Renesas ISL55143IRZ

Overview

ISL55143IRZ from Intersil is a quad-channel, high-speed 18V CMOS window comparator with dual independent thresholds (CVA/CVB) per channel, 9.5ns typical propagation delay, 65MHz operating frequency, and three-state digital output encoding (QA/QB). It operates across ±3V to ±9V split supplies or 10–18V single supply, supporting burn-in ATE and fast power supervision in flash memory test systems.

For engineers reviewing the ISL55143IRZ datasheet, ISL55143IRZ pinout, ISL55143IRZ application, or ISL55143IRZ equivalent, this device delivers precise 3-level signal qualification (Valid Low / Invalid / Valid High) with user-defined VOH/VOL output rails, wide common-mode input range (VEE to VCC−5V), and power-down capability (<10µA).

Technical Context

The ISL55143IRZ implements four independent dual-threshold comparators, each accepting a shared VINPX input and comparing it against programmable CVAx (high threshold) and CVBx (low threshold) analog references. Output logic states QAx/QBx encode input position relative to both thresholds per Table 1, enabling unambiguous three-state window detection without external logic.

VOH and VOL pins are unbuffered analog supplies that directly set all comparator output high/low voltage levels-supporting interface compatibility with TTL, LVCMOS, ECL, LVDS, and CML logic families. The PD pin enables full device power-down with 10µs exit time, reducing quiescent current from ~33mA (4-channel active at 12V/−3V) to <10µA.

Key Specifications

Pinout & Package

ISL55143IRZ uses a 36-lead Thin Quad Flat No-Lead (TQFN) package (6mm × 6mm, 0.55mm pitch) with exposed thermal pad electrically connected to VEE. Pin 1 is located in top-left corner of top view, marked by index area.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar window comparator applications.

Compared with MAX961 and LMH7322, the ISL55143IRZ uniquely combines quad-channel density, 18V operation, user-configurable output rails, and power-down capability-making it the only solution suitable for cost-sensitive, high-voltage ATE and flash power supervision where three-state qualification and thermal efficiency are jointly critical.

Availability

ISL55143IRZ is available at Aetrix Electronics and suitable for burn-in ATE, flash memory power supervision, and low-cost automated test equipment requiring stable component supply, long-term lifecycle support, and RoHS-compliant packaging.

Supply support for ISL55143IRZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Intersil Corporation is a leading provider of precision analog and power management solutions, acquired by Renesas Electronics in 2017. Its products target industrial, infrastructure, and high-end consumer markets.

The ISL55143IRZ belongs to Intersil's high-speed comparator product line, designed specifically for digital test systems requiring wide-voltage window detection, minimal propagation delay, and flexible logic interfacing in compact QFN packages.

FAQ

What is the function of the VOH and VOL pins on the ISL55143IRZ?

The VOH and VOL pins on the ISL55143IRZ are unbuffered analog supply inputs that directly define the high and low voltage levels for all QA/QB outputs. VOH sets the "1" output voltage (e.g., 5V for TTL), VOL sets the "0" output voltage (e.g., 0V), and both must remain within (VEE − 0.5V) to (VCC + 0.5V). Unlike standard logic supplies, these pins require sufficient current sourcing/sinking capability to drive the connected load, as they are not buffered internally. This design enables seamless interface with multiple logic families without level shifters.

How does the ISL55143IRZ implement three-state window comparison?

The ISL55143IRZ implements three-state window comparison per channel using two independent comparators: one driven by CVAx (high threshold) and one by CVBx (low threshold), both evaluating the same VINPx input. Their outputs QA and QB combine to produce three distinct logic states: 00 (input below CVB), 01 (input between CVB and CVA), and 11 (input above CVA). This native encoding eliminates the need for external logic gates or microcontroller polling, delivering deterministic, low-latency state qualification essential for high-speed ATE applications.

What is the recommended power supply sequencing for the ISL55143IRZ?

The ISL55143IRZ requires strict power supply sequencing to prevent EOS damage: apply VEE first, then VOL, followed by VCC, and finally the CVA/CVB reference supplies. The VINPx input must not exceed VEE or VCC during power-up; if transient overvoltage is possible, series current-limiting resistors should be added. This sequence ensures the internal ESD protection diodes remain reverse-biased during ramp-up, preserving reliability in production test environments where supply sequencing may vary across fixture designs.

Can the ISL55143IRZ operate from a single supply, and what are the constraints?

Yes, the ISL55143IRZ can operate from a single supply by tying VEE to ground and applying VCC between 10V and 18V. However, the common-mode input range becomes 0V to (VCC − 5V), limiting the maximum detectable input voltage. Additionally, VOH and VOL must be selected within (0V − 0.5V) to (VCC + 0.5V), and the exposed thermal pad (connected to VEE) must be grounded. Single-supply operation is valid for applications like 12V power supervision but sacrifices the negative-rail input capability available in split-supply configurations.

What is the thermal pad connection requirement for the ISL55143IRZ TQFN package?

The exposed thermal pad on the ISL55143IRZ's 36-lead TQFN package is electrically connected to the VEE supply pin and must be soldered to a PCB copper pour tied to VEE. If VEE is grounded, the pad connects directly to the system ground plane; if VEE is negative (e.g., −3V), the pad must be isolated from other power planes and routed exclusively to the VEE net. This connection is mandatory for thermal performance (θJC = 0.75°C/W) and electrical integrity-floating or misconnected pads cause excessive junction temperature rise and potential device failure under sustained 65MHz operation.