| Burst & Timing Mode | Burst-of-2, pipelined DDR with DLL - guarantees sub-nanosecond data-to-echo-clock alignment for reliable high-speed sampling. |
| Package | 165-ball fine-pitch BGA (13 mm × 15 mm, 1.0 mm pitch) - optimized for dense routing in telecom line cards and switch fabric modules. |
| JTAG Support | TAP controller with TDI/TDO/TCK/TMS pins - enables boundary-scan testing and in-system debug without additional test fixtures. |
Pinout & Package
Package: 165-ball fBGA (13 mm × 15 mm, 1.0 mm pitch), RoHS-compliant, commercial temperature range (0°C to +70°C).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[35:0] | Data I/O (bidirectional) | 36-bit DDR data bus; sampled on K/K rising edges during writes, driven aligned to C/C rising edges during reads. |
| BW0–BW3 | Byte Write Enable (active low) | Controls write enable for four 9-bit bytes (DQ[8:0], DQ[17:9], DQ[26:18], DQ[35:27]); sampled on both K and K edges. |
| SA0 | Burst Address Bit | Selects linear (SA0=0) or reversed (SA0=1) burst order; enables word-level addressing within 36-bit burst window. |
| K, K | Primary Input Clock Pair | Latches address, R/W, LD, and first/second burst word; drives outputs when C/C disabled (single-clock mode). |
| C, C | Output Clock Pair | Deskews read data timing; used with DLL to align DQ outputs to C/C edges; can be disabled to use K/K only. |
| CQ, CQ | Echo Clock Outputs | Free-running, phase-aligned copies of C/C; provide data-valid timing reference independent of read activation state. |
| ZQ | Impedance Calibration Input | Connects to external resistor (175–350 Ω) to ground; sets DQ/CQ output drive strength to match PCB trace impedance. |
| VDDQ | I/O Power Supply | Supplies 1.4–1.9 V to DQ/CQ drivers; decoupled separately from core VDD to minimize noise coupling into data paths. |
| VREF | HSTL Reference Voltage | Static input set to VDDQ/2; defines switching threshold for all HSTL inputs and AC measurement reference points. |
| TDO/TCK/TDI/TMS | JTAG Test Interface | IEEE 1149.1-compliant boundary-scan chain for production test and system-level diagnostics. |
Key Features
| Feature | Design Value |
|---|---|
| DDR Burst-of-2 Data Transfer | Delivers two 36-bit words per K-clock cycle - doubles effective bandwidth over single-data-rate SRAMs without increasing clock frequency. |
| Programmable Output Impedance | Adjusts DQ/CQ driver strength via ZQ pin and external resistor - eliminates need for series termination resistors and simplifies layout. |
| DLL-Based Output Alignment | Internally aligns DQ outputs to C/C edges within ±0.25 ns - removes board-level skew compensation and enables tighter timing margins. |
| Separate Core and I/O Supplies | VDD (1.8 V) powers logic/memory array; VDDQ (1.4–1.9 V) powers DQ/CQ buffers - isolates noise-sensitive analog timing paths from digital switching noise. |
| HSTL-Compatible Interface | Meets JEDEC HSTL Class I specifications with VIH/VIL thresholds referenced to VREF = VDDQ/2 - ensures robust noise immunity at 333 MHz. |
| SA0-Controlled Burst Order | Enables dynamic reversal of 36-bit burst sequence (a,b → b,a) - supports flexible data packing and endian-aware memory access patterns. |
Applications
| High-Speed Packet Buffering | Network Switch Fabric Memory |
|---|---|
|
Use Scenario: Storing ingress/egress packet headers and payloads in Layer 2/3 switches operating at 10 Gbps+ line rates. IC Role / Device Role / Timing Role: Primary burst-access SRAM providing low-latency, deterministic read/write cycles synchronized to switch ASIC clock domains. Use Value: 36-bit width and burst-of-2 DDR operation deliver 2.4 Gbps sustained bandwidth per device - sufficient for full-duplex 10GE MAC buffering with margin. |
Use Scenario: Serving as shared memory for crossbar arbitration logic in modular chassis-based routers with distributed forwarding engines. IC Role / Device Role / Timing Role: Synchronous memory node in multi-port, multi-clock-domain fabric - interfaced via K/C clocks and echo-clocked DQ bus. Use Value: Dual echo clocks (CQ/CQ) and DLL alignment enable precise inter-device deskew across 16+ SRAMs - critical for maintaining coherency in distributed queue management. |
| Telecom Line Card Buffering | Test Equipment Pattern Memory |
|
Use Scenario: Holding protocol-specific frame templates and real-time statistics in SONET/SDH OC-192 or OTU-3 line interface cards. IC Role / Device Role / Timing Role: High-reliability, low-jitter memory supporting deterministic latency for time-critical framing operations. Use Value: 333 MHz clock tolerance and ±0.20 ns cycle-to-cycle jitter meet GR-1089-CORE EMI requirements for carrier-grade equipment. |
Use Scenario: Storing stimulus/response vectors in automated test equipment (ATE) for high-pin-count ASIC validation at >500 MHz pattern rates. IC Role / Device Role / Timing Role: Pin-electronics memory buffer synchronized to ATE pattern generator clocks via K/C pairs and echo feedback. Use Value: Programmable ZQ impedance and HSTL compatibility ensure clean signal edges across 36-bit wide DQ bus - reducing bit-error rate in high-speed vector capture. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed DDR SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Cypress CY7C2663KV18 | Same 512K × 36 DDR II architecture, but uses 1.5 V only VDDQ and lacks SA0 burst reversal; no ZQ calibration - fixed 50 Ω output drive. | Requires external series termination; less flexible for mixed-voltage systems; not suitable where burst-order inversion is needed. | Prefer IDT71P71604S200BQG when ZQ tuning, SA0 control, or 1.4–1.9 V VDDQ scaling is required for system-level optimization. |
| Micron MT46V32M36P-5B | 512M × 36 DDR2 SDRAM (not SRAM); asynchronous initialization, refresh overhead, higher latency; supports 400 MHz data rate but not burst-of-2 pipelined access. | Used in cost-sensitive, non-real-time buffering; unsuitable for deterministic low-latency applications like switch fabric lookup tables. | Choose IDT71P71604S200BQG for zero-refresh, pipeline-locked, sub-10 ns read latency - essential for real-time packet processing. |
Compared with CY7C2663KV18 and MT46V32M36P-5B, the IDT71P71604S200BQG uniquely combines ZQ-calibrated drive strength, SA0-controlled burst sequencing, and true pipelined DDR SRAM behavior - making it the only option among the three that supports both impedance-matched signal integrity and deterministic, refresh-free memory access in high-end telecom infrastructure.
