My Inquiry
My Account
Microchip Technology JANS1N4127D-1/TR
- Part No.:
- JANS1N4127D-1/TR
- Manufacturer:
- Microchip Technology
- Category:
- Single Zener Diodes
- Package:
- DO-204AH, DO-35, Axial
- Datasheet:
-
JANS1N4127D-1/TR.pdf
- Description:
- DIODE ZENER 56V 500MW DO204AH
- Quantity:
- Payment:
- Shipping:
Inventory:9,606
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
JANS1N4127D-1/TR from Microsemi is a 56 V, 1% tolerance, 500 mW metallurgically bonded glass Zener diode in DO-35 (DO-204AH) axial package, qualified to JANS level per MIL-PRF-19500/435 for high-reliability aerospace and defense voltage regulation. It delivers 42.6 mA maximum Zener current, 300 Ω dynamic impedance at 250 mA test current, and +0.100 %/°C temperature coefficient.
For engineers reviewing the JANS1N4127D-1/TR datasheet, JANS1N4127D-1/TR pinout, JANS1N4127D-1/TR application, or JANS1N4127D-1/TR equivalent, key selection criteria include its 1% Zener voltage tolerance, JANS-level radiation-hardened qualification, low 0.01 µA reverse leakage at 45.6 V, and hermetically sealed DO-35 package suitable for extreme-temperature military systems.
Technical Context
This device operates as a precision shunt voltage regulator in reverse-biased breakdown mode, with cathode band marking polarity. Its metallurgical bond construction ensures stable Zener voltage under thermal cycling and mechanical stress, critical for space-grade applications.
The JANS1N4127D-1/TR exhibits a +0.100 %/°C temperature coefficient above 43 V, enabling predictable drift compensation in reference circuits. Its 300 Ω dynamic impedance at IZT = 250 mA and 40 µV/√Hz noise density (typical for ≥6.8 V parts) support low-noise analog references in instrumentation and telemetry.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Zener Voltage VZ | 56 V ±1% at 250 mA - enables precise 56 V rail regulation with tight tolerance for mission-critical references. |
| Power Dissipation | 500 mW at 25 °C - supports stable operation up to 175 °C junction temperature with linear derating. |
| Dynamic Impedance ZZT | 300 Ω at 250 mA - limits output voltage variation under load transients in regulated power supplies. |
| Reverse Leakage IR | 0.01 µA at 45.6 V - ensures minimal quiescent current draw in battery-backed or low-power hold-up circuits. |
| Temp Coefficient αVZ | +0.100 %/°C - allows accurate thermal drift modeling in wide-temperature-range avionics designs. |
| Noise Density ND | ≤40 µV/√Hz (≥6.8 V) - meets low-noise requirements for precision analog front-ends and sensor excitation. |
| Package | DO-35 (DO-204AH) - axial-leaded, hermetically sealed glass package qualified for MIL-STD-883 screening. |
Pinout & Package
DO-35 (DO-204AH) axial-glass package with cathode indicated by colored band; leads are tin-lead or RoHS-compliant matte-tin plated, solderable per MIL-STD-750 method 2026.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| Anode | Forward conduction terminal / Zener cathode reference ground | Connected to system ground or lower-potential node; reverse bias applied between cathode and anode for regulation. |
| Cathode (banded end) | Zener breakdown terminal / regulated output node | Applied positive voltage relative to anode to enter breakdown; provides stable 56 V reference at defined current. |
Key Features
| Feature | Design Value |
|---|---|
| MIL-PRF-19500/435 JANS qualification | Guarantees radiation hardness, extended temperature operation (–65 °C to +175 °C), and lot traceability for flight-critical systems. |
| 1% Zener voltage tolerance (D suffix) | Reduces calibration overhead and improves system-level accuracy without external trimming in precision references. |
| Metallurgically bonded construction | Prevents delamination under thermal shock and vibration, ensuring long-term stability in launch and orbital environments. |
| Hermetic glass DO-35 package | Eliminates moisture ingress and parameter drift over decades, meeting reliability requirements for satellite payloads. |
| Low 0.01 µA reverse leakage at VR = 45.6 V | Minimizes standby power loss in always-on avionics subsystems and extends battery life in remote sensors. |
Applications
