Microchip Technology JAN1N4127C-1/TR
- Part No.:
- JAN1N4127C-1/TR
- Manufacturer:
- Microchip Technology
- Category:
- Single Zener Diodes
- Package:
- DO-204AH, DO-35, Axial
- Datasheet:
-
JAN1N4127C-1/TR.pdf
- Description:
- DIODE ZENER 56V DO204AH
- Quantity:
- Payment:

- Shipping:

Inventory:6,374
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Product details
Overview
JAN1N4127C-1/TR from Microsemi is a 56 V, 2% tolerance, 500 mW metallurgically bonded glass Zener diode in DO-35 package, qualified to JAN level per MIL-PRF-19500/435 for high-reliability voltage regulation in aerospace and defense power supplies.
For engineers reviewing the JAN1N4127C-1/TR datasheet, JAN1N4127C-1/TR pinout, JAN1N4127C-1/TR application, or JAN1N4127C-1/TR equivalent, this page delivers verified Zener voltage, temperature coefficient, dynamic impedance, noise density, and military qualification status - critical for precision reference and overvoltage protection design.
Technical Context
This device operates as a reverse-biased voltage reference with a nominal Zener voltage of 56 V at 250 mA test current (IZT), exhibiting a +0.100 %/°C temperature coefficient and 300 Ω dynamic impedance (ZZT) at IZT. Its metallurgical bond construction ensures stable breakdown characteristics under thermal cycling.
Designed for operation across –65 °C to +175 °C junction temperature range, it delivers ≤0.01 µA reverse leakage (IR) at VR = 42.6 V and generates ≤1 µV/√Hz noise density - enabling low-noise analog references in regulated DC-DC converters and sensor excitation circuits.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Zener Voltage (VZ) | 56 V ±2% at 250 mA - defines precise regulation point for feedback loops in high-voltage power supplies. |
| Power Dissipation | 500 mW at 25 °C - supports stable operation in compact axial-leaded layouts without forced cooling. |
| Dynamic Impedance (ZZT) | 300 Ω at 250 mA - limits output voltage variation under load transients in reference applications. |
| Temperature Coefficient (αVZ) | +0.100 %/°C - enables predictable drift compensation in wide-temperature-range instrumentation. |
| Noise Density (ND) | ≤1 µV/√Hz - ensures minimal added noise in precision analog signal chains and ADC references. |
| Reverse Leakage (IR) | ≤0.01 µA at 42.6 V - guarantees low standby current in battery-backed or low-power monitoring circuits. |
| Junction Temperature Range | –65 °C to +175 °C - meets extended environmental requirements for avionics and space-grade electronics. |
Pinout & Package
DO-35 (DO-204AH) hermetically sealed axial-leaded glass package with cathode indicated by band; banded end is positive during Zener regulation. Weight ≈ 0.2 g.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| Anode | Forward conduction terminal / Zener cathode reference node | Connected to system ground or lower-potential rail; serves as reference return path in shunt regulator topology. |
| Cathode | Zener regulation terminal / voltage clamp node | Banded end; connected to unregulated input; clamps voltage to 56 V when reverse-biased above breakdown threshold. |
Key Features
| Feature | Design Value |
|---|---|
| MIL-PRF-19500/435 JAN qualification | Validated reliability for mission-critical systems requiring screening per military specification. |
| Metallurgical bond construction | Eliminates interfacial delamination risk under thermal shock and long-term bias stress. |
| Low noise density (≤1 µV/√Hz) | Enables use in high-resolution data acquisition front-ends without additional filtering. |
| Hermetic glass sealing | Prevents moisture ingress and parameter drift in humid or corrosive environments. |
| 1% to 5% Zener tolerance options | Supports cost-performance trade-offs: C-suffix = 2%, D-suffix = 1% for tighter regulation. |
Applications
| Aerospace Power Regulation | Defense System Reference |
|---|---|
Use Scenario: Regulating 56 V bus in satellite power distribution units where voltage stability must hold across –55 °C to +125 °C. IC Role / Device Role / Timing Role: Shunt Zener reference providing primary voltage clamp and feedback reference for DC-DC controllers. Use Value: Maintains ±2% regulation accuracy with <0.01 µA leakage at 42.6 V, ensuring minimal load on upstream converters. | Use Scenario: Precision voltage reference in radar receiver analog front-end requiring ultra-low noise and radiation hardness. IC Role / Device Role / Timing Role: Low-noise Zener source for ADC biasing and sensor excitation in hardened RF subsystems. Use Value: Delivers ≤1 µV/√Hz noise density and inherent radiation hardness per MicroNote 050, reducing post-radiation calibration needs. |
| Industrial Control Loop Reference | High-Voltage Test Equipment |
Use Scenario: Stable 56 V reference in programmable logic controller (PLC) analog I/O modules operating in factory environments. IC Role / Device Role / Timing Role: Primary voltage standard for DAC output scaling and current loop (4–20 mA) transmitter calibration. Use Value: +0.100 %/°C αVZ allows predictable drift compensation in firmware, eliminating external temp sensors. | Use Scenario: Overvoltage protection and calibration reference in portable insulation resistance testers (meggers). IC Role / Device Role / Timing Role: Clamp element and reference node in high-impedance voltage divider networks measuring up to 1 kV. Use Value: 300 Ω ZZT ensures minimal loading error on 10 MΩ+ dividers while maintaining 56 V accuracy within ±2%. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar Zener regulation applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| 1N4127UR-1 | Same Zener voltage (56 V) and tolerance (2%), but in DO-213AA surface-mount package. | Requires PCB rework for SMT assembly; lacks axial-leaded mechanical robustness for vibration-prone environments. | Select when board space is constrained and automated placement is required. |
| JANTXV1N4127C-1 | Identical electrical specs, but qualified to JANTXV level with enhanced screening and tighter lot traceability. | Suitable for flight-critical subsystems where burn-in and parametric testing beyond JAN are mandated. | Select when program requirements exceed JAN-level reliability assurance. |
Compared with JAN1N4127C-1/TR, 1N4127UR-1 offers footprint reduction at the cost of mechanical mounting flexibility, while JANTXV1N4127C-1 adds screening rigor without altering regulation performance - enabling tiered qualification alignment across development, qualification, and production phases.
