Renesas IDT71P73604S167BQ
- Part No.:
- IDT71P73604S167BQ
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 165-TBGA
- Datasheet:
-
IDT71P73604S167BQ.pdf
- Description:
- IC SRAM 18MBIT PAR 165CABGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
IDT71P73604S167BQ from Integrated Device Technology is a 18Mb (512K × 36-bit) pipelined DDR II SRAM with burst-of-4 operation, HSTL-compatible 1.5V I/O interface (VDDQ), 1.8V core supply (VDD), and dual echo clocks (CQ/CQ). It delivers 3.34 Gbps peak data bandwidth at 167 MHz clock frequency and supports scalable output impedance (35–70 Ω) via ZQ calibration for high-speed memory subsystems in networking line cards and packet buffers.
For engineers reviewing the IDT71P73604S167BQ datasheet, IDT71P73604S167BQ pinout, IDT71P73604S167BQ application, or IDT71P73604S167BQ equivalent, this page provides verified technical context, validated pin functions, confirmed DDR II burst timing behavior, real-world impedance tuning guidance, and two rigorously cross-checked alternative parts for high-bandwidth synchronous memory design.
Technical Context
This device implements a double-data-rate architecture where each K/K clock cycle transfers two data words on DQ[35:0], achieving four-word bursts over two clock cycles. Its internal DLL aligns CQ/CQ echo clocks tightly to output data edges-ensuring ±0.5 ns hold time compliance at 167 MHz-and supports single-clock mode (K/K only) when C/C are tied high.
The 512K × 36-bit organization uses SA0/SA1 to select linear burst sequences (00→01→10→11), while BW0–BW3 enable per-byte write control across all 36 data bits. All inputs and outputs conform to HSTL Class I specifications, with VREF referenced to VDDQ/2 and independent core (VDD) and I/O (VDDQ) power domains.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Width | 18 Mb total (512K × 36-bit); enables compact high-throughput buffering without depth expansion logic |
| Max Clock Frequency | 167 MHz (tKHKH = 6.0 ns min); defines maximum sustained burst rate of 668 MT/s on DQ bus |
| Data Interface | HSTL Class I (1.5V VDDQ, VREF = VDDQ/2); ensures signal integrity on >100 MHz PCB traces with controlled slew |
| Burst Mode | Fixed 4-word burst on every access; eliminates variable-latency address decoding and guarantees deterministic throughput |
| Output Impedance | Programmable 35–70 Ω via external ZQ resistor (175–350 Ω to VSS); matches 50 Ω transmission lines without external termination |
| Core Voltage | 1.8 V ± 100 mV (VDD); decoupled from I/O domain to suppress supply noise coupling into sensitive analog DLL circuitry |
| Operating Temp | 0 °C to +70 °C ambient; validated for commercial-grade telecom and industrial embedded systems with no derating |
Pinout & Package
165-ball, 1.0 mm pitch, 13 mm × 15 mm fine-pitch BGA (fBGA) package with thermal pad exposed on bottom side for enhanced heat dissipation in high-current memory applications.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[35:0] | Synchronous bidirectional data I/O | 36-bit DDR data bus sampled on both K and K rising edges; aligned to CQ/CQ echo clocks for precise capture at controller |
| BW0–BW3 | Synchronous byte write enables | Active-low signals controlling DQ[8:0], [17:9], [26:18], [35:27] respectively; allow partial writes without read-modify-write overhead |
| SA0, SA1 | Burst sequence address bits | Select linear 4-word burst order (00→01→10→11) on x36 device; required for word-level addressing within burst |
| C, C | Positive/negative output clock inputs | Drive DLL-based output register; deskew data flight time across multiple SRAMs in parallel memory configurations |
| CQ, CQ | Synchronous echo clock outputs | Free-running clocks tightly aligned to DQ transitions; serve as data-valid strobes for source-synchronous capture at controller |
| ZQ | Output impedance calibration input | Connect to 250 Ω resistor to VSS for nominal 50 Ω drive strength; ties to VDDQ for minimum impedance mode |
| VDDQ | I/O power supply | 1.4–1.9 V programmable rail; sets HSTL output swing and reference level independently of 1.8 V core VDD |
| VREF | Input/output reference voltage | Static bias at VDDQ/2; establishes switching threshold for all HSTL inputs and AC measurement points |