| Avionics Power Reference | Satellite Telemetry Calibration |
|---|---|
Use Scenario: Providing stable 56 V reference for ADC biasing and sensor excitation in flight control computers. IC Role / Device Role / Timing Role: Shunt voltage regulator maintaining fixed potential despite input ripple and load variation. Use Value: 1% tolerance and JANS qualification ensure measurement integrity across –55 °C to +125 °C operational range. | Use Scenario: Calibrating downlink voltage monitors in LEO satellite telemetry modules. IC Role / Device Role / Timing Role: Precision Zener reference source for analog-to-digital conversion of bus voltage telemetry. Use Value: Radiation-hardened construction prevents parametric shift during proton exposure in orbit. |
| Missile Guidance Bias Supply | Nuclear Facility Instrumentation |
Use Scenario: Generating stable bias for gyro amplifier stages in inertial navigation systems. IC Role / Device Role / Timing Role: Low-noise Zener regulator supplying clean reference to op-amp feedback networks. Use Value: ≤40 µV/√Hz noise density preserves signal-to-noise ratio in micro-radian angular resolution circuits. | Use Scenario: Regulating reference voltage for radiation detector pulse-height analyzers in containment zones. IC Role / Device Role / Timing Role: High-reliability shunt regulator operating continuously at elevated ambient temperatures. Use Value: 175 °C max junction temperature and hermetic seal ensure uninterrupted operation during emergency cooling loss. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar Zener regulation applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| JANTXV1N4127D-1 | Same 56 V, 1%, DO-35, but qualified only to JANTXV level (not JANS); lower radiation hardness assurance. | Lacks full JANS-level neutron/gamma testing; unsuitable for spaceflight but acceptable for ground-based military hardware. | Select when full JANS qualification is not required and cost sensitivity favors commercial-military grade. |
| 1N4127D-1/TR | Commercial-grade version (no JAN/JANTX/JANS prefix); same electrical specs but no MIL-PRF-19500 qualification. | Not screened for military environmental stresses; limited to benign industrial or lab environments. | Choose only for prototyping or non-safety-critical bench equipment where qualification is unnecessary. |
Compared with JANTXV1N4127D-1 and 1N4127D-1/TR, the JANS1N4127D-1/TR uniquely provides full JANS-level radiation hardness, extended temperature validation, and lot traceability-making it the sole option for flight-qualified systems requiring guaranteed performance under total ionizing dose and single-event effects.
Availability
JANS1N4127D-1/TR is available at Aetrix Electronics and suitable for avionics power reference, satellite telemetry calibration, and missile guidance bias supply requiring stable component supply across extended temperature and radiation environments.
Supply support for JANS1N4127D-1/TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Microsemi Corporation (now part of Microchip Technology) is a U.S.-based semiconductor company specializing in high-reliability analog and mixed-signal components for aerospace, defense, and industrial markets.
The JANS1N4127D-1/TR belongs to Microsemi's legacy MIL-PRF-19500/435 qualified Zener diode family, engineered specifically for voltage reference stability under extreme thermal, mechanical, and radiation stress in mission-critical systems.
FAQ
What is the Zener voltage and tolerance of JANS1N4127D-1/TR?
JANS1N4127D-1/TR has a nominal Zener voltage of 56 V with ±1% tolerance (denoted by the "D" suffix), measured at 250 mA test current and 25 °C ambient. This tight tolerance ensures minimal calibration effort in precision reference designs and is verified per MIL-PRF-19500/435 screening.
Is JANS1N4127D-1/TR radiation hardened?
Yes, JANS1N4127D-1/TR is radiation hardened per Microsemi MicroNote 050 and qualified to JANS level under MIL-PRF-19500/435, including neutron and gamma irradiation testing. Its metallurgically bonded DO-35 construction provides inherent resistance to total ionizing dose and displacement damage, making it suitable for spaceflight applications.