Availability
JAN1N4127C-1/TR is available at Aetrix Electronics and suitable for aerospace power regulation, defense system reference, and industrial control loop reference requiring stable component supply with full MIL-spec traceability and RoHS-compliant plating options.
Supply support for JAN1N4127C-1/TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Microsemi Corporation (now part of Microchip Technology) designs high-reliability analog and mixed-signal semiconductors for aerospace, defense, and industrial markets.
The JAN1N4127C-1/TR belongs to Microsemi's legacy MIL-qualified Zener diode family, engineered specifically for precision voltage regulation in harsh-environment electronics where long-term stability and radiation tolerance are mandatory.
FAQ
What is the Zener voltage tolerance for JAN1N4127C-1/TR?
JAN1N4127C-1/TR has a Zener voltage tolerance of ±2%, denoted by the "C" suffix in its part number per Microsemi's nomenclature. This means its actual VZ at 250 mA test current falls between 54.88 V and 57.12 V at 25 °C, supporting tighter regulation than standard ±5% variants in critical feedback paths.
Is JAN1N4127C-1/TR RoHS compliant?
JAN1N4127C-1/TR is not RoHS compliant. The "e3" RoHS suffix is only available on commercial-grade versions (e.g., 1N4127C-1e3); JAN-level parts like JAN1N4127C-1/TR retain tin-lead plating per MIL-STD-750 method 2026 to ensure solderability and reliability in high-reliability applications.
What does the "TR" suffix mean in JAN1N4127C-1/TR?
The "TR" suffix indicates tape-and-reel packaging per EIA-296 standard, enabling automated pick-and-place assembly. JAN1N4127C-1/TR contains the same electrical and mechanical specifications as JAN1N4127C-1, with no performance difference - only packaging format differs for manufacturing compatibility.
What is the maximum reverse leakage current for JAN1N4127C-1/TR?
JAN1N4127C-1/TR has a maximum reverse leakage current (IR) of 0.01 µA at VR = 42.6 V, as specified in the Electrical Characteristics table on page 3 of Microsemi T4-LDS-0245-2. This ultra-low leakage supports high-impedance bias networks and minimizes quiescent power loss in battery-operated systems.
How is the temperature coefficient of JAN1N4127C-1/TR used in circuit design?
The temperature coefficient of JAN1N4127C-1/TR is +0.100 %/°C, meaning its Zener voltage increases by approximately 56 mV per °C rise. Designers use this value to predict regulation drift across operating temperature ranges and implement compensation techniques - such as pairing with negative-TC components - in precision reference circuits where stability below 100 ppm/°C is required.
JAN1N4127C-1/TR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Microchip Technology
- Series:
- -
- Package/Case:
- DO-204AH, DO-35, Axial
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Voltage - Zener (Nom) (Vz):
- 56 V
- Tolerance:
- ±2%
- Power - Max:
- -
- Impedance (Max) (Zzt):
- 300 Ohms
- Current - Reverse Leakage @ Vr:
- 10 nA @ 42.6 V
- Voltage - Forward (Vf) (Max) @ If:
- 1.1 V @ 200 mA
- Operating Temperature:
- -65°C ~ 175°C
- Grade:
- Military
- Qualification:
- MIL-PRF-19500/435
- Mounting Type:
- Through Hole
- Supplier Device Package:
- DO-204AH (DO-35)
JAN1N4127C-1/TR FAQ
1.How can I place an order for JAN1N4127C-1/TR through Aetrix?
Please submit a Request for Quotation (RFQ) for JAN1N4127C-1/TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for JAN1N4127C-1/TR reliable?
The price and inventory of JAN1N4127C-1/TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for JAN1N4127C-1/TR is usually 5 days.
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Once your JAN1N4127C-1/TR order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for JAN1N4127C-1/TR?
For technical support, including JAN1N4127C-1/TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your JAN1N4127C-1/TR requirements.
6.How does Aetrix verify that JAN1N4127C-1/TR is sourced from the original manufacturer or authorized distributors?
All JAN1N4127C-1/TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that JAN1N4127C-1/TR meets industry standards.
7.What is the process for return or replacement of JAN1N4127C-1/TR?
All JAN1N4127C-1/TR units undergo pre-shipment inspection (PSI). If there is an issue with JAN1N4127C-1/TR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The JAN1N4127C-1/TR part is unused and in its original packaging.
Return procedure for JAN1N4127C-1/TR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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