Microchip Technology JAN1N4126D-1
- Part No.:
- JAN1N4126D-1
- Manufacturer:
- Microchip Technology
- Category:
- Single Zener Diodes
- Package:
- DO-204AH, DO-35, Axial
- Datasheet:
-
JAN1N4126D-1.pdf
- Description:
- DIODE ZENER 51V DO204AH
- Quantity:
- Payment:

- Shipping:

Inventory:6,161
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
JAN1N4126D-1 from Microsemi is a 51 V, 1% tolerance, 500 mW metallurgically bonded glass Zener diode in DO-35 package, qualified to JANS level per MIL-PRF-19500/435 for high-reliability voltage regulation in aerospace and defense power supplies.
For engineers reviewing the JAN1N4126D-1 datasheet, JAN1N4126D-1 pinout, JAN1N4126D-1 application, or JAN1N4126D-1 equivalent, key selection criteria include Zener voltage accuracy (±1%), low noise density (1 µV/√Hz), radiation hardness, and military-grade thermal derating behavior up to +175 °C junction temperature.
Technical Context
This device operates as a precision shunt voltage regulator with a nominal Zener voltage of 51.0 V at 250 mA test current, exhibiting a dynamic impedance of 300 Ω and a temperature coefficient of +0.100 %/°C. Its metallurgical bond construction ensures stable breakdown characteristics under thermal cycling and radiation exposure.
Designed for operation in the reverse-biased breakdown region, it delivers regulated output with ≤0.01 µA reverse leakage at 38.8 V and supports continuous DC regulation across –65 °C to +175 °C ambient, with linear power derating from 500 mW at 25 °C to zero at 175 °C.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Zener Voltage VZ | 51.0 V ±1% at 250 mA - enables precise reference generation for analog monitoring circuits requiring tight tolerance |
| Power Dissipation | 500 mW at 25 °C, derated linearly to zero at 175 °C - defines maximum usable power envelope in high-temp environments |
| Dynamic Impedance ZZT | 300 Ω at 250 mA - determines output voltage stability under load current variation |
| Noise Density | 1 µV/√Hz - critical for low-noise reference applications such as precision ADC biasing |
| Reverse Leakage IR | ≤0.01 µA at 38.8 V - ensures minimal parasitic current draw in standby or high-impedance sensing nodes |
| Temp Coefficient αVZ | +0.100 %/°C - quantifies voltage drift over temperature, enabling compensation in wide-range systems |
| Junction Temp Range | –65 °C to +175 °C - supports operation in extreme environmental conditions without parameter shift |
Pinout & Package
DO-35 (DO-204AH) axial-leaded hermetically sealed glass package with cathode band marking; terminals are tin-lead or RoHS-compliant matte-tin plated, solderable per MIL-STD-750 method 2026.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| Anode | Reference ground node | Connected to system ground or common return; establishes reference potential for regulation |
| Cathode | Zener regulation output | Banded end; connected to input supply rail to clamp voltage at 51.0 V ±1% |
Key Features
| Feature | Design Value |
|---|---|
| MIL-PRF-19500/435 qualification (JANS) | Validated reliability for spaceflight, avionics, and nuclear instrumentation where failure is not acceptable |
| Metallurgical bond construction | Eliminates interfacial delamination risk under thermal shock and long-term bias stress |
| 1 µV/√Hz noise density | Enables use in ultra-low-noise analog references without external filtering |
| Hermetic glass sealing | Prevents moisture ingress and parametric drift over decades in harsh storage or operational environments |
| Radiation hardness (per MicroNote 050) | Retains electrical parameters after total ionizing dose exposure typical of LEO and GEO missions |
Applications
| Aerospace Power Conditioning | Nuclear Instrumentation Reference |
|---|---|
