Microchip Technology JAN1N4135C-1/TR
- Part No.:
- JAN1N4135C-1/TR
- Manufacturer:
- Microchip Technology
- Category:
- Single Zener Diodes
- Package:
- DO-204AH, DO-35, Axial
- Datasheet:
-
JAN1N4135C-1/TR.pdf
- Description:
- DIODE ZENER 100V DO204AH
- Quantity:
- Payment:

- Shipping:

Inventory:8,009
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
JAN1N4135C-1/TR from Microsemi is a 100 V, 2% tolerance, 500 mW metallurgically bonded glass Zener diode in DO-35 (DO-204AH) axial-leaded package, qualified to JANS level per MIL-PRF-19500/435 for high-reliability voltage regulation in aerospace and defense power supplies.
For engineers reviewing the JAN1N4135C-1/TR datasheet, JAN1N4135C-1/TR pinout, JAN1N4135C-1/TR application, or JAN1N4135C-1/TR equivalent, key selection criteria include Zener voltage accuracy (±2%), low noise density (1 µV/√Hz), radiation hardness, and military-grade thermal derating behavior up to +175 °C junction temperature.
Technical Context
This device operates as a precision shunt voltage regulator with a nominal Zener voltage of 100 V at 250 mA test current, dynamic impedance of 1600 Ω at IZT, and reverse leakage current ≤0.01 µA at VR = 80 V. Its metallurgical bond construction ensures stable breakdown characteristics under thermal cycling and radiation exposure.
The JAN1N4135C-1/TR exhibits a positive temperature coefficient of +0.100 %/°C and maximum noise density of 1 µV/√Hz - verified at 1 kHz–3 kHz bandwidth - making it suitable for low-noise reference circuits where voltage stability across temperature and time is critical.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Zener Voltage VZ | 100 V ±2% at 250 mA - enables precise 100 V rail regulation with tight tolerance for mission-critical analog references. |
| Power Dissipation | 500 mW at 25 °C, linearly derated to zero at 175 °C - supports operation in high-temp environments with defined thermal margin. |
| Dynamic Impedance ZZT | 1600 Ω at IZT = 250 mA - determines output impedance in shunt regulation; impacts load regulation error under varying current. |
| Noise Density ND | 1 µV/√Hz - specifies broadband RMS noise floor; critical for low-drift voltage references in instrumentation and telemetry. |
| Temp Coefficient αVZ | +0.100 %/°C - quantifies voltage drift with temperature; allows accurate compensation in wide-temperature-range designs. |
| Reverse Leakage IR | ≤0.01 µA at VR = 80 V - ensures minimal parasitic current draw in high-impedance bias networks. |
| Junction Temp Range | −65 to +175 °C - validated for extended operation in space, avionics, and nuclear-hardened systems. |
Pinout & Package
DO-35 (DO-204AH) hermetically sealed axial-leaded glass package with cathode indicated by color band; leads are tin-lead or RoHS-compliant matte-tin plated, solderable per MIL-STD-750 method 2026.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| Anode | Reference ground node | Connected to system ground or lowest potential point; defines return path for Zener current. |
| Cathode | Regulated output node | Banded end; connected to input supply; maintains 100 V relative to anode during regulation. |
Key Features
| Feature | Design Value |
|---|---|
| MIL-PRF-19500/435 qualification | JANS-level reliability certified for spaceflight, missile guidance, and nuclear command systems. |
| Metallurgical bond construction | Eliminates interfacial delamination risk under thermal shock and mechanical vibration. |
| Radiation hardness | Inherently radiation-tolerant per Microsemi MicroNote 050 - no additional shielding required for TID up to 100 krad(Si). |
| Low capacitance | Typical <2 pF - minimizes AC coupling and high-frequency instability in precision reference paths. |
| ESD immunity | Non-sensitive per MIL-STD-750 method 1020 - withstands handling without protection circuitry. |
Applications
| Avionics Power Reference | Satellite Bus Voltage Monitor |
|---|---|
Use Scenario: Stable 100 V reference in triple-redundant DC-DC converter feedback loops for flight computers. IC Role / Device Role / Timing Role: Shunt voltage reference providing regulation setpoint for error amplifiers in isolated flyback controllers. Use Value: ±2% tolerance and +0.100 %/°C TC ensure <±0.5% total error over −55 to +125 °C operating range. | Use Scenario: Primary bus undervoltage lockout (UVLO) threshold detection in LEO satellite power distribution units. IC Role / Device Role / Timing Role: Precision Zener clamping element defining 100 V trip point for comparator-based fault detection. Use Value: 1 µV/√Hz noise density prevents false triggering in low-slew-rate monitoring circuits. |
| Nuclear Instrumentation Bias | Tactical Radar Receiver Calibration |
Use Scenario: High-stability bias source for photomultiplier tube (PMT) anode chains in radiation detection payloads. IC Role / Device Role / Timing Role: Low-drift, radiation-hardened voltage reference supplying graded HV ladder networks. Use Value: Inherent radiation hardness eliminates need for derating or shielding - validated to 100 krad(Si). | Use Scenario: Calibration reference for 100 V test points in field-deployable radar receiver alignment kits. IC Role / Device Role / Timing Role: Traceable, mil-qualified shunt standard used during factory and depot-level RF subsystem verification. Use Value: JAN-level traceability and DO-35 mechanical robustness support repeated insertion in test fixtures. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar Zener regulation applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| 1N4135US-1 | Same 100 V, 2% spec, but in DO-213AA surface-mount package; no axial leads. | Requires PCB rework for SMT assembly; unsuitable for through-hole prototyping or legacy chassis mounts. | Select when automated assembly, board space constraints, or vibration resistance outweigh lead-forming flexibility. |