What is the maximum reverse leakage current for JANS1N4127D-1/TR?
JANS1N4127D-1/TR specifies a maximum reverse leakage current (IR) of 0.01 µA at 45.6 V (81% of VZ). This ultra-low leakage supports energy-efficient operation in always-on military subsystems and extends battery life in remote sensing nodes where JANS1N4127D-1/TR serves as a reference source.
Does JANS1N4127D-1/TR have a specified noise density?
While the datasheet does not list a measured noise density value specific to JANS1N4127D-1/TR, all devices in the 1N4099–1N4135 series with VZ ≥ 6.8 V-including JANS1N4127D-1/TR-are specified with maximum noise density of 40 µV/√Hz at 1 kHz–3 kHz bandwidth and 250 mA test current, supporting low-noise analog design.
What packaging and plating options are available for JANS1N4127D-1/TR?
JANS1N4127D-1/TR is supplied in the hermetically sealed DO-35 (DO-204AH) axial-glass package with tin-lead or RoHS-compliant matte-tin plating on leads, solderable per MIL-STD-750 method 2026. The "TR" suffix indicates tape-and-reel packaging per EIA-296 standard for automated assembly.
JANS1N4127D-1/TR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Microchip Technology
- Series:
- -
- Package/Case:
- DO-204AH, DO-35, Axial
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Voltage - Zener (Nom) (Vz):
- 56 V
- Tolerance:
- ±1%
- Power - Max:
- 500 mW
- Impedance (Max) (Zzt):
- 300 Ohms
- Current - Reverse Leakage @ Vr:
- 10 nA @ 42.6 V
- Voltage - Forward (Vf) (Max) @ If:
- 1.1 V @ 200 mA
- Operating Temperature:
- -65°C ~ 175°C (TJ)
- Grade:
- Military
- Qualification:
- MIL-PRF-19500/435
- Mounting Type:
- Through Hole
- Supplier Device Package:
- DO-204AH (DO-35)
JANS1N4127D-1/TR FAQ
1.How can I place an order for JANS1N4127D-1/TR through Aetrix?
Please submit a Request for Quotation (RFQ) for JANS1N4127D-1/TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for JANS1N4127D-1/TR reliable?
The price and inventory of JANS1N4127D-1/TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for JANS1N4127D-1/TR is usually 5 days.
3.What payment methods are accepted for JANS1N4127D-1/TR?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for JANS1N4127D-1/TR transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for JANS1N4127D-1/TR?
JANS1N4127D-1/TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your JANS1N4127D-1/TR order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for JANS1N4127D-1/TR?
For technical support, including JANS1N4127D-1/TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your JANS1N4127D-1/TR requirements.
6.How does Aetrix verify that JANS1N4127D-1/TR is sourced from the original manufacturer or authorized distributors?
All JANS1N4127D-1/TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that JANS1N4127D-1/TR meets industry standards.
7.What is the process for return or replacement of JANS1N4127D-1/TR?
All JANS1N4127D-1/TR units undergo pre-shipment inspection (PSI). If there is an issue with JANS1N4127D-1/TR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The JANS1N4127D-1/TR part is unused and in its original packaging.
Return procedure for JANS1N4127D-1/TR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
JANS1N4127D-1/TR Tags
-
MMBZ5240B-7-F
Diodes Incorporated
-
BZT52C5V6T-7
Diodes Incorporated
-
MMSZ5231B-7-F
Diodes Incorporated
-
BZT52C15-7-F
Diodes Incorporated
-
BZX84C3V3LT1G
onsemi
-
MMSZ5245BS-7-F
Diodes Incorporated
-
MMSZ4682T1G
onsemi
-
BZT52C15S-7-F
Diodes Incorporated
-
MM5Z5V1ST1G
onsemi
-
SMAJ4744A-TP
Micro Commercial Co
-
BZT52C3V6LP-7
Diodes Incorporated
-
SMAZ12-13-F
Diodes Incorporated
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