Use Scenario: Regulating auxiliary supply rails in satellite power distribution units exposed to thermal cycling and radiation. IC Role / Device Role / Timing Role: Shunt voltage reference providing stable 51 V bias for DC-DC converter feedback networks. Use Value: Maintains ±1% regulation across –65 °C to +175 °C and survives >100 krad(Si) TID without parameter shift. | Use Scenario: Precision voltage reference in radiation-hardened neutron detector front-end amplifiers. IC Role / Device Role / Timing Role: Low-noise Zener source establishing calibrated bias point for charge-sensitive preamplifiers. Use Value: Delivers 1 µV/√Hz noise floor and <0.01 µA leakage, minimizing signal-to-noise degradation in low-current detection. |
| Avionics Sensor Excitation | High-Reliability Test Equipment |
Use Scenario: Supplying excitation voltage to strain gauge bridges in flight control surface position sensors. IC Role / Device Role / Timing Role: Stable 51 V reference driving Wheatstone bridge with minimal thermal drift. Use Value: +0.100 %/°C tempco allows predictable calibration offset correction across –55 °C to +125 °C operating range. | Use Scenario: Calibration reference in automated test equipment used for verifying military-grade power module performance. IC Role / Device Role / Timing Role: Primary voltage standard traceable to NIST via JANS-certified metrology chain. Use Value: Hermetic DO-35 packaging and 1% tolerance ensure long-term stability and audit-ready compliance documentation. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar Zener regulation applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| JANTXV1N4126D-1 | Same electrical specs, but qualified only to JANTXV level (not JANS); lower radiation tolerance and screening depth | Suitable for airborne non-safety-critical subsystems where full JANS qualification is not mandated | Select when cost and lead time are prioritized over space-grade radiation assurance |
| 1N4126DUR-1 | Same 51 V ±1% Zener voltage, but in DO-213AA surface-mount package; no axial leads | Used in compact PCB layouts where through-hole mounting is prohibited and reflow compatibility is required | Select for modern high-density assemblies needing identical regulation performance in SMT form factor |
Compared with JAN1N4126D-1, JANTXV1N4126D-1 offers reduced qualification rigor and lower radiation hardness, while 1N4126DUR-1 provides identical regulation performance in a surface-mount footprint-neither is pin-compatible due to differing packages and reliability grades.
Availability
JAN1N4126D-1 is available at Aetrix Electronics and suitable for aerospace power conditioning, nuclear instrumentation reference, and avionics sensor excitation requiring stable component supply with full JANS traceability and lot-level certification.
Supply support for JAN1N4126D-1 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Microsemi Corporation (now part of Microchip Technology) designs high-reliability semiconductors for aerospace, defense, and industrial markets, emphasizing radiation tolerance, extended temperature operation, and military qualification.
JAN1N4126D-1 belongs to the 1N4099–1N4135-1 family of metallurgically bonded Zener diodes engineered specifically for mission-critical voltage regulation where parameter stability under extreme thermal, radiation, and mechanical stress is mandatory.
FAQ
What is the Zener voltage tolerance of JAN1N4126D-1?
JAN1N4126D-1 has a nominal Zener voltage of 51.0 V with ±1% tolerance, indicated by the "D" suffix in its nomenclature per Microsemi's part numbering convention. This tight tolerance is maintained across the full operating temperature range and qualifies the device for precision reference applications in military and aerospace systems where calibration stability is essential. The 1% tolerance is verified during JANS-level screening.
Is JAN1N4126D-1 suitable for high-radiation environments?
