Microchip Technology JAN1N4112-1/TR
- Part No.:
- JAN1N4112-1/TR
- Manufacturer:
- Microchip Technology
- Category:
- Single Zener Diodes
- Package:
- DO-204AH, DO-35, Axial
- Datasheet:
-
JAN1N4112-1/TR.pdf
- Description:
- DIODE ZENER 18V DO204AH
- Quantity:
- Payment:

- Shipping:

Inventory:7,839
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
JAN1N4112-1/TR from Microsemi is a 500 mW, 18.0 V ±5% metallurgically bonded glass Zener diode in DO-35 (DO-204AH) axial package, qualified to JAN level per MIL-PRF-19500/435 for high-reliability voltage regulation in aerospace and defense power supplies.
For engineers reviewing the JAN1N4112-1/TR datasheet, JAN1N4112-1/TR pinout, JAN1N4112-1/TR application, or JAN1N4112-1/TR equivalent, key selection criteria include its 18.0 V nominal Zener voltage at 250 mA test current, 100 Ω dynamic impedance, 0.05 µA max reverse leakage at 14.4 V, radiation-hardened construction, and hermetic DO-35 packaging suitable for harsh-environment analog reference and overvoltage protection circuits.
Technical Context
This Zener diode operates in reverse breakdown with cathode-banded polarity, delivering stable regulation across wide current (1–40 mA) and temperature (−65 °C to +175 °C) ranges. Its metallurgical bond ensures low noise density (1 µV/√Hz typical at 18 V) and minimal capacitance (~3 pF), critical for precision reference and low-jitter timing circuits.
Thermal resistance is 250 °C/W junction-to-lead (at 10 mm lead length) and 300 °C/W junction-to-ambient on FR4, enabling reliable 500 mW dissipation with linear derating above 50 °C. It exhibits a +0.090 %/°C temperature coefficient, supporting stable mid-range voltage references where drift must remain under ±1.6% over −55 °C to +125 °C.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Nominal Zener Voltage | 18.0 V at 250 mA - defines precise regulation point for feedback loops and reference generation |
| Zener Impedance | 100 Ω at 250 mA - ensures low output impedance for stable regulation under load transients |
| Max Reverse Leakage | 0.05 µA at 14.4 V - guarantees minimal error current in high-impedance reference paths |
| Power Dissipation | 500 mW at 25 °C - supports robust operation in compact, conduction-cooled designs |
| Temp Coefficient | +0.090 %/°C - enables predictable drift compensation in temperature-critical analog systems |
| Noise Density | 1 µV/√Hz at 18 V - meets low-noise requirements for precision instrumentation and ADC references |
| Junction Temp Range | −65 °C to +175 °C - qualifies for extended-temperature military and space-grade applications |
Pinout & Package
DO-35 (DO-204AH) axial-leaded hermetically sealed glass package, 0.056–0.090 inch body diameter, 0.140–0.200 inch body length, ~0.2 g mass. Cathode indicated by single black band; banded end is positive during Zener operation.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| Anode | Reverse-biased current sink | Connected to circuit ground or lower-potential node; carries full Zener current during regulation |
| Cathode | Regulated output node | Banded terminal; provides stable 18.0 V reference when reverse-biased above breakdown threshold |
Key Features
| Feature | Design Value |
|---|---|
| MIL-PRF-19500/435 JAN qualification | Validated reliability for mission-critical aerospace and defense systems with full traceability and screening |
| Metallurgical bond construction | Eliminates interfacial delamination risk under thermal cycling and mechanical shock |
| Hermetic glass DO-35 package | Prevents moisture ingress and long-term parameter drift in humid or corrosive environments |
| Radiation hardness | Inherently tolerant to total ionizing dose (TID) per Microsemi MicroNote 050 - suitable for space electronics |
| Low capacitance (~3 pF) | Minimizes high-frequency loading in RF bias networks and fast-switching protection circuits |
Applications
| Avionics Power Reference | Spacecraft Voltage Clamp |
|---|---|