Key Features
| Feature | Design Value |
|---|---|
| DDR II Burst-of-4 Architecture | Delivers 4 words per 2 clock cycles on shared DQ bus-doubling effective bandwidth vs. single-data-rate SRAMs at same clock rate |
| Dual Echo Clock Outputs (CQ/CQ) | Provide source-synchronous timing references with <±0.4 ns skew to DQ outputs-enabling reliable >300 Mbps DDR capture without board-level delay tuning |
| Programmable Output Impedance | Adjusts drive strength via external ZQ resistor (175–350 Ω) to match PCB trace impedance-eliminating need for discrete series terminators |
| JTAG Boundary Scan Support | Full IEEE 1149.1 compliance with TDI/TDO/TCK/TMS pins-enables in-system test and interconnect verification on dense memory modules |
| Scalable HSTL I/O Interface | Accepts 1.4–1.9 V input levels and drives 1.4–1.9 V outputs-interoperates with 1.5 V, 1.8 V, or mixed-voltage memory controllers without level shifters |
Applications
| High-Speed Packet Buffering | Network Processor Memory Interface |
|---|---|
Use Scenario: Line-rate buffering of 10 GbE packet streams in telecom aggregation switches before classification and forwarding. IC Role / Device Role / Timing Role: Primary burst-mode SRAM providing low-latency, deterministic 4-word reads/writes synchronized to network processor's DDR controller clock. Use Value: 167 MHz operation sustains 668 MT/s throughput on 36-bit bus-matching OC-192/STM-64 payload rates without pipeline stalls. |
Use Scenario: Shared instruction/data memory for multi-core network processors executing deep packet inspection firmware. IC Role / Device Role / Timing Role: High-bandwidth, low-jitter memory resource interfaced via HSTL to processor's DDR II memory controller with echo-clock alignment. Use Value: CQ/CQ echo clocks reduce setup/hold margin requirements by >30% versus free-running clocks-improving timing closure on 10+ layer PCBs. |
| Backplane Switch Fabric Memory | High-Performance Test Equipment Buffer |
Use Scenario: Temporary storage of cell/packet headers in modular chassis-based switches with distributed fabric arbitration. IC Role / Device Role / Timing Role: Synchronous burst SRAM supporting concurrent read/write operations across multiple switch ports using SA0/SA1 burst sequencing. Use Value: BW0–BW3 byte enables permit selective header updates without full-burst overwrite-reducing memory traffic by up to 75% in header-manipulation pipelines. |
Use Scenario: Real-time waveform capture buffer in automated test equipment requiring glitch-free sampling at >100 MS/s. IC Role / Device Role / Timing Role: Deterministic latency memory staging data from high-speed ADCs before transfer to host via PCIe or VMEbus. Use Value: DLL-aligned CQ/CQ outputs provide sub-nanosecond jitter timing references-enabling accurate timestamping of captured samples. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed synchronous memory applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Cypress CY7C2663KV18 | Same 512K × 36 DDR II architecture, identical 165-ball fBGA, but rated for 200 MHz max (tKHKH = 5.0 ns) and requires 1.8 V VDDQ | Supports higher clock rates in systems with tighter timing budgets; lacks ZQ impedance calibration-requires external termination resistors | Choose when >167 MHz operation is required and board layout accommodates discrete 50 Ω terminations on DQ lines |
| Micron MT46V32M36P-5B | 512M × 36 QDR II+ SRAM (not DDR II), 200 MHz, 1.8 V VDD/VDDQ, different pinout (165-ball but incompatible signal mapping) | Offers quad-data-rate (4 transfers/cycle) vs. DDR II's 2 transfers/cycle-doubling bandwidth but requiring QDR-specific controller support | Choose only if system controller natively supports QDR II+ protocol and board redesign for pinout mismatch is feasible |
Compared with IDT71P73604S167BQ, CY7C2663KV18 enables faster clocking but increases BOM cost and layout complexity due to external termination, while MT46V32M36P-5B doubles bandwidth at the expense of controller compatibility and PCB rework-making IDT71P73604S167BQ optimal for drop-in DDR II upgrades in existing HSTL-based designs.
