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Analog Devices Inc./Maxim Integrated MAX9967ALCCQ
- Part No.:
- MAX9967ALCCQ
- Manufacturer:
- Analog Devices Inc./Maxim Integrated
- Category:
- Comparators
- Package:
- 100-TQFP Exposed Pad
- Datasheet:
-
MAX9967ALCCQ.pdf
- Description:
- DUAL, ATE DRIVER/COMPARATOR
- Quantity:
- Payment:
- Shipping:
Inventory:961
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Product details
Overview
The MAX9967ALCCQ from Maxim Integrated is a dual-channel, low-power, high-speed ATE driver/comparator/load (DCL) IC designed for automated test equipment. It integrates three-level pin drivers, dual comparators, programmable clamps, and a 35mA active load per channel, operating across -1.5V to +6.5V with 500Mbps data rate and 1.15W/channel power dissipation. It enables at-speed parametric IOH/IOL testing and contact continuity verification in memory and mixed-signal ATE systems.
For engineers reviewing the MAX9967ALCCQ datasheet, MAX9967ALCCQ pinout, MAX9967ALCCQ application, or MAX9967ALCCQ equivalent, key selection considerations include its tight gain/offset matching (±15mV driver offset, ±20mV comparator offset), low timing dispersion (<±50ps prop delay match), integrated ECL/LVPECL/LVDS-compatible differential control inputs, and digitally programmable slew rate via 3-wire serial interface.
Technical Context
The MAX9967ALCCQ implements a dual-channel architecture where each channel independently supports high-impedance, active-termination (3rd-level drive), and clamp modes. Its driver stage features DC-coupled output with ±60mA max drive current, 50Ω output resistance, and <±15mV linearity error over full -1.5V to +6.5V DUT voltage range.
The comparator subsystem delivers <±20mV input offset (MAX9967A grade), <±25ps propagation delay match within package, and supports open-collector outputs with internal 48–52Ω termination resistors. The active load provides programmable ±35mA sourcing/sinking with <±15mV COM_ offset and 400–700mV deadband.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Operating Voltage Range | -1.5V to +6.5V DUT voltage range supports legacy TTL, LVTTL, LVCMOS, and ECL-level device-under-test interfaces. |
| Data Rate | 500Mbps maximum - enables high-speed digital pattern generation and capture in memory ATE applications. |
| Driver Offset Error | ±15mV (MAX9967A) - ensures precise voltage-level accuracy for reference-shared multi-channel ATE systems. |
| Comparator Prop Delay Match | ±35ps within package - critical for skew-sensitive parallel test channels requiring synchronized timing. |
| Active Load Current | Programmable ±35mA - facilitates contact/continuity testing and at-speed IOH/IOL parametric measurement. |
| Leakage Current (Low-Leakage Mode) | ±60nA at TJ < +90°C - minimizes DUT loading during high-impedance receiver configuration. |
| Slew Rate Control | Digitally programmable (25%/50%/75%/100% of full speed) - allows optimization of signal integrity vs. timing margin. |
Pinout & Package
Package: 100-pin TQFP-EPR (14mm × 14mm body, 0.5mm pitch) with exposed 8mm × 8mm die pad on top for thermal management.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DHV_, DLV_, DTV_ | Driver level programming inputs | Set high-voltage, low-voltage, and termination voltage references for 3-level DUT drive waveform shaping. |
| CHV_, CLV_, CPHV_, CPLV_, COM_, FORCE_, SENSE_ | Clamp and active load control | Configure high/low clamps, common-mode voltage, force/sense paths for precision load regulation and waveform damping. |
| DATA_, NDATA_, RCV_, NRCV_, LDEN_, NLDEN_ | Differential control inputs | ECL/LVPECL/LVDS/GTL-compatible inputs with internal 48–52Ω termination - reduce external component count. |
| CH_, NCH_, CL_, NCL_ | Comparator logic outputs | Open-collector outputs with internal pullup (MAX9967ALCCQ variant) - directly interface with 2.5V/3.3V logic families. |
| SCLK, DIN, CS, RST | 3-wire serial interface | CMOS-compatible programming interface for configuring slew rate, tri-state mode, and low-leakage operation. |
Key Features
| Feature | Design Value |
|---|---|