Availability
IDT71P71604S200BQG is available at Aetrix Electronics and suitable for high-speed packet buffering, network switch fabric memory, telecom line card buffering, and ATE pattern memory applications requiring stable component supply, long-lifecycle support, and guaranteed traceable sourcing.
Supply support for IDT71P71604S200BQG includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Integrated Device Technology (IDT), now part of Renesas Electronics, designs high-performance timing, memory interface, and RF solutions for communications, computing, and industrial markets.
The IDT71P71604S200BQG belongs to IDT's QDR™ II SRAM family - engineered specifically for deterministic, low-latency, high-bandwidth memory subsystems in networking and telecom infrastructure where DDR timing predictability and signal integrity are mission-critical.
FAQ
What is the maximum supported clock frequency for IDT71P71604S200BQG?
IDT71P71604S200BQG supports up to 333 MHz for K/K and C/C clocks, corresponding to a minimum average clock cycle time (tKHKH) of 3.00 ns. This enables a 666 MT/s effective data rate on its 36-bit DDR bus. Operation at this speed requires compliance with specified setup/hold times, VDD/VDDQ tolerances, and DLL lock conditions as defined in the advance information document DSC-6112/00.
How does the ZQ pin function in IDT71P71604S200BQG?
The ZQ pin on IDT71P71604S200BQG connects to an external resistor (175–350 Ω) tied to VSS to calibrate output driver impedance. The device sets DQ and CQ output impedance to 0.2 × RQ, yielding 35–70 Ω range. Calibration occurs every 1024 clock cycles to compensate for voltage/temperature drift. Tying ZQ to VDDQ forces minimum impedance mode (≈35 Ω), while leaving it unconnected or grounded violates specification.
Does IDT71P71604S200BQG support burst-order reversal, and how is it controlled?
Yes, IDT71P71604S200BQG supports burst-order reversal via the SA0 pin - a feature exclusive to x18 and x36 configurations. When SA0 = 0, the burst proceeds linearly (word a, then word b); when SA0 = 1, it reverses (word b, then word a). This enables flexible data packing for endian conversion or custom protocol alignment without software intervention.
What are the key differences between K/K and C/C clock inputs in IDT71P71604S200BQG?
K/K clocks latch address, control signals (R/W, LD, BWx), and write data; they initiate all memory operations. C/C clocks drive read data output timing and generate echo clocks (CQ/CQ). When C/C are disabled (tied high), K/K assume both roles. The DLL aligns DQ outputs to C/C edges - not K/K - unless DLL is disabled via Doff pin, in which case propagation delay increases significantly.
Can IDT71P71604S200BQG operate with different VDDQ and VDD voltages, and what are the limits?
Yes, IDT71P71604S200BQG requires independent VDD (core, 1.7–1.9 V) and VDDQ (I/O, 1.4–1.9 V) supplies. VDDQ must never exceed VDD during operation. This separation allows interfacing with 1.5 V HSTL, 1.8 V TTL, or other logic families while maintaining 1.8 V core efficiency. VREF is internally derived as VDDQ/2 and must remain within 0.68–0.95 V per specification.
IDT71P71604S200BQG Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 165-TBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II
- Memory Size:
- 18Mbit
- Memory Organization:
- 512K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 200 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 7.88 ns
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-CABGA (13x15)
IDT71P71604S200BQG FAQ
1.How can I place an order for IDT71P71604S200BQG through Aetrix?
Please submit a Request for Quotation (RFQ) for IDT71P71604S200BQG on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for IDT71P71604S200BQG reliable?
The price and inventory of IDT71P71604S200BQG are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for IDT71P71604S200BQG is usually 5 days.
3.What payment methods are accepted for IDT71P71604S200BQG?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for IDT71P71604S200BQG transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for IDT71P71604S200BQG?
IDT71P71604S200BQG orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your IDT71P71604S200BQG order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for IDT71P71604S200BQG?
For technical support, including IDT71P71604S200BQG datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your IDT71P71604S200BQG requirements.
6.How does Aetrix verify that IDT71P71604S200BQG is sourced from the original manufacturer or authorized distributors?
All IDT71P71604S200BQG products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that IDT71P71604S200BQG meets industry standards.
7.What is the process for return or replacement of IDT71P71604S200BQG?
All IDT71P71604S200BQG units undergo pre-shipment inspection (PSI). If there is an issue with IDT71P71604S200BQG, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The IDT71P71604S200BQG part is unused and in its original packaging.
Return procedure for IDT71P71604S200BQG:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
IDT71P71604S200BQG Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…