Yes, JAN1N4126D-1 is inherently radiation hard per Microsemi MicroNote 050 and qualified to JANS level per MIL-PRF-19500/435, making it suitable for high-radiation environments including low-earth orbit (LEO) and geosynchronous (GEO) satellite missions. Its metallurgically bonded structure and hermetic DO-35 package preserve electrical parameters after total ionizing dose exposure exceeding 100 krad(Si).
What is the maximum reverse leakage current for JAN1N4126D-1?
The maximum reverse leakage current (IR) for JAN1N4126D-1 is 0.01 µA at a reverse voltage (VR) of 38.8 V, as specified in the Electrical Characteristics table on page 3 of the T4-LDS-0245-2 datasheet. This ultra-low leakage supports high-impedance sensing and low-power standby modes in battery-backed or energy-constrained systems.
Does JAN1N4126D-1 require derating above 25 °C?
Yes, JAN1N4126D-1 must be linearly derated above 25 °C ambient temperature: its 500 mW rated power dissipation decreases to zero at +175 °C junction temperature. Derating follows a slope of approximately 3.33 mW/°C above 25 °C, as defined in Note 2 of the Maximum Ratings table. This behavior is critical for thermal design in sealed enclosures or high-temperature chassis.
What does the "JAN" prefix indicate for JAN1N4126D-1?
The "JAN" prefix in JAN1N4126D-1 denotes Joint Army-Navy (now DoD) qualification to the lowest military reliability level under MIL-PRF-19500/435. While JAN1N4126D-1 is actually qualified to the highest JANS level, the prefix reflects legacy nomenclature consistent with JEDEC registration and ensures interoperability with legacy procurement systems requiring JAN-series part identification.
JAN1N4126D-1 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Microchip Technology
- Series:
- -
- Package/Case:
- DO-204AH, DO-35, Axial
- Packaging:
- Bulk
- Product Status:
- Active
- Voltage - Zener (Nom) (Vz):
- 51 V
- Tolerance:
- ±1%
- Power - Max:
- -
- Impedance (Max) (Zzt):
- 300 Ohms
- Current - Reverse Leakage @ Vr:
- 10 nA @ 38.8 V
- Voltage - Forward (Vf) (Max) @ If:
- 1.1 V @ 200 mA
- Operating Temperature:
- -65°C ~ 175°C
- Grade:
- Military
- Qualification:
- MIL-PRF-19500/435
- Mounting Type:
- Through Hole
- Supplier Device Package:
- DO-204AH (DO-35)
JAN1N4126D-1 FAQ
1.How can I place an order for JAN1N4126D-1 through Aetrix?
Please submit a Request for Quotation (RFQ) for JAN1N4126D-1 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for JAN1N4126D-1 reliable?
The price and inventory of JAN1N4126D-1 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for JAN1N4126D-1 is usually 5 days.
3.What payment methods are accepted for JAN1N4126D-1?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for JAN1N4126D-1 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for JAN1N4126D-1?
JAN1N4126D-1 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your JAN1N4126D-1 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for JAN1N4126D-1?
For technical support, including JAN1N4126D-1 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your JAN1N4126D-1 requirements.
6.How does Aetrix verify that JAN1N4126D-1 is sourced from the original manufacturer or authorized distributors?
All JAN1N4126D-1 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that JAN1N4126D-1 meets industry standards.
7.What is the process for return or replacement of JAN1N4126D-1?
All JAN1N4126D-1 units undergo pre-shipment inspection (PSI). If there is an issue with JAN1N4126D-1, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The JAN1N4126D-1 part is unused and in its original packaging.
Return procedure for JAN1N4126D-1:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
JAN1N4126D-1 Tags

-
MMBZ5240B-7-F
Diodes Incorporated

-
BZT52C5V6T-7
Diodes Incorporated

-
MMSZ5231B-7-F
Diodes Incorporated

-
BZT52C15-7-F
Diodes Incorporated

-
BZX84C3V3LT1G
onsemi

-
MMSZ5245BS-7-F
Diodes Incorporated

-
MMSZ4682T1G
onsemi

-
BZT52C15S-7-F
Diodes Incorporated

-
MM5Z5V1ST1G
onsemi

-
SMAJ4744A-TP
Micro Commercial Co

-
BZT52C3V6LP-7
Diodes Incorporated

-
SMAZ12-13-F
Diodes Incorporated
Tech Hub
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