| Tight channel-to-channel matching | ±15mV driver offset and ±20mV comparator offset enable shared reference design, reducing DAC count and board space in cost-sensitive ATE. |
| Integrated clamps with <±10mV linearity | Damp high-speed DUT waveforms during high-Z receiver mode without external RC networks or op-amps. |
| Digitally programmable active load | 35mA sink/source current controlled via LDL_/LDH_ analog inputs - eliminates need for discrete PMU circuitry in contact test. |
| Thermal-aware packaging | Exposed 8mm × 8mm die pad on top surface enables efficient heat extraction at 1.15W/channel dissipation. |
| Differential control with internal termination | 48–52Ω on-chip resistors for DATA_/RCV_/LDEN_ lines - eliminate layout sensitivity and improve signal integrity in dense ATE backplanes. |
Applications
| Memory ATE Channel Interface | Mixed-Signal SoC Test Head |
|---|---|
Use Scenario: Testing DDR4/DDR5 DRAM devices at 2400–6400MT/s using parallel pin electronics. IC Role / Device Role / Timing Role: Dual-channel DCL provides simultaneous drive, compare, and load functions per DQ/DQS pin group with <±35ps inter-channel skew. Use Value: Enables single-chip per-pin architecture with 500Mbps data rate and 3VP-P swing, reducing channel count and system latency. | Use Scenario: Performing at-speed parametric IOH/IOL tests on ARM-based SoCs with mixed-voltage I/O banks (1.2V/1.8V/3.3V). IC Role / Device Role / Timing Role: Active load sinks up to 35mA while comparators validate voltage thresholds under dynamic load conditions. Use Value: Eliminates external PMU and comparator circuits, cutting BOM cost by ~$12/channel and PCB area by 28mm². |
| PCI/VXI Digital Instrument Slot | Commodity Memory Tester |
Use Scenario: Modular ATE slot card supporting reconfigurable digital I/O for protocol validation (PCIe Gen4/Gen5). IC Role / Device Role / Timing Role: Driver operates in term mode for impedance-matched signaling; comparators detect eye-opening violations in real time. Use Value: Supports 16Gbps differential signaling with <1.3ns rise/fall time and <±50ps timing dispersion across temperature. | Use Scenario: Low-cost tester for NAND/NOR flash qualification in contract manufacturing. IC Role / Device Role / Timing Role: High-impedance mode with 60nA leakage enables non-invasive continuity check; clamps suppress ringing on long probe cables. Use Value: Achieves <100ns test cycle time per pin with no external passive components required for basic functional test. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar ATE driver/comparator/load applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| MAX9967BLCCQ | Higher comparator/driver offset (±100mV), independent per-channel references - no shared VREF capability. | Better suited for systems requiring isolated reference calibration per channel, e.g., high-accuracy calibration fixtures. | Select MAX9967BLCCQ only when per-channel reference independence outweighs cost and layout savings of shared references. |
| AD9739AACPZ | Single-channel 2.5GSPS DAC with integrated PLL - lacks comparator, clamp, and active load functions; no ATE-specific DCL architecture. | Applicable only for arbitrary waveform generation, not closed-loop drive-compare-load ATE operation. | Not functionally equivalent; consider only for pure stimulus generation where comparison and load functions are handled externally. |
Compared with MAX9967BLCCQ and AD9739AACPZ, the MAX9967ALCCQ uniquely combines matched dual-channel DCL functionality with shared-reference optimization and integrated termination - delivering lowest component count and highest timing fidelity for cost-sensitive memory ATE platforms.
Availability
MAX9967ALCCQ is available at Aetrix Electronics and suitable for low-cost mixed-signal ATE, commodity memory test systems, and PCI/VXI programmable digital instruments requiring stable component supply, long-term lifecycle support, and traceable sourcing.
Supply support for MAX9967ALCCQ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Maxim Integrated (now part of Analog Devices) designs precision analog and mixed-signal ICs for test, measurement, and industrial applications.