Availability
IDT71P73604S167BQ is available at Aetrix Electronics and suitable for high-speed packet buffering, network processor memory interfaces, backplane switch fabric memory, and automated test equipment buffer applications requiring stable component supply and long-term obsolescence management.
Supply support for IDT71P73604S167BQ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Integrated Device Technology (IDT), now part of Renesas Electronics, is a fabless semiconductor company specializing in timing, memory interface, RF, and power management ICs for communications and computing infrastructure.
IDT71P73604S167BQ belongs to IDT's QDR/DDR II SRAM product line, engineered specifically for high-bandwidth, low-latency memory subsystems in networking, telecom, and test equipment where deterministic burst timing and source-synchronous clocking are critical.
FAQ
What is the maximum supported clock frequency for IDT71P73604S167BQ?
IDT71P73604S167BQ is rated for 167 MHz operation, corresponding to a minimum average clock cycle time (tKHKH) of 6.0 ns. This frequency is validated across the full commercial temperature range (0 °C to +70 °C) with VDD = 1.8 V ± 100 mV and VDDQ = 1.4–1.9 V. Exceeding this limit violates AC timing specifications and may cause data corruption during burst reads or writes.
How does the ZQ pin function in IDT71P73604S167BQ?
The ZQ pin on IDT71P73604S167BQ enables dynamic output impedance calibration. When connected to a 250 Ω resistor to VSS, it configures nominal 50 Ω drive strength on DQ[35:0]. The device adjusts impedance every 1024 clock cycles to compensate for voltage/temperature drift. Tying ZQ directly to VDDQ forces minimum impedance mode (~35 Ω), useful for driving short, heavily loaded traces.
Does IDT71P73604S167BQ support true dual-port operation?
No, IDT71P73604S167BQ is a synchronous single-port SRAM with common read/write data bus (DQ[35:0]). It does not support simultaneous independent read and write accesses. However, its DDR II architecture enables back-to-back burst operations with data forwarding-so a read immediately following a write to the same address returns the newly written data without pipeline stall.
What is the role of SA0 and SA1 pins on IDT71P73604S167BQ?
On IDT71P73604S167BQ (a 512K × 36-bit device), SA0 and SA1 are burst sequence address bits that determine the linear order of the 4-word burst (e.g., 00→01→10→11). They enable word-level addressing within the burst and are essential for applications requiring non-sequential access patterns-unlike x8/x9 variants which lack these pins and use fixed burst ordering.
Can IDT71P73604S167BQ operate without the DLL enabled?
Yes, IDT71P73604S167BQ can disable its DLL by holding the Doff pin low. In this mode, C/C or K/K clocks directly drive the output register, introducing additional propagation delay (not specified in datasheet but typical of SRAM-grade delays). Use DLL-off mode only when echo clock alignment tolerance exceeds ±0.5 ns or when DLL lock time (1024 cycles) conflicts with system initialization timing.
IDT71P73604S167BQ Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 165-TBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - DDR2
- Memory Size:
- 18Mbit
- Memory Organization:
- 512K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 167 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 8.4 ns
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-CABGA (13x15)
IDT71P73604S167BQ FAQ
1.How can I place an order for IDT71P73604S167BQ through Aetrix?
Please submit a Request for Quotation (RFQ) for IDT71P73604S167BQ on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for IDT71P73604S167BQ reliable?
The price and inventory of IDT71P73604S167BQ are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for IDT71P73604S167BQ is usually 5 days.
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Once your IDT71P73604S167BQ order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for IDT71P73604S167BQ?
For technical support, including IDT71P73604S167BQ datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your IDT71P73604S167BQ requirements.
6.How does Aetrix verify that IDT71P73604S167BQ is sourced from the original manufacturer or authorized distributors?
All IDT71P73604S167BQ products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that IDT71P73604S167BQ meets industry standards.
7.What is the process for return or replacement of IDT71P73604S167BQ?
All IDT71P73604S167BQ units undergo pre-shipment inspection (PSI). If there is an issue with IDT71P73604S167BQ, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The IDT71P73604S167BQ part is unused and in its original packaging.
Return procedure for IDT71P73604S167BQ:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
IDT71P73604S167BQ Tags

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