Renesas IDT71P72804S250BQ

Overview

IDT71P72804S250BQ from Integrated Device Technology is a 18Mb (1M × 18-bit) QDR™ II SRAM with burst-of-2 architecture, 250MHz clock frequency (4.0ns K/K cycle time), 1.8V core supply (VDD), and HSTL-15 I/O interface. It features independent DDR read/write ports, dual echo clocks (CQ/CQ), and programmable output impedance (35–70Ω) for high-signal-integrity memory subsystems in network packet buffers and switch fabric controllers.

For engineers reviewing the IDT71P72804S250BQ datasheet, IDT71P72804S250BQ pinout, IDT71P72804S250BQ application, or IDT71P72804S250BQ equivalent, this page delivers verified timing parameters (tCHQV ≤ 0.45ns), package mapping (165-ball fBGA, 13mm × 15mm), JTAG-compliant boundary scan support, and confirmed burst-of-2 data transfer behavior across both ports.

Technical Context

The IDT71P72804S250BQ implements a true dual-port DDR architecture: read addresses latch on K rising edge, write addresses on K rising edge, and both R/W control signals sample on K. Its DLL aligns CQ/CQ echo clocks to output data with ±0.45ns skew at 250MHz, enabling precise source-synchronous capture without external deskew circuitry.

All I/Os are HSTL Class I compliant with VREF-referenced inputs (VIH = VDDQ/2 + 0.5V, VIL = VDDQ/2 − 0.5V), scalable VDDQ (1.4–1.9V), and ZQ-controlled output drivers. The device supports concurrent read-write operations per cycle and includes IEEE 1149.1 JTAG TAP for production test and system diagnostics.

Key Specifications

Pinout & Package

165-ball fine-pitch BGA (fBGA), 1.0mm pitch, 13mm × 15mm body size, RoHS-compliant. Ball grid follows JEDEC MO-245AC standard with dedicated power/ground distribution and signal isolation.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed burst SRAM applications.

Compared with CY7C2663KV18-250BZI and MT4QT256W250B, the IDT71P72804S250BQ uniquely combines HSTL-15 scalability, ZQ-calibrated drive strength, and integrated JTAG-critical for high-density, high-reliability telecom and test equipment designs.

Availability

IDT71P72804S250BQ is available at Aetrix Electronics and suitable for network packet buffers, switch fabric controllers, telecom line card memory, and high-speed test equipment requiring stable component supply and long-term obsolescence management.

Supply support for IDT71P72804S250BQ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Integrated Device Technology (IDT), now part of Renesas Electronics, is a fabless semiconductor company specializing in timing, memory interface, RF, and sensor solutions for communications and computing infrastructure.

The IDT71P72804S250BQ belongs to IDT's QDR™ II SRAM product line, engineered specifically for ultra-low-latency, high-throughput memory subsystems in packet-switched networks and high-performance test instrumentation.

FAQ

What is the maximum operating frequency of the IDT71P72804S250BQ?

The IDT71P72804S250BQ is rated for 250MHz operation, corresponding to a 4.0ns clock cycle time (tKHKH). This speed grade is validated across the commercial temperature range (0°C to +70°C); industrial temperature support is not available for this speed bin per datasheet note 11.

Does the IDT71P72804S250BQ support JTAG boundary scan?

Yes, the IDT71P72804S250BQ integrates a full IEEE 1149.1-compliant Test Access Port (TAP) with TCK, TMS, TDI, and TDO pins. It supports EXTEST, SAMPLE-Z, and IDCODE instructions for production connectivity testing and in-system diagnostics.

How is output impedance controlled on the IDT71P72804S250BQ?

Output impedance on the IDT71P72804S250BQ is controlled via the ZQ pin: connecting an external resistor (175–350Ω) between ZQ and VSS sets nominal drive strength (e.g., 250Ω → 50Ω). Tying ZQ to VDDQ enables minimum impedance mode. Calibration occurs automatically every 1024 clock cycles.

What is the function of the CQ and CQ pins on the IDT71P72804S250BQ?

The CQ and CQ pins are synchronous echo clocks generated internally and phase-aligned to Q[17:0] data outputs. They provide a source-synchronous timing reference for downstream capture logic, eliminating the need for external clock routing and reducing timing margining overhead in high-speed designs.

Can the IDT71P72804S250BQ operate with a single clock pair?

Yes, the IDT71P72804S250BQ supports single-clock mode: disabling C and C by tying them high causes K/K to control all output timing and echo clock generation. In this mode, tCHQV and tCHQX timing parameters reference K/K instead of C/C, with identical 0.45ns max valid/hold windows at 250MHz.