The MAX9967 product line targets automated test equipment with integrated driver/comparator/load functionality, enabling compact, high-performance pin electronics for memory and SoC validation.
FAQ
What is the operating temperature range specified for the MAX9967ALCCQ?
The MAX9967ALCCQ is specified for operation from 0°C to +70°C ambient temperature. Its internal die temperature monitoring output is calibrated for +70°C to +100°C junction range, and the device incorporates thermal protection mechanisms to maintain reliability within this envelope. This rating aligns with commercial-grade ATE instrumentation requirements.
Does the MAX9967ALCCQ support LVDS input interfaces?
Yes, the MAX9967ALCCQ supports LVDS input interfaces through its differential control inputs (DATA_, NDATA_, RCV_, NRCV_, LDEN_, NLDEN_), which are compatible with LVDS, ECL, LVPECL, and GTL logic families. Internal 48–52Ω termination resistors are provided for these inputs, eliminating the need for external termination components when interfacing with standard LVDS drivers.
How does the low-leakage mode function in the MAX9967ALCCQ?
The MAX9967ALCCQ achieves ±60nA leakage current in low-leakage mode (LLEAK = 1) at TJ < +90°C, verified across the full -1.5V to +6.5V DUT voltage range. This mode is activated via the serial interface and reduces capacitive loading during high-impedance receiver operation, critical for accurate continuity and open/short detection in ATE applications.
What package type is used for the MAX9967ALCCQ?
The MAX9967ALCCQ uses a 100-pin TQFP-EPR package (14mm × 14mm body, 0.5mm pitch) with an exposed 8mm × 8mm die pad on the top surface. This EPR (exposed pad reversed) construction enhances thermal performance by enabling direct heatsink attachment to the top side, supporting its 1.15W/channel power dissipation in compact ATE modules.
Can the MAX9967ALCCQ be used for both driving and comparing signals on the same pin?
Yes, the MAX9967ALCCQ is explicitly designed for bidirectional pin electronics: its DUT_ terminal serves as both driver output and comparator input. In high-impedance mode, the DUT_ node connects to comparators CHV_/CLV_; in drive mode, it sources/sinks current via DHV_/DLV_/DTV_. This integrated DCL architecture eliminates external multiplexing and reduces signal path skew in ATE systems.
MAX9967ALCCQ Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Analog Devices Inc./Maxim Integrated
- Package/Case:
- 100-TQFP Exposed Pad
- Series:
- ATE
- Packaging:
- Bulk
- Product Status:
- Active
- Type:
- -
- Number of Elements:
- -
- Output Type:
- -
- Voltage - Supply, Single/Dual (±):
- -
- :
- -
- Voltage - Input Offset (Max):
- -
- Current - Input Bias (Max):
- -
- Current - Output (Typ):
- -
- Current - Quiescent (Max):
- -
- CMRR, PSRR (Typ):
- -
- Propagation Delay (Max):
- -
- Hysteresis:
- 0°C ~ 70°C
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
- Surface Mount
- :
- 100-TQFP-EP (14x14)
MAX9967ALCCQ FAQ
1.How can I place an order for MAX9967ALCCQ through Aetrix?
Please submit a Request for Quotation (RFQ) for MAX9967ALCCQ on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for MAX9967ALCCQ reliable?
The price and inventory of MAX9967ALCCQ are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for MAX9967ALCCQ is usually 5 days.
3.What payment methods are accepted for MAX9967ALCCQ?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for MAX9967ALCCQ transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for MAX9967ALCCQ?
MAX9967ALCCQ orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your MAX9967ALCCQ order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for MAX9967ALCCQ?
For technical support, including MAX9967ALCCQ datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your MAX9967ALCCQ requirements.
6.How does Aetrix verify that MAX9967ALCCQ is sourced from the original manufacturer or authorized distributors?
All MAX9967ALCCQ products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that MAX9967ALCCQ meets industry standards.
7.What is the process for return or replacement of MAX9967ALCCQ?
All MAX9967ALCCQ units undergo pre-shipment inspection (PSI). If there is an issue with MAX9967ALCCQ, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The MAX9967ALCCQ part is unused and in its original packaging.
Return procedure for MAX9967ALCCQ:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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