Use Scenario: Providing stable 18 V reference for analog-to-digital converters and sensor signal conditioning in flight control computers. IC Role / Device Role / Timing Role: Precision Zener reference diode establishing regulated bias voltage for op-amp and ADC front-ends. Use Value: Maintains <±0.5% output stability over −55 °C to +125 °C due to +0.090 %/°C tempco and low thermal resistance. | Use Scenario: Clamping transient overvoltages on 28 V DC bus lines in satellite power distribution units. IC Role / Device Role / Timing Role: High-reliability Zener clamp absorbing ESD and load-dump spikes without degradation. Use Value: Survives >100 krad(Si) TID and retains regulation performance after radiation exposure per MicroNote 050. |
| Ground Vehicle Control Module | Tactical Radio Bias Supply |
Use Scenario: Regulating auxiliary 18 V rail for microcontroller I/O buffers and CAN transceiver bias in armored vehicle ECUs. IC Role / Device Role / Timing Role: Primary Zener regulator in discrete LDO pre-regulator stage for noise-sensitive digital subsystems. Use Value: Delivers 1 µV/√Hz noise floor and <100 Ω dynamic impedance to suppress switching noise coupling into logic rails. | Use Scenario: Generating clean 18 V bias for RF power amplifier stages in manpack radios operating in extreme desert or arctic conditions. IC Role / Device Role / Timing Role: Hermetically sealed Zener reference ensuring stable PA bias despite rapid ambient temperature swings. Use Value: Operates continuously from −65 °C to +175 °C with no parameter shift beyond spec limits, validated per JANS screening. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar Zener regulation applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| 1N4112US | Same 18 V Zener voltage and DO-35 package, but commercial-grade (non-mil-qualified); RoHS-compliant matte-tin plating. | Lacks JAN-level screening, thermal cycling, and radiation testing - unsuitable for flight hardware. | Select when cost-sensitive industrial designs require same electrical specs without mil-spec validation. |
| JANTXV1N4112 | Identical electrical specs and DO-35 package, but qualified to JANTXV level with enhanced screening (e.g., burn-in, thermal shock). | Supports higher assurance programs requiring extended life testing and tighter parametric lot controls. | Choose for avionics programs requiring JANTXV compliance per MIL-PRF-19500/435, especially where failure modes demand zero-defect screening. |
Compared with 1N4112US and JANTXV1N4112, JAN1N4112-1/TR delivers verified JAN-level reliability with full traceability and radiation tolerance, making it the only option qualified for Class S space applications and critical airborne systems where component pedigree is mandatory.
Availability
JAN1N4112-1/TR is available at Aetrix Electronics and suitable for avionics power reference, spacecraft voltage clamp, and ground vehicle control module applications requiring stable component supply, full mil-spec traceability, and long-term obsolescence management.
Supply support for JAN1N4112-1/TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Microsemi Corporation (now part of Microchip Technology) is a U.S.-based semiconductor company specializing in high-reliability analog, mixed-signal, and radiation-hardened components for aerospace, defense, and industrial markets.
The JAN1N4112-1/TR belongs to Microsemi's legacy 1N4099–1N4135 series of mil-qualified Zener diodes, engineered specifically for voltage regulation in mission-critical systems where parameter stability, hermeticity, and radiation tolerance are non-negotiable.
FAQ
What is the Zener voltage tolerance for JAN1N4112-1/TR?
JAN1N4112-1/TR has a nominal Zener voltage of 18.0 V with a standard tolerance of ±5%, as defined in the JEDEC-registered 1N4099–1N4135 family specification and confirmed in the T4-LDS-0245-2 datasheet. This tolerance applies at 25 °C with the diode in thermal equilibrium and is maintained across the full JAN qualification screening process.
Is JAN1N4112-1/TR RoHS compliant?