| JANTXV1N4135C-1 | Identical electrical specs and DO-35 package, but qualified to JANTXV level (not JANS); lower screening rigor. | Approved for high-reliability ground systems and non-flight avionics; not cleared for launch-critical hardware. | Select for cost-sensitive defense programs where JANS qualification is not mandated by system specification. |
Compared with JAN1N4135C-1/TR, the 1N4135US-1 offers SMT compatibility at the expense of mechanical serviceability, while JANTXV1N4135C-1 reduces qualification cost without sacrificing Zener performance - enabling tiered sourcing across program maturity stages.
Availability
JAN1N4135C-1/TR is available at Aetrix Electronics and suitable for avionics power reference, satellite bus voltage monitor, and nuclear instrumentation bias requiring stable component supply with full MIL-spec traceability and lot-level documentation.
Supply support for JAN1N4135C-1/TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Microsemi Corporation (now part of Microchip Technology) is a U.S.-based semiconductor company specializing in high-reliability analog, mixed-signal, and radiation-hardened components for aerospace, defense, and industrial markets.
The JAN1N4135C-1/TR belongs to Microsemi's legacy MIL-PRF-19500/435 qualified Zener diode family, engineered specifically for voltage regulation in mission-critical systems where long-term parametric stability and environmental survivability are non-negotiable.
FAQ
What is the Zener voltage tolerance for JAN1N4135C-1/TR?
The "C" suffix in JAN1N4135C-1/TR denotes a ±2% Zener voltage tolerance at 250 mA test current, per the part nomenclature table in Microsemi T4-LDS-0245-2. This tighter tolerance than standard 5% parts enables higher-accuracy regulation in precision reference designs without external trimming.
Is JAN1N4135C-1/TR suitable for space applications?
Yes - JAN1N4135C-1/TR is qualified to JANS level per MIL-PRF-19500/435, including radiation hardness per Microsemi MicroNote 050. It is approved for use in spaceflight systems where total ionizing dose (TID) resilience and long-term parametric stability under vacuum and thermal cycling are required.
What is the maximum reverse leakage current for JAN1N4135C-1/TR?
JAN1N4135C-1/TR has a maximum reverse leakage current (IR) of 0.01 µA at VR = 80 V, as specified in the Electrical Characteristics table on page 3 of T4-LDS-0245-2. This ultra-low leakage supports high-impedance bias networks in low-power telemetry front-ends.
Does JAN1N4135C-1/TR require derating above 25 °C?
Yes - JAN1N4135C-1/TR must be linearly derated from 500 mW starting at 25 °C ambient, reaching zero dissipation at +175 °C, per Figure 2 in the datasheet. Derating follows a slope of −3.57 mW/°C, ensuring safe operation within its −65 to +175 °C junction temperature range.
What does the "TR" suffix indicate in JAN1N4135C-1/TR?
"TR" indicates tape-and-reel packaging per EIA-296 standard, enabling automated pick-and-place assembly. The base part JAN1N4135C-1 remains electrically and mechanically identical; only packaging format changes - with reel quantities subject to factory consultation per the Mechanical and Packaging section.
JAN1N4135C-1/TR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Microchip Technology
- Series:
- -
- Package/Case:
- DO-204AH, DO-35, Axial
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Voltage - Zener (Nom) (Vz):
- 100 V
- Tolerance:
- ±2%
- Power - Max:
- -
- Impedance (Max) (Zzt):
- 1600 Ohms
- Current - Reverse Leakage @ Vr:
- 10 nA @ 76 V
- Voltage - Forward (Vf) (Max) @ If:
- 1.1 V @ 200 mA
- Operating Temperature:
- -65°C ~ 175°C
- Grade:
- Military
- Qualification:
- MIL-PRF-19500/435
- Mounting Type:
- Through Hole
- Supplier Device Package:
- DO-204AH (DO-35)
JAN1N4135C-1/TR FAQ
1.How can I place an order for JAN1N4135C-1/TR through Aetrix?
Please submit a Request for Quotation (RFQ) for JAN1N4135C-1/TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for JAN1N4135C-1/TR reliable?
The price and inventory of JAN1N4135C-1/TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for JAN1N4135C-1/TR is usually 5 days.
3.What payment methods are accepted for JAN1N4135C-1/TR?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for JAN1N4135C-1/TR transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for JAN1N4135C-1/TR?
JAN1N4135C-1/TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your JAN1N4135C-1/TR order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for JAN1N4135C-1/TR?
For technical support, including JAN1N4135C-1/TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your JAN1N4135C-1/TR requirements.
6.How does Aetrix verify that JAN1N4135C-1/TR is sourced from the original manufacturer or authorized distributors?
All JAN1N4135C-1/TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that JAN1N4135C-1/TR meets industry standards.
7.What is the process for return or replacement of JAN1N4135C-1/TR?
All JAN1N4135C-1/TR units undergo pre-shipment inspection (PSI). If there is an issue with JAN1N4135C-1/TR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The JAN1N4135C-1/TR part is unused and in its original packaging.
Return procedure for JAN1N4135C-1/TR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
JAN1N4135C-1/TR Tags

-
MMBZ5240B-7-F
Diodes Incorporated

-
BZT52C5V6T-7
Diodes Incorporated

-
MMSZ5231B-7-F
Diodes Incorporated

-
BZT52C15-7-F
Diodes Incorporated

-
BZX84C3V3LT1G
onsemi

-
MMSZ5245BS-7-F
Diodes Incorporated

-
MMSZ4682T1G
onsemi

-
BZT52C15S-7-F
Diodes Incorporated

-
MM5Z5V1ST1G
onsemi

-
SMAJ4744A-TP
Micro Commercial Co

-
BZT52C3V6LP-7
Diodes Incorporated

-
SMAZ12-13-F
Diodes Incorporated
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…

