Analog Devices Inc./Maxim Integrated MAX9967BDCCQ

Overview

The MAX9967BDCCQ from Maxim Integrated is a dual-channel, low-power, high-speed ATE driver/comparator/load (DCL) IC designed for automated test equipment. It delivers 500Mbps data rate, ±35mA programmable active-load current, and operates across -1.5V to +6.5V DUT voltage range. Its three-level pin driver with active termination, dual comparators with <±100mV offset, and integrated clamps support precision parametric and functional testing of memory and SoC devices.

For engineers reviewing the MAX9967BDCCQ datasheet, MAX9967BDCCQ pinout, MAX9967BDCCQ application, or MAX9967BDCCQ equivalent, key selection criteria include channel-to-channel timing match (<40ps), low-leakage mode (60nA), slew-rate programmability, differential ECL/LVPECL/LVDS/GTL interface compatibility, and thermal monitoring via TEMP output.

Technical Context

The MAX9967BDCCQ implements two independent DCL channels, each integrating a wide-range, linear three-level driver (DHV_/DLV_/DTV_), dual comparators (CH_/NCH_/CL_/NCL_), programmable clamps (CPHV_/CPLV_), and an active load (LDH_/LDL_/COM_). Driver operation supports high-impedance, drive, and active-termination modes with <50mV overshoot and 10ns settling to 25mV.

Its serial interface (3-wire, 50MHz CMOS-compatible) configures slew rate, tri-state/terminate states, and low-leakage mode. The device uses separate positive (VCC = +9.75V) and negative (VEE = -5.25V) supplies, with die temperature monitoring (3.43V at +70°C, +10mV/°C) and an exposed 8mm × 8mm thermal pad for thermal management.

Key Specifications

Pinout & Package

The MAX9967BDCCQ is housed in a 100-pin, 14mm × 14mm, 0.5mm pitch TQFP-EPR package with an exposed 8mm × 8mm die pad on the top surface for enhanced thermal dissipation.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar ATE driver/comparator/load applications.

Compared with MAX9967ADCCQ, the MAX9967BDCCQ trades tighter matching for independent per-channel reference capability-critical when DUTs require unique voltage thresholds. Against MAX9967BGCCQ, it offers identical performance but distinct lot traceability for quality-controlled production environments.

Availability

The MAX9967BDCCQ is available at Aetrix Electronics and suitable for low-cost mixed-signal ATE, commodity memory test systems, and PCI/VXI programmable digital instruments requiring stable component supply, long-term lifecycle support, and consistent thermal performance across production batches.

Supply support for MAX9967BDCCQ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Maxim Integrated (now part of Analog Devices) designs precision analog and mixed-signal ICs for test, measurement, power, and interface applications.

The MAX9967 product line targets automated test equipment with integrated driver/comparator/load functionality, enabling compact, high-channel-count pin electronics for memory, SoC, and high-speed serial interface validation.

FAQ

What is the maximum data rate supported by the MAX9967BDCCQ?

The MAX9967BDCCQ supports a maximum data rate of 500Mbps, verified under 3VP-P differential swing into 50Ω loads. This rating applies to both driver output and comparator input paths, enabling full-speed functional and parametric testing of DDR4/DDR5 and PCIe Gen4 DUTs. The device maintains timing integrity with <±50ps propagation delay variation across voltage, temperature, and pulse width.

Does the MAX9967BDCCQ support independent reference voltages per channel?

Yes, the MAX9967BDCCQ is specifically designed for system architectures requiring independent reference levels per channel. Unlike the MAX9967A variant, the MAX9967BDCCQ does not enforce tight gain/offset matching between channels, allowing separate DHV_/DLV_/DTV_ and CHV_/CLV_ programming for each of its two DCL channels-ideal for multi-DUT or mixed-voltage test scenarios.

How does the low-leakage mode function in the MAX9967BDCCQ?

The MAX9967BDCCQ's low-leakage mode reduces DUT pin leakage current to ≤60nA (at TJ < +90°C, VDUT_ = 0–3V), achieved by disabling internal bias paths during high-impedance receiver operation. Activation is controlled via the LLEAK bit in the serial interface register. Recovery time after disable is ≤4µs, ensuring minimal disruption to high-speed test sequences requiring rapid mode switching.

What thermal management features does the MAX9967BDCCQ include?

The MAX9967BDCCQ incorporates an exposed 8mm × 8mm die pad on the top of its 100-pin TQFP-EPR package for efficient heat extraction, plus an integrated die temperature monitor (TEMP pin) outputting 3.43V at +70°C with +10mV/°C slope. These features enable active thermal derating in densely packed ATE cards and provide real-time junction temperature feedback without external sensors.

Can the MAX9967BDCCQ interface directly with LVDS and ECL logic families?

Yes, the MAX9967BDCCQ's differential control inputs (DATA_/NDATA_, RCV_/NRCV_, LDEN_/NLDEN_) are compatible with ECL, LVPECL, LVDS, and GTL signaling standards. Internal termination resistors (48–52Ω) and configurable input termination voltages eliminate external bias networks. Comparator outputs support open-collector operation with programmable pull-up to VCCO_, enabling seamless interfacing with multiple logic families on the same board.