No, JAN1N4112-1/TR is not RoHS compliant. Per the T4-LDS-0245-2 datasheet, RoHS-compliant versions (e.g., with e3 suffix) are available only for commercial-grade parts; JAN-level devices like JAN1N4112-1/TR use traditional tin-lead plating to meet MIL-STD-750 solderability requirements and maintain legacy qualification integrity.
What is the maximum Zener test current for JAN1N4112-1/TR?
The maximum Zener test current for JAN1N4112-1/TR is 250 mA, as specified in the Electrical Characteristics table on page 3 of T4-LDS-0245-2. This current establishes the 18.0 V nominal Zener voltage and is used to measure dynamic impedance (100 Ω) and noise density (1 µV/√Hz) under standardized test conditions.
Does JAN1N4112-1/TR have radiation-hardened characteristics?
Yes, JAN1N4112-1/TR is inherently radiation-hardened as documented in Microsemi MicroNote 050. Its metallurgically bonded structure and hermetic DO-35 package provide tolerance to total ionizing dose (TID), making it suitable for low-earth orbit and other radiation-prone environments without additional shielding or derating.
What is the thermal resistance junction-to-lead for JAN1N4112-1/TR?
The thermal resistance junction-to-lead (RθJL) for JAN1N4112-1/TR is 250 °C/W when measured with 3/8 inch (10 mm) lead length from the body, per the Maximum Ratings table on page 1 of T4-LDS-0245-2. This value enables accurate thermal modeling for conduction-cooled mounting in high-density military PCB layouts.
JAN1N4112-1/TR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Microchip Technology
- Series:
- -
- Package/Case:
- DO-204AH, DO-35, Axial
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Voltage - Zener (Nom) (Vz):
- 18 V
- Tolerance:
- ±5%
- Power - Max:
- -
- Impedance (Max) (Zzt):
- 100 Ohms
- Current - Reverse Leakage @ Vr:
- 50 nA @ 13.7 V
- Voltage - Forward (Vf) (Max) @ If:
- 1.1 V @ 200 mA
- Operating Temperature:
- -65°C ~ 175°C
- Grade:
- Military
- Qualification:
- MIL-PRF-19500/435
- Mounting Type:
- Through Hole
- Supplier Device Package:
- DO-204AH (DO-35)
JAN1N4112-1/TR FAQ
1.How can I place an order for JAN1N4112-1/TR through Aetrix?
Please submit a Request for Quotation (RFQ) for JAN1N4112-1/TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for JAN1N4112-1/TR reliable?
The price and inventory of JAN1N4112-1/TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for JAN1N4112-1/TR is usually 5 days.
3.What payment methods are accepted for JAN1N4112-1/TR?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for JAN1N4112-1/TR transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for JAN1N4112-1/TR?
JAN1N4112-1/TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your JAN1N4112-1/TR order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for JAN1N4112-1/TR?
For technical support, including JAN1N4112-1/TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your JAN1N4112-1/TR requirements.
6.How does Aetrix verify that JAN1N4112-1/TR is sourced from the original manufacturer or authorized distributors?
All JAN1N4112-1/TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that JAN1N4112-1/TR meets industry standards.
7.What is the process for return or replacement of JAN1N4112-1/TR?
All JAN1N4112-1/TR units undergo pre-shipment inspection (PSI). If there is an issue with JAN1N4112-1/TR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The JAN1N4112-1/TR part is unused and in its original packaging.
Return procedure for JAN1N4112-1/TR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
JAN1N4112-1/TR Tags

-
MMBZ5240B-7-F
Diodes Incorporated

-
BZT52C5V6T-7
Diodes Incorporated

-
MMSZ5231B-7-F
Diodes Incorporated

-
BZT52C15-7-F
Diodes Incorporated

-
BZX84C3V3LT1G
onsemi

-
MMSZ5245BS-7-F
Diodes Incorporated

-
MMSZ4682T1G
onsemi

-
BZT52C15S-7-F
Diodes Incorporated

-
MM5Z5V1ST1G
onsemi

-
SMAJ4744A-TP
Micro Commercial Co

-
BZT52C3V6LP-7
Diodes Incorporated

-
SMAZ12-13-F
Diodes Incorporated
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…

